JPH05307011A - Spot converging camera device - Google Patents

Abstract

PURPOSE:To locate the optical axis of X-rays emitted from an X-ray source of a spot convergence camera device precisely identical to the optical axis of an X-ray optical system. CONSTITUTION:A horizontal reflector 3 is fixed onto a base table 8. On this table 8, an assist base 17 which can rotate, i.e., tilt, in the guide planes P, Q in the form of a circular arc centering on a horizontal axis alpha passing the X-ray reflex surface of this reflector 3, is placed. On the assist base 17 is furnished an X-ray optical system consisting of a vertical reflector 4, diffusion preventive slit 5, specimen 7, and film 6. The assist base 17 is tilted round the axis alphaby adjusting a screw 18 installed at the right end of the assist base 17. Thereby the optical axis of the X-ray optical system on a movable base 13 can be put identical accurately to the optical axis of X-rays reflected by the horizontal reflector 3.

Description

Detailed Description of the Invention

[0001]

BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention uses two X-ray reflectors, that is, reflectors, which are arranged one behind the other so that their reflecting surfaces are oriented at right angles to each other, while concentrating the X-rays. The present invention relates to a point-focusing camera device in which an X-ray image diffracted by the sample is imaged on a film.

[0002]

2. Description of the Related Art The above-mentioned point-focusing camera device is already known and is used for detecting an X-ray diffraction image of an organic-inorganic crystalline substance such as a living body, a natural polymer or a metal. This point-focusing camera device is generally used in the X-ray source 1 as shown in FIG.
It has an entrance side slit 2, a horizontal reflector 3, a vertical reflector 4, a scattering prevention slit 5, and a film 6. The sample 7 to be measured is arranged between the anti-scatter slit 5 and the film 6.

The X-rays emitted from the X-ray source 1 are focused by the horizontal reflector 3 and the vertical reflector 4 so as to form a fine focus on the film 6. The sample 7 is irradiated with the focused X-rays, and the film 6 is exposed by the X-rays diffracted or scattered by the sample 7. By this exposure, a two-dimensional diffraction image of the X-ray diffracted by the sample 7 is captured on the film 6.

In the above point-focusing camera device, it is general that an X-ray reflecting mirror is used for the horizontal reflector 3 and an X-ray reflecting mirror or a monochromator is used for the vertical reflector 4. The X-ray reflecting mirror totally reflects the X-rays, and the monochromator diffracts and reflects the X-rays. When the X-ray reflecting mirrors are used for both the horizontal reflector 3 and the vertical reflector 4, the X-ray optical system of the point-focusing camera device is arranged as shown in FIG. In this case, the elements are arranged in a very small angle on almost a straight line. On the other hand, when an X-ray reflecting mirror is used as the horizontal reflector 3 and a monochromator is used as the vertical reflector 4, the optical axes of the respective elements arranged on the film 6 side of the monochromator 4 are as shown in FIG. It is tilted in the horizontal plane corresponding to the diffraction angle 2θ of the monochromator 4.

In order to support the X-ray optical system shown in FIG.
Conventionally, a support structure as shown in FIG. 5 has been used. This structure has a plate-shaped base 8, and the base 8 is placed on a floor 10 by foot members 9. A horizontal reflector holder 11 for supporting the horizontal reflector 3 is fixed to the upper surface of the left side of the base 8. A vertical reflector holder 12 for supporting the vertical holder 4 is fixed at a substantially central position of the base 8. Also, the base 8
A movable base 13 is provided on the upper surface of the right part of the above so as to be rotatable in the horizontal plane about the central axis ω of the vertical reflector 4. Then, on the movable base 13, a slit box 14 for supporting the anti-scattering slit 5 and the sample 7 are provided.
A sample holder 15 for supporting the film and a film cassette 16 carrying the film 6 are fixed.

As described above, the arrangement mode of the X-ray optical system changes as shown in FIG. 3 or 4 depending on whether the element used as the vertical reflector 4 is an X-ray reflecting mirror or a monochromator. However, such a change of the arrangement mode is
This is performed by rotating the movable base 13 by an appropriate angle about the central axis ω.

[0007]

Generally, in a point-focusing camera device, it is necessary to adjust the height position of the horizontal reflector 3 with respect to the X-ray source 1. Further, the optical axis of the X-ray reflected by the horizontal reflector 3 and the optical axis of the X-ray optical system extending from the vertical reflector 4 to the film 6 must be exactly aligned. In the conventional point-focusing camera device shown in FIG. 5, those two adjustments, that is, the height adjustment of the horizontal reflector 3 and the optical axis adjustment of the X-ray reflected by the horizontal reflector 3, are provided on the base 8. This is done by adjusting the height of the member 9.

However, simply adjusting each foot member 9 causes the X-ray optical system on the movable base 13 and the horizontal reflector 3 to move integrally, so that the reflected X-rays from the horizontal reflector are slit. However, it was not perpendicular to the sample and film, but had an angle, and the height could not be adjusted accurately.

The present invention has been made in order to solve the above-mentioned problems in the conventional point-focusing camera device, and adjusts the height of the horizontal reflector with respect to the X-ray source and the light of the X-ray reflected by the horizontal reflector. It is an object of the present invention to provide a point-focusing camera device capable of accurately performing two types of adjustments, that is, adjusting the axis and the optical axis of the X-ray optical system arranged on the downstream side of the horizontal reflector to coincide with each other.

[0010]

In order to achieve the above object, a point-focusing camera device according to the present invention is provided with an X-ray source which emits X-rays having a cross-sectional point shape, and an X-ray which is arranged in a horizontal plane. A horizontal reflector that reflects the X-rays emitted from the source, a vertical reflector that is arranged in a vertical plane and that reflects the X-rays that are reflected by the horizontal reflector, and a downstream position of the vertical reflector with respect to the traveling direction of the X-rays. Scattering prevention slit for preventing the passage of scattered X-rays, a sample holder arranged at the downstream position of the slit for supporting a sample to be measured, and a film arranged at the downstream position of the sample In a point-focusing camera device having
It is characterized in that an auxiliary base rotatable about a horizontal axis passing on the line reflection surface is provided, and each element of the vertical reflector, slit, sample holder and film is placed on the auxiliary base.

[0011]

By rotating or tilting the auxiliary base about the axis of the horizontal reflector, the optical axis of the X-ray optical system mounted on the auxiliary base can be tilted about the horizontal reflector. By this tilting of the optical axis, the optical axis of the X-ray optical system on the downstream side of the horizontal reflector can be accurately matched with the optical axis of the X-ray reflected by the horizontal reflector.

[0012]

DESCRIPTION OF THE PREFERRED EMBODIMENTS FIG. 1 shows an embodiment of a point-converging camera device according to the present invention. This device has a base 8 supported on three points by three foot members 9 and placed on a floor 10. One of the three foot members 9 on the right side is hidden behind the base 8 and is invisible. A horizontal reflector holder 11 that is a columnar or prismatic member that supports the horizontal reflector 3 is fixedly provided on the upper surface of the left side of the base 8. The horizontal reflector 3 rotates about a reflection point and is adjusted so as to receive an incident X-ray entering horizontally. In addition, the horizontal reflector holder 11
An arc-shaped guide surface P is formed around the root portion of the horizontal reflector 3 on the X-ray reflecting surface of the horizontal reflector 3 with the axis α extending in the direction perpendicular to the paper surface as the center.

An auxiliary base 17 is arranged on the base 8. A guide surface Q having the same radius of curvature as the guide surface P of the base 8 is formed on the lower surface of the left side of the auxiliary base 17. The guide surface Q of the auxiliary base 17 and the guide surface P of the base 8 are joined so as not to separate from each other but to allow relative sliding movement. The horizontal reflector holder 11 passes through the auxiliary base 17, and a sufficient space is provided between the horizontal reflector holder 11 and the auxiliary base 17 so that the auxiliary base 17 can freely tilt.

A cylindrical vertical reflector holder 12 that supports the vertical reflector 4 is fixedly provided at a position adjacent to the horizontal reflector 3 of the auxiliary base 17. Further, on the upper surface of the right portion of the auxiliary base 17, a movable base 13 which is rotatable in the horizontal plane about the X-ray reflection point ω of the vertical reflector 4 is placed. And this movable base 13
A slit box 14 supporting the anti-scattering slit 5, a sample holder 15 supporting the sample 7, and a film cassette 16 supporting the film 6 are fixed thereon.
A height adjusting screw 18 is screwed to the right end of the auxiliary base 17. The lower end of the adjusting screw 18 is in contact with the upper surface of the right portion of the base 8.

The operation of the point-converging camera device having the above structure will be described below.

(Image pickup processing of X-ray diffraction image) Movable base 13
The angular position around the axis ω of is set to either the reflecting mirror corresponding position shown in FIG. 3 or the monochromator corresponding position shown in FIG. In that state, the X-ray source 1 emits X-rays. In this case, from the X-ray source 1, a minute focus, for example, 0.1
X-rays are emitted from a focal point having a size of about mm × 0.1 mm. The emitted X-ray having a minute cross-sectional diameter is reflected by the horizontal reflector 3 and further reflected or diffracted by the vertical reflector 4 in a state where the cross-sectional shape is restricted by the entrance slit 2.

The X-rays reflected or diffracted by the vertical reflector 4 pass through the anti-scatter slit 5 and enter the sample 7. When a predetermined diffraction condition is satisfied between the X-rays incident on the sample 7 and the crystal lattice planes in the sample 7, X
Line diffraction occurs. The diffracted X-rays are imaged on the film 6, and the film 6 is exposed to light, whereby a desired diffracted X-ray image is obtained on the film 6.

In this point-focusing camera device, the X-rays are focused on the film 6 by both the horizontal reflector 3 and the vertical reflector 4. Since the sample 7 is irradiated with the converged X-rays, it is possible to obtain a two-dimensional diffraction image with a high resolution and a low background, particularly a diffraction image in a small angle region on the film 6.

(Optical Axis Adjustment Processing) In the above-described X-ray diffraction image pickup processing, the optical axis of the X-ray emitted from the X-ray source 1 and the optical axis of the X-ray optical system on the base 8 are exactly matched. It will be done correctly only in the state where it did. This optical axis adjustment is performed as follows.

First, the height of each of the three foot members 9 attached to the base 8 is adjusted so that the mirror surface of the horizontal reflector 3 is exactly aligned with a predetermined height position with respect to the X-ray source 1. Specifically, the X-ray reflected by the horizontal reflector 3 is received by a fluorescent screen or an X-ray counter, and the height position of the horizontal reflector 3 is set so that the intensity of the received X-ray becomes maximum.

Next, the optical axis of the X-ray optical system on the movable base 13 is exactly matched with the optical axis of the X-ray reflected by the horizontal reflector 3 and traveling. Specifically, tighten or loosen the auxiliary base height adjusting screw 18 to remove the auxiliary base 1
7 is rotated by an appropriate angle along the guide surfaces P and Q. By this rotation, the auxiliary base 17 tilts about the axis α on the X-ray reflection surface of the horizontal reflector 3. At this time, the horizontal reflector 3 supported by the holder 11 remains stationary. When the auxiliary base 17 tilts, the movable base 13 which is integral with the auxiliary base 17 also tilts, and as a result, the optical axis of the X-ray optical system from the vertical reflector 4 mounted on the movable base 13 to the film 6 is screwed. Tilt by an angle corresponding to the adjustment amount of 18. Due to this tilting, the optical axis of the optical system and the optical axis of the X-ray reflected by the horizontal reflector 3 can be accurately matched.

By accurately matching the X-ray and the optical axis of the optical system in this way, it is possible to obtain an X-ray diffraction image with extremely high resolution. That is, a clear blackened image that can be easily identified can be obtained on the film 6.

Although the present invention has been described with reference to one embodiment, the present invention is not limited to this embodiment. For example, the mechanism for rotating the auxiliary base 17 about the axis α on the horizontal reflector 3 is not limited to the guide surfaces P and Q formed in an arc shape, but may be any other configuration.

[0024]

According to the present invention, the optical axis of the X-ray optical system on the downstream side of the horizontal reflector can be tilted with respect to the horizontal reflector by rotating, that is, tilting the auxiliary base. It became so. As a result, the optical axis of the X-ray optical system, which is installed on the downstream side of the horizontal reflector and extends from the vertical reflector to the film, can be accurately matched with the optical axis of the X-ray reflected by the horizontal reflector. Therefore, it has become possible to perform X-ray diffraction measurement with extremely high resolution using the point-focusing camera device.

[0025]

[Brief description of drawings]

FIG. 1 is a front view showing an embodiment of a point converging camera device according to the present invention.

FIG. 2 is a perspective view showing a general X-ray optical system in a point-focusing camera device.

FIG. 3 is a plan view showing an arrangement mode of an X-ray optical system when an X-ray reflecting mirror is used as a vertical reflector.

FIG. 4 is a plan view showing an arrangement mode of an X-ray optical system when a monochromator is used as a vertical reflector.

FIG. 5 is a front view showing an example of a conventional point-focusing camera device.

[Explanation of symbols]

 1 X-ray source 3 Horizontal reflector 4 Vertical reflector 5 Anti-scatter slit 6 Film 7 Sample 15 Sample holder 17 Auxiliary base α Axial axis of auxiliary base

Claims (1)

[Claims] 1. A micro focus X which emits an X-ray having a point-like cross section.
A radiation source, a horizontal reflector arranged in a horizontal plane for reflecting X-rays emitted from the X-ray source, a vertical reflector arranged in a vertical plane for reflecting X-rays reflected by the horizontal reflector, and X The anti-scattering slit, which is arranged at the wake position of the vertical reflector in the traveling direction of the X-rays and prevents the passage of scattered X-rays, and the wake position of the anti-scattering slit, which is arranged at the wake position of the X-ray traveling direction, In a point-focusing camera device having a sample holder supporting a certain sample and a film arranged at a position downstream of the sample with respect to the X-ray traveling direction, rotating around a horizontal axis passing through the X-ray reflecting surface of the horizontal reflector. It has a possible auxiliary base and is characterized in that the vertical reflector, the anti-scatter slit, the sample holder and the film are mounted on the auxiliary base. Converging camera device.