JPH0527196B2 - - Google Patents

Info

Publication number
JPH0527196B2
JPH0527196B2 JP58244119A JP24411983A JPH0527196B2 JP H0527196 B2 JPH0527196 B2 JP H0527196B2 JP 58244119 A JP58244119 A JP 58244119A JP 24411983 A JP24411983 A JP 24411983A JP H0527196 B2 JPH0527196 B2 JP H0527196B2
Authority
JP
Japan
Prior art keywords
data
memory
address
test data
written
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP58244119A
Other languages
English (en)
Japanese (ja)
Other versions
JPS60136997A (ja
Inventor
Yoshio Kaneko
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toshiba Corp
Original Assignee
Tokyo Shibaura Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Tokyo Shibaura Electric Co Ltd filed Critical Tokyo Shibaura Electric Co Ltd
Priority to JP58244119A priority Critical patent/JPS60136997A/ja
Publication of JPS60136997A publication Critical patent/JPS60136997A/ja
Publication of JPH0527196B2 publication Critical patent/JPH0527196B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/56—External testing equipment for static stores, e.g. automatic test equipment [ATE]; Interfaces therefor

Landscapes

  • Tests Of Electronic Circuits (AREA)
  • Techniques For Improving Reliability Of Storages (AREA)
  • For Increasing The Reliability Of Semiconductor Memories (AREA)
JP58244119A 1983-12-26 1983-12-26 メモリ試験装置 Granted JPS60136997A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP58244119A JPS60136997A (ja) 1983-12-26 1983-12-26 メモリ試験装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP58244119A JPS60136997A (ja) 1983-12-26 1983-12-26 メモリ試験装置

Publications (2)

Publication Number Publication Date
JPS60136997A JPS60136997A (ja) 1985-07-20
JPH0527196B2 true JPH0527196B2 (enrdf_load_stackoverflow) 1993-04-20

Family

ID=17114040

Family Applications (1)

Application Number Title Priority Date Filing Date
JP58244119A Granted JPS60136997A (ja) 1983-12-26 1983-12-26 メモリ試験装置

Country Status (1)

Country Link
JP (1) JPS60136997A (enrdf_load_stackoverflow)

Also Published As

Publication number Publication date
JPS60136997A (ja) 1985-07-20

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