JPH0521429B2 - - Google Patents
Info
- Publication number
- JPH0521429B2 JPH0521429B2 JP59175454A JP17545484A JPH0521429B2 JP H0521429 B2 JPH0521429 B2 JP H0521429B2 JP 59175454 A JP59175454 A JP 59175454A JP 17545484 A JP17545484 A JP 17545484A JP H0521429 B2 JPH0521429 B2 JP H0521429B2
- Authority
- JP
- Japan
- Prior art keywords
- circuit
- discharge
- charge
- value
- charge amount
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
- 238000012360 testing method Methods 0.000 claims description 17
- 230000001186 cumulative effect Effects 0.000 claims description 6
- 238000007493 shaping process Methods 0.000 claims 1
- 238000010586 diagram Methods 0.000 description 12
- 238000005259 measurement Methods 0.000 description 10
- 238000009413 insulation Methods 0.000 description 8
- 230000007547 defect Effects 0.000 description 4
- 238000000034 method Methods 0.000 description 3
- 230000032683 aging Effects 0.000 description 1
- 230000003321 amplification Effects 0.000 description 1
- 230000008033 biological extinction Effects 0.000 description 1
- 239000003990 capacitor Substances 0.000 description 1
- 230000008878 coupling Effects 0.000 description 1
- 238000010168 coupling process Methods 0.000 description 1
- 238000005859 coupling reaction Methods 0.000 description 1
- 230000006866 deterioration Effects 0.000 description 1
- 238000002405 diagnostic procedure Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 239000011810 insulating material Substances 0.000 description 1
- 239000012774 insulation material Substances 0.000 description 1
- 239000012212 insulator Substances 0.000 description 1
- 238000009659 non-destructive testing Methods 0.000 description 1
- 238000003199 nucleic acid amplification method Methods 0.000 description 1
- 230000000737 periodic effect Effects 0.000 description 1
- 230000001105 regulatory effect Effects 0.000 description 1
- 239000007787 solid Substances 0.000 description 1
Landscapes
- Testing Relating To Insulation (AREA)
- Protection Of Static Devices (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP17545484A JPS6153577A (ja) | 1984-08-23 | 1984-08-23 | 部分放電測定装置 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP17545484A JPS6153577A (ja) | 1984-08-23 | 1984-08-23 | 部分放電測定装置 |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS6153577A JPS6153577A (ja) | 1986-03-17 |
JPH0521429B2 true JPH0521429B2 (cs) | 1993-03-24 |
Family
ID=15996351
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP17545484A Granted JPS6153577A (ja) | 1984-08-23 | 1984-08-23 | 部分放電測定装置 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS6153577A (cs) |
Families Citing this family (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH0697250B2 (ja) * | 1987-08-29 | 1994-11-30 | エ−テイ−アイ株式会社 | 部分放電電荷量測定装置 |
JPH0479275U (cs) * | 1990-11-24 | 1992-07-10 | ||
JP2866533B2 (ja) * | 1992-07-14 | 1999-03-08 | 株式会社フジクラ | 高周波部分放電検出システム |
JP3462257B2 (ja) * | 1994-03-23 | 2003-11-05 | 東京電力株式会社 | 部分放電検出方法 |
JP4594646B2 (ja) * | 2004-05-17 | 2010-12-08 | 住友金属工業株式会社 | 部分放電の損傷量検出方法及び部分放電の損傷量検出装置 |
Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS54115176A (en) * | 1978-02-27 | 1979-09-07 | Shii Emu Shii Shii Kk | Electric insulator diagnoser |
-
1984
- 1984-08-23 JP JP17545484A patent/JPS6153577A/ja active Granted
Patent Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS54115176A (en) * | 1978-02-27 | 1979-09-07 | Shii Emu Shii Shii Kk | Electric insulator diagnoser |
Also Published As
Publication number | Publication date |
---|---|
JPS6153577A (ja) | 1986-03-17 |
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