JPH051828Y2 - - Google Patents

Info

Publication number
JPH051828Y2
JPH051828Y2 JP17176685U JP17176685U JPH051828Y2 JP H051828 Y2 JPH051828 Y2 JP H051828Y2 JP 17176685 U JP17176685 U JP 17176685U JP 17176685 U JP17176685 U JP 17176685U JP H051828 Y2 JPH051828 Y2 JP H051828Y2
Authority
JP
Japan
Prior art keywords
voltage
drain
current
mosfet
source
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP17176685U
Other languages
English (en)
Japanese (ja)
Other versions
JPS6281071U (zh
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP17176685U priority Critical patent/JPH051828Y2/ja
Publication of JPS6281071U publication Critical patent/JPS6281071U/ja
Application granted granted Critical
Publication of JPH051828Y2 publication Critical patent/JPH051828Y2/ja
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Landscapes

  • Testing Of Individual Semiconductor Devices (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
JP17176685U 1985-11-08 1985-11-08 Expired - Lifetime JPH051828Y2 (zh)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP17176685U JPH051828Y2 (zh) 1985-11-08 1985-11-08

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP17176685U JPH051828Y2 (zh) 1985-11-08 1985-11-08

Publications (2)

Publication Number Publication Date
JPS6281071U JPS6281071U (zh) 1987-05-23
JPH051828Y2 true JPH051828Y2 (zh) 1993-01-18

Family

ID=31107695

Family Applications (1)

Application Number Title Priority Date Filing Date
JP17176685U Expired - Lifetime JPH051828Y2 (zh) 1985-11-08 1985-11-08

Country Status (1)

Country Link
JP (1) JPH051828Y2 (zh)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP6293623B2 (ja) * 2014-09-05 2018-03-14 株式会社東芝 半導体検査装置
US10094863B2 (en) * 2016-03-02 2018-10-09 Texas Instruments Incorporated High-resolution power electronics measurements

Also Published As

Publication number Publication date
JPS6281071U (zh) 1987-05-23

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