JPH0513390B2 - - Google Patents
Info
- Publication number
- JPH0513390B2 JPH0513390B2 JP60015683A JP1568385A JPH0513390B2 JP H0513390 B2 JPH0513390 B2 JP H0513390B2 JP 60015683 A JP60015683 A JP 60015683A JP 1568385 A JP1568385 A JP 1568385A JP H0513390 B2 JPH0513390 B2 JP H0513390B2
- Authority
- JP
- Japan
- Prior art keywords
- hydrogen
- semiconductor
- single crystal
- silicon single
- neutron beam
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
- G01T3/00—Measuring neutron radiation
- G01T3/08—Measuring neutron radiation with semiconductor detectors
Landscapes
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- General Physics & Mathematics (AREA)
- High Energy & Nuclear Physics (AREA)
- Molecular Biology (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Measurement Of Radiation (AREA)
- Light Receiving Elements (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP60015683A JPS61174778A (ja) | 1985-01-30 | 1985-01-30 | 半導体中性子線検出器の製造方法 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP60015683A JPS61174778A (ja) | 1985-01-30 | 1985-01-30 | 半導体中性子線検出器の製造方法 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS61174778A JPS61174778A (ja) | 1986-08-06 |
| JPH0513390B2 true JPH0513390B2 (enrdf_load_stackoverflow) | 1993-02-22 |
Family
ID=11895546
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP60015683A Granted JPS61174778A (ja) | 1985-01-30 | 1985-01-30 | 半導体中性子線検出器の製造方法 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS61174778A (enrdf_load_stackoverflow) |
Families Citing this family (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH0716024B2 (ja) * | 1987-08-06 | 1995-02-22 | 富士電機株式会社 | 半導体放射線検出素子の製造方法 |
| JP5170600B1 (ja) * | 2012-08-11 | 2013-03-27 | 和浩 山本 | 水素濃度計 |
| KR101711440B1 (ko) * | 2015-12-16 | 2017-03-03 | 위덕대학교 산학협력단 | 다결정실리콘 광검출기의 제조방법 |
Family Cites Families (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5785269A (en) * | 1980-11-18 | 1982-05-27 | Fuji Electric Co Ltd | Semiconductor radiation detector |
-
1985
- 1985-01-30 JP JP60015683A patent/JPS61174778A/ja active Granted
Also Published As
| Publication number | Publication date |
|---|---|
| JPS61174778A (ja) | 1986-08-06 |
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