JPH0513441B2 - - Google Patents
Info
- Publication number
- JPH0513441B2 JPH0513441B2 JP18446485A JP18446485A JPH0513441B2 JP H0513441 B2 JPH0513441 B2 JP H0513441B2 JP 18446485 A JP18446485 A JP 18446485A JP 18446485 A JP18446485 A JP 18446485A JP H0513441 B2 JPH0513441 B2 JP H0513441B2
- Authority
- JP
- Japan
- Prior art keywords
- hologram
- hologram prototype
- lens
- prototype
- optical
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
- 230000003287 optical effect Effects 0.000 claims description 115
- 238000005259 measurement Methods 0.000 claims description 54
- 238000000034 method Methods 0.000 claims description 17
- 230000007246 mechanism Effects 0.000 claims description 3
- 239000000758 substrate Substances 0.000 claims 1
- 238000012360 testing method Methods 0.000 description 28
- 238000010586 diagram Methods 0.000 description 18
- 238000003384 imaging method Methods 0.000 description 13
- 230000033001 locomotion Effects 0.000 description 7
- 238000004364 calculation method Methods 0.000 description 6
- 238000004519 manufacturing process Methods 0.000 description 4
- 229910000831 Steel Inorganic materials 0.000 description 3
- 238000010521 absorption reaction Methods 0.000 description 3
- 230000008901 benefit Effects 0.000 description 3
- 230000026058 directional locomotion Effects 0.000 description 3
- 238000010894 electron beam technology Methods 0.000 description 3
- 238000007689 inspection Methods 0.000 description 3
- 238000000691 measurement method Methods 0.000 description 3
- 239000010959 steel Substances 0.000 description 3
- 238000007796 conventional method Methods 0.000 description 2
- 238000012986 modification Methods 0.000 description 2
- 230000004048 modification Effects 0.000 description 2
- 210000001747 pupil Anatomy 0.000 description 2
- 238000005773 Enders reaction Methods 0.000 description 1
- 230000009471 action Effects 0.000 description 1
- 230000002411 adverse Effects 0.000 description 1
- 230000004075 alteration Effects 0.000 description 1
- 238000004458 analytical method Methods 0.000 description 1
- 201000009310 astigmatism Diseases 0.000 description 1
- 230000015572 biosynthetic process Effects 0.000 description 1
- 239000002131 composite material Substances 0.000 description 1
- 238000013461 design Methods 0.000 description 1
- 238000011161 development Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 238000000609 electron-beam lithography Methods 0.000 description 1
- 239000000284 extract Substances 0.000 description 1
- 238000001093 holography Methods 0.000 description 1
- 230000002452 interceptive effect Effects 0.000 description 1
- 238000005305 interferometry Methods 0.000 description 1
- 238000003825 pressing Methods 0.000 description 1
- 230000009467 reduction Effects 0.000 description 1
- 238000009877 rendering Methods 0.000 description 1
- 238000001179 sorption measurement Methods 0.000 description 1
- 230000000087 stabilizing effect Effects 0.000 description 1
Landscapes
- Instruments For Measurement Of Length By Optical Means (AREA)
- Length Measuring Devices By Optical Means (AREA)
- Testing Of Optical Devices Or Fibers (AREA)
- Holo Graphy (AREA)
Priority Applications (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP18446485A JPS6244608A (ja) | 1985-08-22 | 1985-08-22 | 測定用ホログラム原器のセッティング方法及びそのための装置 |
US06/898,323 US4758089A (en) | 1985-08-22 | 1986-08-20 | Holographic interferometer |
US07/096,609 US4812042A (en) | 1985-08-22 | 1987-09-11 | Holographic interferometer |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP18446485A JPS6244608A (ja) | 1985-08-22 | 1985-08-22 | 測定用ホログラム原器のセッティング方法及びそのための装置 |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS6244608A JPS6244608A (ja) | 1987-02-26 |
JPH0513441B2 true JPH0513441B2 (enrdf_load_stackoverflow) | 1993-02-22 |
Family
ID=16153609
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP18446485A Granted JPS6244608A (ja) | 1985-08-22 | 1985-08-22 | 測定用ホログラム原器のセッティング方法及びそのための装置 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS6244608A (enrdf_load_stackoverflow) |
Families Citing this family (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2723502B2 (ja) * | 1986-01-08 | 1998-03-09 | 日本電気株式会社 | 位置決め方法 |
JPS62226628A (ja) * | 1986-03-27 | 1987-10-05 | Nec Corp | 位置決め方法 |
JP6955911B2 (ja) * | 2017-06-16 | 2021-10-27 | 株式会社共和電業 | ひび割れ幅計測方法、ひび割れ幅計測装置およびひび割れ幅計測プログラム |
-
1985
- 1985-08-22 JP JP18446485A patent/JPS6244608A/ja active Granted
Also Published As
Publication number | Publication date |
---|---|
JPS6244608A (ja) | 1987-02-26 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
US4812042A (en) | Holographic interferometer | |
CN107843213A (zh) | 共焦自准直中心偏和曲率半径测量方法与装置 | |
CN105890875B (zh) | 一种基于掩模板的投影物镜性能测试装置以及方法 | |
CN101226344A (zh) | 测量光学系统参数的测量装置及其测量方法 | |
JP2000097666A (ja) | 面形状計測用干渉計、波面収差測定機、前記干渉計及び前記波面収差測定機を用いた投影光学系の製造方法、及び前記干渉計の校正方法 | |
JP3435019B2 (ja) | レンズ特性測定装置及びレンズ特性測定方法 | |
CN102305596B (zh) | 在球面面形干涉检测中旋转误差控制装置及其方法 | |
JPH0812127B2 (ja) | 曲率半径測定装置及び方法 | |
US5737081A (en) | Extended-source low coherence interferometer for flatness testing | |
US6924897B2 (en) | Point source module and methods of aligning and using the same | |
JPH0769219B2 (ja) | 干渉縞解析方法及びそのための装置 | |
JPH0513441B2 (enrdf_load_stackoverflow) | ||
JPH0353125Y2 (enrdf_load_stackoverflow) | ||
JPH0353124Y2 (enrdf_load_stackoverflow) | ||
JPS6244601A (ja) | 移動載置台装置 | |
JPH0554602B2 (enrdf_load_stackoverflow) | ||
JPS6244604A (ja) | ホログラフイツク干渉計 | |
JPH0554601B2 (enrdf_load_stackoverflow) | ||
JPH0585843B2 (enrdf_load_stackoverflow) | ||
JP2831428B2 (ja) | 非球面形状測定機 | |
JP3410896B2 (ja) | 非球面レンズの偏心測定方法および装置 | |
JPH06174430A (ja) | 中心厚測定方法およびそれに使用する装置 | |
JP3385082B2 (ja) | 非球面測定装置 | |
JPH0814854A (ja) | 計算機ホログラムを有する平板及びそれを用いた計測 方法 | |
Slomba et al. | A coaxial interferometer with low mapping distortion |