JPH0536979A - Surge protective element - Google Patents

Surge protective element

Info

Publication number
JPH0536979A
JPH0536979A JP21131891A JP21131891A JPH0536979A JP H0536979 A JPH0536979 A JP H0536979A JP 21131891 A JP21131891 A JP 21131891A JP 21131891 A JP21131891 A JP 21131891A JP H0536979 A JPH0536979 A JP H0536979A
Authority
JP
Japan
Prior art keywords
layer
thyristor
voltage
layers
breakdown
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP21131891A
Other languages
Japanese (ja)
Other versions
JP3083881B2 (en
Inventor
Koichi Ota
鋼一 太田
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Shindengen Electric Manufacturing Co Ltd
Original Assignee
Shindengen Electric Manufacturing Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Shindengen Electric Manufacturing Co Ltd filed Critical Shindengen Electric Manufacturing Co Ltd
Priority to JP03211318A priority Critical patent/JP3083881B2/en
Publication of JPH0536979A publication Critical patent/JPH0536979A/en
Application granted granted Critical
Publication of JP3083881B2 publication Critical patent/JP3083881B2/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

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  • Emergency Protection Circuit Devices (AREA)

Abstract

PURPOSE:To prevent an operation starting voltage from being increased more than a breakdown strength to contrive the improvement of the surge protection power of a surge protection element by a method wherein the element has a structure consisting of four layers of P1, N2, P3 and N4 layers and the N2 layer and the P3 layer, which are exposed, are respectively short-circuited with the P1 layer and the N4 layer by metallic electrodes. CONSTITUTION:A unidirectional thyristor consists of four layers of P1, N2, P3 and N4 layers from a circuit constitution to burden a reverse breakdown strength with diodes D1 and D2 and diodes D3 and D4 and one part of the N2, layer and one part of the P3 layer respectively penetrate the P1 layer and the N4 layer and are respectively exposed in the surface and rear of the thyristor. Moreover, the thyristor is formed into a reverse conduction type constitution, wherein these exposed parts are respectively short-circuited with the P1 layer and the N4 layer by metallic electrodes T1 and T2. A breakdown of the thyristor is set so as to begin when exceeding a mere yielding of a junction J2, that is, a breakdown voltage VB, of the junction J2, to break down a relation of VBO<VCL and to satisfy the relation of VBO=VCL. Provided that, the VBO is a breakdown strength and the VCL is an operating voltage. Thereby, the realization of an increase in a holding current is contrived and a protection power and a cut-off power can e improved.

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【産業上の利用分野】本発明は通信回路などの弱電回路
のサージ防護に好適するサージ防護素子に関するもので
ある。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a surge protection element suitable for surge protection of a weak electric circuit such as a communication circuit.

【0002】[0002]

【従来の技術】通信回路などの弱電回路を正,負サージ
から保護するための手段として、小型安価であって動作
が高速なサージ防護素子、例えば図4(a)のように、
1 1 PN2 3 の5層からなり、図4(b)に示す
如き特性をもつVBO点弧の両方向サイリスタ型サージ防
護素子が知られている。この素子Zは図4(c)のよう
に通信回路などの被防護回路Gの線路L間に接続して使
用され、線路Lに侵入した正または負のサージ電圧S1
2 が、素子Zの耐圧VBOを越えたときターンオンして
素子Zに電流を流して、被防護回路Gに耐圧VBO以上の
電圧が印加されないようにする。また素子Zに流れる電
流が減少して素子Zの保護電流IH を下廻ったとき、直
流電源電圧Eと線路抵抗Rにもとづく続流を遮断して通
常状態に復旧する動作を行う。
2. Description of the Related Art As a means for protecting a weak electric circuit such as a communication circuit from positive and negative surges, a surge protection element which is small and inexpensive and operates at high speed, for example, as shown in FIG.
There is known a bidirectional thyristor type surge protection device of V BO ignition which is composed of five layers of P 1 N 1 PN 2 P 3 and has the characteristics shown in FIG. 4 (b). This element Z is used by being connected between the lines L of the protected circuit G such as a communication circuit as shown in FIG. 4C, and the positive or negative surge voltage S 1 that has entered the line L.
When S 2 exceeds the withstand voltage V BO of the element Z, it is turned on and a current is passed through the element Z so that a voltage higher than the withstand voltage V BO is not applied to the protected circuit G. Further, when the current flowing through the element Z decreases and falls below the protection current I H of the element Z, an operation for interrupting the follow current based on the DC power supply voltage E and the line resistance R to restore the normal state is performed.

【0003】[0003]

【発明が解決しようとする課題】ところでこのようなサ
ージ防護素子により、よりよいサージ防護素子を行うた
めには、素子として次の条件を備えることが要求され
る。 耐圧VBOを直流電源電圧Eより大即ちVBO>E
の条件を満足しながら、出来る限り小として防護能力の
向上を図る。 素子の保持電流IH を、IH >E/R
を満足しながらできる限り大として遮断能力の向上を図
る。 サージ電流耐量が大きい。 被保護回路Gで
ある保護回路の通信性能を悪化を招かないようにするた
め、図 (c)のように線路L間に挿入される素子のも
つ静電容量Cを極力小にする。 素子Zの耐圧V
BOは、図4(a)の接合J2 またはJ3 の逆方向耐圧を
B 、構成トランジスタN1 PN2の電流増幅率をαと
したとき VBO=VB (1−α)1/n ………(1) ただしn:2〜6 によって定まる。このためサージ電圧の立上り速度dV
/dtが大になると、サージ印加時の動作開始電圧が耐
圧VBOによって決定されず、VBOより高い電圧VCL外1
B となる。従ってよい防護能力をもたせるためVBO
CLに関係を満足させる。ことが要求される。しかし例
えば周知のように耐圧VBOを小にすると、逆に素子Zの
もつ静電容量Cは大になるなど、上記各条件の間に素子
の設計上厳しいトレードオフの関係があり、従来の両方
向サイリスタの構造によっては上記の各条件を同時に満
足させることは容易ではない。
By the way, in order to perform a better surge protection element with such a surge protection element, it is required that the element has the following conditions. Withstand voltage V BO is greater than DC power supply voltage E, that is, V BO > E
While satisfying the conditions of, the protection capacity should be improved as small as possible. The holding current I H of the element is I H > E / R
While satisfying the above, try to improve the breaking ability by making it as large as possible. Large surge current capability. In order not to deteriorate the communication performance of the protection circuit which is the protected circuit G, the capacitance C of the element inserted between the lines L is minimized as shown in FIG. Withstand voltage V of element Z
BO is V BO = V B (1-α) 1 / , where V B is the reverse breakdown voltage of the junction J 2 or J 3 in FIG. 4A and α is the current amplification factor of the constituent transistor N 1 PN 2. n ………… (1) However, it is determined by n: 2-6. Therefore, the rising speed dV of the surge voltage
If / dt becomes large, the operation start voltage at the time of applying a surge is not determined by the withstand voltage V BO , and the voltage higher than V BO is outside V CL 1
It becomes V B. Therefore, in order to have good protection ability, V BO =
Satisfy the relationship with V CL . Is required. However, as is well known, for example, when the breakdown voltage V BO is reduced, the electrostatic capacitance C of the element Z is increased. Depending on the structure of the bidirectional thyristor, it is not easy to satisfy the above conditions at the same time.

【外1】 [Outer 1]

【0004】[0004]

【発明の目的】本発明は上記〜の要求のうち、特に
耐圧(VBO)=動作電圧VCLの実現と、保持電流IH
増大の実現を図って防護能力と遮断能力を前記従来の両
方向サイリスタ型サージ防護素子より向上させた、サー
ジ防護素子の提示を目的とするものである。
SUMMARY OF THE INVENTION Among the above-mentioned requirements, the present invention aims to realize a withstand voltage (V BO ) = operating voltage V CL and an increase in holding current I H , in particular, in order to realize protection ability and interruption ability. The purpose of the present invention is to present a surge protection element that is an improvement over the bidirectional thyristor type surge protection element.

【0005】[0005]

【課題を解決するための手段】本発明の目的は次の手段
により達成される。即ち 図1(a)に示すように正
サージS1 に対してそれぞれ順方向となるダイオードD
1 と一方向サイリスタTとダイオードD2 の直列回路か
らなり、正サージによる電流を線路接続端子t1 からt
2 の一方向に流しうる回路と、負サージに対してそれぞ
れ順方向となるダイオードD3 と前記一方向サイリスタ
TとダイオードD4 の直列回路からなり、負サージによ
る電流を線路接続端子t2 からt1 の一方向に流す回路
構成とする。そしてこれにより正または負サージ印加時
一方向サイリスタTに常にD1 ,D2 およびD3 ,D4
のそれぞれ2個のダイオードが直列に入るようにして、
それぞれのダイオードの逆方向耐圧により一方向サイリ
スタTが、逆方向耐圧をもつのを不要とする。 ダイ
オードD1 ,D2 およびD3 ,D4 により逆方向耐圧を
負担させる上記の回路構成から、一方向サイリスタT
を、図1(b)のようにP1 2 3 4 の4層からな
り、そのN2 層とP3 層の一部がP1 層とN4 層を貫通
して表裏面に露呈し、かつこれらの露呈部分がP1 層と
4 層と共に、金属電極T1 ,T2 により短絡した逆導
通型構成とする。そして以下に説明する本発明一方向サ
イリスタの作用説明から明らかなように、一方向サイリ
スタTの降伏が接合J2 の単なる降伏、即ち接合J2
降伏電圧VB を越えたとき始まるようにして、前記従来
素子におけるVBO<VCLの関係を打破し、また逆方向耐
圧が不要であること、即ち逆導通でよいことから、表裏
面にショートゲート構造F,Hの形成を可能とし、これ
により保持電流の増大を図りうるようにして目的を達成
したものである。
The objects of the present invention are achieved by the following means. That is, as shown in FIG. 1 (a), the diodes D which are in the forward direction with respect to the positive surge S 1 respectively.
1 and a one-way thyristor T and a diode D 2 connected in series to generate a positive surge current from the line connection terminals t 1 to t.
A circuit that can run on a 2-way, a diode D 3 whose forward directions becomes a series circuit of the one-way thyristor T and a diode D 4, the current due to the negative surge from the line connecting terminal t 2 for a negative surge The circuit configuration is such that t 1 flows in one direction. As a result, D 1 , D 2 and D 3 , D 4 are always applied to the unidirectional thyristor T when a positive or negative surge is applied.
So that each of the two diodes in
The reverse breakdown voltage of each diode makes it unnecessary for the unidirectional thyristor T to have a reverse breakdown voltage. From the above circuit configuration in which the reverse breakdown voltage is borne by the diodes D 1 , D 2 and D 3 , D 4 , the unidirectional thyristor T
As shown in FIG. 1 (b), it is composed of four layers of P 1 N 2 P 3 N 4 and part of the N 2 layer and the P 3 layer penetrates the P 1 layer and the N 4 layer to form the front and back surfaces. A reverse conduction type structure which is exposed and whose exposed portions are short-circuited by the metal electrodes T 1 and T 2 together with the P 1 layer and the N 4 layer is provided. And as is clear from the action described of the present invention one-way thyristor described below, mere breakdown breakdown of the junction J 2-way thyristor T, i.e. as starting when exceeding the breakdown voltage V B of the junction J 2 Since the relationship of V BO <V CL in the conventional element is broken and reverse breakdown voltage is not required, that is, reverse conduction is sufficient, it is possible to form the short gate structures F and H on the front and back surfaces. Therefore, the holding current can be increased to achieve the object.

【0006】[0006]

【作用】本発明一方向サイリスタは次のように動作す
る。即ち図1(a)においてダイオードD1 ,D2 を介
して一方向サイリスタTの金属電極T1 からT2 の方向
に電圧が印加されると、図1(b)に示す一方向サイリ
スタTの正方向接合J2 は逆バイアスとなり、電圧が接
合J2 の降伏電圧VB に達すると電流I1,I2 が流れ
始める。これらの電流成分はエミッタ直下のN2 層とP
3 層の実効横方向抵抗RN P により、N2 層とP3
にそれぞれRN 1 ,RP 2 の電圧降下を生じさせ、
これらの電圧降下は接合J1 を左端に行くに従い正バイ
アスし、また接合J3 の右端に行くに従い正バイアス
する。そしてこのバイアス電圧が接合J2 3 の正方向
立上り電圧VD 程度になると、接合J1 とJ3 からそれ
ぞれ正孔と電子の注入が行われてオン状態に移行する。
一方図1(a)においてダイオードD3 4を介して一
方向サイリスタTの金属電極T2 からT1 の方向の電圧
が印加されると、図1(b)の一方向サイリスタTは接
合J2の正方向特性を示すのみである。また更にオン状
態からオフ状態に移行する場合には、電流I1 ,I2
減少して接合J1 ,J3 の注入が停止することによりタ
ーンオフする。従ってこの一方向サイリスタの特性は図
1(c)のようになる。以上から本発明の一方向サイリ
スタTの降伏は単に、PN接合J2 の降伏電圧VB によ
って定まるため、前記した従来の素子のように耐圧VBO
と動作電圧VCLとの間に差を生ずることがなくなり、前
記VBO<VCLの問題は解決される。またターンオフは電
流11 ,I2
The unidirectional thyristor of the present invention operates as follows. That is, when a voltage is applied in the direction from the metal electrodes T 1 to T 2 of the unidirectional thyristor T via the diodes D 1 and D 2 in FIG. 1A, the unidirectional thyristor T shown in FIG. The forward junction J 2 is reverse biased, and when the voltage reaches the breakdown voltage V B of the junction J 2 , currents I 1 and I 2 start to flow. These current components are P 2 and P directly below the emitter.
The effective lateral resistance R N R P of three layers, each of N 2 layer and the P 3 layer causes a voltage drop R N I 1, R P I 2,
These voltage drops cause the junction J 1 to be positively biased toward the left end and to the right end of the junction J 3 . Then, when this bias voltage reaches about the positive-direction rising voltage V D of the junction J 2 J 3 , holes and electrons are injected from the junctions J 1 and J 3 , respectively, and the state changes to the ON state.
On the other hand, when a voltage in the direction from the metal electrode T 2 to T 1 of the one-way thyristor T is applied via the diode D 3 D 4 in FIG. 1A, the one-way thyristor T in FIG. It only shows a positive direction characteristic of 2 . Further, when the on-state shifts to the off-state, the currents I 1 and I 2 decrease and the injection of the junctions J 1 and J 3 is stopped to turn off. Therefore, the characteristics of this one-way thyristor are as shown in FIG. From the above, the breakdown of the unidirectional thyristor T of the present invention is simply determined by the breakdown voltage V B of the PN junction J 2 , so that the breakdown voltage V BO is the same as in the conventional device described above.
Between the operating voltage V CL and the operating voltage V CL is eliminated, and the problem of V BO <V CL is solved. At turn-off, the currents 1 1 and I 2 are

【数1】 程度以下になったとき、接合J1 ,J3 から正孔および
電子の注入が止むので、本発明で電流IH を増加するこ
とができ、しかも本発明一方向サイリスタでは両面ショ
ートゲート構造であるので、保持電流IH の増大効果は
大きい。またサージ電流耐量はショートゲート部以外の
有効面積できまるから、ショートゲート部の面積を小さ
くすればサージ電流耐量に対する影響はない。次に本発
明一方向サイリスタの実施例について説明する。
[Equation 1] Since the injection of holes and electrons from the junctions J 1 and J 3 is stopped when the temperature falls below a certain level, the current I H can be increased in the present invention, and the one-way thyristor of the present invention has a double-sided short gate structure. Therefore, the effect of increasing the holding current I H is great. Further, since the surge current resistance can be determined by the effective area other than the short gate portion, if the area of the short gate portion is made small, there is no influence on the surge current resistance. Next, an embodiment of the one-way thyristor of the present invention will be described.

【0007】[0007]

【実施例】図2(a)(b)は拡散法により製造された
本発明一方向サイリスタの一実施例を示す平面図および
そのA−A’部断面図である。この例は中心部において
2 層の一部をP1 層を貫通させて表面に露呈させ、こ
の露呈N2 層とP1 層とを金属電極T1 により短絡し、
左右端の2箇所においてP3 層の1部をN4 層を貫通さ
せて裏面に露呈させ、P3 層の露呈部とN4 層とを金属
電極T2 により短絡したものである。この場合表裏面に
おけるショートゲート構造F,Hの数が多い程保持電流
H が大になることは明らかであり、また表裏面におけ
るショートゲート構造間の距離が小さい程保持電流IH
の増大効果が大になることも明らかである。また安定な
ターンオンを実現するためには、最初中央部でターンオ
ンが行われ、これが次第に周辺全面に拡がるようにする
ことが望まれしいが、それには図2(a)中の距離L1
とL2 をL1 ≧2L2 にするのがよい。図3(a)
(b)は本発明一方向サイリスタの他の実施例を示す断
面図である。この例は表裏面におけるショート構造F,
Hを対向して設けて、図2の実施例と同様の作用が得ら
れるようにしたものであって、表裏面におけるショート
ゲート構造の数,位置,相互配置等は保持電流の大きさ
など要求される特性に応じて任意に選定できる。また以
上ではP1 2 3 4 の伝導型について説明したが、
伝導型を逆にしてもよいことは云うまでもない。
2 (a) and 2 (b) are a plan view and an AA 'sectional view showing an embodiment of the unidirectional thyristor of the present invention manufactured by a diffusion method. In this example, a part of the N 2 layer is penetrated through the P 1 layer in the central portion to be exposed to the surface, and the exposed N 2 layer and the P 1 layer are short-circuited by the metal electrode T 1 .
At two locations on the left and right ends, a part of the P 3 layer penetrates the N 4 layer and is exposed to the back surface, and the exposed portion of the P 3 layer and the N 4 layer are short-circuited by the metal electrode T 2 . Short gate structure F in this case the front and rear surfaces, the holding current I H as a large number of H is clear that becomes large, also the holding current as the distance between the short gate structure in the front and rear surfaces is small I H
It is also clear that the increasing effect of Further, in order to realize stable turn-on, it is desirable that the turn-on is first performed in the central portion and gradually spreads over the entire periphery, which is the distance L 1 in FIG. 2 (a).
And L 2 should be L 1 ≧ 2L 2 . Figure 3 (a)
(B) is sectional drawing which shows the other Example of the one way thyristor of this invention. This example shows a short structure F on the front and back surfaces.
H is provided so as to face each other so that the same effect as that of the embodiment of FIG. 2 can be obtained, and the number, position, mutual arrangement, etc. of the short gate structures on the front and back surfaces are required such as the magnitude of the holding current. It can be arbitrarily selected according to the characteristics to be achieved. Also, the conductivity type of P 1 N 2 P 3 N 4 has been described above.
It goes without saying that the conductivity types may be reversed.

【0008】[0008]

【発明の効果】以上の説明から明らかなように本発明に
よれば、防護能力が高くしかも遮断能力の高いVBO点弧
のサージ防護素子を提供できるもので、通信回路などこ
の種弱電回路のサージ防護に用いて大きな効果を発揮す
る。
As is apparent from the above description, according to the present invention, it is possible to provide a surge protection element for V BO ignition having a high protection ability and a high interruption ability. It is very effective when used for surge protection.

【図面の簡単な説明】[Brief description of drawings]

【図1】本発明のサージ防護素子の説明図である。FIG. 1 is an explanatory diagram of a surge protection element of the present invention.

【図2】本発明の一実施例の説明図である。FIG. 2 is an explanatory diagram of an embodiment of the present invention.

【図3】本発明の他の実施例の説明図である。FIG. 3 is an explanatory diagram of another embodiment of the present invention.

【図4】従来のサージ防護素子の説明図である。FIG. 4 is an explanatory diagram of a conventional surge protection element.

【符号の説明】[Explanation of symbols]

Z サージ防護素子 L 線路 G 被保護回路 E 直流電源 R 線路抵抗 D1 ,D2 ,D3 ,D4 ダイオード T 一方向サイリスタ F,H ショートゲート構造Z surge protection element L line G protected circuit E DC power supply R line resistance D 1 , D 2 , D 3 , D 4 diode T one-way thyristor F, H short gate structure

Claims (1)

【特許請求の範囲】 【請求項1】 P1 2 3 4 (N1 2 3 4
の4層構造を有し、そのN2 (P2 )層とP3 (N3
層の一部がP1 (N1 )とN4 (P4)層を貫通して表
面と裏面にそれぞれ露呈され、かつ前記露呈N
2 (P3 )層とP3 (N3 )層が、前記P1 (N1 )層
とN4 (P4 )層と共にそれぞれ金属電極により短絡さ
れた構造に形成されていることを特徴とするサージ防護
素子。
[Claims] [Claim 1] P 1 N 2 P 3 N 4 (N 1 P 2 N 3 P 4 )
4 layer structure of N 2 (P 2 ) layer and P 3 (N 3 )
Part of the layer penetrates the P 1 (N 1 ) and N 4 (P 4 ) layers to be exposed on the front surface and the back surface, respectively, and the exposure N
The 2 (P 3 ) layer and the P 3 (N 3 ) layer are respectively formed together with the P 1 (N 1 ) layer and the N 4 (P 4 ) layer in a structure short-circuited by a metal electrode. Surge protection element that does.
JP03211318A 1991-07-30 1991-07-30 Surge protection element Expired - Fee Related JP3083881B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP03211318A JP3083881B2 (en) 1991-07-30 1991-07-30 Surge protection element

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP03211318A JP3083881B2 (en) 1991-07-30 1991-07-30 Surge protection element

Publications (2)

Publication Number Publication Date
JPH0536979A true JPH0536979A (en) 1993-02-12
JP3083881B2 JP3083881B2 (en) 2000-09-04

Family

ID=16603967

Family Applications (1)

Application Number Title Priority Date Filing Date
JP03211318A Expired - Fee Related JP3083881B2 (en) 1991-07-30 1991-07-30 Surge protection element

Country Status (1)

Country Link
JP (1) JP3083881B2 (en)

Cited By (6)

* Cited by examiner, † Cited by third party
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WO2003041170A1 (en) * 2001-11-07 2003-05-15 Shindengen Electric Manufacturing Co., Ltd. Surge protection semiconductor device
WO2003041236A1 (en) * 2001-11-07 2003-05-15 Shindengen Electric Manufacturing Co., Ltd. Surge protecting semiconductor device
KR100559938B1 (en) * 2004-01-28 2006-03-13 광전자 주식회사 transient voltage suppressor diode
US7848069B2 (en) 2008-02-04 2010-12-07 Mitsubishi Electric Corporation Protective circuit
JP2012074458A (en) * 2010-09-28 2012-04-12 Shindengen Electric Mfg Co Ltd Semiconductor device
JP2015522238A (en) * 2012-07-05 2015-08-03 リテルヒューズ・インク Clover device for transient voltage circuit protection

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* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2003041170A1 (en) * 2001-11-07 2003-05-15 Shindengen Electric Manufacturing Co., Ltd. Surge protection semiconductor device
WO2003041236A1 (en) * 2001-11-07 2003-05-15 Shindengen Electric Manufacturing Co., Ltd. Surge protecting semiconductor device
US6870202B2 (en) 2001-11-07 2005-03-22 Shindengen Electric Manufacturing Co., Ltd. Surge protection semiconductor device
CN1321457C (en) * 2001-11-07 2007-06-13 新电元件工业株式会社 Surge protection semiconductor device
KR100559938B1 (en) * 2004-01-28 2006-03-13 광전자 주식회사 transient voltage suppressor diode
US7848069B2 (en) 2008-02-04 2010-12-07 Mitsubishi Electric Corporation Protective circuit
JP2012074458A (en) * 2010-09-28 2012-04-12 Shindengen Electric Mfg Co Ltd Semiconductor device
JP2015522238A (en) * 2012-07-05 2015-08-03 リテルヒューズ・インク Clover device for transient voltage circuit protection
EP2870611A4 (en) * 2012-07-05 2015-11-25 Littelfuse Inc Crowbar device for voltage transient circuit protection
US10074642B2 (en) 2012-07-05 2018-09-11 Littelfuse, Inc. Crowbar device for voltage transient circuit protection

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