JPH05235149A - Adhesion-preventive plate and inner jig - Google Patents

Adhesion-preventive plate and inner jig

Info

Publication number
JPH05235149A
JPH05235149A JP3475992A JP3475992A JPH05235149A JP H05235149 A JPH05235149 A JP H05235149A JP 3475992 A JP3475992 A JP 3475992A JP 3475992 A JP3475992 A JP 3475992A JP H05235149 A JPH05235149 A JP H05235149A
Authority
JP
Japan
Prior art keywords
adhesion
film
sic
roughness
plate
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP3475992A
Other languages
Japanese (ja)
Inventor
Tomoji Watanabe
友治 渡辺
Shigeya Mori
重哉 森
Katsuya Okumura
勝弥 奥村
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toshiba Corp
Original Assignee
Toshiba Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Toshiba Corp filed Critical Toshiba Corp
Priority to JP3475992A priority Critical patent/JPH05235149A/en
Publication of JPH05235149A publication Critical patent/JPH05235149A/en
Pending legal-status Critical Current

Links

Abstract

PURPOSE:To obtain an adhesion-preventive plate which is scarcely peeled even on film having a strong internal stress to be adhered, has small discharge gas and a light weight by exposing an SiO layer having surface roughness on its surface and specifying the thickness of an SiC layer and the roughness. CONSTITUTION:A surface of an adhesion-preventive plate made of silicon carbide (SiC) is roughed, for example, to roughness of 10-100mum by mechanical machining such as blasting for deleting the surface by injecting alumina particles. Further, a high density SiC layer 13 having a uniform thickness of 100-1000mum is provided on the surface by a CVD method. Graphite is used as a base material of an adhesion-preventing agent, and the adhesion-preventing agent coated with SiC may be used as a base on a surface of the base material. Thus, it is scarcely peeled even on a film having a strong internal stress to be adhered.

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【産業上の利用分野】本発明は薄膜形成装置の形成チャ
ンバ内に設けられ、所望する薄膜形成領域以外の部分を
覆う防着板及び内部治具の改良に関する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to an improvement of an adhesion preventive plate and an internal jig which are provided in a forming chamber of a thin film forming apparatus and cover a portion other than a desired thin film forming region.

【0002】[0002]

【従来の技術】一般に半導体集積回路装置等を製造する
際に、基板等に薄膜を形成するスパッタリング装置やC
VD装置等の薄膜形成装置がある。
2. Description of the Related Art Generally, when manufacturing a semiconductor integrated circuit device or the like, a sputtering apparatus or C for forming a thin film on a substrate or the like.
There is a thin film forming apparatus such as a VD apparatus.

【0003】図3には、一般的なスパッタリング装置の
構造を示す。スパッタリング装置のチャンバ1内には、
上部にターゲット2が取り付けられた上部電極3が吊り
下げられ、これと対向するように、下部には被処理基板
5を載置する下部電極6が設けられている。前記上部電
極3と下部電極6の間には、所定プロセスガスを導入し
た雰囲気領域を形成し、その雰囲気内で下部電極6上に
被処理基板5を置き、プラズマを発生させて、被処理基
板5に薄膜を形成している。
FIG. 3 shows the structure of a general sputtering apparatus. In the chamber 1 of the sputtering device,
An upper electrode 3 having a target 2 attached thereto is suspended, and a lower electrode 6 on which a substrate 5 to be processed is placed is provided in the lower portion so as to face the upper electrode 3. An atmosphere region into which a predetermined process gas is introduced is formed between the upper electrode 3 and the lower electrode 6, and the substrate 5 to be processed is placed on the lower electrode 6 in the atmosphere to generate plasma to generate a substrate to be processed. A thin film is formed on No. 5.

【0004】この薄膜を形成する時には、前記チャンバ
内の被処理基板以外にも所定雰囲気領域に接する壁面、
シャッタ7等の内部治具、搬送機構等にも不所望な薄膜
(以下、付着膜と称する)が形成される。これを防止す
るために、前記チャンバ1内の所望箇所を覆うように、
防着板8を設けている。一般的に、このような防着板や
シャッタ等は、耐熱、強度、放出ガス等を考慮して、ス
テンレス材により作られている。
When forming this thin film, in addition to the substrate to be processed in the chamber, a wall surface in contact with a predetermined atmosphere region,
An undesired thin film (hereinafter referred to as an adhering film) is also formed on an internal jig such as the shutter 7 and the transport mechanism. In order to prevent this, so as to cover a desired portion in the chamber 1,
A deposition preventive plate 8 is provided. Generally, such a deposition preventive plate, a shutter and the like are made of a stainless material in consideration of heat resistance, strength, released gas and the like.

【0005】従って、このようなスパッタ装置に、M
o,Ti等の高融点金属のターゲットを装着し、雰囲気
に酸素や窒素等のプロセスガスを導入し、ホウ化物炭化
物,窒化物,酸化物,ケイ化物等の薄膜を被処理基板に
形成した場合には、前記防着板8にも高融点金属の付着
膜が形成される。
Therefore, in such a sputtering apparatus, M
When a target made of refractory metal such as o or Ti is mounted and a process gas such as oxygen or nitrogen is introduced into the atmosphere to form a thin film of boride carbide, nitride, oxide or silicide on the substrate to be processed. In this case, an adhesion film of a high melting point metal is also formed on the adhesion preventing plate 8.

【0006】前記防着板8と内部治具の表面は、ブラス
ト処理等により粗度をつけて、膜剥がれが発生し難いよ
うにしているが、特に高融点金属の付着膜は、ステンレ
ス材に融着せず、単に付着しているため剥離しやすい。
The surfaces of the deposition preventive plate 8 and the internal jig are roughened by blasting or the like so that film peeling is less likely to occur. Particularly, the high melting point metal adhesion film is made of stainless steel. It is not fused and is simply attached, so it is easy to peel off.

【0007】また被処理基板装着時,脱着時には、チャ
ンバ1内が大気に晒され、その付着面に急俊な温度変化
が繰返し与えられるため、高融点金属の付着膜の内部応
力やステンレス材との熱膨脹係数の違いから、付着した
膜の剥離が発生する。図4には、シャッタ板に付着膜が
数10μm程度付着した場合の膜剥離を示す図である。
When the substrate to be processed is attached or detached, the inside of the chamber 1 is exposed to the atmosphere, and a rapid temperature change is repeatedly applied to the adhered surface thereof. Due to the difference in the coefficient of thermal expansion of, the peeling of the adhered film occurs. FIG. 4 is a diagram showing film peeling when the adhered film adheres to the shutter plate by about several tens of μm.

【0008】通常、薄膜形成の際には、窒素雰囲気下で
両電極間にプラズマを発生(プリスパッタ)させた後、
シャッタ板7が回動され、被処理基板上に薄膜形成が開
始される。そのために、図示するようにシャッタ板7の
表面には、TiN膜9(30μm)が形成され、前述し
たような外因等により、ひび割れ9a、剥離膜9bが発
生する。
Usually, when forming a thin film, after plasma is generated (pre-sputtering) between both electrodes in a nitrogen atmosphere,
The shutter plate 7 is rotated, and thin film formation is started on the substrate to be processed. Therefore, as shown in the drawing, the TiN film 9 (30 μm) is formed on the surface of the shutter plate 7, and the crack 9a and the peeling film 9b are generated due to the external factors as described above.

【0009】一旦、剥離した高融点金属の付着膜は、ア
ルミニウム等に比べて、細かな小片になりやすく、各機
構部を動作させる毎に、浮遊あるいは移動して、被処理
基板の処理面に付着する。
The film of the high melting point metal that has been once peeled off is more likely to be a small piece than aluminum or the like, and floats or moves every time each mechanical section is operated, so that it adheres to the processed surface of the substrate to be processed. Adhere to.

【0010】この他に、表面粗度を付ける技術として、
モリブデン(Mo)溶射法が挙げられ、これは防着板と
内部治具にモリブデンを溶射して、その表面に多孔質の
構造の層を形成して、その層に付着させて剥離し難くく
している。
In addition to this, as a technique for imparting surface roughness,
The molybdenum (Mo) spraying method can be mentioned, which is a method of spraying molybdenum on an adhesion-preventing plate and an internal jig to form a layer having a porous structure on the surface and making it adhere to the layer to make it difficult to peel off. ing.

【0011】いずれの手法も付着膜を剥離し難くさせて
いるのみなので、前記防着板、内部治具に形成される付
着膜が剥離する前に、防着板、内部治具の洗浄を行っ
て、前記付着膜を除去していた。
Since all of the methods only make it difficult to remove the adhesion film, the adhesion prevention plate and the internal jig are washed before the adhesion film formed on the adhesion preventing plate and the internal jig is separated. Then, the adhered film was removed.

【0012】[0012]

【発明が解決しようとする課題】しかし、前述した防着
板、内部治具の洗浄においては、繰り返し洗浄される
と、その凹凸を有する表面は徐々になめらかになり、前
回使用したよりも膜剥がれが発生し易くなってくる。従
って、表面粗度を付けなおす必要があり、洗浄以外のブ
ラスト処理工程等も含められ、洗浄工程が繁雑になって
いた。しかも、生産等により薄膜の形成する量が多いほ
ど、洗浄するサイクル(メンテナンスサイクル)が早く
なる。
However, in the above-mentioned cleaning of the adhesion-preventing plate and the internal jig, when repeatedly cleaned, the surface having the unevenness becomes gradually smoother, and the film peeling than that used last time. Is more likely to occur. Therefore, it is necessary to reapply the surface roughness, and the blasting process and the like other than the cleaning are included, and the cleaning process is complicated. In addition, the cleaning cycle (maintenance cycle) becomes faster as the amount of thin film formed by production increases.

【0013】また、薄膜形成装置が真空状態を雰囲気と
して利用し薄膜形成する装置であれば、基板装着時、脱
着時にチャンバ内が大気に晒され、その大気に含まれる
ガスや水が防着板に吸着する。このチャンバ内を、例え
ば真空度を到達真空度まで排気する場合に、吸着したガ
スや水が多いほど放出量があるため、排気時間が長くな
る。
Further, if the thin film forming apparatus is an apparatus for forming a thin film by utilizing a vacuum state as an atmosphere, the inside of the chamber is exposed to the atmosphere when the substrate is mounted and demounted, and the gas and water contained in the atmosphere are attached to the deposition preventive plate. Adsorb to. When the inside of this chamber is evacuated to the ultimate vacuum, for example, the more the adsorbed gas and water, the more the released amount, and thus the evacuation time becomes longer.

【0014】従って、防着板、内部治具の洗浄のための
装脱着の回数が、多くなるほど排気にかかる時間が増
え、薄膜形成装置の稼働率を低くする。そして装脱着の
作業性の面からもステンレス材は重く、取り付けに労を
要する。
Therefore, as the number of times of attachment / detachment for cleaning the deposition preventive plate and the internal jig increases, the time required for exhausting increases and the operating rate of the thin film forming apparatus decreases. The stainless steel material is heavy from the viewpoint of workability of attachment and detachment, and it requires labor to attach it.

【0015】また、前記Mo溶射法は前述したように形
成層が多孔質の構造になっているため、大気が吸着し、
放出ガスの点でも防着板や内部治具としては望ましくな
い。そこで本発明は、付着する強い内部応力を有する膜
においても剥離しずらく、放出ガスの少ない軽量な防着
板や内部治具を提供することを目的とする。
Further, in the Mo spraying method, since the formation layer has a porous structure as described above, the atmosphere is adsorbed,
Also in terms of released gas, it is not desirable as a deposition preventive plate or an internal jig. Therefore, it is an object of the present invention to provide a light-weight deposition preventive plate and an internal jig which are less likely to be peeled off even when a film having a strong internal stress is attached, and which emits less gas.

【0016】[0016]

【課題を解決するための手段】本発明は上記目的を達成
するために、被処理基板以外の不所望の領域に成膜を防
止するための防着手段を具備する所定雰囲気内で薄膜形
成する装置において、表面粗度を有するSiC層を表面
に露出し、前記SiC層が100〜1000μmの膜厚
を有し、その表面粗度が10〜100μmである防着板
及び内部治具を提供する。
In order to achieve the above object, the present invention forms a thin film in a predetermined atmosphere provided with an adhesion preventing means for preventing film formation in an undesired region other than a substrate to be processed. In a device, a SiC layer having a surface roughness is exposed on the surface, the SiC layer has a film thickness of 100 to 1000 μm, and the surface roughness is 10 to 100 μm. ..

【0017】[0017]

【作用】以上のような構成の防着板や内部治具は、表面
がSiC膜がコートされるため、薬品(酸)に対する耐
食性が強くなり、付着膜の除去のための洗浄を行っても
最初の表面粗度が保たれ、且つ熱膨脹係数が小さく、放
出ガス特性であり、ステンレス材に比較して軽量であ
る。
Since the adhesion-preventing plate and the internal jig having the above-mentioned structure are coated with the SiC film on the surface, the corrosion resistance against chemicals (acid) becomes strong and even if cleaning is performed to remove the adhered film. The initial surface roughness is maintained, the coefficient of thermal expansion is small, the gas has the characteristics of released gas, and it is lighter in weight than stainless steel.

【0018】[0018]

【実施例】以下、図面を参照して本発明の実施例を詳細
に説明する。
Embodiments of the present invention will now be described in detail with reference to the drawings.

【0019】図1(a)は、本発明による第1実施例と
して、炭化シリコン(以下、SiCと称する)からなる
防着板の断面図を示す。防着板11の表面に、例えば、
アルミナ粒子を噴出して表面を削るブラスト処理等の機
械加工によって、その表面に10〜100μmの粗度を
施す。しかしSiCで防着板等を形成するのは容易でな
く、強度的にも脆い。また、表面に施す粗度について述
べると、粗度が小さい場合は、表面が滑らか(平坦)に
なり、剥離しやすくなる、また、粗度が大きすぎても十
分な効果が得られない。よって、後述する実施例の結果
と機械加工の関係から、最適と思われる範囲を10〜1
00μmの粗度とした。
FIG. 1A shows a sectional view of an adhesion-preventing plate made of silicon carbide (hereinafter referred to as SiC) as a first embodiment according to the present invention. On the surface of the deposition preventive plate 11, for example,
Roughness of 10 to 100 μm is applied to the surface by mechanical processing such as blasting in which alumina particles are jetted to scrape the surface. However, it is not easy to form a deposition preventive plate or the like from SiC, and the strength is also fragile. Further, regarding the roughness applied to the surface, when the roughness is small, the surface becomes smooth (flat) and easily peels off, and when the roughness is too large, a sufficient effect cannot be obtained. Therefore, based on the relationship between the results of Examples described later and machining, the range considered to be optimum is 10 to 1
The roughness was set to 00 μm.

【0020】図1(b)には、第1実施例に示したSi
C防着板の強度的な改善を施した第2実施例として、防
着板に芯となる母材を用い、その母材表面にSiCをコ
ーティングした防着板の断面図を示す。この第2実施例
では、母材に黒鉛を用いて、該黒鉛板12の表面を前述
した機械加工により、10〜100μmの粗度を施す。
さらにCVD法によって、その表面上に100〜100
0μmの均一な膜厚の高密度SiC膜13を形成する。
FIG. 1B shows the Si shown in the first embodiment.
As a second embodiment in which the strength of the C deposition preventive plate is improved, a cross-sectional view of a deposition preventing plate in which a core base material is used for the deposition preventing plate and the surface of the base material is coated with SiC is shown. In the second embodiment, graphite is used as a base material, and the surface of the graphite plate 12 is subjected to the above-mentioned machining to give a roughness of 10 to 100 μm.
Further, by the CVD method, 100-100 on the surface
A high density SiC film 13 having a uniform film thickness of 0 μm is formed.

【0021】また図1(c)には第3実施例のSiC防
着板の断面図を示す。第2実施例では母材表面に粗度を
施したが、第3実施例では、母材表面には粗度を施さ
ず、母材14表面上に形成した高密度SiC膜13に前
述したと同様に機械加工により10〜100μmの粗度
を施している。この実施例は、形成した高密度SiC膜
13に粗度を直接的に施しているため、第2実施例より
も所望する粗度の精度を得ることができる。これらのよ
うに表面に所望粗度を施された高密度SiC膜が形成さ
れる防着板及び内部治具について、第2実施例を一例と
して、具体的に説明する。
FIG. 1 (c) is a sectional view of the SiC deposition preventive plate of the third embodiment. In the second embodiment, the base material surface was roughened, but in the third embodiment, the base material surface was not roughened, and the high density SiC film 13 formed on the base material 14 surface was described above. Similarly, a roughness of 10 to 100 μm is applied by machining. In this embodiment, since the formed high-density SiC film 13 is directly provided with the roughness, a desired accuracy of the roughness can be obtained as compared with the second embodiment. The deposition preventive plate and the internal jig, on which the high-density SiC film having the desired roughness is formed on the surface as described above, will be specifically described by taking the second embodiment as an example.

【0022】前述したように、防着板母材の黒鉛12の
表面に50μm程度の粗度を施し、CVD法によって、
500μmの均一な膜厚の高密度SiC膜13を形成す
る。この防着板の表面にTiNを連続して、2000μ
m程度成膜しても、剥離が無かったことを確認した。
As described above, the surface of the graphite 12 of the adhesion-preventing plate base material is roughened to about 50 μm, and then the CVD method is used.
A high-density SiC film 13 having a uniform film thickness of 500 μm is formed. TiN is continuously applied to the surface of this adhesion preventive plate to
It was confirmed that there was no peeling even after forming a film of about m.

【0023】さらに実施例では、防着板について説明し
たが、付着を防止すべき部分やシャッタ等の内部治具に
おいても、SiC膜で形成若しくは表面をコートするこ
とにより、同様の効果が得られる。
Further, in the embodiment, the anti-adhesion plate has been described, but the same effect can be obtained by forming the SiC film or coating the surface of the internal jig such as the shutter and the portion where adhesion should be prevented. ..

【0024】次に図2は、SiC内部治具を用いて昇温
による放出ガス特性を評価した結果である。この放出ガ
ス特性を測定するに当たって比較のために、ステンレス
材A、モリブデン(Mo)溶射B、炭化シリコン(Si
C)を表面に有する治具C、SiO2 基板Dを用意して
実際のスパッタリング装置内部において、ランプヒータ
加熱をして測定したものである。
Next, FIG. 2 shows the results of evaluation of the emission gas characteristics due to temperature rise using a SiC internal jig. For comparison of the emission gas characteristics, stainless steel material A, molybdenum (Mo) sprayed B, silicon carbide (Si
A jig C having C) on the surface and a SiO 2 substrate D are prepared and measured by heating with a lamp heater in an actual sputtering device.

【0025】通常、チャンバ内部にはステンレス材が多
用されている。常温で到達真空度(2.2×10-5
a)まで排気した後、常温から徐々にステンレス部材A
を加熱していくと、まず水分(H2 O)等の放出があ
り、一時的に1桁真空度が悪くなるが、しばらくの後、
回復する。しかし、250℃以上から、バックグラウン
ドのH2 が多量に放出され、再び真空度が悪くなる。
Usually, stainless steel is often used inside the chamber. Degree of vacuum reached at room temperature (2.2 × 10 -5 P
After evacuation to a), the stainless steel member A is gradually heated from room temperature.
When heating, the water (H 2 O) etc. is released first and the vacuum degree temporarily deteriorates, but after a while,
Recover. However, from 250 ° C. or higher, a large amount of background H 2 is released, and the degree of vacuum deteriorates again.

【0026】Mo溶射部材Bもステンレス材と同様に、
まず水分等を放出した後、400℃以上から、バックグ
ラウンドのH2 が多量に放出され、再び真空度が悪くな
る。このMo溶射部材Bは、ステンレス材と同様な特性
曲線を示すが、水分等を放出の際には3倍程真空度が悪
くなる。
The Mo sprayed member B is similar to the stainless steel material,
First, after releasing water and the like, a large amount of background H 2 is released from 400 ° C. or higher, and the degree of vacuum deteriorates again. The Mo sprayed member B shows a characteristic curve similar to that of the stainless steel material, but the degree of vacuum is deteriorated by a factor of 3 when releasing water or the like.

【0027】またSiC治具CやSiO2 基板Dは、常
温から徐々に加熱しても、水分等の吸着が少ないため、
ステンレス材のように真空特性に急俊な変化を与えず徐
々に真空度が悪くなっていく。つまりバックグラウンド
のH2 の放出が徐々に増えていくことが推測される。
Further, since the SiC jig C and the SiO 2 substrate D have little adsorption of moisture even when they are gradually heated from room temperature,
Unlike stainless steel, the vacuum characteristics do not change rapidly and the degree of vacuum gradually deteriorates. That is, it is estimated that the background H 2 emission gradually increases.

【0028】特に前記ステンレス材AやMo溶射部材B
に比較して放出ガスが少なく、またバックグラウンド以
外の放出ガスは見られず、H2 ガス放出による排気特性
の悪化を防ぐ。
In particular, the stainless material A and Mo sprayed member B
The amount of released gas is smaller than that of the above, and the released gas other than the background is not seen, and deterioration of exhaust characteristics due to H 2 gas release is prevented.

【0029】従って、本発明によれば、従来、付着膜の
剥離が発生したステンレス防着板、内部治具の交換頻度
を格段に減少させることができる。また、SiC膜は薬
品(酸)に対する耐食性も強く、付着膜の除去のための
洗浄を行っても最初の表面粗度が保たれ、且つ熱膨脹係
数が小さく、常温〜1000℃の間で変形がない。さら
に大気に放置しても、SiO2 基板と同等の放出ガス特
性であり、しかもステンレス材に比較して非常に軽量で
ある。
Therefore, according to the present invention, it is possible to remarkably reduce the frequency of replacement of the stainless steel anti-adhesion plate and the internal jig in which the peeling of the adhered film has conventionally occurred. In addition, the SiC film has a strong corrosion resistance to chemicals (acid), maintains the initial surface roughness even when washed to remove the adhered film, has a small coefficient of thermal expansion, and does not deform at room temperature to 1000 ° C. Absent. Further, even when left in the atmosphere, it has the same emission gas characteristics as the SiO 2 substrate, and is extremely lightweight as compared with the stainless steel material.

【0030】よって本発明のSiCを表面にコートした
防着板及び内部治具を使用することで、洗浄の容易さと
防着板へのダメージの低減、高温プロセスにおける排気
特性向上、軽量化による作業性の容易さを提供できる。
Therefore, by using the deposition preventive plate coated with SiC and the internal jig of the present invention, the cleaning work is easy and the damage to the deposition preventive plate is reduced, the exhaust characteristic is improved in the high temperature process, and the work is performed by the weight reduction. Can provide ease of sex.

【0031】また本発明は、前述した実施例に限定され
るものではなく、実施例では母材に黒鉛を用いたが、こ
れに限定されず、付着する膜と熱膨脹係数が近似してい
る部材であれば良く、例えば、熱膨脹係数の小さなセラ
ミックス焼結体等でも同様の効果が期待される。他にも
発明の要旨を逸脱しない範囲で種々の変形や応用が可能
であることは勿論である。
Further, the present invention is not limited to the above-mentioned embodiment, but graphite was used as a base material in the embodiment, but the present invention is not limited to this, and a member having a thermal expansion coefficient similar to that of the attached film is used. The same effect can be expected with a ceramic sintered body having a small coefficient of thermal expansion. Of course, various modifications and applications are possible without departing from the scope of the invention.

【0032】[0032]

【発明の効果】以上詳述したように本発明によれば、付
着する強い内部応力を有する膜においても剥離し難く、
放出ガスの少ない軽量な防着板や内部治具を提供するこ
とができる。
As described in detail above, according to the present invention, even a film having a strong internal stress that adheres is difficult to peel off,
It is possible to provide a lightweight anti-adhesion plate and an internal jig that emit little gas.

【図面の簡単な説明】[Brief description of drawings]

【図1】図1は、(a)本発明による第1実施例の防着
板の構造を示す断面図、図1(b)は第2実施例の防着
板の構造を示す断面図、図1(c)は第3実施例の防着
板の構造を示す断面図である。
1A is a sectional view showing a structure of an adhesion-preventing plate of a first embodiment according to the present invention, and FIG. 1B is a sectional view showing a structure of an adhesion-preventing plate of a second embodiment; FIG. 1C is a sectional view showing the structure of the deposition preventive plate of the third embodiment.

【図2】図2は、昇温による内部治具から放出されるガ
ス特性を示す図である。
FIG. 2 is a diagram showing a characteristic of gas released from an internal jig due to temperature rise.

【図3】図3は、一般的なスパッタリング装置の構造を
示す図である。
FIG. 3 is a diagram showing a structure of a general sputtering apparatus.

【図4】図4は、シャッタ板に成膜されたTiN膜の剥
離の状態を示す図である。
FIG. 4 is a diagram showing a peeled state of a TiN film formed on a shutter plate.

【符号の説明】[Explanation of symbols]

1…チャンバ、2…ターゲット、3…上部電極、4…タ
ーゲット押え、5…被処理基板、6…下部電極、7…シ
ャッタ、8…防着板、9…TiN膜、9a…ひび割れ、
9b…剥離膜、11…防着板、12…黒鉛板、13…S
iC膜。
1 ... Chamber, 2 ... Target, 3 ... Upper electrode, 4 ... Target presser, 5 ... Substrate, 6 ... Lower electrode, 7 ... Shutter, 8 ... Adhesion plate, 9 ... TiN film, 9a ... Crack,
9b ... Release film, 11 ... Anti-adhesion plate, 12 ... Graphite plate, 13 ... S
iC film.

Claims (2)

【特許請求の範囲】[Claims] 【請求項1】 被処理基板以外の不所望の領域に成膜を
防止するための防着手段を具備する所定雰囲気内で薄膜
形成する装置において、 表面粗度を有するSiC層を表面に露出することを特徴
とする防着板及び内部治具。
1. An apparatus for forming a thin film in a predetermined atmosphere, comprising an adhesion preventing means for preventing film formation in an undesired region other than a substrate to be processed, wherein a SiC layer having a surface roughness is exposed on the surface. An adhesion-preventing plate and an internal jig.
【請求項2】 前記SiC層が100〜1000μmの
膜厚を有し、その表面粗度が10〜100μmであるこ
とを特徴とする請求項1記載の防着板及び内部治具。
2. The deposition preventive plate and the internal jig according to claim 1, wherein the SiC layer has a film thickness of 100 to 1000 μm and a surface roughness of 10 to 100 μm.
JP3475992A 1992-02-21 1992-02-21 Adhesion-preventive plate and inner jig Pending JPH05235149A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP3475992A JPH05235149A (en) 1992-02-21 1992-02-21 Adhesion-preventive plate and inner jig

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP3475992A JPH05235149A (en) 1992-02-21 1992-02-21 Adhesion-preventive plate and inner jig

Publications (1)

Publication Number Publication Date
JPH05235149A true JPH05235149A (en) 1993-09-10

Family

ID=12423248

Family Applications (1)

Application Number Title Priority Date Filing Date
JP3475992A Pending JPH05235149A (en) 1992-02-21 1992-02-21 Adhesion-preventive plate and inner jig

Country Status (1)

Country Link
JP (1) JPH05235149A (en)

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2002091457A1 (en) * 1999-12-09 2002-11-14 Ibiden Co., Ltd. Ceramic plate for semiconductor producing/inspecting apparatus
JP2005133133A (en) * 2003-10-29 2005-05-26 Toyobo Co Ltd Deposition-preventive plate for vacuum thin film deposition apparatus
JP2011074442A (en) * 2009-09-30 2011-04-14 Mitsubishi Electric Corp Vacuum vapor-deposition apparatus
JP2011094239A (en) * 2011-01-21 2011-05-12 Toshiba Corp Method for producing component for vacuum film deposition system
JP2012501387A (en) * 2008-08-28 2012-01-19 アプライド マテリアルズ インコーポレイテッド Process kit shield and its usage

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2002091457A1 (en) * 1999-12-09 2002-11-14 Ibiden Co., Ltd. Ceramic plate for semiconductor producing/inspecting apparatus
US6884972B2 (en) 1999-12-09 2005-04-26 Ibiden Co., Ltd. Ceramic plate for a semiconductor producing/inspecting apparatus
JP2005133133A (en) * 2003-10-29 2005-05-26 Toyobo Co Ltd Deposition-preventive plate for vacuum thin film deposition apparatus
JP2012501387A (en) * 2008-08-28 2012-01-19 アプライド マテリアルズ インコーポレイテッド Process kit shield and its usage
JP2011074442A (en) * 2009-09-30 2011-04-14 Mitsubishi Electric Corp Vacuum vapor-deposition apparatus
JP2011094239A (en) * 2011-01-21 2011-05-12 Toshiba Corp Method for producing component for vacuum film deposition system

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