JPH05340993A - Burn-in jig - Google Patents

Burn-in jig

Info

Publication number
JPH05340993A
JPH05340993A JP14437892A JP14437892A JPH05340993A JP H05340993 A JPH05340993 A JP H05340993A JP 14437892 A JP14437892 A JP 14437892A JP 14437892 A JP14437892 A JP 14437892A JP H05340993 A JPH05340993 A JP H05340993A
Authority
JP
Japan
Prior art keywords
semiconductor device
burn
tray
board
jig
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP14437892A
Other languages
Japanese (ja)
Inventor
Michiharu Ikeda
美智治 池田
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Oki Electric Industry Co Ltd
Original Assignee
Oki Electric Industry Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Oki Electric Industry Co Ltd filed Critical Oki Electric Industry Co Ltd
Priority to JP14437892A priority Critical patent/JPH05340993A/en
Publication of JPH05340993A publication Critical patent/JPH05340993A/en
Pending legal-status Critical Current

Links

Abstract

PURPOSE:To realize the direct burn-in of a semiconductor device on a transfer tray by integrating a contactor, a pattern wiring, pad parts, and a tray cover having locking function with the transfer tray. CONSTITUTION:A cover is aligned exactly with a tray 11 upon insertion of positioning rods 7 on the tray cover 8 into aligning holes 9 of the transfer tray 11 on which semiconductor devices 10 are arranged while being positioned. When they are integrated through a lock mechanism 6, contactors 5 at retaining section 4 come into contact with the terminals of semiconductor devices 10 being arranged thus allowing burn-in. This burn-in jig obviates the necessity of transferring/rearranging work of semiconductor devices to semiconductor device sockets on a burn-in board.

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【産業上の利用分野】本発明は半導体デバイスのバーン
インを行なうための治具に関するものである。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a jig for burn-in of semiconductor devices.

【0002】[0002]

【従来の技術】従来、半導体装置のバーンインを行なう
際、半導体装置搬送トレイ上に整列された半導体装置を
個々または複数個同時に拾い上げ、あらかじめ、バーン
インボード上に位置出しされ、整列実装された半導体装
置用ソケット上に対して位置出しを行ない、半導体装置
を挿入し、半導体装置の端子とこの半導体装置用ソケッ
トの端子を接触させ、電気的に導通させた上で、バーン
インボードをバーンイン装置に入れてバーンインを行な
っていた。
2. Description of the Related Art Conventionally, when a semiconductor device is burned in, semiconductor devices aligned on a semiconductor device carrying tray are picked up individually or in plural at the same time, and the semiconductor devices are aligned and mounted in advance on a burn-in board. The semiconductor device, insert the semiconductor device, make the terminals of the semiconductor device and the terminals of this semiconductor device socket contact and make them electrically conductive, and then insert the burn-in board into the burn-in device. I was doing a burn-in.

【0003】[0003]

【発明が解決しようとする課題】しかしながら、以上述
べた方法では、バーンインボード上に整列実装された半
導体装置用ソケット内で、半導体装置の端子と半導体装
置用ソケットの接触子とを接触させ、電気的に導通可能
な状態とし、半導体装置がバーンインボード上の半導体
装置用ソケット内に実装されたままの状態のバーンイン
ボードを、バーンイン槽に入れてバーンインを行なうた
め、半導体装置を半導体装置搬送用トレイからバーンイ
ンボード上の半導体装置用ソケットへの移し換え作用、
すなわち、半導体装置搬送用トレイからの拾い上げ、搬
送、位置決め、挿入といった工程を必要としている。ま
た、バーンイン終了後は、バーンインボード上の半導体
装置用ソケットから抜き取り、半導体装置搬送用トレイ
への詰め換え作業も必要とする。このように、工程が複
雑で、かつこれらの作業を行なうため自動機を必要と
し、しかもこの自動機は工程が複雑な分、高価になる、
などという問題点があった。
However, in the method described above, the terminals of the semiconductor device and the contacts of the semiconductor device socket are brought into contact with each other in the socket for the semiconductor device aligned and mounted on the burn-in board, and the electrical contact is made. The semiconductor device is placed in a semiconductor device socket on the burn-in board, and the burn-in board is placed in the burn-in tank to perform burn-in. To the semiconductor device socket on the burn-in board,
That is, steps such as picking up from the semiconductor device transport tray, transport, positioning, and insertion are required. Further, after the burn-in is completed, it is necessary to pull out from the semiconductor device socket on the burn-in board and refill the semiconductor device transport tray. As described above, the process is complicated, and an automatic machine is required to perform these operations, and the automatic machine becomes expensive due to the complicated process.
There was a problem such as.

【0004】本発明は、以上述べた移し換え作業および
詰め換え作業といった工程を除くため、バーンインされ
るべき半導体装置を、半導体装置搬送トレイ上で直接バ
ーンインを行なうことができる優れた治具を提供するこ
とを目的とする。
Since the present invention excludes the steps such as the transfer operation and the refilling operation described above, it provides an excellent jig which can directly burn-in a semiconductor device to be burned in on a semiconductor device carrying tray. The purpose is to

【0005】[0005]

【課題を解決するための手段】本発明に係る半導体装置
のバーンイン治具は半導体装置搬送用トレイ内に整列し
てある半導体装置を押え、半導体装置の端子と電気的に
導通可能な接触子と、半導体装置に電源電圧や入力電圧
を供給するパターン配線と、バーンイン槽内のコネクタ
に接触するパッド部と、半導体装置搬送用トレイと一体
化するためのロック機能とを有するバーンインボードを
兼ねた半導体装置搬送用のトレイ蓋を、半導体装置搬送
用トレイに一体化してバーンインを行なうことができる
ようにするものである。
A burn-in jig for a semiconductor device according to the present invention holds a semiconductor device aligned in a tray for carrying a semiconductor device, and a contact which is electrically conductive with a terminal of the semiconductor device. A semiconductor serving as a burn-in board having a pattern wiring for supplying a power supply voltage and an input voltage to the semiconductor device, a pad portion contacting a connector in the burn-in tank, and a lock function for integrating with a semiconductor device transport tray The device transport tray lid is integrated with the semiconductor device transport tray to enable burn-in.

【0006】[0006]

【作用】本発明は作業効率を上げることができ、しかも
自動化ラインに容易にのせることができる。
According to the present invention, the working efficiency can be improved, and moreover, it can be easily placed on the automation line.

【0007】[0007]

【実施例】図1は本発明に係る半導体装置のバーンイン
治具の一実施例を示す分解斜視図であり、図2は図1の
半導体装置搬送用トレイにトレイ蓋を位置合せし、ロッ
クした状態を示す。図において、1は半導体装置に対し
て電源電圧、入力電圧を供給するためのコネクタ用パッ
ド部2およびパターン配線3を設けたプリント基板、4
は半導体装置の端子に接触する接触子5を備えた押え
板、6はロック機構、7は位置決め棒、8は上記のプリ
ント板1、おさえ板4、ロック機構6および位置決め棒
7から構成され、接触子5がプリント基板1のパターン
配線3に電気的に接続するバーンインボードを兼ねた半
導体装置搬送用のトレイ蓋、9はこのトレイ蓋8の位置
決め棒7が挿入される位置合せ穴、10は位置出し整列
している半導体装置、11はこの位置合せ穴を備え、こ
の半導体装置10を位置出し整列して支持する半導体装
置搬送用トレイである。
1 is an exploded perspective view showing an embodiment of a burn-in jig for a semiconductor device according to the present invention, and FIG. 2 is a view showing the semiconductor device carrying tray shown in FIG. Indicates the state. In the figure, 1 is a printed circuit board provided with a connector pad portion 2 and a pattern wiring 3 for supplying a power supply voltage and an input voltage to a semiconductor device, 4
Is a holding plate provided with a contactor 5 that comes into contact with the terminals of the semiconductor device, 6 is a locking mechanism, 7 is a positioning rod, and 8 is the above-mentioned printed board 1, retaining plate 4, locking mechanism 6 and positioning rod 7, The contact 5 has a tray lid for transporting a semiconductor device, which also serves as a burn-in board for electrically connecting to the pattern wiring 3 of the printed board 1, 9 is a positioning hole into which the positioning rod 7 of the tray lid 8 is inserted, and 10 is a positioning hole. A semiconductor device 11 which is aligned and aligned is a tray for carrying a semiconductor device, which is provided with this alignment hole and which supports the semiconductor device 10 by aligning and aligning it.

【0008】この構成により、半導体装置10が位置出
し整列されている半導体装置搬送用トレイ11の位置合
せ穴9に、トレイ蓋8の位置決め棒7を挿入すると、こ
の半導体装置搬送用トレイ11に、トレイ蓋8がぴった
り合わされる。そして、図2に示すように、ロック機構
6によりロックし一体化すると、押え部4の接触子5は
整列されている半導体装置10の端子と接触し、電気的
に導通する。そして、このトレイ蓋8と半導体装置搬送
用トレイ11が一体化したままの状態で、バーンインす
ることができる。
With this structure, when the positioning rod 7 of the tray lid 8 is inserted into the alignment hole 9 of the semiconductor device carrying tray 11 in which the semiconductor devices 10 are aligned and aligned, the semiconductor device carrying tray 11 is The tray lid 8 fits snugly. Then, as shown in FIG. 2, when the lock mechanism 6 locks and integrates the contacts, the contacts 5 of the pressing portion 4 come into contact with the terminals of the aligned semiconductor devices 10 and become electrically conductive. Then, the burn-in can be performed while the tray lid 8 and the semiconductor device transport tray 11 remain integrated.

【0009】このため、従来のバーンインボード上の半
導体装置ソケットへの移し換え、詰め換えといった作業
を除くことができる。
Therefore, it is possible to eliminate the conventional work such as transfer and refill to the semiconductor device socket on the burn-in board.

【0010】[0010]

【発明の効果】以上詳細に説明したように、本発明に係
る半導体装置のバーンイン治具によれば、バーンイン前
の工程から送られてきた半導体装置および半導体装置搬
送用トレイを、そのままの状態でバーンインを行い、そ
のままの状態で、次の工程へ送ることができるので、作
業効率が良く、しかも半導体装置搬送用トレイで、バー
ンイン工程前後の受け渡しができるので、自動化ライン
の構築が容易になるなどの効果がある。
As described in detail above, according to the burn-in jig for a semiconductor device according to the present invention, the semiconductor device and the semiconductor device transport tray sent from the process before the burn-in are left as they are. Burn-in can be performed and sent to the next process as it is, so work efficiency is good, and the semiconductor device transport tray can be delivered before and after the burn-in process, facilitating the construction of an automated line. Has the effect of.

【図面の簡単な説明】[Brief description of drawings]

【図1】本発明に係る半導体装置のバーンイン治具の一
実施例を示す分解斜視図である。
FIG. 1 is an exploded perspective view showing an embodiment of a burn-in jig for a semiconductor device according to the present invention.

【図2】図1のトレイ蓋と半導体装置搬送用トレイを一
体化した状態を示す斜視図である。
FIG. 2 is a perspective view showing a state in which the tray lid of FIG. 1 and a semiconductor device transport tray are integrated.

【符号の説明】[Explanation of symbols]

1 プリント基板 6 ロック機構 7 位置決め棒 8 トレイ蓋 10 半導体装置 11 半導体装置搬送用トレイ 1 Printed Circuit Board 6 Lock Mechanism 7 Positioning Rod 8 Tray Lid 10 Semiconductor Device 11 Semiconductor Device Transport Tray

Claims (1)

【特許請求の範囲】[Claims] 【請求項1】 半導体装置搬送用トレイに位置出し整列
された半導体装置を、バーンインボードを兼ねた半導体
装置搬送用のトレイ蓋により押えて一体化することによ
り、電気的に導通した状態でバーンインを行なうことを
特徴とする半導体装置のバーンイン治具。
1. A semiconductor device carrying tray is positioned and aligned with a semiconductor device carrying tray lid which also serves as a burn-in board, and the semiconductor device carrying tray is pressed to be integrated with the semiconductor device carrying tray. A burn-in jig for a semiconductor device characterized by being performed.
JP14437892A 1992-06-04 1992-06-04 Burn-in jig Pending JPH05340993A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP14437892A JPH05340993A (en) 1992-06-04 1992-06-04 Burn-in jig

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP14437892A JPH05340993A (en) 1992-06-04 1992-06-04 Burn-in jig

Publications (1)

Publication Number Publication Date
JPH05340993A true JPH05340993A (en) 1993-12-24

Family

ID=15360737

Family Applications (1)

Application Number Title Priority Date Filing Date
JP14437892A Pending JPH05340993A (en) 1992-06-04 1992-06-04 Burn-in jig

Country Status (1)

Country Link
JP (1) JPH05340993A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7095242B2 (en) * 2000-02-23 2006-08-22 Micron Technology, Inc. In-tray burn-in board, device and test assembly for testing integrated circuit devices in situ on processing trays

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7095242B2 (en) * 2000-02-23 2006-08-22 Micron Technology, Inc. In-tray burn-in board, device and test assembly for testing integrated circuit devices in situ on processing trays
US7365558B2 (en) * 2000-02-23 2008-04-29 Micron Technology, Inc. In-tray burn-in board, device and test assembly for testing integrated circuit devices in situ on processing trays

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