JPH05335206A - Projection aligner - Google Patents
Projection alignerInfo
- Publication number
- JPH05335206A JPH05335206A JP4161768A JP16176892A JPH05335206A JP H05335206 A JPH05335206 A JP H05335206A JP 4161768 A JP4161768 A JP 4161768A JP 16176892 A JP16176892 A JP 16176892A JP H05335206 A JPH05335206 A JP H05335206A
- Authority
- JP
- Japan
- Prior art keywords
- holder
- exposure
- optical system
- projection
- filter
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Abstract
Description
【0001】[0001]
【産業上の利用分野】本発明は投影式露光機に関し、特
に露光対象としての処理物を保持するためのホルダを有
する投影式露光機に関する。BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a projection type exposure machine, and more particularly to a projection type exposure machine having a holder for holding a processed product as an exposure object.
【0002】[0002]
【従来の技術】図3は従来の投影式露光機のブロック図
である。同図に示す様に、照明光を出力する為の照明光
学系1と、照明光の露光に有効な波長のみを透過するフ
ィルタ3と、所要の露光パターンが形成される露光マス
ク4と、その露光パターンを露光対象としての被処理物
10に投影するための投影光学系5と、被処理物10を
載置するホルダ6と、このホルダ6を前記投影光学系5
に対して移動して位置決めさせる為のステージ7を有す
る。この投影露光機では、照明光学系1から出力された
照明光はフィルタ3を通過することにより露光に有効な
波長のみに選択される。フィルタ3通過後の照明光は露
光マスク4、投影光学系5を通過し、マスク4の露光パ
ターンを被処理物10へ投影する。被処理物10はホル
ダ6により正確に位置決めされ、さらにホルダ6はステ
ージ7により投影位置へ正確に移動され処理が行われ
る。2. Description of the Related Art FIG. 3 is a block diagram of a conventional projection type exposure machine. As shown in the figure, an illumination optical system 1 for outputting illumination light, a filter 3 that transmits only a wavelength effective for exposure of illumination light, an exposure mask 4 on which a required exposure pattern is formed, and its A projection optical system 5 for projecting an exposure pattern onto an object 10 to be exposed, a holder 6 for mounting the object 10 to be processed, and the holder 6 for the projection optical system 5
It has a stage 7 for moving and positioning with respect to. In this projection exposure apparatus, the illumination light output from the illumination optical system 1 passes through the filter 3 and is selected only as a wavelength effective for exposure. The illumination light after passing through the filter 3 passes through the exposure mask 4 and the projection optical system 5 and projects the exposure pattern of the mask 4 onto the object to be processed 10. The workpiece 10 is accurately positioned by the holder 6, and the holder 6 is accurately moved to the projection position by the stage 7 for processing.
【0003】[0003]
【発明が解決しようとする課題】この従来の投影式露光
機では、ホルダ6の上面に異物若しくは不純物が存在し
ていると、ホルダ6に載置した被処理物10の平坦精度
が失われ焦点ずれ等が起因して露光不良が生じる。これ
ら異物や不純物はクリーニングで有る程度除去可能であ
るが、有機系の異物及び不純物は残留し易く、前記した
ように被処理物の平坦精度が失われ正常な露光が不可能
となる。本発明の目的は、ホルダに付着した異物や不純
物を効果的に除去することを可能にした投影式露光機を
提供することにある。In this conventional projection type exposure apparatus, if foreign matter or impurities are present on the upper surface of the holder 6, the flatness of the object to be processed 10 placed on the holder 6 is lost and the focus is reduced. Exposure defects occur due to misalignment and the like. Although these foreign matters and impurities can be removed to some extent by cleaning, organic foreign matters and impurities tend to remain, and as described above, the flatness of the object to be processed is lost and normal exposure becomes impossible. It is an object of the present invention to provide a projection type exposure apparatus capable of effectively removing foreign matters and impurities attached to a holder.
【0004】[0004]
【課題を解決するための手段】本発明は、照明光学系,
露光マスク,投影光学系,被処理物を載置するホルダを
有する投影式露光機に、ホルダ表面に紫外線を照射する
手段を有している。The present invention is directed to an illumination optical system,
A projection type exposure machine having an exposure mask, a projection optical system, and a holder for mounting an object to be processed has means for irradiating the surface of the holder with ultraviolet rays.
【0005】[0005]
【実施例】次に、本発明について図面を参照して説明す
る。図1(A)は、本発明の一実施例の投影式露光機の
ブロック図である。図1(A)に示す様に、照明光を出
力する為の照明光学系1と、照明光の露光に有効な波長
のみを透過するフィルタ3と、有機物の酸化除去に有効
な波長、例えば紫外光のみを透過する紫外線フィルタ2
と、所要の露光パターンが形成される露光マスク4と、
その露光パターンを被処理物10に投影するための投影
光学系5と、被処理物10を載置するホルダ6と、この
ホルダ6を前記投影光学系5に対して移動させる為のス
テージ7を有する。尚、紫外線フィルタ2はフィルタ3
とは並列に配置され、光路に対してフィルタ3及び露光
マスク4とは選択的に進退させることができる構成とさ
れている。DESCRIPTION OF THE PREFERRED EMBODIMENTS Next, the present invention will be described with reference to the drawings. FIG. 1A is a block diagram of a projection type exposure apparatus according to an embodiment of the present invention. As shown in FIG. 1 (A), an illumination optical system 1 for outputting illumination light, a filter 3 that transmits only a wavelength effective for exposure of the illumination light, a wavelength effective for removing oxidation of organic matter, for example, ultraviolet light. UV filter 2 that transmits only light
And an exposure mask 4 on which a required exposure pattern is formed,
A projection optical system 5 for projecting the exposure pattern onto the object 10 to be processed, a holder 6 for mounting the object 10 to be processed, and a stage 7 for moving the holder 6 with respect to the projection optical system 5. Have. The ultraviolet filter 2 is the filter 3
Are arranged in parallel, and the filter 3 and the exposure mask 4 can be selectively moved back and forth with respect to the optical path.
【0006】この構成によれば、通常の露光時には、図
1(A)に示す様に、フィルタ2が待避されているた
め、フィルタ3と露光マスク4による通常露光処理が可
能である。この通常露光処理が実施されていない間に
は、図1(B)に示す様に、フィルタ3及び露光マスク
4を待避させ、代わりに紫外線フィルタ2を光路に位置
させる。この状態では、照明光学系1から出力された照
明光はフィルタ2を通過することにより有機物の酸化除
去に有効な波長(紫外光)のみに選択される。そしてこ
の紫外線フィルタ2通過後の照明光は投影系5を通過
し、ホルダ6に直接照射される。これにより、ホルダ6
上に付着している有機系の異物及び不純物は酸化除去さ
れ、露光処理時にホルダ6に載置される処理物10の平
坦精度は保たれ正常な露光が可能となる。According to this structure, at the time of normal exposure, since the filter 2 is retracted as shown in FIG. 1A, the normal exposure processing by the filter 3 and the exposure mask 4 can be performed. While this normal exposure process is not being performed, as shown in FIG. 1B, the filter 3 and the exposure mask 4 are retracted, and the ultraviolet filter 2 is positioned in the optical path instead. In this state, the illumination light output from the illumination optical system 1 passes through the filter 2 and is selected only as a wavelength (ultraviolet light) effective for removing oxidation of organic substances. Then, the illumination light after passing through the ultraviolet filter 2 passes through the projection system 5 and is directly applied to the holder 6. As a result, the holder 6
The organic foreign matter and impurities adhering to the upper portion are oxidized and removed, and the flatness accuracy of the processing object 10 placed on the holder 6 during the exposure processing is maintained and normal exposure can be performed.
【0007】図2(A)は本発明の第2実施例の投影式
露光機のブロック図である。図2(A)に示す様に、照
明光を出力する為の照明光学系1と、照明光の露光に有
効な波長のみを透過するフィルタ3と、露光パターンが
形成された露光マスク4と、露光パターンを被処理物1
0に投影するための投影光学系5と、被処理物10を載
置するホルダ6と、ホルダ6を投影光学系5に対して移
動させる為のステージ7と、有機物の酸化除去に有効な
紫外線を出力する紫外線照明光学系8と、この紫外線照
明光学系8より出力された紫外線をホルダ6及びステー
ジ7に照射するための紫外線投影光学系9を有する。
尚、前記照明光学系1,フィルタ3,露光マスク4,投
影光学系5で構成される系と、前記紫外線照明光学系
8,紫外線投影光学系9で構成される系は、ホルダ6及
びステージ7に対して選択的に対向位置されるように構
成されている。FIG. 2A is a block diagram of a projection type exposure apparatus according to the second embodiment of the present invention. As shown in FIG. 2 (A), an illumination optical system 1 for outputting illumination light, a filter 3 that transmits only a wavelength effective for exposure of the illumination light, an exposure mask 4 on which an exposure pattern is formed, Exposure pattern to be processed 1
Projection optical system 5 for projecting onto 0, a holder 6 on which the object to be processed 10 is placed, a stage 7 for moving the holder 6 with respect to the projection optical system 5, and ultraviolet rays effective for removing oxidation of organic substances. And an ultraviolet projection optical system 9 for irradiating the holder 6 and the stage 7 with the ultraviolet light output from the ultraviolet illumination optical system 8.
The system including the illumination optical system 1, the filter 3, the exposure mask 4, and the projection optical system 5, and the system including the ultraviolet illumination optical system 8 and the ultraviolet projection optical system 9 are a holder 6 and a stage 7. It is configured to be selectively opposed to.
【0008】この構成によれば、図2(A)に示す状態
では、ホルダ6及びステージ7が投影光学系5の下部に
存在する状態であるため、通常の露光処理が可能であ
る。通常の露光処理が実施されていない間は、図2
(B)に示す様に、ホルダ6及びステージ7上に紫外線
照明光学系8と紫外線投影光学系9を移動位置させる。
そして、紫外線照明光学系8から出力された紫外線を紫
外線投影光学系9を通過してホルダ6に直接照射すれ
ば、ホルダ6に付着した有機物の異物や不純物を酸化除
去することができ、通常の露光処理時にホルダ6に載置
される被処理物10の平坦精度を保ち、正常な露光が可
能となる。According to this structure, in the state shown in FIG. 2A, since the holder 6 and the stage 7 are present below the projection optical system 5, normal exposure processing is possible. As long as the normal exposure process is not performed, FIG.
As shown in (B), the ultraviolet illumination optical system 8 and the ultraviolet projection optical system 9 are moved and positioned on the holder 6 and the stage 7.
Then, by directly irradiating the holder 6 with the ultraviolet light output from the ultraviolet illumination optical system 8 through the ultraviolet projection optical system 9, it is possible to oxidize and remove the foreign matters and impurities of the organic substances adhering to the holder 6. It is possible to maintain the flatness accuracy of the object to be processed 10 placed on the holder 6 during the exposure processing and perform normal exposure.
【0009】[0009]
【発明の効果】以上、説明した様に本発明は露光パター
ンを投影する被処理物10を載置するためのホルダ表面
に有機物の酸化除去に有効な紫外線を照射できる手段を
有することにより、ホルダ上の有機物の異物や不純物を
酸化除去することができ、露光処理時にホルダに載置さ
れる被処理物の平坦度は保たれ正常な露光が可能とな
る。As described above, according to the present invention, the holder surface for mounting the object to be processed 10 on which the exposure pattern is projected is provided with means capable of irradiating the holder surface with the ultraviolet rays effective for removing the oxidation of the organic matter. It is possible to oxidize and remove the foreign matters and impurities above the organic substance, and the flatness of the object to be processed placed on the holder during the exposure processing is maintained and normal exposure becomes possible.
【図1】本発明の投影式露光機の第1実施例のブロック
図である。FIG. 1 is a block diagram of a first embodiment of a projection type exposure apparatus of the present invention.
【図2】本発明の投影式露光機の第2実施例のブロック
図である。FIG. 2 is a block diagram of a second embodiment of the projection type exposure apparatus of the present invention.
【図3】従来の投影式露光機のブロック図である。FIG. 3 is a block diagram of a conventional projection type exposure apparatus.
1 照明光学系 2 紫外線フィルタ 3 フィルタ 4 露光マスク 5 投影光学系 6 ホルダ 7 ステージ 8 紫外線照明光学系 9 紫外線投影光学系 10 被処理物 1 Illumination Optical System 2 Ultraviolet Filter 3 Filter 4 Exposure Mask 5 Projection Optical System 6 Holder 7 Stage 8 Ultraviolet Illumination Optical System 9 Ultraviolet Projection Optical System 10 Workpiece
Claims (1)
光パターンが形成された露光マスクと、前記露光パター
ンを被処理物に投影するための投影光学系と、露光パタ
ーンが投影される被処理物を載置するホルダを有する投
影式露光機において、前記ホルダ表面に紫外線を照射す
る手段を有することを特徴とする投影式露光機。1. An illumination optical system for outputting illumination light, an exposure mask on which an exposure pattern is formed, a projection optical system for projecting the exposure pattern onto an object to be processed, and an exposure pattern. A projection type exposure machine having a holder for mounting an object to be processed, comprising a means for irradiating the surface of the holder with ultraviolet light.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP4161768A JPH05335206A (en) | 1992-05-29 | 1992-05-29 | Projection aligner |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP4161768A JPH05335206A (en) | 1992-05-29 | 1992-05-29 | Projection aligner |
Publications (1)
Publication Number | Publication Date |
---|---|
JPH05335206A true JPH05335206A (en) | 1993-12-17 |
Family
ID=15741535
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP4161768A Pending JPH05335206A (en) | 1992-05-29 | 1992-05-29 | Projection aligner |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPH05335206A (en) |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6980278B2 (en) | 2003-05-26 | 2005-12-27 | Oki Electric Industry Co., Ltd. | Self-cleaning method for semiconductor exposure apparatus |
JP2007047609A (en) * | 2005-08-11 | 2007-02-22 | Dainippon Printing Co Ltd | Manufacturing method for pattern forming body |
US7733460B2 (en) | 2004-11-24 | 2010-06-08 | Oki Semiconductor Co., Ltd. | Aligner and self-cleaning method for aligner |
-
1992
- 1992-05-29 JP JP4161768A patent/JPH05335206A/en active Pending
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6980278B2 (en) | 2003-05-26 | 2005-12-27 | Oki Electric Industry Co., Ltd. | Self-cleaning method for semiconductor exposure apparatus |
US7733460B2 (en) | 2004-11-24 | 2010-06-08 | Oki Semiconductor Co., Ltd. | Aligner and self-cleaning method for aligner |
JP2007047609A (en) * | 2005-08-11 | 2007-02-22 | Dainippon Printing Co Ltd | Manufacturing method for pattern forming body |
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