JPH05264082A - Air-supplying device for clean room - Google Patents

Air-supplying device for clean room

Info

Publication number
JPH05264082A
JPH05264082A JP5858592A JP5858592A JPH05264082A JP H05264082 A JPH05264082 A JP H05264082A JP 5858592 A JP5858592 A JP 5858592A JP 5858592 A JP5858592 A JP 5858592A JP H05264082 A JPH05264082 A JP H05264082A
Authority
JP
Japan
Prior art keywords
air
clean room
cleaning
clean
air supply
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP5858592A
Other languages
Japanese (ja)
Other versions
JP3163722B2 (en
Inventor
Koji Nomaki
宏治 野牧
Koji Iizuka
廣治 飯塚
Shunji Kumakura
俊二 熊倉
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fujitsu Ltd
Original Assignee
Fujitsu Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fujitsu Ltd filed Critical Fujitsu Ltd
Priority to JP05858592A priority Critical patent/JP3163722B2/en
Publication of JPH05264082A publication Critical patent/JPH05264082A/en
Application granted granted Critical
Publication of JP3163722B2 publication Critical patent/JP3163722B2/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

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Abstract

PURPOSE:To enable efficiently purifying air to a high level with respect to the constitution of a device for supplying purified air to a clean room where semiconductor devices or the like are manufactured. CONSTITUTION:Outdoor air is conveyed by a first air supply line 13 and through a first purifying means 11, whose level of purification is high, to a first clean room 1; part of the exhaust air is conveyed by a first return air line 14 and through the first purifying means 11 returned to the first clean room 1; the rest of the air is conveyed by a second air supply line 16 and through a means of checking 15 and through a second purifying means 12, whose level of purification is lower than the first purifying means 11, to a second clean room 2; part of the exhaust air from the second clean room 2 is conveyed by a second return air line 17 and through the second purifying means 12 returned to the second clean room 2.

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【産業上の利用分野】本発明は半導体装置等の製造を行
うクリーンルームに清浄化空気を供給する装置の構成に
関する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a structure of an apparatus for supplying purified air to a clean room for manufacturing semiconductor devices and the like.

【0002】近年、半導体装置は高集積・高密度化の要
求に対応してパターンの微細化が進められ、それを製造
するクリーンルームの空気清浄度に対する要求が厳しさ
を増している。パーティクルに関しては0.1μm で評価
されるようになり、更に分子汚染の制御も必要となって
いる。一方、このような要求を満足するクリーンルーム
を実現させる清浄化空気給気装置の設備費や動力費が膨
大となっている。そのため、高レベルの清浄化空気を効
率良くクリーンルームに供給することが可能な給気装置
が望まれている。
In recent years, semiconductor devices have been made finer in pattern in response to the demand for higher integration and higher density, and the demand for air cleanliness of a clean room for manufacturing the same has become more severe. Particles have come to be evaluated at 0.1 μm, and it is also necessary to control molecular contamination. On the other hand, the equipment cost and power cost of the purified air supply device for realizing a clean room satisfying such requirements are enormous. Therefore, an air supply device capable of efficiently supplying a high level of purified air to a clean room is desired.

【0003】[0003]

【従来の技術】クリーンルーム用給気装置の従来例を図
3を参照しながら説明する。図3は従来例の概念を示す
図である。同図において、図1と同じものには同一の符
号を付与した。この例は、高度の清浄度を要する第一の
クリーンルーム1(例えばウェーハ処理室)と、これよ
り必要清浄度が低い第二のクリーンルーム2(例えばメ
ンテナンス室)とが隣接しており、又、いずれもダウン
フロー式クリーンルームであり、これらの上方は一つの
天井チャンバ(図示は省略)となり、下方は一つの床下
チャンバ(図示は省略)となっている場合の、両クリー
ンルームに清浄化空気を供給する装置である。
2. Description of the Related Art A conventional example of a clean room air supply device will be described with reference to FIG. FIG. 3 is a diagram showing the concept of the conventional example. In the figure, the same components as those in FIG. 1 are designated by the same reference numerals. In this example, a first clean room 1 (for example, a wafer processing room) that requires a high degree of cleanliness and a second clean room 2 (for example, a maintenance room) that requires a lower degree of cleanliness are adjacent to each other. Is also a down-flow type clean room, and the upper part of them is one ceiling chamber (not shown), and the lower part is one underfloor chamber (not shown), and clean air is supplied to both clean rooms. It is a device.

【0004】この装置は空気の流れが次のようになるよ
うに構成されている。外気は外気処理装置31により吸引
され、清浄化と温湿度調整がなされた後、天井チャンバ
に送られる。次にここから高度の清浄化が可能な第一の
清浄化手段11(例えばULPAフィルタ)を経て第一の
クリーンルーム1に給気されると共に、第一の清浄化手
段11より清浄化レベルが低い第二の清浄化手段12(例え
ばHEPAフィルタ)を経て第二のクリーンルーム2に
給気される。これらのクリーンルームを通過した空気は
床下チャンバに入る。その後、一部は排気され、残部は
空調機32により冷却され、更にフィルタ33により清浄化
された後、給気側(即ち天井チャンバ)に戻される。
This device is constructed so that the air flow is as follows. The outside air is sucked in by the outside air processing device 31, cleaned, adjusted in temperature and humidity, and then sent to the ceiling chamber. Next, the air is supplied to the first clean room 1 through the first cleaning means 11 (for example, ULPA filter) capable of high-level cleaning, and the cleaning level is lower than that of the first cleaning means 11. Air is supplied to the second clean room 2 through the second cleaning means 12 (for example, HEPA filter). Air passing through these clean rooms enters the underfloor chamber. After that, a part is exhausted, the rest is cooled by the air conditioner 32, further cleaned by the filter 33, and then returned to the air supply side (that is, the ceiling chamber).

【0005】[0005]

【発明が解決しようとする課題】ところが、このような
従来のクリーンルーム用給気装置では、第一のクリーン
ルームを通過した空気と第二のクリーンルームを通過し
た空気とが床下チャンバで混合されるから、この空気の
清浄度低下、特に分子汚染が著しい上、一般的には温度
上昇も著しい。従って、これを給気側に戻して再利用す
るには大規模の装置を必要としていた。又、外気処理装
置は第一のクリーンルームと第二のクリーンルームの双
方に給気する外気を処理するから、大容量の装置とな
り、多大の設備費、動力費を要していた。
However, in such a conventional air supply device for a clean room, since the air passing through the first clean room and the air passing through the second clean room are mixed in the underfloor chamber, This decrease in the cleanliness of the air, in particular, the molecular contamination is remarkable, and generally the temperature is also remarkable. Therefore, a large-scale device was required to return this to the air supply side and reuse it. Further, since the outside air processing device processes the outside air supplied to both the first clean room and the second clean room, it becomes a large-capacity device and requires a great deal of equipment cost and power cost.

【0006】本発明はこのような問題を解決して、高レ
ベルの空気清浄化を効率良く行うことが可能なクリーン
ルーム用給気装置を提供することを目的とする。
An object of the present invention is to solve the above problems and to provide a clean room air supply device capable of efficiently performing a high level of air cleaning.

【0007】[0007]

【課題を解決するための手段】この目的を達成する手段
を、図1を参照しながら説明する。図1は本発明の概念
を示す図である。
Means for achieving this object will be described with reference to FIG. FIG. 1 is a diagram showing the concept of the present invention.

【0008】この目的は、本発明によれば、高度の清浄
度を必要とする第一のクリーンルーム1と該第一のクリ
ーンルーム1より必要清浄度が低位の第二のクリーンル
ーム2とを含む複数のクリーンルームに清浄化空気を供
給する装置において、外気を吸引して清浄化レベルが高
位の第一の清浄化手段11を介して第一のクリーンルーム
1へ給気する第一の給気路13と、該第一のクリーンルー
ム1から排出される空気の一部を該第一の清浄化手段11
を介して該第一のクリーンルーム1に還気する第一の還
気路14と、該第一のクリーンルーム1から排出される空
気の残部を逆止め手段15及び清浄化レベルが該第一の清
浄化手段11より低位の第二の清浄化手段12を介して第二
のクリーンルーム2に給気する第二の給気路16とを有
し、該第二のクリーンルーム2から排出される空気は該
第一のクリーンルーム1を介することなく装置外に排出
されることを特徴とするクリーンルーム用給気装置とす
ることで、達成される。
According to the present invention, a plurality of objects including a first clean room 1 requiring a high degree of cleanliness and a second clean room 2 having a required cleanliness lower than that of the first clean room 1 are provided. In a device for supplying purified air to a clean room, a first air supply passage 13 for sucking outside air to supply air to the first clean room 1 via a first cleaning means 11 having a high cleaning level. A part of the air discharged from the first clean room 1 is replaced with the first cleaning means 11
The first return air passage 14 for returning the air to the first clean room 1 via the first clean room 1 and the rest of the air discharged from the first clean room 1 by the check means 15 and the cleaning level of the first cleaning. And a second air supply passage 16 for supplying air to the second clean room 2 through the second cleaning means 12 which is lower than the air purification means 11, and the air discharged from the second clean room 2 is This is achieved by providing a clean room air supply device characterized in that the air is discharged outside the device without passing through the first clean room 1.

【0009】[0009]

【作用】本発明のクリーンルーム用給気装置では、清浄
度が上位レベルのクリーンルームへはそのクリーンルー
ムを通過した空気だけを還風し、下位レベルのクリーン
ルームを通過した空気は混入されず、又、清浄度が上位
レベルのクリーンルームを通過した空気を下位レベルの
クリーンルームに送る給気路には逆止め手段が挿入され
ているから、清浄度が上位レベルのクリーンルームへ還
風される空気は元々清浄度が比較的高く(一般的には温
度変化も比較的小さい)、これを清浄化するフィルタ
(及びこれを冷却する空調機)は小規模でよいか、不要
となる。又、分子汚染制御も比較的容易に行なえる。更
に、外気処理装置は清浄度が上位レベルのクリーンルー
ムへの給気分だけを処理すればよいから、小容量の装置
でよい。従って、高レベルの空気清浄化を効率良く行う
ことが可能となる。
In the clean room air supply device of the present invention, only the air that has passed through the clean room is returned to the clean room having the higher cleanliness level, and the air that has passed through the lower clean room is not mixed and is clean. Since a non-return device is inserted in the air supply path that sends the air that has passed through the clean room of the higher level to the clean room of the lower level, the air returned to the clean room of the higher level originally has the cleanliness. The filter is relatively high (generally, the temperature change is also relatively small), and a filter (and an air conditioner for cooling the same) for cleaning the filter may be small or unnecessary. In addition, molecular contamination control can be performed relatively easily. Furthermore, since the outside air treatment device only needs to treat the mood of a clean room with a high degree of cleanliness, it can be a small capacity device. Therefore, it becomes possible to efficiently perform high-level air cleaning.

【0010】[0010]

【実施例】本発明に係るクリーンルーム用給気装置の実
施例を図2を参照しながら説明する。図2は本発明の実
施例の説明図であり、装置の構成を隣接する二つのダウ
ンフロー式クリーンルームと共に示している。尚、同図
中、図1と同じものには同一の符号を付与した。
DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS An embodiment of a clean room air supply device according to the present invention will be described with reference to FIG. FIG. 2 is an explanatory view of an embodiment of the present invention, showing the configuration of the apparatus together with two adjacent downflow type clean rooms. In the figure, the same parts as those in FIG. 1 are designated by the same reference numerals.

【0011】第一のクリーンルーム1は、例えばウェー
ハ処理室であり、高度の空気清浄度を必要とする。第二
のクリーンルーム2は、例えばメンテナンス室(ウェー
ハ処理装置の付属設備が設置され、且つウェーハ処理装
置のメンテナンスを行う)であり、第一のクリーンルー
ム1より低レベルの空気清浄度を必要とする。第一のク
リーンルーム1の上方は第一の天井チャンバ1a、下方は
第一の床下チャンバ1bとなっており、又、第二のクリー
ンルーム2の上方は第二の天井チャンバ2a、下方は第二
の床下チャンバ2bとなっている。
The first clean room 1 is, for example, a wafer processing room and requires a high degree of air cleanliness. The second clean room 2 is, for example, a maintenance room (where the auxiliary equipment of the wafer processing apparatus is installed and the wafer processing apparatus is maintained), and requires a lower level of air cleanliness than the first clean room 1. The upper part of the first clean room 1 is a first ceiling chamber 1a and the lower part is a first underfloor chamber 1b. The upper part of the second clean room 2 is a second ceiling chamber 2a and the lower part is a second ceiling chamber 2a. It is the underfloor chamber 2b.

【0012】第一の清浄化手段11は超高性能フィルタ
(ULPAフィルタ)とファンからなるフィルタユニッ
トであり、多数のこのフィルタユニットが第一のクリー
ンルーム1の天井を構成している。第二の清浄化手段12
は高性能フィルタ(HEPAフィルタ)であり、第二の
クリーンルーム2の天井には多数の第二の清浄化手段12
が取り付けられている。
The first cleaning means 11 is a filter unit consisting of an ultra-high performance filter (ULPA filter) and a fan, and a large number of these filter units constitute the ceiling of the first clean room 1. Second cleaning means 12
Is a high performance filter (HEPA filter), and a large number of second cleaning means 12 are provided on the ceiling of the second clean room 2.
Is attached.

【0013】第一の給気路13は外気取入れ口(図示は省
略)から外気処理装置21を経て第一の天井チャンバ1aに
至るダクトからなる。第一の還気路14は第一の床下チャ
ンバ1bから空調機22及び特殊フィルタ23を経て第一の天
井チャンバ1aに至るダクトと送風機からなる。逆止め手
段15はチャッキダンパであり、空気の逆流を防止する。
第二の給気路16は第一の床下チャンバ1bから逆止め手段
15を経て第二の天井チャンバ1bに至るダクトと送風機か
らなる。第二の還気路17は第二の床下チャンバ2bから空
調機24を経て第二の天井チャンバ1bに至るダクトと送風
機からなる。
The first air supply passage 13 is composed of a duct extending from an outside air intake (not shown) to the first ceiling chamber 1a via the outside air treatment device 21. The first return air passage 14 is composed of a duct and a blower from the first underfloor chamber 1b to the first ceiling chamber 1a via the air conditioner 22 and the special filter 23. The check means 15 is a check damper and prevents the backflow of air.
The second air supply passage 16 is a check means from the first underfloor chamber 1b.
It consists of a duct and a blower that goes through 15 to the second ceiling chamber 1b. The second return air passage 17 is composed of a duct and a blower from the second underfloor chamber 2b to the second ceiling chamber 1b via the air conditioner 24.

【0014】外気処理装置21は空気洗浄機、プレフィル
タ、中性能フィルタ、高性能フィルタ、空調機、送風機
等からなり、外気の吸引、清浄化、温湿度制御、送風を
行う。空調機22及び24はそれぞれ第一の還気路14及び第
二の還気路17の空気を所望の温度に冷却する。特殊フィ
ルタ23は活性炭等に汚染分子を吸着させる分子汚染用フ
ィルタである。
The outside air processing device 21 is composed of an air cleaner, a pre-filter, a medium performance filter, a high performance filter, an air conditioner, a blower, etc., and performs suction, cleaning, temperature / humidity control, and blowing of the outside air. The air conditioners 22 and 24 cool the air in the first return air passage 14 and the second return air passage 17, respectively, to a desired temperature. The special filter 23 is a molecular contamination filter that adsorbs contaminant molecules on activated carbon or the like.

【0015】次に、この給気装置における空気の流れを
説明する。先ず外気が外気処理装置21に吸引され、清浄
化、温湿度調整がなされて第一の天井チャンバ1aに送風
される。次に第一の清浄化手段11により所望の清浄度に
清浄化され、第一のクリーンルーム1を垂直層流となっ
て通過し、若干汚染すると共に若干昇温して第一の床下
チャンバ1bに入る。その後この空気は、一部が冷却及び
清浄化されて再び第一の天井チャンバ1aに送風され、残
部は逆止め手段15を経て第二の天井チャンバ2aに送風さ
れる。
Next, the flow of air in this air supply device will be described. First, the outside air is sucked into the outside air processing device 21, cleaned, adjusted in temperature and humidity, and sent to the first ceiling chamber 1a. Next, it is cleaned to a desired cleanliness by the first cleaning means 11, passes through the first clean room 1 as a vertical laminar flow, is slightly contaminated, and is slightly heated to the first underfloor chamber 1b. enter. After that, a part of this air is cooled and cleaned and is blown again to the first ceiling chamber 1a, and the rest is blown to the second ceiling chamber 2a through the non-return means 15.

【0016】第二の天井チャンバ2a内の空気は第二の清
浄化手段12により所望の清浄度に清浄化され、第二のク
リーンルーム2を垂直層流となって通過し、若干汚染す
ると共に若干昇温して第二の床下チャンバ2bに入る。そ
の後この空気は、一部が冷却されて再び第二の天井チャ
ンバ2aに送風され、残部は排気として外気中に放出され
るか、各クリーンルーム内に設置されている生産設備類
内に排熱・排ガス等のために送られたのち外気中に放出
されるか、或いは第二のクリーンルーム2により更に必
要清浄度の低い部屋に送られる。
The air in the second ceiling chamber 2a is cleaned by the second cleaning means 12 to a desired cleanliness level, passes through the second clean room 2 as a vertical laminar flow, and is slightly polluted and slightly polluted. The temperature rises and enters the second underfloor chamber 2b. After that, a part of this air is cooled and blown again to the second ceiling chamber 2a, and the rest is discharged to the outside air as exhaust gas, or exhaust heat is generated in the production equipment installed in each clean room. After being sent for exhaust gas or the like, it is discharged to the outside air, or is sent by the second clean room 2 to a room having a lower required cleanliness.

【0017】本発明は以上の実施例に限定されることな
く、更に種々変形して実施することが出来る。例えば、
各給気路、還気路に必要に応じて空調機、フィルタを追
加若しくは削除しても、本発明は有効である。
The present invention is not limited to the above embodiments, but can be implemented with various modifications. For example,
The present invention is effective even if an air conditioner and a filter are added to or removed from each air supply passage and return air passage as needed.

【0018】[0018]

【発明の効果】以上説明したように、本発明によれば、
清浄度が上位レベルのクリーンルームの排気を清浄度が
下位レベルのクリーンルームに逆止め手段を介して供給
すると共に、下位レベルのクリーンルームの排気を清浄
度が上位レベルのクリーンルームに還風することがない
から、高レベルの空気清浄化を効率良く行うことが可能
なクリーンルーム用給気装置を提供することが出来、半
導体装置製造におけるコストの低減、歩留り向上等に寄
与する。
As described above, according to the present invention,
Exhaust gas from a clean room with a higher cleanliness level is supplied to a clean room with a lower cleanliness level through a non-return means, and exhaust gas from a lower clean room does not return to a clean room with a higher clean level. A clean room air supply device capable of efficiently performing high-level air cleaning can be provided, which contributes to cost reduction in semiconductor device manufacturing, yield improvement, and the like.

【図面の簡単な説明】[Brief description of drawings]

【図1】 本発明の概念を示す図である。FIG. 1 is a diagram showing the concept of the present invention.

【図2】 本発明の実施例の説明図である。FIG. 2 is an explanatory diagram of an example of the present invention.

【図3】 従来例の概念を示す図である。FIG. 3 is a diagram showing a concept of a conventional example.

【符号の説明】[Explanation of symbols]

1 第一のクリーンルーム 1a 第一の天井チャンバ 1b 第一の床下チャンバ 2 第二のクリーンルーム 2a 第二の天井チャンバ 2b 第二の床下チャンバ 11 第一の清浄化手段 12 第二の清浄化手段 13 第一の給気路 14 第一の還気路 15 逆止め手段 16 第二の給気路 17 第二の還気路 21, 31 外気処理装置 22, 24, 32 空調機 23 特殊フィルタ 33 フィルタ 1 1st clean room 1a 1st ceiling chamber 1b 1st underfloor chamber 2 2nd clean room 2a 2nd ceiling chamber 2b 2nd underfloor chamber 11 1st cleaning means 12 2nd cleaning means 13 1st First air supply passage 14 First return air passage 15 Non-return means 16 Second air supply passage 17 Second return air passage 21, 31 Outside air treatment device 22, 24, 32 Air conditioner 23 Special filter 33 Filter

Claims (2)

【特許請求の範囲】[Claims] 【請求項1】 高度の清浄度を必要とする第一のクリー
ンルーム(1) と該第一のクリーンルーム(1) より必要清
浄度が低位の第二のクリーンルーム(2) とを含む複数の
クリーンルームに清浄化空気を供給する装置において、 外気を吸引して清浄化レベルが高位の第一の清浄化手段
(11)を介して該第一のクリーンルーム(1) へ給気する第
一の給気路(13)と、 該第一のクリーンルーム(1) から排出される空気の一部
を該第一の清浄化手段(11)を介して該第一のクリーンル
ーム(1) に還気する第一の還気路(14)と、 該第一のクリーンルーム(1) から排出される空気の残部
を逆止め手段(15)及び清浄化レベルが該第一の清浄化手
段(11)より低位の第二の清浄化手段(12)を介して第二の
クリーンルーム(2) に給気する第二の給気路(16)とを有
することを特徴とするクリーンルーム用給気装置。
1. A plurality of clean rooms including a first clean room (1) requiring a high degree of cleanliness and a second clean room (2) having a lower required cleanliness than the first clean room (1). In the device that supplies purified air, the first cleaning means that sucks outside air and has a high cleaning level.
A first air supply passage (13) for supplying air to the first clean room (1) via (11) and a part of the air discharged from the first clean room (1) The first return air passage (14) returning to the first clean room (1) through the cleaning means (11) and the rest of the air discharged from the first clean room (1) are reversed. A second air supply for supplying air to the second clean room (2) via the means (15) and the second cleaning means (12) having a cleaning level lower than that of the first cleaning means (11). An air supply device for a clean room, characterized in that it has a passage (16).
【請求項2】 前記第二のクリーンルーム(2) から排出
される空気は前記第一のクリーンルーム(1) を介するこ
となく装置外に排出されることを特徴とする請求項1記
載のクリーンルーム用給気装置。
2. The clean room supply according to claim 1, wherein the air discharged from the second clean room (2) is discharged outside the apparatus without passing through the first clean room (1). Qi device.
JP05858592A 1992-03-17 1992-03-17 Air supply system for clean room Expired - Fee Related JP3163722B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP05858592A JP3163722B2 (en) 1992-03-17 1992-03-17 Air supply system for clean room

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP05858592A JP3163722B2 (en) 1992-03-17 1992-03-17 Air supply system for clean room

Publications (2)

Publication Number Publication Date
JPH05264082A true JPH05264082A (en) 1993-10-12
JP3163722B2 JP3163722B2 (en) 2001-05-08

Family

ID=13088549

Family Applications (1)

Application Number Title Priority Date Filing Date
JP05858592A Expired - Fee Related JP3163722B2 (en) 1992-03-17 1992-03-17 Air supply system for clean room

Country Status (1)

Country Link
JP (1) JP3163722B2 (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2006029606A (en) * 2004-07-12 2006-02-02 Ryoshin:Kk Clean room
JP2006094754A (en) * 2004-09-29 2006-04-13 Sanyo Electric Co Ltd Cell culture facility
JP2007115389A (en) * 2005-09-26 2007-05-10 Hoya Corp Method of manufacturing magnetic disk glass substrate and method of manufacturing magnetic disk

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2006029606A (en) * 2004-07-12 2006-02-02 Ryoshin:Kk Clean room
JP2006094754A (en) * 2004-09-29 2006-04-13 Sanyo Electric Co Ltd Cell culture facility
JP4632737B2 (en) * 2004-09-29 2011-02-16 三洋電機株式会社 Cell culture facility
JP2007115389A (en) * 2005-09-26 2007-05-10 Hoya Corp Method of manufacturing magnetic disk glass substrate and method of manufacturing magnetic disk

Also Published As

Publication number Publication date
JP3163722B2 (en) 2001-05-08

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