JPH0529798A - Positioning of article mounting apparatus - Google Patents

Positioning of article mounting apparatus

Info

Publication number
JPH0529798A
JPH0529798A JP3181464A JP18146491A JPH0529798A JP H0529798 A JPH0529798 A JP H0529798A JP 3181464 A JP3181464 A JP 3181464A JP 18146491 A JP18146491 A JP 18146491A JP H0529798 A JPH0529798 A JP H0529798A
Authority
JP
Japan
Prior art keywords
product
article
origin mark
capacitance
probe
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP3181464A
Other languages
Japanese (ja)
Inventor
Yoshiyuki Fukami
美行 深見
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Ibaraki Ltd
Original Assignee
NEC Ibaraki Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NEC Ibaraki Ltd filed Critical NEC Ibaraki Ltd
Priority to JP3181464A priority Critical patent/JPH0529798A/en
Publication of JPH0529798A publication Critical patent/JPH0529798A/en
Pending legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K1/00Printed circuits
    • H05K1/02Details
    • H05K1/0266Marks, test patterns or identification means
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K1/00Printed circuits
    • H05K1/02Details
    • H05K1/11Printed elements for providing electric connections to or between printed circuits

Landscapes

  • Structure Of Printed Boards (AREA)
  • Supply And Installment Of Electrical Components (AREA)

Abstract

PURPOSE:To accurately and rapidly mount an article in a predetermined position on an apparatus by putting an article origin mark such that contact portion of four metal squares are arranged into a square shape at slight intervals, and connecting a capacitance meter between a measuring unit and electrodes. CONSTITUTION:There is mounted on an electrode 5 an article origin mark 4 where contact portions 4a-4d of four metal squares are arranged into a square shape at slight intervals. The article origin mark 4 is adjusted at the centers thereof to substantially coincide the tip end of a measuring unit 3, observing the mark 4 with a naked eye using microscope. Then, the article position is finely adjusted, reading a capacitance meter 6 connected between a measuring unit 3 and the electrode 5. When the article is correctly mounted in a predetermined location on the apparatus, the tip end of the measuring unit 3 makes contact with all contact parts 4a-4d and hence the capacitance meter 6 reads maximum capacitance (reference capacitance). Thus, the article is accurately and rapidly mounted at the predetermined location of the apparatus.

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【産業上の利用分野】本発明は、例えばプリント基板に
ICを搭載するためのIC搭載装置のような物品搭載装
置において、プリント基板等の製品を正しく物品搭載装
置の所定の位置に搭載するための位置合わせ方法に関す
る。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to an article mounting apparatus such as an IC mounting apparatus for mounting an IC on a printed circuit board so that a product such as a printed circuit board is correctly mounted at a predetermined position of the article mounting apparatus. The alignment method of.

【0002】[0002]

【従来の技術】図4は、物品搭載装置の従来の位置合わ
せ方法に使用する従来の製品原点マークおよび物品搭載
装置の測定子の一例を示す模式図、図5は図4の例によ
って製品の位置合わせを行っている状態を示す斜視図で
ある。
2. Description of the Related Art FIG. 4 is a schematic view showing an example of a conventional product origin mark used in a conventional alignment method of an article mounting apparatus and a probe of an article mounting apparatus. FIG. It is a perspective view which shows the state which is aligning.

【0003】例えばプリント基板にICを搭載するため
のIC搭載装置のような物品搭載装置において、製品
(プリント基板)を装置(IC搭載装置)に対して正し
く搭載するための従来の位置合わせ方法は、図4に示す
ように、製品側に“十”字状の製品原点マーク14を設
けておき、一方、装置側に針状の測定子13を設け、図
5に示すように、顕微鏡2を肉眼1で覗きながら、測定
子13の先端に製品原点マーク14の中心を合わせるこ
とによって行っている。
In an article mounting apparatus such as an IC mounting apparatus for mounting an IC on a printed circuit board, a conventional alignment method for correctly mounting a product (printed circuit board) on the apparatus (IC mounting apparatus) is known. As shown in FIG. 4, the product side is provided with a “ten” -shaped product origin mark 14, while the device side is provided with a needle-shaped probe 13, and as shown in FIG. This is performed by aligning the center of the product origin mark 14 with the tip of the probe 13 while looking through with the naked eye 1.

【0004】[0004]

【発明が解決しようとする課題】上述したように、従来
の物品搭載装置における位置合わせ方法は、顕微鏡を用
いて肉眼で測定子の先端と製品原点マークの中心とを合
わせるという方法であるため、位置合わせの精度は作業
者の感覚に依存し、また作業の速度は作業者の熟練によ
って左右されるという欠点を有している。
As described above, the conventional alignment method in the article mounting apparatus is a method in which the tip of the probe and the center of the product origin mark are aligned with the naked eye using a microscope. The accuracy of alignment depends on the sense of the operator, and the speed of the operation depends on the skill of the operator.

【0005】[0005]

【課題を解決するための手段】本発明の物品搭載装置の
位置合わせ方法は、製品側に製品原点マークを設け、装
置側に針状の測定子を設け、前記製品原点マークの構成
を金属製の4個の正方形の接触部を相互間に僅かな間隙
を設けて方形に配置したものとし、前記測定子の先端部
の直径を前記接触部間の前記間隙よりも大きくし、前記
製品原点マークを電極の上に搭載し、前記測定子と前記
電極との間に静電容量計を接続し、前記測定子を前記製
品原点マークに接触させて前記静電容量計によって電気
容量を測定しながら前記製品と前記装置との位置合わせ
を行うこと含んでいる。
According to a method of aligning an article mounting apparatus of the present invention, a product origin mark is provided on the product side, a needle-shaped measuring element is provided on the apparatus side, and the product origin mark is made of metal. 4 square contact portions are arranged in a square shape with a slight gap between them, and the diameter of the tip portion of the probe is made larger than the gap between the contact portions, and the product origin mark Is mounted on an electrode, a capacitance meter is connected between the probe and the electrode, the probe is brought into contact with the product origin mark, and the capacitance is measured by the capacitance meter. Aligning the product with the device is included.

【0006】[0006]

【実施例】次に、本発明の実施例について図面を参照し
て説明する。
Embodiments of the present invention will now be described with reference to the drawings.

【0007】図1は本発明の一実施例を示す模式図、図
2は図1の実施例によって製品の原点の位置合わせを行
っている状態を示す斜視図、図3は図1の実施例に使用
する製品原点マークと装置の測定子との接触状態を示す
平面図である。
FIG. 1 is a schematic view showing an embodiment of the present invention, FIG. 2 is a perspective view showing a state where the origin of a product is aligned by the embodiment of FIG. 1, and FIG. 3 is an embodiment of FIG. FIG. 6 is a plan view showing a contact state between a product origin mark used in the above and a probe of the apparatus.

【0008】本実施例は、製品原点マークとして金属製
の製品原点マーク4を用い、図1に示すように、この製
品原点マーク4を電極5の上に搭載し、製品原点マーク
4に接触する測定子3と電極5との間に静電容量計6を
接続し、静電容量計6によって電気容量を測定しながら
製品と装置との位置合わせを行う。
In this embodiment, the product origin mark 4 made of metal is used as the product origin mark. As shown in FIG. 1, the product origin mark 4 is mounted on the electrode 5 and comes into contact with the product origin mark 4. A capacitance meter 6 is connected between the probe 3 and the electrode 5, and the capacitance is measured by the capacitance meter 6 to align the product with the device.

【0009】製品原点マーク4は、図3に示すように、
金属製の4個の正方形の接触部4a〜4dを、相互間に
僅かな間隙を設けて方形に配置したものであり、これを
装置に搭載すべき製品の所定の位置に設けておく。一
方、測定子3の先端部の直径は、接触部4a〜4d間の
間隙よりも大きくしてある。製品が装置に正しく搭載さ
れていないため、図3(a)に示すように測定子3の先
端部が接触部4aのみに接触していて、他の接触部4b
〜4dに接触していないときや、図3(b)に示すよう
に測定子3の先端部が接触部4aおよび4bのみに接触
していて、他の接触部4c〜4dに接触していないとき
の静電容量は、図3(c)に示すように測定子3の先端
部が接触部4a〜4dのすべてに接触しているときの静
電容量よりも小さくなる。本実施例は、この原理を利用
して製品と装置との位置合わせを行う。
The product origin mark 4 is, as shown in FIG.
The four square contact portions 4a to 4d made of metal are arranged in a square shape with a slight gap between them, and these are provided at predetermined positions of the product to be mounted on the apparatus. On the other hand, the diameter of the tip of the probe 3 is larger than the gap between the contact portions 4a to 4d. Since the product is not properly mounted on the device, the tip of the probe 3 is in contact with only the contact part 4a and the other contact part 4b as shown in FIG. 3 (a).
4d to 4d, or the tip of the probe 3 is in contact with only the contact portions 4a and 4b and is not in contact with the other contact portions 4c to 4d as shown in FIG. 3 (b). The capacitance at this time is smaller than the capacitance when the tip of the probe 3 is in contact with all of the contact portions 4a to 4d as shown in FIG. This embodiment utilizes this principle to align the product and the device.

【0010】すなわち、図2に示すように、製品の製品
原点マーク4を電極5の上に搭載し、まず顕微鏡2を肉
眼1で覗きながら、測定子3の先端に製品原点マーク4
の中心がほぼ一致するように合わせる。次に、測定子3
と電極5との間に接続した静電容量計6を見ながら、製
品の位置の微細な調整を行う。製品が装置の所定の位置
にに正しく搭載されたときは、図3(c)に示すよう
に、測定子3の先端部が接触部4a〜4dのすべてに接
触するため、静電容量計6を最大の静電容量を示す。製
品が装置の所定の位置に正しく搭載されていないとき
は、図3(a)や図3(b)に示すように、測定子3の
先端部が接触部4a〜4dの一部にしか接触しないた
め、静電容量計6は最大の静電容量(基準容量)よりも
小さい値を示す。図3(a)の場合は基準容量の25
%、図3(b)の場合は基準容量の50%を示す。この
ように、静電容量計6の示す値が基準容量になるように
することによって、製品を装置の所定の位置に正確にか
つ速かに搭載することができる。
That is, as shown in FIG. 2, the product origin mark 4 of the product is mounted on the electrode 5. First, while looking through the microscope 2 with the naked eye 1, the product origin mark 4 is attached to the tip of the probe 3.
Align so that the centers of are almost the same. Next, probe 3
While observing the capacitance meter 6 connected between the electrode 5 and the electrode 5, the position of the product is finely adjusted. When the product is properly mounted at a predetermined position of the device, the tip of the probe 3 comes into contact with all the contact parts 4a to 4d as shown in FIG. Indicates the maximum capacitance. When the product is not properly mounted in the predetermined position of the device, as shown in FIG. 3 (a) and FIG. 3 (b), the tip of the probe 3 contacts only a part of the contact parts 4 a to 4 d. Therefore, the capacitance meter 6 shows a value smaller than the maximum capacitance (reference capacitance). In the case of FIG. 3A, the reference capacity is 25
%, 50% of the reference capacity is shown in the case of FIG. In this way, by setting the value indicated by the capacitance meter 6 to be the reference capacitance, the product can be mounted accurately and quickly at a predetermined position of the device.

【0011】[0011]

【発明の効果】以上説明したように、本発明の物品搭載
装置の位置合わせ方法は、製品側に製品原点マークを設
け、装置側に針状の測定子を設け、製品原点マークの構
成を金属製の4個の正方形の接触部を相互間に僅かな間
隙を設けて方形に配置したものとし、測定子の先端部の
直径を接触部間の間隙よりも大きくし、製品原点マーク
を電極の上に搭載し、測定子と電極との間に静電容量計
を接続し、測定子を製品原点マークに接触させて静電容
量計によって電気容量を測定しながら製品と装置との位
置合わせを行うことにより、製品を装置の所定の位置に
正確にかつ速かに搭載することができるという効果があ
る。
As described above, according to the method of aligning the article mounting apparatus of the present invention, the product origin mark is provided on the product side, the needle-shaped probe is provided on the apparatus side, and the product origin mark is made of metal. It is assumed that four square contact parts made of metal are arranged in a square shape with a small gap between them, and the diameter of the tip of the probe is made larger than the gap between the contact parts, and the product origin mark is Mounted on top, connect a capacitance meter between the probe and the electrode, bring the probe into contact with the product origin mark, and measure the capacitance with the capacitance meter to align the product with the device. By doing so, there is an effect that the product can be mounted accurately and quickly at a predetermined position of the device.

【図面の簡単な説明】[Brief description of drawings]

【図1】本発明の一実施例を示す模式図である。FIG. 1 is a schematic view showing an embodiment of the present invention.

【図2】図1の実施例によって製品の原点の位置合わせ
を行っている状態を示す斜視図である。
FIG. 2 is a perspective view showing a state in which the origin of the product is aligned according to the embodiment of FIG.

【図3】図1の実施例に使用する製品原点マークと装置
の測定子との接触状態を示す平面図である。
FIG. 3 is a plan view showing a contact state between a product origin mark used in the embodiment of FIG. 1 and a probe of the apparatus.

【図4】物品搭載装置の従来の位置合わせ方法に使用す
る従来の製品原点マークと物品搭載装置の測定子との一
例を示す模式図である。
FIG. 4 is a schematic view showing an example of a conventional product origin mark used in a conventional alignment method of an article mounting apparatus and a probe of the article mounting apparatus.

【図5】図4の例によって製品の位置合わせを行ってい
る状態を示す斜視図である。
FIG. 5 is a perspective view showing a state in which the products are aligned according to the example of FIG.

【符号の説明】[Explanation of symbols]

1 肉眼 2 顕微鏡 3 測定子 4 製品原点マーク 4a〜4d 接触部 5 電極 6 静電容量計 13 測定子 14 製品原点マーク 1 Visual eye 2 Microscope 3 Measuring element 4 Product origin mark 4a-4d Contact part 5 Electrode 6 Capacitance meter 13 Measuring element 14 Product origin mark

Claims (1)

【特許請求の範囲】 【請求項1】 製品側に製品原点マークを設け、装置側
に針状の測定子を設け、前記製品原点マークの構成を金
属製の4個の正方形の接触部を相互間に僅かな間隙を設
けて方形に配置したものとし、前記測定子の先端部の直
径を前記接触部間の前記間隙よりも大きくし、前記製品
原点マークを電極の上に搭載し、前記測定子と前記電極
との間に静電容量計を接続し、前記測定子を前記製品原
点マークに接触させて前記静電容量計によって電気容量
を測定しながら前記製品と前記装置との位置合わせを行
うこと含むことを特徴とする物品搭載装置の位置合わせ
方法。
Claims: 1. A product origin mark is provided on the product side, a needle-shaped measuring element is provided on the device side, and the product origin mark is configured such that four metal square contact portions are mutually connected. It is assumed that they are arranged in a rectangular shape with a slight gap between them, the diameter of the tip portion of the probe is made larger than the gap between the contact portions, and the product origin mark is mounted on the electrode, and the measurement is performed. A capacitance meter is connected between the probe and the electrode, and the probe is brought into contact with the product origin mark to measure the capacitance with the capacitance meter to align the product with the device. A method for aligning an article mounting apparatus, which comprises performing.
JP3181464A 1991-07-23 1991-07-23 Positioning of article mounting apparatus Pending JPH0529798A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP3181464A JPH0529798A (en) 1991-07-23 1991-07-23 Positioning of article mounting apparatus

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP3181464A JPH0529798A (en) 1991-07-23 1991-07-23 Positioning of article mounting apparatus

Publications (1)

Publication Number Publication Date
JPH0529798A true JPH0529798A (en) 1993-02-05

Family

ID=16101216

Family Applications (1)

Application Number Title Priority Date Filing Date
JP3181464A Pending JPH0529798A (en) 1991-07-23 1991-07-23 Positioning of article mounting apparatus

Country Status (1)

Country Link
JP (1) JPH0529798A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH08204395A (en) * 1995-01-20 1996-08-09 Nec Corp Mounting of bare chip mounter on substrate
US9326408B2 (en) 2009-12-04 2016-04-26 Robert Bosch Gmbh Sensor having a sensor housing

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH08204395A (en) * 1995-01-20 1996-08-09 Nec Corp Mounting of bare chip mounter on substrate
US9326408B2 (en) 2009-12-04 2016-04-26 Robert Bosch Gmbh Sensor having a sensor housing

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