JPH05275992A - Phase difference measuring circuit system - Google Patents
Phase difference measuring circuit systemInfo
- Publication number
- JPH05275992A JPH05275992A JP3996092A JP3996092A JPH05275992A JP H05275992 A JPH05275992 A JP H05275992A JP 3996092 A JP3996092 A JP 3996092A JP 3996092 A JP3996092 A JP 3996092A JP H05275992 A JPH05275992 A JP H05275992A
- Authority
- JP
- Japan
- Prior art keywords
- phase difference
- signal
- pulse
- signals
- phase
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Landscapes
- Measuring Phase Differences (AREA)
- Manipulation Of Pulses (AREA)
Abstract
Description
【0001】[0001]
【産業上の利用分野】本発明は2つのパルス間の信号の
立ち上がりまたは立ち下がりの位相差を計測する位相差
計測回路方式に関し、特に2つのパルス間の信号の位相
差が数十ナノ秒以下に近接している場合を対象とした位
相差計測回路方式に関する。BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a phase difference measuring circuit system for measuring the phase difference between the rising and falling edges of a signal between two pulses, and more particularly, the phase difference of a signal between two pulses is several tens of nanoseconds or less. The present invention relates to a phase difference measuring circuit system for the case of being close to.
【0002】[0002]
【従来の技術】従来、2つのパルス間の信号の位相差が
数十ナノ秒以下に近接している場合にこの位相差を計測
するには、計測したい位相差以下の時間幅を周期とする
高速クロック信号で2つのパルス信号を打ち抜いて位相
差すなわち時間差を求めていた。2. Description of the Related Art Conventionally, in the case where the phase difference between signals between two pulses is close to several tens of nanoseconds or less, to measure this phase difference, a period of time less than the phase difference to be measured is set as a cycle. The two pulse signals are punched out by the high-speed clock signal to obtain the phase difference, that is, the time difference.
【0003】[0003]
【発明が解決しようとする課題】この従来の位相差計測
回路方式では、求めたい位相差の分解能を上げるために
は分解能の単位となるクロック信号の周波数と安定度を
高める必要があり、分解能として数十ナノ秒以下の値が
求められた場合のクロック周波数は数十メガヘルツ以上
が必要となる。一方、通常の電子回路で用いられている
安価で高安定な水晶発振器をクロック源に考えた場合、
最高発振周波数は高調波を逓倍したものでも現状では百
メガヘルツ付近が限界であること、また論理素子の動作
スピードも一般に使用されているTTL系またはCMO
S系の素子で現状では数十メガヘルツが限界であること
から、従来の方式における2つのパルス間の位相差の分
解能は数十ナノ秒程度が限界であり、数十ナノ秒以下に
近接している場合の位相差を計測できないという問題点
があった。In this conventional phase difference measuring circuit system, in order to increase the resolution of the desired phase difference, it is necessary to increase the frequency and stability of the clock signal which is the unit of resolution. When a value of tens of nanoseconds or less is required, a clock frequency of tens of megahertz or higher is required. On the other hand, when considering a cheap and highly stable crystal oscillator used in ordinary electronic circuits as the clock source,
Even though the maximum oscillation frequency is a multiple of harmonics, at present, the limit is around 100 megahertz, and the operating speed of logic elements is generally TTL system or CMO.
Since the S-type element is currently limited to several tens of megahertz, the resolution of the phase difference between two pulses in the conventional method is limited to about several tens of nanoseconds, and is close to several tens of nanoseconds or less. There was a problem that the phase difference when there was no measurement.
【0004】[0004]
【課題を解決するための手段】本発明の位相差計測回路
方式は、パルス信号の立ち上がりまたは立ち下がりのエ
ッジをトリガにして2つのパルス間の位相差を片方のパ
ルスの位相を基準に位相比較して結果を位相差に応じた
時間幅のパルスとして位相進み端子あるいは位相遅れ端
子に出力するパルス出力手段と、複数の中間タップ出力
を有しタップ間の規定の信号伝送遅延時間で入力信号の
遅延時間を自由に設定する遅延時間設定手段と、前記遅
延時間設定手段のタップ出力を使用して前記2つのパル
ス間の位相差が所定の範囲の中に収まっているか否かを
論理判定する判定手段とを備えている。According to the phase difference measuring circuit system of the present invention, the phase difference between two pulses is compared with the phase of one pulse as a reference by using the rising or falling edge of the pulse signal as a trigger. Then, the pulse output means for outputting the result as a pulse having a time width corresponding to the phase difference to the phase lead terminal or the phase delay terminal, and having a plurality of intermediate tap outputs and having a prescribed signal transmission delay time between taps A delay time setting means for freely setting a delay time and a tap output of the delay time setting means are used to determine logically whether or not the phase difference between the two pulses is within a predetermined range. And means.
【0005】[0005]
【実施例】次に、本発明について図面を参照して説明す
る。図1は本発明の位相差計測回路方式の一実施例の回
路図である。DESCRIPTION OF THE PREFERRED EMBODIMENTS Next, the present invention will be described with reference to the drawings. FIG. 1 is a circuit diagram of an embodiment of the phase difference measuring circuit system of the present invention.
【0006】図1において、位相差計測回路は2つのフ
リップフロップ(以下FF)11,12とANDゲート
13とから構成されるエッジトリガタイプの位相比較器
1と、遅延素子2,3と、ANDゲート43,44,4
5を組合わせて構成される論理回路4と、同様にAND
ゲート53,54,55から構成される論理回路5とを
備えている。In FIG. 1, the phase difference measuring circuit comprises an edge trigger type phase comparator 1 composed of two flip-flops (FF) 11 and 12 and an AND gate 13, delay elements 2 and 3, and an AND circuit. Gates 43,44,4
AND the same as the logic circuit 4 configured by combining 5
The logic circuit 5 includes gates 53, 54 and 55.
【0007】次に、本回路の動作について説明する。位
相差を計測したい2つのパルス信号は端子A,Bに入力
される。ここで、端子A,Bに入力される2つのパルス
信号をa,bとして、パルス信号の位相を信号の立ち上
がりまたは立ち下がりのどちらかに着目してパルス信号
aの位相がパルス信号bの位相より進んでいる場合を考
える。Next, the operation of this circuit will be described. Two pulse signals whose phase difference is to be measured are input to terminals A and B. Here, assuming that the two pulse signals input to the terminals A and B are a and b, and the phase of the pulse signal a is the phase of the pulse signal b by focusing on either the rising or falling of the signal. Consider the case where you are more advanced.
【0008】パルス信号aはFF11のクロック入力C
Kへ、パルス信号bはFF12のクロック入力CKへ入
力されており、FF11はFF12よりも先にセットさ
れ、続いてFF12がセットされることになり、FF1
1の出力QとFF12の出力Qも同様な時間差で出力が
変化する。ANDゲート13は双方のFF11,12の
出力Qがともにハイレベルとなった時点でその出力結果
であるハイレベルの信号を双方のFF11,12のリセ
ット入力Rへ出力して双方のFF11,12をリセット
する。The pulse signal a is the clock input C of the FF11.
The pulse signal b is input to the clock input CK of the FF12, the FF11 is set prior to the FF12, and the FF12 is subsequently set.
The output Q of 1 and the output Q of the FF 12 change with the same time difference. The AND gate 13 outputs a high level signal, which is the output result thereof, to the reset input R of both FFs 11 and 12 when the outputs Q of both FFs 11 and 12 become high level, and outputs both FFs 11 and 12 to each other. Reset.
【0009】従ってこの場合、図1の信号cに2つのパ
ルス信号の位相差と同じ時間幅のパルス信号が現れ、信
号dには素子間の信号遅延に起因するひげ状のパルス信
号が現れる。遅延素子2,3は同一仕様でタップ間の信
号遅延時間をtとすると、本回路では遅延時間t,2
t,3tを設定していることになる。論理回路4,5は
信号c,dそのままと、さらに遅延時間t,2t,3t
だけ遅延した信号が入力され、論理演算後、信号e,
f,g,h,i,jが出力される。従ってこの場合、パ
ルス信号a,bの位相差である信号cのパルス幅をTと
おくと、信号h,i,jはすべて変化無くローレベルと
なっているのに対し、T>3tでは信号e,f,gがす
べてハイレベル、2t<T<3tでは信号f,gがハイ
レベルで信号eのみローレベル、t<T<2tでは信号
e,fがローレベルで信号gのみハイレベル、T<tで
は信号e,f,gがすべてローレベルとなる。逆に、パ
ルス信号aの位相がパルス信号bの位相よりも遅れてい
る場合は、上記の結果とは反対に信号dに位相差分のパ
ルスが出力され信号h,i,jにパルス幅の計測結果が
出力される。Therefore, in this case, a pulse signal having the same time width as the phase difference between the two pulse signals appears in the signal c in FIG. 1, and a whisker-shaped pulse signal resulting from the signal delay between the elements appears in the signal d. If the delay elements 2 and 3 have the same specifications and the signal delay time between taps is t, in this circuit, the delay times t and 2
This means that t and 3t are set. The logic circuits 4 and 5 keep the signals c and d as they are, and further delay times t, 2t and 3t.
The signal delayed by only
f, g, h, i, j are output. Therefore, in this case, if the pulse width of the signal c, which is the phase difference between the pulse signals a and b, is set to T, the signals h, i, and j are all at the low level without any change, whereas when T> 3t. e, f, g are all high level, 2t <T <3t, signals f, g are high level and only signal e is low level, and t <T <2t, signals e, f are low level and only signal g is high level, When T <t, the signals e, f and g are all at low level. On the contrary, when the phase of the pulse signal a lags the phase of the pulse signal b, the pulse of the phase difference is output to the signal d and the pulse width is measured to the signals h, i, and j contrary to the above result. The result is output.
【0010】図2は本発明の位相差計測回路方式の一応
用例を示すブロック図である。複数の中間タップをもつ
遅延素子1001と選択回路1002から構成され信号
の遅延時間を制御する遅延時間制御ブロック100と、
位相比較器2001とローパスフィルタと電圧制御発振
器2003と分周器2004から構成される位相同期発
振ブロック200と、遅延素子300と、本発明による
位相差計測回路400と、演算処理回路500とを備え
ている。FIG. 2 is a block diagram showing an application example of the phase difference measuring circuit system of the present invention. A delay time control block 100 configured by a delay element 1001 having a plurality of intermediate taps and a selection circuit 1002 to control a delay time of a signal;
A phase-locked oscillator block 200 including a phase comparator 2001, a low-pass filter, a voltage-controlled oscillator 2003, and a frequency divider 2004, a delay element 300, a phase difference measuring circuit 400 according to the present invention, and an arithmetic processing circuit 500. ing.
【0011】本応用例の動作は、位相同期発振ブロック
200で生ずるパルス信号lとパルス信号nの間に定常
的に残ってしまう位相誤差をおおもとのパルス信号kに
制御可能な信号遅延量を加えることによって吸収し、パ
ルス信号nと基準出力信号oの間の位相差を位相差計測
回路400によって計測し、位相誤差が規定の範囲を越
えないように演算処理回路500が遅延時間制御ブロッ
ク100内の選択回路1002ヘフィードバック信号を
出力するようになっている。ここで、遅延素子300の
遅延時間は遅延時間制御ブロック100で設定可能な遅
延時間のおよそ半分の値となっている。また、位相同期
発振ブロック200は配下の装置に供給する出力クロッ
ク信号mを出力する。The operation of this application example is a signal delay amount capable of controlling the phase error, which remains in the steady state between the pulse signal 1 and the pulse signal n generated in the phase locked oscillator block 200, to the original pulse signal k. Is added, the phase difference between the pulse signal n and the reference output signal o is measured by the phase difference measuring circuit 400, and the arithmetic processing circuit 500 controls the delay time control block so that the phase error does not exceed the specified range. A feedback signal is output to the selection circuit 1002 in 100. Here, the delay time of the delay element 300 is about half the value of the delay time that can be set by the delay time control block 100. Further, the phase-locked oscillation block 200 outputs an output clock signal m to be supplied to a device under it.
【0012】[0012]
【発明の効果】以上説明したように本発明は、2つのパ
ルス間の信号の位相差が数十ナノ秒以下に近接している
場合において、2つのパルス間の信号の立ち上がりまた
は立ち下がりの位相差を特殊な素子を用いることなく計
測できるという効果を有する。As described above, according to the present invention, when the phase difference between the signals between the two pulses is close to several tens of nanoseconds or less, the rising or falling position of the signal between the two pulses is high. It has an effect that the phase difference can be measured without using a special element.
【0013】また、本発明による位相差計測回路を位相
同期発振回路の構成の中に遅延回路といっしょに取り込
むことによって位相同期発振回路で発生する定常位相誤
差を吸収できるという効果を得ることができる。Further, by incorporating the phase difference measuring circuit according to the present invention together with the delay circuit in the structure of the phase locked oscillator circuit, it is possible to obtain the effect that the steady phase error generated in the phase locked oscillator circuit can be absorbed. .
【図1】本発明の位相差計測回路方式の一実施例の回路
図である。FIG. 1 is a circuit diagram of an embodiment of a phase difference measuring circuit system according to the present invention.
【図2】本発明の位相差計測回路方式の一応用例を示す
ブロック図である。FIG. 2 is a block diagram showing an application example of a phase difference measuring circuit system of the present invention.
1 エッジトリガタイプの位相比較器 2,3,300,1001 遅延素子 4,5 論理回路 11,12 フリップフロップ(FF) 13,41,42,43,51,52,53 AND
ゲート 100 遅延時間制御ブロック 200 位相同期発振ブロック 400 位相差計測ブロック 500 演算処理回路 1002 選択回路 2001 位相比較器 2002 ローパスフィルタ 2003 電圧制御発振器 a,b,k,l,n パルス信号 c,d,e,f,g,h,i,j 出力信号 m 出力クロック信号 o 基準出力信号1 Edge Trigger Type Phase Comparator 2, 3, 300, 1001 Delay Element 4, 5 Logic Circuit 11, 12 Flip Flop (FF) 13, 41, 42, 43, 51, 52, 53 AND
Gate 100 Delay time control block 200 Phase locked oscillation block 400 Phase difference measurement block 500 Operation processing circuit 1002 Selection circuit 2001 Phase comparator 2002 Low pass filter 2003 Voltage controlled oscillator a, b, k, l, n Pulse signal c, d, e , F, g, h, i, j output signal m output clock signal o reference output signal
Claims (1)
りのエッジをトリガにして2つのパルス間の位相差を片
方のパルスの位相を基準に位相比較して結果を位相差に
応じた時間幅のパルスとして位相進み端子あるいは位相
遅れ端子に出力するパルス出力手段と、複数の中間タッ
プ出力を有しタップ間の規定の信号伝送遅延時間で入力
信号の遅延時間を自由に設定する遅延時間設定手段と、
前記遅延時間設定手段のタップ出力を使用して前記2つ
のパルス間の位相差が所定の範囲の中に収まっているか
否かを論理判定する判定手段とを備えることを特徴とす
る位相差計測回路方式。1. A rising or falling edge of a pulse signal is used as a trigger to compare the phase difference between two pulses with reference to the phase of one pulse, and the result is converted into a pulse having a time width corresponding to the phase difference. A pulse output means for outputting to a phase lead terminal or a phase delay terminal; a delay time setting means for freely setting the delay time of an input signal with a prescribed signal transmission delay time between taps having a plurality of intermediate tap outputs;
A phase difference measuring circuit comprising: a judgment unit that logically judges whether or not the phase difference between the two pulses falls within a predetermined range by using the tap output of the delay time setting unit. method.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP3996092A JPH05275992A (en) | 1992-02-27 | 1992-02-27 | Phase difference measuring circuit system |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP3996092A JPH05275992A (en) | 1992-02-27 | 1992-02-27 | Phase difference measuring circuit system |
Publications (1)
Publication Number | Publication Date |
---|---|
JPH05275992A true JPH05275992A (en) | 1993-10-22 |
Family
ID=12567528
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP3996092A Pending JPH05275992A (en) | 1992-02-27 | 1992-02-27 | Phase difference measuring circuit system |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPH05275992A (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2009135718A (en) * | 2007-11-30 | 2009-06-18 | Onkyo Corp | Switching amplifier |
Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS585673A (en) * | 1981-07-01 | 1983-01-13 | Shinko Electric Co Ltd | Measuring circuit for minute pulse width |
JPS6130814A (en) * | 1984-07-10 | 1986-02-13 | ジヨン・フリユ−ク・マニフアクチヤリング.カムパニ−,インコ−ポレ−テツド | Digital phase detector |
-
1992
- 1992-02-27 JP JP3996092A patent/JPH05275992A/en active Pending
Patent Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS585673A (en) * | 1981-07-01 | 1983-01-13 | Shinko Electric Co Ltd | Measuring circuit for minute pulse width |
JPS6130814A (en) * | 1984-07-10 | 1986-02-13 | ジヨン・フリユ−ク・マニフアクチヤリング.カムパニ−,インコ−ポレ−テツド | Digital phase detector |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2009135718A (en) * | 2007-11-30 | 2009-06-18 | Onkyo Corp | Switching amplifier |
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Legal Events
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A02 | Decision of refusal |
Free format text: JAPANESE INTERMEDIATE CODE: A02 Effective date: 19980707 |