JPH0471224A - Aligner - Google Patents

Aligner

Info

Publication number
JPH0471224A
JPH0471224A JP2183220A JP18322090A JPH0471224A JP H0471224 A JPH0471224 A JP H0471224A JP 2183220 A JP2183220 A JP 2183220A JP 18322090 A JP18322090 A JP 18322090A JP H0471224 A JPH0471224 A JP H0471224A
Authority
JP
Japan
Prior art keywords
light
wafer
optical cable
exposure
cable
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2183220A
Other languages
Japanese (ja)
Inventor
Junichi Araki
順一 荒木
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Yamagata Ltd
Original Assignee
NEC Yamagata Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NEC Yamagata Ltd filed Critical NEC Yamagata Ltd
Priority to JP2183220A priority Critical patent/JPH0471224A/en
Publication of JPH0471224A publication Critical patent/JPH0471224A/en
Pending legal-status Critical Current

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  • Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
  • Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)

Abstract

PURPOSE:To obtain a low-cost aligner requiring less space by branching a light into two light paths, and installing an optical cable for guiding one of the branched lights, and a mechanism for moving the spot position of the light led out from the optical cable. CONSTITUTION:A peripheral exposing part 1 having an optical cable 3 for introducing one of lights wherein the light generated by a mercury lamp 5 as a light source is branched by a half mirror 4 is installed. A driving part 10 for retaining one end of the optical cable 3 and moving the cable is installed in the lower part of the peripheral exposing part 1. A spin chuck 8 for retaining a wafer 9 and rotating it in the manner in which the periphery of the wafer 9 is irradiated with the light led out from the optical cable 3 is installed so as to face the driving part 10.

Description

【発明の詳細な説明】 〔産業上の利用分野〕 本発明は、半導体基板であるウェーハに塗布されたレジ
ストに光を投射する露光装置に関する。
DETAILED DESCRIPTION OF THE INVENTION [Field of Industrial Application] The present invention relates to an exposure apparatus that projects light onto a resist coated on a wafer, which is a semiconductor substrate.

〔従来の技術〕[Conventional technology]

従来、半導体装置の製造におけるフォトリソグラフィー
工程は、フォトレジストをウェーハ上へ塗布し、次に、
フォトマスクを通して紫外線を含む光で露光し、さらに
、現像液に浸すことにより所望のパターンを形成すると
いった一連のフローになっていた。近年、パターンが微
細化されるにつれ、フォトレジストの穐類は、従来のネ
ガ型からポジ型へと移行され、ポジ型が大量に使用され
るに至った。しかしながら、ポジ型レジストの場合硬度
が比較的大きいため、機械的な衡機等でかけが生じやす
いといった欠点を有していた。このため、ウェーハの最
外周において、ウェーハキャリアとのこすれ、ビンセッ
トでのハンドリング等の機械的に接触することによりレ
ジストにかけを起し、そのかけによる発塵が生じていた
。そこで、その対策の一つとして、例えば、ウェーハ最
外周部を数mm程度に割ってフォトレジストを感光させ
、あらかじめ現像の際に取り除く技術が開発された。
Conventionally, the photolithography process in the manufacture of semiconductor devices involves coating a photoresist onto a wafer, and then
The process involved exposing the material to light containing ultraviolet light through a photomask, and then immersing it in a developer to form a desired pattern. In recent years, as patterns have become finer, the photoresist type has been shifted from the conventional negative type to the positive type, and the positive type has come to be used in large quantities. However, since positive resists have relatively high hardness, they have the disadvantage that they tend to chip when using a mechanical balancer or the like. For this reason, at the outermost periphery of the wafer, mechanical contact such as rubbing with a wafer carrier or handling with a bottle set causes resist buildup, which causes dust generation. Therefore, as one of the countermeasures, a technique has been developed, for example, in which the outermost periphery of the wafer is divided into several millimeters, the photoresist is exposed, and the photoresist is removed before development.

第2図は従来の露光装置を使用するフォトリソグラフィ
ー工程の一例を説明するためのフローチャートである。
FIG. 2 is a flowchart for explaining an example of a photolithography process using a conventional exposure apparatus.

従来、このフォトリソグラフィー工程では、図面には示
さないが、ウェーハにレジストを塗布する塗布装置と、
塗布されたレジストに紫外光を含む光を投射する露光装
置と、レジストが焼付けされた部分を除去する現像装置
とが使用されていた。また、このフォトリソグラフィー
工程は、第2図に示すように、まず、〔レジスト塗布〕
で、塗布装置でウェーハ面にレジストを一様に塗布する
0次に、〔目合せ露光〕で、第1の露光装置によりパタ
ーン露光を行う0次に、〔周辺露光〕で、第2の露光装
置でウェーハの周辺部に光を投光する0次に、〔現像〕
で、現像装置によりレジストの露光された部分がエツチ
ング除去され、周辺部のレジストが除去されるとともに
ポジ型のレジストパターンが形成される。
Conventionally, in this photolithography process, although not shown in the drawings, a coating device that coats the wafer with resist;
An exposure device that projects light containing ultraviolet light onto the coated resist and a developing device that removes the printed portion of the resist were used. Also, in this photolithography process, as shown in Figure 2, first, [resist coating]
Then, the resist is uniformly applied to the wafer surface using a coating device, the first exposure device performs pattern exposure in [alignment exposure], and the second exposure is performed in [peripheral exposure]. The 0th order, in which the equipment emits light onto the periphery of the wafer, [development]
Then, the exposed portion of the resist is etched away by the developing device, and the peripheral portion of the resist is removed, and a positive resist pattern is formed.

〔発明が解決しようとする課題〕[Problem to be solved by the invention]

しかしながら、上述した従来のリソグラフィー工程で使
用される露光装置は、目合せ露光用の露光装置と、周辺
部露光用の露光装置とが別々に独立して配置されている
ため、フロアスペースを大きく必要とするばかりか、露
光装置間の受は渡し時間が余部にかかるという欠点があ
る。また、受は渡しによるウェーハの損傷を起すという
欠点がある。さらに、設備投資コストが多額であるとい
う欠点がある。
However, the exposure equipment used in the conventional lithography process described above requires a large amount of floor space because the exposure equipment for alignment exposure and the exposure equipment for peripheral area exposure are installed separately. Not only that, but there is also a drawback that the transfer between the exposure apparatuses takes a considerable amount of time. Further, the transfer method has the disadvantage that the wafer may be damaged due to transfer. Furthermore, there is a drawback that the equipment investment cost is large.

本発明の目的は、かかる問題を解消し、フロアスペース
が狭くて済むとともに受は渡し作業を必要としない安価
な露光装置を提供することにある。
SUMMARY OF THE INVENTION An object of the present invention is to solve this problem and provide an inexpensive exposure apparatus that requires only a small floor space and does not require transfer work.

〔課題を解決するための手段〕[Means to solve the problem]

本発明の露光装置は、紫外線を含む光を発生する一つの
光源と、前記光を二つの光路に分岐するハーフミラ−と
、分岐された光の一つを導く光ケーブルと、この光ケー
ブルの一端を保持するとともに前記光ケーブルから導出
される光のスポット位置を移動させる機構とを有してい
る。
The exposure apparatus of the present invention includes a light source that generates light including ultraviolet light, a half mirror that branches the light into two optical paths, an optical cable that guides one of the branched lights, and one end of the optical cable that is held. and a mechanism for moving the spot position of the light led out from the optical cable.

〔実施例〕〔Example〕

次に、本発明について図面を参照して説明する。 Next, the present invention will be explained with reference to the drawings.

第1図は本発明の一実施例を示す露光装置の模式断面図
である。この露光装置は、同図に示すように、目合せ露
光するための目合せ露光部2と、この目合せ露光部2の
光源である水銀ランプ5より発生する光がハーフミラ−
5により分岐される光の一つを導入する光ケーブル3を
有する周辺露光部1とを設けたことである。また、この
光ケーブル3の一端を保持するとともに移動するための
駆動部10が周辺露光部1と下部に設けられている。さ
らに、光ケーブル3より導出される光がウェーハ9の周
辺に照射されるようにウェーハ9を保持し、回転させる
スピンチャック8が駆動部10に対向するよう備えられ
ている。
FIG. 1 is a schematic sectional view of an exposure apparatus showing an embodiment of the present invention. As shown in the figure, this exposure apparatus includes an alignment exposure section 2 for alignment exposure, and a half mirror in which light generated from a mercury lamp 5, which is a light source of this alignment exposure section 2, is used for alignment exposure.
5 is provided with a peripheral exposure section 1 having an optical cable 3 into which one of the lights branched by 5 is introduced. Further, a driving section 10 for holding one end of the optical cable 3 and moving it is provided at the peripheral exposure section 1 and below. Furthermore, a spin chuck 8 that holds and rotates the wafer 9 so that the periphery of the wafer 9 is irradiated with light led out from the optical cable 3 is provided so as to face the drive unit 10 .

一方、目合せ露光部2は、従来の構造と同じで、その、
光路中に、光源拡大用のレンズ6C26dと、反射用の
ミラー6と、レチクル14に光を投下させるレンズ6a
と、レチクルの像を縮小してウェーハ9に投光する縮小
レンズ6bとを有している。また、駆動部10には、ウ
ェーハ9の周辺部を投光する機構になっている。
On the other hand, the alignment exposure section 2 has the same structure as the conventional one, and its
In the optical path, a lens 6C26d for enlarging the light source, a mirror 6 for reflection, and a lens 6a for projecting light onto the reticle 14.
and a reduction lens 6b that reduces the image of the reticle and projects it onto the wafer 9. Further, the drive section 10 has a mechanism for projecting light onto the periphery of the wafer 9.

次に、この露光装置の動作について説明する。Next, the operation of this exposure apparatus will be explained.

まず、スピンチャック8に保持されているウェーハ9は
、光ケーブル3より導出する光で、その周辺部が露光さ
れる。この動作と同時に、目合せ露光部2側にあるステ
ージ7に搭載されているとともに既に周辺部が露光済み
のウェーハ9にレティクル14より透過した光が投光さ
れる0次に、ステージに搭載され、露光が完了したウェ
ーハ9は、ハンドリング装置(図示せず)により装置外
に搬送されスピンチャック8に保持されたウェーハ9は
、ハンドリング装置により矢印の方向に移動され、ステ
ージ7に移載される。この動作と同時に別のローダ装W
(図示せず)により、未露光のウェーハがスピンチャッ
ク8に移載される。このような動作を繰返して順次ウェ
ーハを露光する。このように、一つの光源を利用して二
つの光に分岐し、一つの光でウェーハの周辺部を、他の
光をウェーハの主要部分に投光することによって、同時
にウェーハ全体を露光するのと同じ効果が得られるので
露光処理時間を半分に減らすという利点がある。
First, the periphery of the wafer 9 held by the spin chuck 8 is exposed to light emitted from the optical cable 3. At the same time as this operation, the light transmitted from the reticle 14 is projected onto the wafer 9, which is mounted on the stage 7 on the alignment exposure section 2 side and whose peripheral portion has already been exposed. The exposed wafer 9 is transferred to the outside of the apparatus by a handling device (not shown), and the wafer 9 held by the spin chuck 8 is moved by the handling device in the direction of the arrow and transferred to the stage 7. . At the same time as this operation, another loader
(not shown), the unexposed wafer is transferred to the spin chuck 8. These operations are repeated to sequentially expose the wafers. In this way, the entire wafer can be exposed at the same time by using one light source and splitting it into two lights, emitting one light to the periphery of the wafer and the other light to the main part of the wafer. Since the same effect can be obtained, it has the advantage of cutting the exposure processing time in half.

〔発明の効果〕〔Effect of the invention〕

以上説明したように本発明は一つの光源により発生する
光を二つに分岐し、これら分岐された光を導入する目合
せ露光部と、周辺露光部とを分離して設けることによっ
て、目合せ露光および周辺露光の2つの工程を同時に処
理することが出来るし、また、この2つの露光部の光源
、ウェーハ収納室が共用出来る。さらに、二つの露光工
程間でウェーハ装置外で搬送する搬送機構が不要になる
。従って、ウェーハを損傷することなく、占有面積が小
さくて済む安価な露光装置が得られるという効果がある
As explained above, the present invention splits the light generated by one light source into two, and separates the alignment exposure section that introduces these branched lights and the peripheral exposure section, thereby achieving alignment. The two steps of exposure and peripheral exposure can be performed simultaneously, and the light source and wafer storage chamber of these two exposure sections can be shared. Furthermore, a transport mechanism for transporting the wafer outside the wafer apparatus between two exposure processes becomes unnecessary. Therefore, it is possible to obtain an inexpensive exposure apparatus that does not damage the wafer and occupies a small area.

小レンズ、7・・・ステージ、8・・・スピンチャック
、9・・・ウェーハ、10・・・駆動部、11・・・発
光素子、12・・・受光素子、13・・・サーボモータ
、14・・・レチクル。
Small lens, 7... Stage, 8... Spin chuck, 9... Wafer, 10... Drive unit, 11... Light emitting element, 12... Light receiving element, 13... Servo motor, 14... Reticle.

Claims (1)

【特許請求の範囲】[Claims]  紫外線を含む光を発生する一つの光源と、前記光を二
つの光路に分岐するハーフミラーと、分岐された光の一
つを導く光ケーブルと、この光ケーブルの一端を保持す
るとともに前記光ケーブルから導出される光のスポット
位置を移動させる機構とを有することを特徴とする露光
装置。
A light source that generates light including ultraviolet rays, a half mirror that splits the light into two optical paths, an optical cable that guides one of the split lights, and a cable that holds one end of the optical cable and that is led out from the optical cable. 1. An exposure apparatus comprising: a mechanism for moving a spot position of light;
JP2183220A 1990-07-11 1990-07-11 Aligner Pending JPH0471224A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2183220A JPH0471224A (en) 1990-07-11 1990-07-11 Aligner

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2183220A JPH0471224A (en) 1990-07-11 1990-07-11 Aligner

Publications (1)

Publication Number Publication Date
JPH0471224A true JPH0471224A (en) 1992-03-05

Family

ID=16131891

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2183220A Pending JPH0471224A (en) 1990-07-11 1990-07-11 Aligner

Country Status (1)

Country Link
JP (1) JPH0471224A (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2001082001A1 (en) * 2000-04-26 2001-11-01 Advanced Micro Devices, Inc. Lithography system with device for exposing the periphery of a wafer
US6614507B2 (en) * 2001-02-01 2003-09-02 Lsi Logic Corporation Apparatus for removing photoresist edge beads from thin film substrates
US6618118B2 (en) 2001-05-08 2003-09-09 Asml Netherlands B.V. Optical exposure method, device manufacturing method and lithographic projection apparatus

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6060724A (en) * 1983-09-14 1985-04-08 Toshiba Corp Semiconductor exposing device
JPS63258019A (en) * 1987-04-15 1988-10-25 Nec Kyushu Ltd Resistering aligner

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6060724A (en) * 1983-09-14 1985-04-08 Toshiba Corp Semiconductor exposing device
JPS63258019A (en) * 1987-04-15 1988-10-25 Nec Kyushu Ltd Resistering aligner

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2001082001A1 (en) * 2000-04-26 2001-11-01 Advanced Micro Devices, Inc. Lithography system with device for exposing the periphery of a wafer
US6614507B2 (en) * 2001-02-01 2003-09-02 Lsi Logic Corporation Apparatus for removing photoresist edge beads from thin film substrates
US6618118B2 (en) 2001-05-08 2003-09-09 Asml Netherlands B.V. Optical exposure method, device manufacturing method and lithographic projection apparatus

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