JPH0548623B2 - - Google Patents

Info

Publication number
JPH0548623B2
JPH0548623B2 JP59245770A JP24577084A JPH0548623B2 JP H0548623 B2 JPH0548623 B2 JP H0548623B2 JP 59245770 A JP59245770 A JP 59245770A JP 24577084 A JP24577084 A JP 24577084A JP H0548623 B2 JPH0548623 B2 JP H0548623B2
Authority
JP
Japan
Prior art keywords
electron beam
circuit
integrated circuit
signal
under test
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP59245770A
Other languages
English (en)
Japanese (ja)
Other versions
JPS61124148A (ja
Inventor
Kazuyuki Ozaki
Akio Ito
Yoshiaki Goto
Kazuo Ookubo
Masaaki Kawabata
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fujitsu Ltd
Original Assignee
Fujitsu Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fujitsu Ltd filed Critical Fujitsu Ltd
Priority to JP59245770A priority Critical patent/JPS61124148A/ja
Publication of JPS61124148A publication Critical patent/JPS61124148A/ja
Publication of JPH0548623B2 publication Critical patent/JPH0548623B2/ja
Granted legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L22/00Testing or measuring during manufacture or treatment; Reliability measurements, i.e. testing of parts without further processing to modify the parts as such; Structural arrangements therefor

Landscapes

  • Engineering & Computer Science (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
JP59245770A 1984-11-20 1984-11-20 電子ビ−ム装置 Granted JPS61124148A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP59245770A JPS61124148A (ja) 1984-11-20 1984-11-20 電子ビ−ム装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP59245770A JPS61124148A (ja) 1984-11-20 1984-11-20 電子ビ−ム装置

Publications (2)

Publication Number Publication Date
JPS61124148A JPS61124148A (ja) 1986-06-11
JPH0548623B2 true JPH0548623B2 (enrdf_load_html_response) 1993-07-22

Family

ID=17138549

Family Applications (1)

Application Number Title Priority Date Filing Date
JP59245770A Granted JPS61124148A (ja) 1984-11-20 1984-11-20 電子ビ−ム装置

Country Status (1)

Country Link
JP (1) JPS61124148A (enrdf_load_html_response)

Also Published As

Publication number Publication date
JPS61124148A (ja) 1986-06-11

Similar Documents

Publication Publication Date Title
EP1062521B1 (en) Simultaneous display of primary measurement values and derived parameters
EP1048954B1 (en) An interleaved digital peak detector
US4477775A (en) Method and apparatus for a fast internal logic check of integrated circuits
US4486660A (en) Electron beam testing device for stroboscopic measurement of high-frequency, periodic events
JPH07151790A (ja) オシロスコープ及び測定機器
KR100296085B1 (ko) 파형분석을위한방법및장치
US6225815B1 (en) Charged particle beam test system
US5210487A (en) Double-gated integrating scheme for electron beam tester
JPH0548623B2 (enrdf_load_html_response)
US6163159A (en) Charged particle beam test system
US4831328A (en) Measurement processing arrangement
JPH0124269B2 (enrdf_load_html_response)
JPH03229179A (ja) 荷電ビーム装置
Brust A novel waveform measurement method for signals with low repetition rate
JPH0341376A (ja) 電子ビーム装置
JPH01141362A (ja) 工程検査用標準パターン発生装置
SU815967A1 (ru) Устройство автоматического контрол КАчЕСТВЕННыХ пОКАзАТЕлЕй ТЕлЕВизиОННыХКАНАлОВ
JPS6251430B2 (enrdf_load_html_response)
SU1478130A1 (ru) Устройство подавлени нестабильностей стробоскопического регистратора
Hall et al. Rapid data acquisition for e-beam testing
JPS61201173A (ja) 磁気デイスク特性測定装置
JPH07280880A (ja) Icの静止時電源電流試験装置
JPS61107170A (ja) 電子ビ−ムプロ−ビング装置
JPH0777540A (ja) 多段レベルサンプリング型波形測定器
JPS62219447A (ja) ストロボ電子ビ−ム装置