JPH05337435A - Method for applying resist - Google Patents

Method for applying resist

Info

Publication number
JPH05337435A
JPH05337435A JP4145377A JP14537792A JPH05337435A JP H05337435 A JPH05337435 A JP H05337435A JP 4145377 A JP4145377 A JP 4145377A JP 14537792 A JP14537792 A JP 14537792A JP H05337435 A JPH05337435 A JP H05337435A
Authority
JP
Japan
Prior art keywords
substrate
resist
adhesive
auxiliary
glass
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP4145377A
Other languages
Japanese (ja)
Inventor
Seitaro Ono
清太郎 大野
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Nikon Corp
Original Assignee
Nikon Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nikon Corp filed Critical Nikon Corp
Priority to JP4145377A priority Critical patent/JPH05337435A/en
Publication of JPH05337435A publication Critical patent/JPH05337435A/en
Pending legal-status Critical Current

Links

Landscapes

  • Manufacturing Optical Record Carriers (AREA)
  • Application Of Or Painting With Fluid Materials (AREA)

Abstract

PURPOSE:To reduce the load of works for setting various kinds of conditions such as the revolution speed of a substrate and resist density when a resist of a specific film thickness is applied on a substrate by a spin coating method. CONSTITUTION:The load of works for resetting various kinds of conditions is reduced at the time of spin coating by bonding an auxiliary substrate 3 to the rear surface of the substrate to apparently increase the thickness of the substrate 1 when the resist is applied on a comparatively thin substrate 1.

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【産業上の利用分野】本発明は、比較的薄い基板(ガラ
ス板)にレジスト(液)を塗布する方法に関する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a method for coating a resist (liquid) on a relatively thin substrate (glass plate).

【0002】[0002]

【従来の技術】文書ファイル、データファイル用などの
高密度メモリとして、記録、再生あるいは消去が可能な
光ディスクが用いられている。光ディスクには、微細な
凹凸(例えば、トラッキングのための溝)が必要であ
る。従って、安価に大量に光ディスクを製造するには、
プラスチック(合成樹脂)を使用し、Niスタンパーと呼
ばれる鋳型(金型)によりプラスチック上に微細な凹凸
パターンを転写し、光ディスク用基板とすることが好ま
しい。
2. Description of the Related Art An optical disk capable of recording, reproducing or erasing is used as a high density memory for document files and data files. Optical discs require fine irregularities (for example, grooves for tracking). Therefore, in order to inexpensively manufacture a large number of optical disks,
It is preferable to use a plastic (synthetic resin) and transfer a fine concavo-convex pattern onto the plastic using a mold (die) called Ni stamper to prepare an optical disk substrate.

【0003】このNiスタンパーを製造するには、厚いガ
ラス基板(例えば、5.85mm程度)上に感光性樹脂(フォ
トレジスト;以下レジストと略す)を塗布し、これに所
定パターン(例えば、同心円状又はうず巻き状のトラッ
クパターン)をレーザ光で露光後、現象してレーザー照
射部(又は、それ以外の部分)を除去し、ガラス基板上
にレジストパターンを形成させる。レジストパターンを
有するガラス基板をガラス原盤という。このガラス原盤
のレジストパターンが形成されている面に、Niをドライ
めっきにより積層させ、その後湿式めっきを行う。この
後、めっきされた表面に接着剤を塗布し、ガラス板を接
着させた後、これをガラス原盤からはがすことで、ガラ
ス原盤上のパターンがNi層に転写されたNiスタンパーが
製造される。
To manufacture this Ni stamper, a photosensitive resin (photoresist; hereinafter abbreviated as resist) is applied on a thick glass substrate (for example, about 5.85 mm), and a predetermined pattern (for example, concentric circles or After the spiral-shaped track pattern) is exposed to the laser beam, the laser irradiation portion (or the other portion) is removed due to a phenomenon to form a resist pattern on the glass substrate. A glass substrate having a resist pattern is called a glass master. Ni is dry-plated on the surface of the glass master on which the resist pattern is formed, and then wet plating is performed. After that, an adhesive is applied to the plated surface to adhere a glass plate, and then the glass plate is peeled off to manufacture a Ni stamper in which the pattern on the glass master is transferred to the Ni layer.

【0004】ところで、別のタイプの光ディスクの製造
工程において、薄いガラス基板(1.2mm 位)に直接に所
定パターン(例えば、同心円状又は、うず巻状のトラッ
クパターン)を形成する。この工程は、基板上にレジス
トを塗布し、これに所定のパターンを露光し、現象する
ことで基板上にレジストパターンが形成される。その
後、エッチングして基板に所定パターンの溝を形成し、
最後にレジストパターンを除去すると、目的の基板を得
ることができる。
By the way, in another type of optical disk manufacturing process, a predetermined pattern (for example, a concentric or spiral track pattern) is directly formed on a thin glass substrate (about 1.2 mm). In this step, a resist pattern is formed on the substrate by applying a resist on the substrate, exposing a predetermined pattern to the resist, and causing a phenomenon. After that, etching is performed to form a groove having a predetermined pattern on the substrate,
Finally, the resist pattern is removed to obtain the target substrate.

【0005】何れの場合にも、ガラス原盤やガラス基板
にレジストを塗布する必要がある。このように基板上に
レジストを塗布する方法としては、スピンコート法がよ
く用いられている。スピンコート法を用いる理由は、表
面が平滑で、膜厚の均一なレジスト層を効率良く形成で
きることにある。この方法は、高速で回転している基板
上にレジストを滴下するだけで塗布作業が完了する。
In any case, it is necessary to apply a resist to the glass master or the glass substrate. A spin coating method is often used as a method for coating a resist on a substrate as described above. The reason why the spin coating method is used is that a resist layer having a smooth surface and a uniform film thickness can be efficiently formed. In this method, the coating operation is completed simply by dropping the resist on the substrate rotating at a high speed.

【0006】[0006]

【発明が解決しようとする課題】スピンコート法により
基板上に所定の膜厚のレジストを塗布する場合、基板の
回転速度、レジスト濃度などの諸条件を厳密に設定する
必要がある。これらの諸条件はガラス基板の厚さによっ
て異なり、先に厚いガラス基板にレジストを塗布した
後、次に薄いガラス基板にレジストを塗布しようとする
ときは、再び諸条件を設定し直さなければならない。し
かし、諸条件の設定し直しは、仲々面倒な作業である。
特にレジスト濃度の変更は極めてやっかいな作業であ
る。このように厚い基板に塗布した後に薄い基板に塗布
する場合、諸条件の設定し直しが必要であることが問題
点である。
When a resist having a predetermined film thickness is applied onto a substrate by the spin coating method, it is necessary to strictly set various conditions such as the rotation speed of the substrate and the resist concentration. These conditions differ depending on the thickness of the glass substrate, and after applying the resist to the thick glass substrate first, when trying to apply the resist to the next thin glass substrate, the conditions must be set again. .. However, resetting the conditions is a troublesome task.
In particular, changing the resist concentration is an extremely troublesome task. When applying to a thin substrate after applying to such a thick substrate, it is necessary to reset various conditions.

【0007】本発明の目的は、このような問題点の解決
にある。
An object of the present invention is to solve such a problem.

【0008】[0008]

【課題を解決する為の手段】本発明者は、基板の厚さが
一定ならば、スピンコート時の諸条件を一定にできるこ
とから、薄いガラス基板にレジストを塗布するときには
基板の裏面に補助基板を接着してガラス基板の見掛けの
厚さを厚くしてやればスピンコート時の諸条件の設定し
直しが軽減されることを見い出し、本発明を成すに至っ
た。
The inventor of the present invention can make constant various conditions at the time of spin coating if the thickness of the substrate is constant. Therefore, when applying a resist to a thin glass substrate, an auxiliary substrate is formed on the back surface of the substrate. It was found that if the glass substrate is adhered to increase the apparent thickness of the glass substrate, resetting of various conditions during spin coating can be reduced, and the present invention has been completed.

【0009】よって、本発明は第一に基板を接着剤で補
助基板に接着する第1工程、該補助基板を接着した基板
をスピンコーターに取り付けて、スピンコート法により
前記基板上にレジストを塗布する第2工程、及び前記基
板を接着剤から剥す第3工程からなることを特徴とする
レジストの塗布方法を提供する。また、本発明は第二に
接着剤の屈折率は、基板及び補助基板の屈折率と等しい
か又はほぼ等しいことを特徴とする塗布方法を提供す
る。
Therefore, according to the present invention, first, the first step of adhering the substrate to the auxiliary substrate with an adhesive, the substrate to which the auxiliary substrate is adhered is attached to a spin coater, and a resist is applied onto the substrate by spin coating. And a third step of peeling the substrate from the adhesive, to provide a resist coating method. Secondly, the present invention provides a coating method characterized in that the refractive index of the adhesive is equal to or substantially equal to the refractive indexes of the substrate and the auxiliary substrate.

【0010】[0010]

【実施例】以下に、図1を参照して、本発明の具体的な
実施例を示す。 (1)厚さ (5.8mm)のガラス製の補助基板3(305mmφ)
を用意し貼合せ用回転テーブルの上にのせ、紫外線硬化
型接着剤2(メーカー名:日本化薬)を塗布する。接着
剤層の厚さは50μm位である。
EXAMPLES Specific examples of the present invention will be described below with reference to FIG. (1) Glass auxiliary substrate 3 (305mmφ) with thickness (5.8mm)
Prepare and place it on a laminating rotary table, and apply UV curable adhesive 2 (maker name: Nippon Kayaku). The thickness of the adhesive layer is about 50 μm.

【0011】(2)次に厚みが (1.2mm)の透明なガラス
基板1(305mmφ) を、補助基板3上にのせて接着剤層2
をサンドイッチする。 (3)この状態で紫外線を照射して接着剤を硬化させ
る。 (4)基板1と補助基板3が一体となったものを基板面
を上にしてスピンコーターのチャックテーブルの上に置
き真空チャックした後、回転数600rpmで回転させ、上か
らレジスト液を滴下させ塗布する。レジスト層の厚さ
は、約1100Åである。
(2) Next, a transparent glass substrate 1 (305 mmφ) having a thickness of (1.2 mm) is placed on the auxiliary substrate 3 and the adhesive layer 2 is formed.
Sandwich. (3) In this state, ultraviolet rays are irradiated to cure the adhesive. (4) Place the integrated substrate 1 and auxiliary substrate 3 on the chuck table of the spin coater with the surface of the substrate facing up, vacuum chuck, and then rotate at 600 rpm to drop the resist solution from above. Apply. The thickness of the resist layer is about 1100Å.

【0012】(5)塗布後、基板1と補助基板3が一体
になったものをスピンコーターから外し、プリベーク
(湿度 100℃、時間30分) を行なう。 (6)前記基板1を接着剤層2より剥離をする。 なお、ここでは接着剤2として屈折率nd=1.5 のものを
用いたが、これは基板ガラス1及びガラス製の補助基板
3と屈折率が等しい。レジスト層の膜厚をエリプソメー
ターで測定する場合、斜入射でレーザ光を照射して、そ
の反射光を利用するが、このとき、基板ガラス1が 1.2
mmと薄いと、測定不可能である。ところが、接着剤2と
して屈折率が基板1及び補助基板3と等しいか又はほぼ
等しいものを使用し、基板1を接着剤層2から剥さずに
補助基板3を接着したまま(つまり、前述の(5)工程
の後のもの)、測定すると、測定可能である。
(5) After coating, the substrate 1 and the auxiliary substrate 3 integrated with each other are removed from the spin coater and prebaked (humidity 100 ° C., time 30 minutes). (6) The substrate 1 is peeled off from the adhesive layer 2. Although the adhesive 2 has a refractive index nd = 1.5 here, it has the same refractive index as the substrate glass 1 and the glass auxiliary substrate 3. When measuring the film thickness of the resist layer with an ellipsometer, the laser light is radiated at an oblique incidence and the reflected light is used.
If it is as thin as mm, it cannot be measured. However, the adhesive 2 having the same or substantially the same refractive index as that of the substrate 1 and the auxiliary substrate 3 is used, and the auxiliary substrate 3 is adhered without peeling the substrate 1 from the adhesive layer 2 (that is, the above-mentioned (5) After the process), the measurement is possible.

【0013】[0013]

【発明の効果】本発明によれば、スピンコート法により
レジスト層を形成する場合、厚いガラス基板から薄いガ
ラス基板に切り換えたときのスピンコート時の諸条件の
設定のし直しが軽減される。
According to the present invention, when the resist layer is formed by the spin coating method, it is possible to reduce re-setting of various conditions during spin coating when switching from a thick glass substrate to a thin glass substrate.

【図面の簡単な説明】[Brief description of drawings]

【図1】本発明の実施例において、基板を補助基板に接
着して一体にしたものの概略垂直断面図である。
FIG. 1 is a schematic vertical cross-sectional view of a substrate and an auxiliary substrate which are bonded and integrated in an embodiment of the present invention.

【符号の説明】[Explanation of symbols]

1 基板 2 接着剤 3 補助基板 4 真空チャックテーブル 1 substrate 2 adhesive 3 auxiliary substrate 4 vacuum chuck table

Claims (2)

【特許請求の範囲】[Claims] 【請求項1】 基板を接着剤で補助基板に接着する第1
工程、該補助基板を接着した基板をスピンコーターに取
り付けて、スピンコート法により前記基板上にレジスト
を塗布する第2工程、及び前記基板を接着剤から剥す第
3工程からなることを特徴とするレジストの塗布方法。
1. A first substrate for adhering a substrate to an auxiliary substrate with an adhesive.
A step of attaching the substrate to which the auxiliary substrate is adhered to a spin coater, applying a resist on the substrate by a spin coating method, and a third step of peeling the substrate from the adhesive. How to apply resist.
【請求項2】 前記接着剤の屈折率は、前記基板及び補
助基板の屈折率と等しいか又はほぼ等しいことを特徴と
する請求項1記載の塗布方法。
2. The coating method according to claim 1, wherein a refractive index of the adhesive is equal to or substantially equal to a refractive index of the substrate and the auxiliary substrate.
JP4145377A 1992-06-05 1992-06-05 Method for applying resist Pending JPH05337435A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP4145377A JPH05337435A (en) 1992-06-05 1992-06-05 Method for applying resist

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP4145377A JPH05337435A (en) 1992-06-05 1992-06-05 Method for applying resist

Publications (1)

Publication Number Publication Date
JPH05337435A true JPH05337435A (en) 1993-12-21

Family

ID=15383831

Family Applications (1)

Application Number Title Priority Date Filing Date
JP4145377A Pending JPH05337435A (en) 1992-06-05 1992-06-05 Method for applying resist

Country Status (1)

Country Link
JP (1) JPH05337435A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE19608370A1 (en) * 1996-03-05 1996-07-25 Josef Dr Lechner Micro-mechanical channel prodn. with connection to surrounding atmos.

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE19608370A1 (en) * 1996-03-05 1996-07-25 Josef Dr Lechner Micro-mechanical channel prodn. with connection to surrounding atmos.

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