JPH05279175A - Device for lifting semiconductor single crystal - Google Patents

Device for lifting semiconductor single crystal

Info

Publication number
JPH05279175A
JPH05279175A JP8218692A JP8218692A JPH05279175A JP H05279175 A JPH05279175 A JP H05279175A JP 8218692 A JP8218692 A JP 8218692A JP 8218692 A JP8218692 A JP 8218692A JP H05279175 A JPH05279175 A JP H05279175A
Authority
JP
Japan
Prior art keywords
shaft
single crystal
pulling
crucible
semiconductor single
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP8218692A
Other languages
Japanese (ja)
Other versions
JP2855498B2 (en
Inventor
Toshiro Umeki
俊郎 梅木
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Sumco Techxiv Corp
Original Assignee
Komatsu Electronic Metals Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Komatsu Electronic Metals Co Ltd filed Critical Komatsu Electronic Metals Co Ltd
Priority to JP8218692A priority Critical patent/JP2855498B2/en
Publication of JPH05279175A publication Critical patent/JPH05279175A/en
Application granted granted Critical
Publication of JP2855498B2 publication Critical patent/JP2855498B2/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

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  • Crystals, And After-Treatments Of Crystals (AREA)
  • Liquid Deposition Of Substances Of Which Semiconductor Devices Are Composed (AREA)

Abstract

PURPOSE:To provide the single crystal-lifting device capable of improving the thermal stability of a lifting shaft and capable of stably forming the semiconductor single crystal having a stable thick diameter over a long period. CONSTITUTION:The lifting shaft 5 is composed of the connected member of an upper shaft 15a with a lower shaft 15b, and the connected member is placed in a protecting cylinder. Preferably, the upper shaft is detachably attached to the lower shaft. Further, the lower shaft is preferably constituted so as to attain a diameter larger than that of the upper shaft.

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【産業上の利用分野】本発明は、るつぼ内の原料融液か
ら、均質な半導体単結晶を製造する半導体単結晶製造装
置に関する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a semiconductor single crystal manufacturing apparatus for manufacturing a homogeneous semiconductor single crystal from a raw material melt in a crucible.

【0002】[0002]

【従来の技術】半導体単結晶の育成には、るつぼ内の原
料融液から円柱状の結晶を育成するCZ(チョクラルス
キー引上げ)法が広く用いられている。
2. Description of the Related Art A CZ (Czochralski pulling) method for growing a columnar crystal from a raw material melt in a crucible is widely used for growing a semiconductor single crystal.

【0003】通常、半導体単結晶の育成に際し、育成さ
れる単結晶を高品質に維持するために、所定の真空度に
真空排気されたチャンバー内にるつぼを設置し、このる
つぼ内の原料融液から結晶を引き上げつつ育成するとい
う方法がとられている。
Usually, in growing a semiconductor single crystal, in order to maintain high quality of the grown single crystal, a crucible is installed in a chamber evacuated to a predetermined vacuum degree, and a raw material melt in the crucible is placed. The method of pulling up the crystal while growing it is adopted.

【0004】このような装置においては、その引上げ方
法によってシャフトを引き上げるシャフト方式と、ワイ
ヤを巻き取るワイヤ方式とにわけられる。
Such a device is divided into a shaft system in which a shaft is pulled up by the pulling method and a wire system in which a wire is wound.

【0005】引上げ単結晶の直径を制御するために引上
げ速度を制御しなければならないが、これらのうちシャ
フト方式では、カメラを用いて引上げ単結晶の直径を検
出する光学式制御方法と、重量センサを用いて引上げ単
結晶の重量を検出する重量式制御方法とがある。
In order to control the diameter of the pulled single crystal, the pulling speed must be controlled. Among these, the shaft method uses an optical control method for detecting the diameter of the pulled single crystal using a camera, and a weight sensor. There is a weight type control method in which the weight of the pulled single crystal is detected by using.

【0006】例えば、光学式制御方法を用いた従来の光
学式半導体単結晶育成装置は、図5に示すように、カメ
ラ11を用いて引上げ単結晶の直径を検出するようにし
たもので、減圧下に保持されたチャンバー1内に設置さ
れた石英るつぼ2内に収容した原料3をヒータ4によっ
て加熱溶融し、この融液に引上げ軸5にとりつけた種結
晶を浸漬し、これを回転させつつ上方に引き上げて単結
晶(図示せず)を成長せしめるように構成されている。
ここでは、ヒータ4内に、ペディスタル(るつぼ支持
台)7に装着されたるつぼ受け8によって支持された黒
鉛るつぼ9内にさらに石英るつぼ2を装着し、この石英
るつぼ2内部でシリコン原料を溶融せしめ原料融液とし
て保持するようになっている。そして、この光学式制御
方法では、引上げ軸5は引上げ軸ガイドを介して引上げ
装置本体に取り付けられており、その引上げ軸5は長さ
方向に対し単一直径の細い丸棒で構成されその先端にシ
ードアダプター16と呼ばれる種結晶17の取り付け部
が連結されている。またこのシードアダプタ−が2種以
上の異なった部品で構成されたものもある。しかしなが
ら、これは光学的に引上げ単結晶の直径を検出するもの
であるため、カメラの位置に制限があり装置が大型化す
る上、反射などによる誤差が生じやすいという問題があ
った。
For example, a conventional optical semiconductor single crystal growing apparatus using an optical control method is one in which a diameter of a pulled single crystal is detected by using a camera 11 as shown in FIG. A raw material 3 housed in a quartz crucible 2 installed in a chamber 1 held below is heated and melted by a heater 4, and a seed crystal attached to a pulling shaft 5 is dipped in this melt, and while rotating this. It is configured to pull up to grow a single crystal (not shown).
Here, in the heater 4, the quartz crucible 2 is further mounted in the graphite crucible 9 supported by the crucible receiver 8 mounted on the pedestal (crucible support base) 7, and the silicon raw material is melted inside the quartz crucible 2. It is designed to be held as a raw material melt. In this optical control method, the pulling shaft 5 is attached to the pulling device main body via the pulling shaft guide, and the pulling shaft 5 is composed of a thin round bar having a single diameter in the length direction and its tip end. A mounting portion of a seed crystal 17 called a seed adapter 16 is connected to the. In addition, there is a seed adapter which is composed of two or more different parts. However, since this is for optically detecting the diameter of the pulled single crystal, there is a problem that the position of the camera is limited, the size of the apparatus becomes large, and an error due to reflection is likely to occur.

【0007】これに対し、重量式の直径制御方式は、図
6に示すように重量センサ12を用いて引上げ単結晶の
重量を検出するもので、上述したような問題はない。し
かしながら近年引上げ単結晶の直径は太くなる一方であ
り、このような重量式の直径制御方式では、その引上げ
軸は下方で石英るつぼ2内の溶融液3やヒータ14から
の輻射熱を多く受けるが、引上げ軸5は単一の丸棒で構
成されているため、この熱が上方の駆動部にも伝達さ
れ、シャフトの機械的精度を長時間保持することができ
なくなり、半導体単結晶の製造が不安定となるという問
題が出てきている。ここで10は保温筒である。
On the other hand, in the weight type diameter control system, the weight sensor 12 is used to detect the weight of the pulled single crystal as shown in FIG. 6, and there is no problem as described above. However, in recent years, the diameter of the pulled single crystal is becoming thicker, and in such a weight type diameter control system, the pulling shaft receives much radiant heat from the melt 3 in the quartz crucible 2 and the heater 14 below, Since the pulling shaft 5 is composed of a single round bar, this heat is also transmitted to the upper drive unit, and it becomes impossible to maintain the mechanical accuracy of the shaft for a long time, making it difficult to manufacture a semiconductor single crystal. The problem of becoming stable is emerging. Here, 10 is a heat insulating cylinder.

【0008】また、引上げ軸に熱的耐久性を持たせるた
めに長さ方向に対し直径を太くすることも考えられる
が、この場合は引上げ駆動軸の重量が著しく増加するた
めメンテナンスなどを容易にすることができなくなると
いう問題点があった。
It is also possible to make the pulling shaft thicker in the lengthwise direction in order to provide the pulling shaft with thermal durability. In this case, however, the weight of the pulling drive shaft increases remarkably, which facilitates maintenance. There was a problem that it could not be done.

【0009】そこでこの問題を解決すべく、太径の半導
体単結晶を引上げる場合はワイヤ方式が多く採用されて
いる。しかしながら、ワイヤ方式は位置ずれが生じ易い
という問題がある。
Therefore, in order to solve this problem, a wire system is often used when pulling up a large-diameter semiconductor single crystal. However, the wire method has a problem that a positional deviation easily occurs.

【0010】[0010]

【発明が解決しようとする課題】このように太径の半導
体単結晶を引上げる場合、重量式の直径制御方式では、
その引上げ軸は単一の丸棒であるために、石英るつぼ内
の溶融液やヒータからの輻射熱を多く受け、この熱が上
方の駆動部にも伝達され、シャフトの機械的精度を長時
間保持することができなくなり、半導体単結晶の製造が
不安定となるという問題が出てきている。また太径の半
導体単結晶を引上げるために引上げ軸の機械的強度およ
び熱的強度を大きくしなければならないが、太くすると
重量が増大しメンテナンスが困難となるという問題があ
った。
When pulling a semiconductor single crystal having a large diameter as described above, the weight type diameter control system
Since the pulling shaft is a single round bar, it receives a lot of radiant heat from the molten liquid in the quartz crucible and the heater, and this heat is also transmitted to the upper drive part, maintaining the mechanical accuracy of the shaft for a long time. However, there is a problem that the production of semiconductor single crystals becomes unstable. Further, in order to pull up a semiconductor single crystal having a large diameter, it is necessary to increase the mechanical strength and the thermal strength of the pulling shaft, but if it is thick, there is a problem that the weight increases and maintenance becomes difficult.

【0011】本発明は、前記実情に鑑みてなされたもの
で、引上げ軸の熱的安定性を向上し、メンテナンスが容
易で長期にわたって安定した太径の半導体単結晶を形成
することのできる単結晶引上げ装置を提供することを目
的とする。
The present invention has been made in view of the above circumstances, and is a single crystal that improves the thermal stability of the pulling shaft, is easy to maintain, and can form a large diameter semiconductor single crystal that is stable for a long period of time. An object is to provide a pulling device.

【0012】[0012]

【課題を解決するための手段】そこで本発明では、引上
げ軸を上部シャフトと下部シャフトとの連結体で構成
し、この連結部は保護筒内に位置するようにしている。
Therefore, in the present invention, the pulling shaft is composed of a connecting body of the upper shaft and the lower shaft, and the connecting portion is located in the protective cylinder.

【0013】また望ましくはこの上部シャフトと下部シ
ャフトを着脱自在に装着している。さらに望ましくはこ
の、下部シャフトは上部シャフトよりも径大であるよう
に構成している。
Preferably, the upper shaft and the lower shaft are detachably mounted. More preferably, the lower shaft is constructed to have a larger diameter than the upper shaft.

【0014】[0014]

【作用】上記構成によれば、引上げ軸を上部シャフトと
下部シャフトとの連結体で構成するようにしているた
め、この連結部で一旦熱が遮断される状態になるため、
上部シャフトへの熱伝導は小さい。従って熱による劣化
は防止される。
According to the above construction, since the pulling shaft is composed of the connecting body of the upper shaft and the lower shaft, heat is temporarily cut off at this connecting portion.
Heat conduction to the upper shaft is small. Therefore, deterioration due to heat is prevented.

【0015】また、引上げ軸の上部シャフトと下部シャ
フトを着脱自在に装着することにより、熱輻射により下
部シャフトが劣化すれば下部シャフトのみを取り替えれ
ばよく、また、引上げ単結晶の直径に応じて下部シャフ
トの太さあるいは材質を変えるようにすれば、引上げ軸
の熱的安定性を向上することができる。
Further, by detachably mounting the upper shaft and the lower shaft of the pulling shaft, if the lower shaft deteriorates due to heat radiation, only the lower shaft needs to be replaced, and depending on the diameter of the pulling single crystal. If the thickness or the material of the lower shaft is changed, the thermal stability of the pulling shaft can be improved.

【0016】また、引上げ軸を上部シャフトと前記上部
シャフトよりも径大の下部シャフトとの連結体で構成す
るようにすれば、熱輻射を受けるため、熱的耐久性の必
要な下部シャフトのみを径大にすれば、重量の増大を低
減し耐久性を持たせることが可能となる。また、引上げ
軸自体の重量を低減することにより、引上げ単結晶の直
径の制御のために引上げ軸に支持された引上げ単結晶の
重量を検出する重量センサの検出精度の必要範囲が小さ
くなる。
Further, if the pulling shaft is composed of a connected body of an upper shaft and a lower shaft having a diameter larger than that of the upper shaft, it receives heat radiation, so that only the lower shaft which is required to have thermal durability is used. If the diameter is increased, it is possible to reduce the increase in weight and provide durability. Further, by reducing the weight of the pulling shaft itself, the required range of the detection accuracy of the weight sensor for detecting the weight of the pulling single crystal supported by the pulling shaft for controlling the diameter of the pulling single crystal is reduced.

【0017】[0017]

【実施例】以下、本発明実施例について図面を参照しつ
つ詳細に説明する。
Embodiments of the present invention will now be described in detail with reference to the drawings.

【0018】本発明の第1の実施例の単結晶育成装置
は、図1に断面図を示すように、単結晶引上げ軸15が
ステンレス棒からなる上部シャフト15aと、この上部
シャフトよりも径大のステンレス棒からなる下部シャフ
ト15bとから構成され、これらの連結部Rがステンレ
ス製の保温筒10の下端よりも上にくるようにし、るつ
ぼ上に露呈する部分はすべて径大部であるように構成さ
れていることを特徴とする。
The single crystal growing apparatus of the first embodiment of the present invention is, as shown in the sectional view of FIG. 1, an upper shaft 15a having a single crystal pulling shaft 15 made of a stainless steel rod, and a diameter larger than this upper shaft. And a lower shaft 15b made of a stainless steel rod so that these connecting portions R are located above the lower end of the stainless steel heat insulating cylinder 10 and all portions exposed on the crucible are large diameter portions. It is characterized by being configured.

【0019】ここで下部シャフト15bの下にはカーボ
ン製のシードアダプター16が設置され種結晶17を支
持している。
A seed adapter 16 made of carbon is installed below the lower shaft 15b to support a seed crystal 17.

【0020】他の部分は図6に示した従来例の装置と同
様に形成されており、減圧下に保持したチャンバー1内
の石英るつぼ2内に収容した単結晶原料3をヒータ4に
よって加熱溶融し、この融液に引上げ軸5にとりつけた
種結晶を浸漬し、これを回転させつつ上方に引き上げて
単結晶6を成長せしめるように構成されている。
The other parts are formed in the same manner as the conventional apparatus shown in FIG. 6, and the single crystal raw material 3 contained in the quartz crucible 2 in the chamber 1 held under reduced pressure is heated and melted by the heater 4. Then, the seed crystal attached to the pulling shaft 5 is immersed in this melt, and the single crystal 6 is grown by pulling the seed crystal upward while rotating it.

【0021】次に、この単結晶製造装置を用いてシリコ
ン単結晶の育成を行う方法について説明する。
Next, a method for growing a silicon single crystal using this single crystal manufacturing apparatus will be described.

【0022】まず、チャンバー1を真空排気し、10-2
〜10-3Torrとする。
First, the chamber 1 is evacuated to 10 -2.
-10 -3 Torr.

【0023】そして、ガス導入口(図示せず)からチャ
ンバー内にアルゴンガスを導入し、さらにチャンバー1
内の石英るつぼ2を加熱するためのヒータ4をオンし、
原料融液を得る。
Argon gas is introduced into the chamber through a gas inlet (not shown), and the chamber 1
Turn on the heater 4 for heating the quartz crucible 2 inside,
A raw material melt is obtained.

【0024】そして、この原料融液内に種結晶を浸漬
し、重量センサ12で引上げ軸を含めた成長単結晶の重
量を測定し、引上げ速度を調整しながら引上げ軸15に
よって引き上げることにより単結晶を育成するようにな
っている。
Then, a seed crystal is dipped in this raw material melt, the weight of the growing single crystal including the pulling axis is measured by the weight sensor 12, and the single crystal is pulled up by the pulling axis 15 while adjusting the pulling rate. Are to be trained.

【0025】この装置を用いることにより、長期にわた
って安定で信頼性の高い良好な結晶を得ることができ
る。
By using this apparatus, it is possible to obtain a good crystal which is stable and reliable for a long period of time.

【0026】さらに、本発明は前記実施例に限定される
ことなく、種々の応用例、例えば、シリコン以外の単結
晶の育成等においても適用可能である。
Furthermore, the present invention is not limited to the above-mentioned embodiment, but can be applied to various application examples, for example, growth of single crystals other than silicon.

【0027】次に、本発明の第2の実施例として図2に
示すように、引上げ軸の上部シャフト25aと径大の下
部シャフト25bとが取り付け金具25cによって着脱
自在に取り付けられていることを特徴とするものであ
る。このようにすれば、熱輻射により下部シャフト25
bが劣化すれば下部シャフトのみを取り替えればよく、
また、引上げ単結晶の直径に応じて下部シャフトの太さ
あるいは材質を変えるようにすれば、引上げ軸の熱的安
定性を向上することができる。
Next, as a second embodiment of the present invention, as shown in FIG. 2, the upper shaft 25a of the pulling shaft and the lower shaft 25b having a large diameter are detachably attached by the attachment fittings 25c. It is a feature. In this way, the lower shaft 25
If b deteriorates, only the lower shaft needs to be replaced,
Further, if the thickness or material of the lower shaft is changed according to the diameter of the pulled single crystal, the thermal stability of the pulled shaft can be improved.

【0028】また、本発明の第3の実施例として図3に
示すように、ステンレス製の上部シャフト35aと同径
の下部シャフト35bとを連結するようにしてもよい。
この場合同径でかつ同一材料で構成されているが、一体
的に形成するのに比べ、連結界面で一旦熱が遮断される
ため、大幅に上部シャフトの劣化は少なくて済む。
As a third embodiment of the present invention, as shown in FIG. 3, an upper shaft 35a made of stainless steel and a lower shaft 35b having the same diameter may be connected.
In this case, although they have the same diameter and are made of the same material, the heat is temporarily cut off at the connecting interface as compared with the case where they are integrally formed, so that the deterioration of the upper shaft can be greatly reduced.

【0029】また前記第3の実施例では同一材料で構成
したが、下部シャフトをより耐熱性の高い材料で構成す
ればなおよくなる。
In the third embodiment, the same material is used, but the lower shaft may be made of a material having higher heat resistance.

【0030】さらに本発明の第4の実施例として図4に
示すように、熱絶縁性の材料からなる連結部材45Cを
介して上部シャフト45aと下部シャフト45bとを連
結するようにしてもよい。
As a fourth embodiment of the present invention, as shown in FIG. 4, the upper shaft 45a and the lower shaft 45b may be connected via a connecting member 45C made of a heat insulating material.

【0031】[0031]

【発明の効果】以上説明してきたように、本発明によれ
ば、チャンバーの下方から導入されたアルゴンガスがメ
インヒータの下方から上端部に向かって上昇する流れを
形成し、酸化シリコンの付着により消耗品であるカーボ
ン炉内品の寿命を伸ばすことができ、また引上げ単結晶
の製造歩留まりを向上させることができる。
As described above, according to the present invention, the argon gas introduced from the lower side of the chamber forms a rising flow from the lower side of the main heater toward the upper end portion, and the deposition of silicon oxide It is possible to extend the life of the carbon in-furnace product, which is a consumable item, and improve the manufacturing yield of the pulled single crystal.

【図面の簡単な説明】[Brief description of drawings]

【図1】本発明の第1の実施例の単結晶製造装置の断面
FIG. 1 is a sectional view of a single crystal manufacturing apparatus according to a first embodiment of the present invention.

【図2】本発明の第2の実施例の単結晶製造装置の要部
FIG. 2 is a main part diagram of a single crystal manufacturing apparatus according to a second embodiment of the present invention.

【図3】本発明の第3の実施例の単結晶製造装置の要部
FIG. 3 is a main part diagram of a single crystal manufacturing apparatus according to a third embodiment of the present invention.

【図4】本発明の第4の実施例の単結晶製造装置の要部
FIG. 4 is a main part diagram of a single crystal manufacturing apparatus according to a fourth embodiment of the present invention.

【図5】従来例の単結晶製造装置の断面図FIG. 5 is a sectional view of a conventional single crystal manufacturing apparatus.

【図6】従来例の単結晶製造装置の断面図FIG. 6 is a sectional view of a conventional single crystal manufacturing apparatus.

【符号の説明】[Explanation of symbols]

1 チャンバー 2 石英るつぼ 3 融液 4 ヒータ 5 引上げ軸 7 ペディスタル 8 るつぼ受け 9 黒鉛るつぼ 10 保温筒 11 カメラ 12 重量センサ 15a 上部シャフト 15b 下部シャフト 16 シードアダプタ 17 種結晶 25a 上部シャフト 25b 下部シャフト 25c 連結金具 35a 上部シャフト 35b 下部シャフト 45a 上部シャフト 45b 下部シャフト 45c 連結金具 1 chamber 2 quartz crucible 3 melt 4 heater 5 pulling shaft 7 pedestal 8 crucible receiver 9 graphite crucible 10 heat retaining cylinder 11 camera 12 weight sensor 15a upper shaft 15b lower shaft 16 seed adapter 17 seed crystal 25a upper shaft 25b lower shaft 25c connecting fitting 35a Upper shaft 35b Lower shaft 45a Upper shaft 45b Lower shaft 45c Connecting fitting

Claims (3)

【特許請求の範囲】[Claims] 【請求項1】 原料を充填するるつぼと、 前記るつぼの周りに近接して設置され、前記るつぼ内の
原料を溶融し原料融液を形成する加熱ヒ―タとを具備し
たチャンバーと、 前記るつぼ内の原料融液に引上げ軸の先端に取り付けら
れた種結晶を浸漬して単結晶を引上げる引上部と、 前記引上げ軸に取り付けられ引上げ単結晶の重量を測定
する重量センサと、 前記重量センサの測定値に基づいて引上げ速度を制御す
る制御部とを備えた半導体単結晶製造装置において、 前記引上げ軸が上部シャフトと下部シャフトとの連結体
から構成されていることを特徴とする半導体単結晶引上
げ装置。
1. A chamber provided with a crucible for filling a raw material, a heating heater installed in the vicinity of the crucible in the vicinity of the crucible and melting the raw material in the crucible to form a raw material melt, and the crucible. A pulling part for pulling a single crystal by immersing a seed crystal attached to the end of the pulling shaft in the raw material melt, a weight sensor attached to the pulling shaft for measuring the weight of the pulling single crystal, and the weight sensor In the semiconductor single crystal manufacturing apparatus having a control unit that controls the pulling rate based on the measured value of the semiconductor single crystal, the pulling shaft is composed of a connected body of an upper shaft and a lower shaft. Lifting device.
【請求項2】 前記上部シャフトと下部シャフトは着脱
自在に装着されていることを特徴とする請求項1に記載
の半導体単結晶引上げ装置。
2. The semiconductor single crystal pulling apparatus according to claim 1, wherein the upper shaft and the lower shaft are detachably mounted.
【請求項3】 前記引上げ軸が上部シャフトと前記上部
シャフトよりも径大の下部シャフトとの連結体から構成
されている特徴とする請求項1に記載の半導体単結晶引
上げ装置。
3. The semiconductor single crystal pulling apparatus according to claim 1, wherein the pulling shaft is composed of a connected body of an upper shaft and a lower shaft having a diameter larger than that of the upper shaft.
JP8218692A 1992-04-03 1992-04-03 Semiconductor single crystal pulling equipment Expired - Lifetime JP2855498B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP8218692A JP2855498B2 (en) 1992-04-03 1992-04-03 Semiconductor single crystal pulling equipment

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP8218692A JP2855498B2 (en) 1992-04-03 1992-04-03 Semiconductor single crystal pulling equipment

Publications (2)

Publication Number Publication Date
JPH05279175A true JPH05279175A (en) 1993-10-26
JP2855498B2 JP2855498B2 (en) 1999-02-10

Family

ID=13767414

Family Applications (1)

Application Number Title Priority Date Filing Date
JP8218692A Expired - Lifetime JP2855498B2 (en) 1992-04-03 1992-04-03 Semiconductor single crystal pulling equipment

Country Status (1)

Country Link
JP (1) JP2855498B2 (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN102534760A (en) * 2011-12-28 2012-07-04 苏州优晶光电科技有限公司 Device for monitoring crystal growth

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN102534760A (en) * 2011-12-28 2012-07-04 苏州优晶光电科技有限公司 Device for monitoring crystal growth

Also Published As

Publication number Publication date
JP2855498B2 (en) 1999-02-10

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