JPH05121392A - Treating tank for etching and the like - Google Patents
Treating tank for etching and the likeInfo
- Publication number
- JPH05121392A JPH05121392A JP30987891A JP30987891A JPH05121392A JP H05121392 A JPH05121392 A JP H05121392A JP 30987891 A JP30987891 A JP 30987891A JP 30987891 A JP30987891 A JP 30987891A JP H05121392 A JPH05121392 A JP H05121392A
- Authority
- JP
- Japan
- Prior art keywords
- tank
- etching
- processing tank
- supply pipe
- processing
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Landscapes
- ing And Chemical Polishing (AREA)
- Manufacturing Of Printed Circuit Boards (AREA)
- Weting (AREA)
Abstract
Description
【0001】[0001]
【産業上の利用分野】本発明は、プリント配線基板や半
導体などの製作工程におけるエッチング処理や電子部品
の洗浄等の際に用いられる処理槽に関する。BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a processing tank used for etching processing and cleaning of electronic parts in the manufacturing process of printed wiring boards, semiconductors and the like.
【0002】[0002]
【従来の技術】従来、この種の処理槽は、図2に示すよ
うにオーバーフロー槽2を添設した処理槽本体1内に、
その底部に連通した供給管8からエッチング溶液等の処
理・洗浄液を供給し、オーバーフロー槽2に溢れた液体
を該オーバーフロー槽2の底部に連通した循環路12を
介して、その途中に設けたフィルター12aで異物を除
去した後、再び上記処理槽本体1内に還流させるように
して成り、この時の液体の流れにより、該処理槽本体1
内で固定治具5により液体に浸漬状態で保持された電子
部品1表面のエッチングや洗浄等を行うものであった。2. Description of the Related Art Conventionally, a processing tank of this type is provided in a processing tank main body 1 provided with an overflow tank 2 as shown in FIG.
A processing / cleaning solution such as an etching solution is supplied from a supply pipe 8 communicating with the bottom of the overflow tank 2, and the liquid overflowing into the overflow tank 2 is passed through a circulation path 12 communicating with the bottom of the overflow tank 2 and a filter provided in the middle thereof. The foreign matter is removed by 12a, and then it is returned to the inside of the processing tank main body 1 again.
The surface of the electronic component 1 held in the liquid by the fixing jig 5 is etched and washed.
【0003】尚、図中符号3は整流格子、12bは上記
循環路12に設けた液体循環用のポンプ、8aは上記供
給管8のバルブを示す。又、9,10はそれぞれ上記処
理槽本体1に連通した排出管と、オーバーフロー槽2に
連通した排出管を示し、9a,10aはそれぞれ該排出
管9,10のバルブを示す。In the figure, reference numeral 3 is a rectifying grid, 12b is a liquid circulation pump provided in the circulation passage 12, and 8a is a valve of the supply pipe 8. Reference numerals 9 and 10 denote a discharge pipe communicating with the processing tank main body 1 and a discharge pipe communicating with the overflow tank 2, and 9a and 10a denote valves of the discharge pipes 9 and 10, respectively.
【0004】[0004]
【発明が解決しようとする課題】上述した従来の処理槽
では、液体が処理槽本体内の下方から上方へと流れるの
で、エッチングの際に発生した滓や部品の表面に付着し
ていた埃等の微少片(以下、パーティクル粒子と称す
る)が、拡散しやすく、このパーティクル粒子をオーバ
ーフローさせる為には、大量の液体を循環させなくては
ならないという問題点を有していた。又、槽内の流れの
分布においてもその底部と上部とで不均一となる確立が
高く、処理される部品の上下で洗浄効果やエッチング効
果にばらつきを生じる恐れがあるという問題点を有して
いた。In the above-mentioned conventional processing bath, since the liquid flows from the lower part to the upper part in the main body of the processing bath, slag generated at the time of etching and dust adhered to the surface of parts are removed. The small pieces (hereinafter referred to as particle particles) easily diffuse, and there is a problem that a large amount of liquid must be circulated in order to overflow the particle particles. In addition, the distribution of the flow in the tank is highly likely to be non-uniform at the bottom and the top, and there is a problem that the cleaning effect and the etching effect may vary above and below the component to be processed. It was
【0005】[0005]
【課題を解決する為の手段】本発明では、オーバーフロ
ーした洗浄液等の液体を還流させる多孔給水管を処理槽
本体内の一側に浸漬して設けると共に、該多孔給水管の
側方に整流格子を同様に浸漬して設け、該オーバーフロ
ー槽と該多孔給水管とを第1の循環路で連通させると共
に、該処理槽と該多孔給水管とを第二の循環路で連通さ
せることにより、上記従来の問題点を解決した。According to the present invention, a perforated water supply pipe for circulating a liquid such as an overflowing cleaning liquid is provided by being dipped into one side of the treatment tank main body, and a rectifying grid is provided on the side of the perforated water supply pipe. By immersing the same in the same manner, the overflow tank and the porous water supply pipe are communicated with each other through the first circulation path, and the treatment tank and the porous water supply tube are communicated with each other through the second circulation path. The conventional problem was solved.
【0006】[0006]
【作用】処理槽本体内の一側に浸漬して設けた多孔給水
管と整流格子は、該処理槽本体内に液体を層流として送
り出すように作用し、2系統の循環路は前記層流を円滑
に為さしむ共に、液体の汚れの状況に応じたより適切な
瀘過が可能なように作用する。The perforated water supply pipe and the rectifying grid, which are provided by being dipped on one side in the main body of the processing tank, act to send out the liquid as a laminar flow into the main body of the processing tank, and the two circulation paths are the laminar flow It works smoothly so that it can be filtered more appropriately according to the condition of liquid stains.
【0007】[0007]
【実施例】図1は実施例の簡略断面図であり、従来と同
様に電子部品11が浸漬される処理槽本体1には、オー
バーフロー槽2が添設され、該処理槽本体1にはエッチ
ング溶液やフロン、純水等の処理・洗浄液を供給する供
給管8と、排出する為の排出管9が設けられ、又、オー
バーフロー槽2にも同様の排出管10が設けられてい
る。FIG. 1 is a simplified cross-sectional view of an embodiment. An overflow bath 2 is attached to a processing bath main body 1 into which an electronic component 11 is immersed, and an etching bath is attached to the processing bath main body 1 as in the conventional case. A supply pipe 8 for supplying a treatment / cleaning liquid such as a solution, chlorofluorocarbon, and pure water, and a discharge pipe 9 for discharging the same are provided, and the overflow tank 2 is also provided with a similar discharge pipe 10.
【0008】ここにおいて本発明では、図示したように
上記処理槽本体1内の一側に、オーバーフロー槽2と第
一の循環路7を介して連通した多孔給水管4を浸漬して
設けると共に、該多孔給水管4の一側に整流用の整流格
子3を同様に浸漬して設けている。又、該多孔給水管4
と上記処理槽本体1とを第二の循環路6を介して連通し
ている。Here, in the present invention, as shown in the drawing, the perforated water supply pipe 4 communicating with the overflow tank 2 via the first circulation path 7 is provided on one side in the processing tank body 1 by immersion. A rectifying grid 3 for rectifying is similarly dipped and provided on one side of the porous water supply pipe 4. Also, the perforated water supply pipe 4
And the processing tank body 1 are communicated with each other via the second circulation path 6.
【0009】尚、図中符号6a,7aはそれぞれ上記循
環路6,7中に設けたフィルター、6b,7bは同じく
該循環路6,7に設けた還流用のポンプ、8a,9a,
10aは、上記供給管8と上記排出管9,10の各バル
ブを示す。In the figure, reference numerals 6a and 7a denote filters provided in the circulation paths 6 and 7, reference numerals 6b and 7b denote reflux pumps also provided in the circulation paths 6 and 7, and 8a and 9a, respectively.
Reference numeral 10a denotes each valve of the supply pipe 8 and the discharge pipes 9 and 10.
【0010】上記構成を有する本発明の処理槽は、図示
したように処理を要するプリント基板や半導体等の部品
11を、該部品11を傾斜した状態で保持する固定治具
5により処理槽本体1内にセットし、ポンプ6b,7b
により該処理槽本体1内の液体とオーバーフロー槽2に
溢れた液体をそれぞれ循環路6,7を介して多孔給水管
4に送り込み、該多孔給水管4から噴出した乱流状態の
液体を整流格子3で整流して、図中矢印で示すような層
流状態として上記部品11の側方から通過させることに
より、該部品11表面のエッチングや洗浄等の処理を行
うものである。この時、オーバーフロー槽2に溢れた液
体中に混入している塵等の比較的軽いパーティクル粒子
は、循環路7中に設けたフィルター7aで除去され、処
理槽1の下方に沈殿したエッチング屑等の比較的重いパ
ーティクル粒子は、循環路6中に設けたフィルター6a
で除去される。In the processing tank of the present invention having the above-mentioned structure, the processing tank main body 1 is provided with a fixing jig 5 for holding a component 11 such as a printed circuit board or a semiconductor which requires processing as shown in the figure in an inclined state. Set inside and pump 6b, 7b
The liquid in the processing tank main body 1 and the liquid overflowing the overflow tank 2 are sent to the perforated water supply pipe 4 through the circulation paths 6 and 7, respectively, and the turbulent liquid ejected from the perforated water supply pipe 4 is rectified by a rectifying grid. By rectifying at 3 and passing it from the side of the component 11 in a laminar flow state as shown by the arrow in the figure, the surface of the component 11 is subjected to processing such as etching and cleaning. At this time, relatively light particle particles such as dust mixed in the liquid overflowing the overflow tank 2 are removed by the filter 7a provided in the circulation path 7, and etching wastes and the like precipitated below the processing tank 1 are removed. The relatively heavy particle particles of the filter 6a installed in the circulation path 6
Will be removed.
【0011】このようにして本発明の処理槽では、処理
槽中に斜めに配置された部品の側方から液体が層流状態
で流れるので、該部品の表面にはサイドフローの効果と
アップフローの効果が共に作用し、高い洗浄等の処理効
果が得られるものである。As described above, in the treatment tank of the present invention, the liquid flows in a laminar state from the side of the component obliquely arranged in the treatment tank, so that the effect of side flow and upflow are exerted on the surface of the component. The above-mentioned effects work together to obtain high processing effects such as cleaning.
【0012】尚、上記固定治具は部品を斜めに保持でき
る形状であればよいが、水流を妨げないように格子状に
形成されていれば、一層望ましい。The fixing jig may have a shape capable of holding the component obliquely, but it is more preferable if it is formed in a lattice shape so as not to impede the water flow.
【0013】[0013]
【発明の効果】以上のように本発明のエッチング等の処
理槽では、槽内で斜めに保持された部品の一側から液体
が層流として流れるので、部品の表面にサイドフローの
効果とアップフローの効果が作用し、従来のような洗浄
効果やエッチング効果のばらつきが見られず、均質で高
い処理効果が得られ、製品の歩留りが向上する。又、上
層部と下層部の液体を別々のフィルターで瀘過するの
で、混入したパーティクル粒子の径に応じた適正なフィ
ルターが使用でき、瀘過能力及び効率が向上する。更
に、従来のようにオーバーフローのみによるパーティク
ル粒子の除去に比し、循環させる液体量が少なくて良
く、装置が小型化されると共に、設備費やランニングコ
ストも低廉になるという多くの優れた効果を奏する。As described above, in the processing tank for etching or the like of the present invention, the liquid flows as a laminar flow from one side of the component held obliquely in the tank, so that the side flow effect and the effect on the surface of the component are improved. The effect of the flow acts, the variation of the cleaning effect and the etching effect as in the past is not seen, the uniform and high processing effect is obtained, and the product yield is improved. Further, since the upper layer liquid and the lower layer liquid are filtered with separate filters, an appropriate filter can be used according to the diameter of the mixed particle particles, and the filtering ability and efficiency are improved. Further, compared to the conventional method of removing particle particles only by overflow, the amount of liquid to be circulated may be small, the device can be downsized, and the equipment cost and running cost can be reduced. Play.
【図1】実施例の配管系統図である。FIG. 1 is a piping system diagram of an example.
【図2】従来例の配管系統図である。FIG. 2 is a piping system diagram of a conventional example.
1 処理槽本体 2 オーバーフロー槽 3 整流格子 4 多孔給水管 6,7 循環路 6a,7a フィルター 6b,7b ポンプ 1 Processing tank main body 2 Overflow tank 3 Rectifying grid 4 Perforated water supply pipe 6,7 Circulation path 6a, 7a Filter 6b, 7b Pump
Claims (2)
の内部一側に、該オーバーフロー槽と第一の循環路を介
して連通した多孔給水管を浸漬して設けると共に、該多
孔給水管からの水流を整流する整流格子を同様に浸漬し
て設け、該多孔給水管と上記処理槽本体とを第二の循環
路で連通させたことを特徴とするエッチング等の処理
槽。1. A porous water supply pipe communicating with the overflow tank via a first circulation path is provided by immersing the inside of a processing tank main body additionally provided with an overflow tank, and A processing tank for etching or the like, characterized in that a rectifying grid for rectifying a water flow is similarly provided by immersion, and the perforated water supply pipe and the processing tank main body are communicated with each other through a second circulation path.
特徴とするエッチング等の処理槽。2. A processing tank for etching or the like, characterized in that parts are obliquely arranged in the processing tank.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP3309878A JP2835546B2 (en) | 1991-10-28 | 1991-10-28 | Processing tank for etching etc. |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP3309878A JP2835546B2 (en) | 1991-10-28 | 1991-10-28 | Processing tank for etching etc. |
Publications (2)
Publication Number | Publication Date |
---|---|
JPH05121392A true JPH05121392A (en) | 1993-05-18 |
JP2835546B2 JP2835546B2 (en) | 1998-12-14 |
Family
ID=17998393
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP3309878A Expired - Fee Related JP2835546B2 (en) | 1991-10-28 | 1991-10-28 | Processing tank for etching etc. |
Country Status (1)
Country | Link |
---|---|
JP (1) | JP2835546B2 (en) |
Cited By (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5868898A (en) * | 1996-11-21 | 1999-02-09 | Taiwan Semiconductor Manufacturing Company, Ltd. | Fluid dispensing device for wet chemical process tank and method of using |
KR100627108B1 (en) * | 1999-10-08 | 2006-09-25 | 엘지.필립스 엘시디 주식회사 | Liquid Jetting Apparatus |
JP2010192641A (en) * | 2009-02-18 | 2010-09-02 | Toppan Printing Co Ltd | Surface roughening device for build-up substrate insulating layer |
JP2011018780A (en) * | 2009-07-09 | 2011-01-27 | Toppan Printing Co Ltd | Surface roughening device of build-up substrate insulating layer |
JP2011054731A (en) * | 2009-09-01 | 2011-03-17 | Renesas Electronics Corp | Method of manufacturing semiconductor device |
JP2017014742A (en) * | 2015-06-29 | 2017-01-19 | 鹿島建設株式会社 | Clear water region creation device and clear water region creation method |
CN117693127A (en) * | 2023-12-09 | 2024-03-12 | 常州澳弘电子股份有限公司 | Pattern transfer equipment based on photoetching technology and technology thereof |
Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS61117249U (en) * | 1985-01-07 | 1986-07-24 | ||
JPS6298732A (en) * | 1985-10-25 | 1987-05-08 | Matsushita Electric Ind Co Ltd | Cleaning apparatus for wafer |
JPS6373364U (en) * | 1986-10-30 | 1988-05-16 | ||
JPH0310253A (en) * | 1989-06-07 | 1991-01-17 | Fujitsu Ltd | Method for processing photomask |
-
1991
- 1991-10-28 JP JP3309878A patent/JP2835546B2/en not_active Expired - Fee Related
Patent Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS61117249U (en) * | 1985-01-07 | 1986-07-24 | ||
JPS6298732A (en) * | 1985-10-25 | 1987-05-08 | Matsushita Electric Ind Co Ltd | Cleaning apparatus for wafer |
JPS6373364U (en) * | 1986-10-30 | 1988-05-16 | ||
JPH0310253A (en) * | 1989-06-07 | 1991-01-17 | Fujitsu Ltd | Method for processing photomask |
Cited By (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5868898A (en) * | 1996-11-21 | 1999-02-09 | Taiwan Semiconductor Manufacturing Company, Ltd. | Fluid dispensing device for wet chemical process tank and method of using |
KR100627108B1 (en) * | 1999-10-08 | 2006-09-25 | 엘지.필립스 엘시디 주식회사 | Liquid Jetting Apparatus |
JP2010192641A (en) * | 2009-02-18 | 2010-09-02 | Toppan Printing Co Ltd | Surface roughening device for build-up substrate insulating layer |
JP2011018780A (en) * | 2009-07-09 | 2011-01-27 | Toppan Printing Co Ltd | Surface roughening device of build-up substrate insulating layer |
JP2011054731A (en) * | 2009-09-01 | 2011-03-17 | Renesas Electronics Corp | Method of manufacturing semiconductor device |
JP2017014742A (en) * | 2015-06-29 | 2017-01-19 | 鹿島建設株式会社 | Clear water region creation device and clear water region creation method |
CN117693127A (en) * | 2023-12-09 | 2024-03-12 | 常州澳弘电子股份有限公司 | Pattern transfer equipment based on photoetching technology and technology thereof |
CN117693127B (en) * | 2023-12-09 | 2024-05-14 | 常州澳弘电子股份有限公司 | Pattern transfer equipment based on photoetching technology and technology thereof |
Also Published As
Publication number | Publication date |
---|---|
JP2835546B2 (en) | 1998-12-14 |
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