JPH0541428A - Semiconductor device - Google Patents
Semiconductor deviceInfo
- Publication number
- JPH0541428A JPH0541428A JP15815391A JP15815391A JPH0541428A JP H0541428 A JPH0541428 A JP H0541428A JP 15815391 A JP15815391 A JP 15815391A JP 15815391 A JP15815391 A JP 15815391A JP H0541428 A JPH0541428 A JP H0541428A
- Authority
- JP
- Japan
- Prior art keywords
- pads
- zap
- semiconductor device
- semiconductor chip
- pad
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Withdrawn
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/02—Bonding areas; Manufacturing methods related thereto
- H01L2224/04—Structure, shape, material or disposition of the bonding areas prior to the connecting process
- H01L2224/05—Structure, shape, material or disposition of the bonding areas prior to the connecting process of an individual bonding area
- H01L2224/0554—External layer
- H01L2224/0555—Shape
- H01L2224/05552—Shape in top view
- H01L2224/05554—Shape in top view being square
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/42—Wire connectors; Manufacturing methods related thereto
- H01L2224/47—Structure, shape, material or disposition of the wire connectors after the connecting process
- H01L2224/48—Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
- H01L2224/481—Disposition
- H01L2224/48151—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
- H01L2224/48221—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
- H01L2224/48245—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being metallic
- H01L2224/48247—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being metallic connecting the wire to a bond pad of the item
Landscapes
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
- Semiconductor Integrated Circuits (AREA)
Abstract
Description
【0001】[0001]
【産業上の利用分野】本発明は、半導体チップのザップ
用パッドの配置を改良した半導体装置に関するものであ
る。BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a semiconductor device having an improved arrangement of zap pads on a semiconductor chip.
【0002】近年の半導体装置の半導体チップは可能な
限り小型にすることが要求されるが、一方では高機能化
した半導体チップにおいては内部のダイオードなどをシ
ョートさせて例えば所定の抵抗値を得るためのザップ用
パッドが設けられる。このザップ用パッドにはプローブ
針がコンタクトされて例えばダイオードをショートさせ
る電圧を内部回路に供給するのであるが、最近では多く
のザップ用パッドを半導体チップの一辺にまとめて配置
する傾向にあるため、半導体チップの小型化の障害にな
っている。The semiconductor chip of a recent semiconductor device is required to be as small as possible. On the other hand, in a highly functional semiconductor chip, an internal diode or the like is short-circuited to obtain a predetermined resistance value, for example. Zap pads are provided. A probe needle is brought into contact with this zap pad to supply a voltage that short-circuits a diode, for example, to the internal circuit, but recently, since many zap pads tend to be placed together on one side of a semiconductor chip, This is an obstacle to miniaturization of semiconductor chips.
【0003】以上のような状況のため、多くのザップ用
パッドをできる限り狭い領域に配置することが可能な半
導体チップを有する半導体装置が要望されている。Under the circumstances as described above, there is a demand for a semiconductor device having a semiconductor chip in which many zap pads can be arranged in a region as narrow as possible.
【0004】[0004]
【従来の技術】従来の5個のザップ用パッドを備えた半
導体チップを有する半導体装置について図3により詳細
に説明する。2. Description of the Related Art A conventional semiconductor device having a semiconductor chip having five zap pads will be described in detail with reference to FIG.
【0005】図3は従来の半導体装置のザップ用パッド
の配置を示す図である。リードフレーム2のリード2aと
半導体チップ1のボンディングパッド1aとの間のワイヤ
3によるボンディングを優先的に考慮してパッドを配置
すると、図3に示すようにザップ用パッド1bの全長が長
くなり、ザップ用パッド1bを配置した辺の長さは素子形
成領域1cの長さよりも長くなり、遊休領域1dが生じて半
導体チップ1の小型化の障害になっている。FIG. 3 is a view showing the arrangement of zap pads of a conventional semiconductor device. If the pads are arranged by preferentially considering the bonding by the wire 3 between the lead 2a of the lead frame 2 and the bonding pad 1a of the semiconductor chip 1, the entire length of the zap pad 1b becomes long as shown in FIG. The length of the side on which the zap pad 1b is arranged is longer than the length of the element formation region 1c, and an idle region 1d is generated, which hinders miniaturization of the semiconductor chip 1.
【0006】[0006]
【発明が解決しようとする課題】以上説明した従来の半
導体装置の半導体チップにおいては、ザップ用パッドの
中心を一直線上に並べて配置しているので、ザップ用パ
ッドを配置した辺の全長が、素子形成領域よりも長くな
り、遊休領域が生じて半導体チップの小型化の障害にな
り、また図4に示すように半導体チップ1の小型化を優
先してパッドを配置すると、*Aのボンディングパッド
と、*Bのリードの二ケ所においてはボンディングを行
うことが困難になり、リードフレームを新規に製造しな
ければならないという問題点があった。In the semiconductor chip of the conventional semiconductor device described above, since the centers of the zap pads are arranged in a straight line, the total length of the side on which the zap pads are arranged is the element. It becomes longer than the formation region, and an idle region is generated, which hinders the miniaturization of the semiconductor chip. Further, as shown in FIG. 4, when the pads are arranged by prioritizing the miniaturization of the semiconductor chip 1, the bonding pad of * A is formed. , * B, it is difficult to perform bonding at the two places of the lead, and there is a problem that a lead frame must be newly manufactured.
【0007】本発明は以上のような状況から、多くのザ
ップ用パッドを配置する場合に半導体チップの小型化の
障害となる遊休領域の発生を防止することが可能となる
半導体チップを有する半導体装置の提供を目的としたも
のである。In view of the above situation, the present invention is a semiconductor device having a semiconductor chip which can prevent the generation of an idle region which hinders the miniaturization of the semiconductor chip when many zap pads are arranged. The purpose is to provide.
【0008】[0008]
【課題を解決するための手段】本発明の半導体装置は、
ザップ用パッドを備えた半導体チップを有する半導体装
置であって、隣接するこのザップ用パッドの中心が一直
線上になく、ジグザグラインの折れ点にあり、このザッ
プ用パッドどうしの相対する辺が平行で配置されている
ように構成する。The semiconductor device of the present invention comprises:
A semiconductor device having a semiconductor chip with a zap pad, wherein the center of the adjacent zap pad is not on a straight line, but at the zigzag line break point, and the opposite sides of the zap pads are parallel to each other. Configure it to be placed.
【0009】[0009]
【作用】即ち本発明においては、隣接するザップ用パッ
ドの中心が一直線上になく、ジグザグラインの折れ点に
あり、このザップ用パッドの相対する辺が平行で、この
辺の間隔が許容可能な最小寸法にザップ用パッドが配置
されているので、図2に示すように配置ピッチが 200μ
m の正八角形のザップ用パッドにおいてはこのザップ用
パッド一個当たり 58.58μm 〔200 ÷(1+1.4142+1)〕
短縮可能であり、例えばザップ用パッドが5個の場合は
234.3μm (1,000−765.7)短縮でき、同数のザップ用パ
ッドを配置する場合に従来より短い範囲に配置すること
ができるので遊休領域を無くすことが可能となり、ボン
ディングパッドの位置に合わせて新規にリードフレーム
を製造する必要がなくなる。That is, in the present invention, the centers of the adjacent zap pads are not on a straight line but at the zigzag line break points, the opposite sides of the zap pads are parallel, and the distance between these sides is the minimum allowable value. As the zap pads are placed in the dimensions, the placement pitch is 200μ as shown in Fig. 2.
In case of regular octagonal zap pad of m, 58.58μm per one zap pad [200 ÷ (1 + 1.4142 + 1)]
It can be shortened, for example, if there are 5 zap pads,
234.3 μm (1,000-765.7) can be shortened, and when arranging the same number of zap pads, it can be arranged in a shorter range than before, so it is possible to eliminate idle areas and newly lead according to the position of the bonding pad. Eliminates the need to manufacture a frame.
【0010】また、他のボンディング用のパッドとは形
状が異なっているため、識別が容易である。Further, since the shape is different from that of other bonding pads, the identification is easy.
【0011】[0011]
【実施例】以下図1〜図2により本発明の一実施例の5
個の正八角形のザップ用パッドを備えた半導体チップを
有する半導体装置について詳細に説明する。DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS A fifth embodiment of the present invention will now be described with reference to FIGS.
A semiconductor device having a semiconductor chip having a regular octagonal zap pad will be described in detail.
【0012】図1は本発明による一実施例の半導体装置
のザップ用パッドの配置を示す図である。本発明による
一実施例においては図に示すように隣接するザップ用パ
ッド1bの中心を図において点線にて示すジグザグライン
の折れ点に配置し、このザップ用パッド1bの相対する辺
が平行で、この辺の間隔が許容可能な最小寸法にザップ
用パッド1bを配置しているので、図2に示すように、従
来に比して 234.3μm短い範囲にザップ用パッド1bを配
置することができ、遊休領域1dを無くすことが可能とな
るので、従来通りのリードフレーム2を用いてワイヤ3
のボンディングを行うことが可能となる。FIG. 1 is a view showing the arrangement of zap pads of a semiconductor device according to an embodiment of the present invention. In one embodiment according to the present invention, as shown in the figure, the center of the adjacent zap pad 1b is arranged at the break point of the zigzag line shown by the dotted line in the figure, and the opposite sides of this zap pad 1b are parallel, Since the zap pad 1b is arranged at the minimum allowable space between the sides, the zap pad 1b can be arranged in a range 234.3 μm shorter than the conventional one as shown in FIG. Since it is possible to eliminate the area 1d, the conventional lead frame 2 is used and the wire 3
Can be bonded.
【0013】[0013]
【発明の効果】以上の説明から明らかなように、本発明
によれば極めて簡単なザップ用パッドの配置の変更によ
り、半導体チップの遊休領域を無くすことが可能とな
り、新規にリードフレームを製造する必要がなくなる等
の利点があり、著しい経済的及び、信頼性向上の効果が
期待できる半導体装置の提供が可能である。As is apparent from the above description, according to the present invention, it is possible to eliminate the idle region of the semiconductor chip by changing the arrangement of the zap pads, which is extremely simple, and to manufacture a new lead frame. It is possible to provide a semiconductor device which has advantages such as no need, and which can be expected to have a remarkable economic effect and reliability improvement effect.
【図1】 本発明による一実施例の半導体装置のザップ
用パッドの配置を示す図、FIG. 1 is a diagram showing an arrangement of zap pads of a semiconductor device according to an embodiment of the present invention,
【図2】 ザップ用パッドの数とザップ用パッド部の全
長との関係を示す図、FIG. 2 is a diagram showing the relationship between the number of zap pads and the total length of zap pads,
【図3】 従来の半導体装置のザップ用パッドの配置を
示す図、FIG. 3 is a diagram showing a layout of zap pads of a conventional semiconductor device;
【図4】 従来の半導体装置の問題点を示す図、FIG. 4 is a diagram showing a problem of a conventional semiconductor device,
1は半導体チップ、 1aはボンディングパッド、 1bはザップ用パッド、 1cは素子形成領域、 1dは遊休領域、 2はリードフレーム、 2aはリード、 3はワイヤ、 1 is a semiconductor chip, 1a is a bonding pad, 1b is a zap pad, 1c is an element formation region, 1d is an idle region, 2 is a lead frame, 2a is a lead, 3 is a wire,
Claims (1)
プ(1) を有する半導体装置であって、 隣接する前記ザップ用パッド(1b)の中心が一直線上にな
く、ジグザグラインの折れ点にあり、前記ザップ用パッ
ド(1b)どうしの相対する辺が平行で配置されていること
を特徴とする半導体チップ(1) を有する半導体装置。1. A semiconductor device having a semiconductor chip (1) provided with a zap pad (1b), wherein the centers of adjacent zap pads (1b) are not on a straight line, and at zigzag line break points. A semiconductor device having a semiconductor chip (1), characterized in that opposite sides of the zap pads (1b) are arranged in parallel.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP15815391A JPH0541428A (en) | 1991-06-28 | 1991-06-28 | Semiconductor device |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP15815391A JPH0541428A (en) | 1991-06-28 | 1991-06-28 | Semiconductor device |
Publications (1)
Publication Number | Publication Date |
---|---|
JPH0541428A true JPH0541428A (en) | 1993-02-19 |
Family
ID=15665424
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP15815391A Withdrawn JPH0541428A (en) | 1991-06-28 | 1991-06-28 | Semiconductor device |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPH0541428A (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH0319832A (en) * | 1989-06-16 | 1991-01-29 | Sumitomo Rubber Ind Ltd | Grooving apparatus for tyre and grooving method thereof |
-
1991
- 1991-06-28 JP JP15815391A patent/JPH0541428A/en not_active Withdrawn
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH0319832A (en) * | 1989-06-16 | 1991-01-29 | Sumitomo Rubber Ind Ltd | Grooving apparatus for tyre and grooving method thereof |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
A300 | Withdrawal of application because of no request for examination |
Free format text: JAPANESE INTERMEDIATE CODE: A300 Effective date: 19980903 |