JPH0542977Y2 - - Google Patents

Info

Publication number
JPH0542977Y2
JPH0542977Y2 JP1985089623U JP8962385U JPH0542977Y2 JP H0542977 Y2 JPH0542977 Y2 JP H0542977Y2 JP 1985089623 U JP1985089623 U JP 1985089623U JP 8962385 U JP8962385 U JP 8962385U JP H0542977 Y2 JPH0542977 Y2 JP H0542977Y2
Authority
JP
Japan
Prior art keywords
wafer
chuck
receiving surface
guide
holder
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP1985089623U
Other languages
Japanese (ja)
Other versions
JPS61206537U (en
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP1985089623U priority Critical patent/JPH0542977Y2/ja
Publication of JPS61206537U publication Critical patent/JPS61206537U/ja
Application granted granted Critical
Publication of JPH0542977Y2 publication Critical patent/JPH0542977Y2/ja
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Landscapes

  • Feeding Of Articles By Means Other Than Belts Or Rollers (AREA)

Description

【考案の詳細な説明】 〔考案の技術分野〕 本考案は、バキユームを用いないで、チヤツク
爪によりウエハを保持するメカニカルなウエハ搬
送チヤツクに係り、特にアンチヤツク時における
ウエハの横ズレ防止に関するものである。
[Detailed Description of the Invention] [Technical Field of the Invention] The present invention relates to a mechanical wafer transfer chuck that holds a wafer with a chuck claw without using a vacuum, and particularly relates to preventing lateral displacement of a wafer during anti-chucking. be.

〔考案の技術的背景とその問題点〕[Technical background of the invention and its problems]

従来のウエハ搬送チヤツクは、バキユームを用
いその吸着力でウエハを保持するのが一般的であ
る。この場合の欠点として、ウエハとフイラ(吸
口)の接触による損傷や清浄度の低下またはウエ
ハに付着している処理液の吸引によるバキユーム
装置の作動不良等があり、さらにコスト面を考慮
してバキユームによらないチヤツクを必要とする
場合がある。一方メカニカルなウエハ搬送チヤツ
クの場合には、チヤツク爪の先端部がウエハ表面
よりオーバハングし、ウエハの受取りや受渡しの
際相手側の保持具や搬送チヤツクに干渉するた
め、アプローチの途中でアンチヤツクしてから持
込みする必要があり、ウエハの横ズレを生じ、チ
ヤツク外に落下する恐れがあつた。
Conventional wafer transfer chucks generally use a vacuum to hold the wafer with its suction force. Disadvantages of this case include damage due to contact between the wafer and filler (suction port), reduction in cleanliness, and malfunction of the vacuum equipment due to suction of processing liquid adhering to the wafer. In some cases, a check that does not depend on the situation may be required. On the other hand, in the case of a mechanical wafer transfer chuck, the tip of the chuck claw overhangs the wafer surface and interferes with the other party's holder or transfer chuck when receiving or transferring the wafer, so the chuck may be anti-jawed during the approach. The wafers had to be brought in from the chuck, which caused the wafers to shift laterally and risk falling out of the chuck.

〔考案の目的〕[Purpose of invention]

本考案は、バキユームを用いないでチヤツク爪
によりウエハを保持するものにおいてアンチヤツ
ク状態でウエハを受渡す際ウエハの横ズレを生じ
ないメカニカルなウエハ搬送チヤツクを提供する
ことを目的とする。
The object of the present invention is to provide a mechanical wafer transfer chuck which does not cause lateral displacement of the wafer when the wafer is transferred in an anti-chuck state, in which the wafer is held by chuck claws without using a vacuum.

〔考案の概要〕[Summary of the idea]

本考案は、上記の目的を達成するため、複数の
チヤツク爪でチヤツク本体側のウエハ受面との間
でウエハを保持するようにし、かつウエハの外周
部にスプリング等の弾性体により前記ウエハ受面
より飛び出しうるガイドを具備し、このガイドに
よつてアンチヤツク状態でウエハを受渡す際にお
いてもウエハの横ズレを防止するようにしたもの
である。
In order to achieve the above object, the present invention uses a plurality of chuck claws to hold the wafer between the wafer receiving surface on the chuck body side, and an elastic body such as a spring on the outer periphery of the wafer. It is equipped with a guide that can protrude from the surface, and this guide prevents the wafer from shifting laterally even when the wafer is transferred in an anti-yack state.

〔考案の実施例〕[Example of idea]

以下本考案の一実施例を示す第1図ないし第5
図について説明する。第1図は、本発明によるウ
エハ搬送チヤツクAがウエハ3を保持して機械の
保持具または他のウエハ搬送チヤツク(以下保持
具として説明する)Bの同心位置の真下に移送さ
れた状態を示す。このウエハ搬送チヤツクAのチ
ヤツク本体1は、アームCの先端に取付けられて
いる。アームCは図示しない移送機構により上下
移動、水平移動(旋回も含む)を与えられるほか
必要に応じて回転しウエハ搬送チヤツクAを反転
し得るように構成されている。
Figures 1 to 5 below show an embodiment of the present invention.
The diagram will be explained. FIG. 1 shows a state in which a wafer transport chuck A according to the present invention holds a wafer 3 and is transferred to a concentric position directly below a machine holder or another wafer transport chuck (hereinafter referred to as a holder) B. . The chuck body 1 of this wafer transfer chuck A is attached to the tip of an arm C. The arm C is configured to be able to move vertically and horizontally (including rotation) by a transfer mechanism (not shown), and also rotate as necessary to reverse the wafer transfer chuck A.

チヤツク本体1の第1図において上面2には凹
部2′が設けられ、この凹部2′の囲りの僅かな巾
(2〜4mm)のリング状の上面(以下ウエハ受面
という)2によつて、ウエハ3の外周寄り部分を
支持するようになつている。
In FIG. 1 of the chuck body 1, a recess 2' is provided in the upper surface 2, and a ring-shaped upper surface (hereinafter referred to as wafer receiving surface) 2 with a small width (2 to 4 mm) surrounds this recess 2'. Thus, a portion near the outer periphery of the wafer 3 is supported.

チヤツク本体1の外周部には支点ピン4で支え
られた複数のチヤツク爪5が設けられている。チ
ヤツク爪5はシリンダ等の駆動装置9によつて前
記支点ピン4を中心に揺動されるようになつてい
る。チヤツク爪5は、第4図に拡大して示すよう
に、駆動装置9によりチヤツク状態にあるとき、
チヤツク本体1のストツパ面8で動きを制限さ
れ、ウエハ3の上面および外周面でのそれぞれに
対し僅少のスキマを持つようになつている。
A plurality of chuck pawls 5 supported by a fulcrum pin 4 are provided on the outer periphery of the chuck body 1. The chuck pawl 5 is adapted to be swung around the fulcrum pin 4 by a driving device 9 such as a cylinder. When the chuck pawl 5 is in the chuck state by the drive device 9, as shown enlarged in FIG.
Movement is restricted by the stopper surface 8 of the chuck body 1, and there is a slight clearance between the upper surface and the outer peripheral surface of the wafer 3.

また、チヤツク本体1の外周部には、上下に滑
動可能で背部のスプリング等の弾性体6によりウ
エハ受面2に対し垂直方向へ一定量飛び出し可能
な複数のピン状のガイド(チヤツク爪5に当る部
分を切欠したリング状体のものなどでもよい)7
が設けられている。このガイド7は、第5図に拡
大して示すように、ウエハ3の外周面に対し僅少
のスキマを持つようになつている。
In addition, on the outer periphery of the chuck body 1, there are a plurality of pin-shaped guides (on the chuck claws 5) that can be slid up and down and that can be protruded by a certain amount in a direction perpendicular to the wafer receiving surface 2 by means of an elastic body 6 such as a spring on the back. It may also be a ring-shaped body with a cutout in the contact area) 7
is provided. As shown in an enlarged view in FIG. 5, this guide 7 is designed to have a slight clearance from the outer peripheral surface of the wafer 3.

次にウエハ3の保持具Bに対する受渡しの動作
について説明する。先づチヤツク爪5を開き、機
械または装置外から図示しない搬送ベルトなどに
より所定位置に位置付けされているウエハ3に対
し、アームCの移動によつてウエハ受面2を接触
または僅少なスキマを置いて対向させ、駆動装置
9によりチヤツク爪5を閉じてウエハ3をウエハ
搬送チヤツクAに保持する。なお、このウエハ搬
送チヤツクAは、ウエハ3の表面すなわち実際に
半導体装置が形成される側の面(第1図において
下側の面)をウエハ受面2に対向させるようにな
つており、保持具Bによつて吸着される側すなわ
ち図において上面は裏面である。このウエハ3の
表面は、ウエハ受面2に設けた凹部2′により外
周部のみが支持され、かつチヤツク爪5による保
持を第4図に示したように僅少なスキマを持つて
行なうようにすることにより、損傷が避けられ
る。次いで、アームCの移動により第1図に示す
ように、ウエハ搬送チヤツクAを保持具Bの同心
位置の真下に対向させ、さらにアームCを上昇さ
せる。ウエハ搬送チヤツクAのチヤツク爪5が保
持具Bに当たる手前でチヤツク爪5を、第2図に
示すように、その先端がウエハ3の上面より後方
(第2図において下方)へ退避するまで開く。こ
のとき、チヤツク爪5によるウエハ3の保持は解
除されるが、ウエハ受面2より所定量突出してい
るガイド7があるため、ウエハ3は横ズレを生ず
ることなく、ウエハ受面2上に保持され続ける。
Next, the operation of transferring the wafer 3 to the holder B will be explained. First, the chuck claw 5 is opened, and the wafer receiving surface 2 is brought into contact with the wafer 3, which is positioned at a predetermined position by a conveyor belt (not shown) from outside the machine or the apparatus, or with a slight gap, by moving the arm C. The chuck claws 5 are closed by the driving device 9 to hold the wafer 3 on the wafer transport chuck A. Note that this wafer transfer chuck A is designed so that the surface of the wafer 3, that is, the surface on which semiconductor devices are actually formed (the lower surface in FIG. 1), faces the wafer receiving surface 2, and holds the wafer. The side that is attracted by tool B, that is, the upper surface in the figure, is the back surface. The surface of the wafer 3 is supported only at its outer periphery by a recess 2' provided in the wafer receiving surface 2, and is held by chuck claws 5 with a slight gap as shown in FIG. This will prevent damage. Next, as shown in FIG. 1, the arm C is moved so that the wafer transfer chuck A faces directly below the concentric position of the holder B, and the arm C is further raised. Before the chuck pawl 5 of the wafer transport chuck A contacts the holder B, the chuck pawl 5 is opened until its tip retreats to the rear (downward in FIG. 2) from the upper surface of the wafer 3, as shown in FIG. At this time, the holding of the wafer 3 by the chuck claw 5 is released, but since there is a guide 7 that protrudes from the wafer receiving surface 2 by a predetermined amount, the wafer 3 is held on the wafer receiving surface 2 without causing lateral displacement. continues to be.

さらにウエハ搬送チヤツクAを上昇させると、
先づガイド7の先端が保持具Bに当たるが、この
ガイド7は弾性体6に抗して押込められ、第3図
に示すように、ウエハ3の上面が保持具Bに接触
または僅少なスキマを置いて対向する。この状態
で、保持具Bを作動させ、例えばバキユームによ
る吸着力などによつてウエハ3を保持具Bによつ
て保持する。このとき、ウエハ3を強く保持具B
へ押圧することは好ましくないので、一般には極
く軽く接触させるかまたは前記のように僅少なス
キマを置いて対向させるため、前記吸着に伴つて
ウエハ3が横スベリを生じようとするが、このウ
エハ3の横スベリはガイド7によつて阻止され、
ウエハ3は保持具Bの所定位置に正確に保持され
る。
When wafer transfer chuck A is further raised,
First, the tip of the guide 7 hits the holder B, but the guide 7 is pushed against the elastic body 6, and as shown in FIG. and face each other. In this state, the holder B is operated, and the wafer 3 is held by the holder B, for example, by the suction force of a vacuum. At this time, hold the wafer 3 firmly with the holder B.
Since it is undesirable to press the wafer 3 against the wafer 3, generally the wafer 3 is brought into very light contact or is placed facing each other with a slight gap as described above. Lateral sliding of the wafer 3 is prevented by the guide 7,
The wafer 3 is accurately held at a predetermined position on the holder B.

こうしてウエハ3を保持具Bへ渡し終つたなら
ば、チヤツク爪5を開いたまま、アームCを下降
させ、さらに機械および装置外にアームCを移動
させ、次の動作に供える。
When the wafer 3 has been transferred to the holder B in this manner, the arm C is lowered while the chuck claw 5 is kept open, and the arm C is further moved outside the machine and apparatus to prepare for the next operation.

前記保持具Bに保持されているウエハ3をウエ
ハ搬送チヤツクAに受取る場合は、前述した動作
と逆になるが、ウエハ3をウエハ受面2側へ確実
に受取るために、保持具Bに保持されているウエ
ハ3に対し、ウエハ受面2を若干離して対向さ
せ、保持具B側のバキユームを加圧に変えてウエ
ハ3を積極的に離脱することが好ましい。このよ
うな場合にも、ガイド7はウエハ3の横ズレを防
止するため、ウエハ3はウエハ受面2上に位置ズ
レを生ずることなく、移換えられる。
When the wafer 3 held on the holder B is received by the wafer transfer chuck A, the operation is the opposite of the above-mentioned operation. It is preferable to face the wafer 3 with the wafer receiving surface 2 slightly separated from it, and change the vacuum on the holder B side to pressure to actively remove the wafer 3. Even in such a case, the guide 7 prevents the wafer 3 from shifting laterally, so that the wafer 3 can be transferred without causing any displacement on the wafer receiving surface 2.

なお、上記のアームCの上下動の一部または全
部は保持具B側がおこなつても良い。
Note that part or all of the vertical movement of the arm C may be performed by the holder B side.

〔考案の効果〕 本考案は以上説明したように、バキユームを用
いないためローコストであり、フイラ(吸口)に
よるウエハの損傷や洗浄度の低下もなく、また最
終的に製品として使用されないウエハの外周部を
チヤツク面と受面に使用することによりウエハの
表面に損傷等の悪影響を与えず、しかもウエハの
受授に際しアンチヤツク状態でも、ウエハの横ズ
レを防ぐことができるという効果をもつものであ
る。
[Effects of the invention] As explained above, the present invention is low cost because it does not use a vacuum, there is no damage to the wafer due to the filler (suction port), there is no deterioration in cleaning quality, and the outer periphery of the wafer that is not ultimately used as a product is reduced. By using the parts on the chuck surface and the receiving surface, there is no damage or other negative effects on the wafer surface, and it also has the effect of preventing the wafer from shifting laterally even when the wafer is in an anti-chuck state when receiving or receiving the wafer. .

【図面の簡単な説明】[Brief explanation of the drawing]

第1図乃至第5図は本考案の実施例を示すもの
で第1図はウエハを保持した状態、第2図は保持
具にアプローチし、チヤツク爪の干渉防止上アン
チヤツクした状態、第3図はウエハの受渡しと受
取りの状態、第4図はチヤツクした時の拡大図、
第5図はガイドの拡大図である。 A……ウエハ搬送チヤツク、B……相手保持
具、C……アーム、1……チヤツク本体、2……
ウエハ受面、3……ウエハ、4……支点ピン、5
……チヤツク爪、6……スプリング、7……ガイ
ド、8……ストツパ面、9……シリンダ。
Figures 1 to 5 show an embodiment of the present invention. Figure 1 shows the state in which the wafer is held, Figure 2 shows the state in which the holder is approached and the chuck is anti-chucked to prevent interference with the chuck claws, and Figure 3 Figure 4 shows the status of wafer delivery and reception, and Figure 4 is an enlarged view when checking.
FIG. 5 is an enlarged view of the guide. A...Wafer transfer chuck, B...Mating holder, C...Arm, 1...Chuck body, 2...
Wafer receiving surface, 3... Wafer, 4... Fulcrum pin, 5
...Chuck pawl, 6...Spring, 7...Guide, 8...Stopper surface, 9...Cylinder.

Claims (1)

【実用新案登録請求の範囲】 (1) ウエハを複数のチヤツク爪で保持する搬送チ
ヤツクにおいて、 チヤツク本体のウエハ受面上に前記ウエハを
保持すべく前記チヤツク本体の外周部に半径方
向へ揺動可能に設けられた複数のチヤツク爪
と、 前記ウエハの外周部と僅かなスキマをもつ
て、弾性体により前記ウエハ受面に対し上下垂
直に滑動可能に設けられたガイドとを具備し、 前記チヤツクの爪の先端は、チヤツク状態に
あるとき、ウエハの外周および上面に対向可能
に形成されると共に、アンチヤツク状態にある
とき、ウエハ受面上のウエハ上面より後方へ退
避可能に形成されている ことを特徴とするウエハ搬送チヤツク。 (2) ガイドが複数のピンであることを特徴とする
実用新案登録請求の範囲第1項のウエハ搬送チ
ヤツク。 (3) ガイドがチヤツク爪部を切欠したリング状体
であることを特徴とする実用新案登録請求の範
囲第1項のウエハ搬送チヤツク。 (4) ウエハ受面が前記ウエハの外周部より内側の
極く少ない巾に限定されていることを特徴とす
る実用新案登録請求の範囲第1項のウエハ搬送
チヤツク。
[Scope of Claim for Utility Model Registration] (1) In a transport chuck that holds a wafer with a plurality of chuck claws, the outer peripheral portion of the chuck body swings in a radial direction to hold the wafer on the wafer receiving surface of the chuck body. a plurality of chuck pawls that can be provided, and a guide that is provided with a slight clearance from the outer periphery of the wafer so as to be slidable up and down vertically with respect to the wafer receiving surface by means of an elastic body; The tips of the claws are formed so that they can face the outer periphery and top surface of the wafer when in the chuck state, and are formed so that they can be retracted backward from the top surface of the wafer on the wafer receiving surface when in the anti-chuck state. A wafer transfer chuck featuring: (2) The wafer transfer chuck according to claim 1 of the utility model registration, characterized in that the guide is a plurality of pins. (3) The wafer transfer chuck according to claim 1, wherein the guide is a ring-shaped body having a chuck claw portion cut out. (4) The wafer transfer chuck according to claim 1, wherein the wafer receiving surface is limited to a very small width inside the outer circumference of the wafer.
JP1985089623U 1985-06-14 1985-06-14 Expired - Lifetime JPH0542977Y2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP1985089623U JPH0542977Y2 (en) 1985-06-14 1985-06-14

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1985089623U JPH0542977Y2 (en) 1985-06-14 1985-06-14

Publications (2)

Publication Number Publication Date
JPS61206537U JPS61206537U (en) 1986-12-26
JPH0542977Y2 true JPH0542977Y2 (en) 1993-10-28

Family

ID=30643874

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1985089623U Expired - Lifetime JPH0542977Y2 (en) 1985-06-14 1985-06-14

Country Status (1)

Country Link
JP (1) JPH0542977Y2 (en)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP6298364B2 (en) * 2014-06-09 2018-03-20 株式会社ディスコ Processing equipment

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5338291Y2 (en) * 1973-08-14 1978-09-16
JPS6018310Y2 (en) * 1980-01-21 1985-06-03 シ−ケ−デイ株式会社 Holding device for semi-flexible sheets

Also Published As

Publication number Publication date
JPS61206537U (en) 1986-12-26

Similar Documents

Publication Publication Date Title
KR20010049569A (en) Wafer transfer station for a chemical mechanical polisher
TW201718202A (en) Substrate conveyance robot and substrate processing system
CN110870057B (en) Substrate holding device
US3695502A (en) Bonding tool
JPH0542977Y2 (en)
JPH0338051A (en) Handling method and device for semiconductor wafer
JP2838957B2 (en) Industrial robot hand device and work transfer method
JP3516066B2 (en) Article transfer device
JP2019125756A (en) Workpiece transfer device and workpiece transfer method
JP2556856Y2 (en) Frame clamping mechanism in dicing machine
CN114695191A (en) Tape mounter
JPH0318435Y2 (en)
JPH07277535A (en) Retainer of lead frame
KR200173017Y1 (en) Wafer transporting unit
JP4187370B2 (en) Wafer and contact board alignment system
KR0164254B1 (en) Semiconductor package singulation device
JP4144000B2 (en) Wafer centering device
WO2023209953A1 (en) Component push-up device and component mounting device
JP7402946B2 (en) Wafer positioning device
JPH02283021A (en) Semiconductor wafer retaining equipment
JPH077066Y2 (en) Link lever insertion machine
JP2006032687A (en) Workpiece transporting device
KR100223970B1 (en) Position array implements of semiconductor wafer carrier
JP2004235536A (en) Open cassette for transferring semiconductor wafer and cassette opening and closing device
JPH07201947A (en) Robot hand for transferring wafer and holding of wafer by this robot hand