JPH0511424B2 - - Google Patents

Info

Publication number
JPH0511424B2
JPH0511424B2 JP60258472A JP25847285A JPH0511424B2 JP H0511424 B2 JPH0511424 B2 JP H0511424B2 JP 60258472 A JP60258472 A JP 60258472A JP 25847285 A JP25847285 A JP 25847285A JP H0511424 B2 JPH0511424 B2 JP H0511424B2
Authority
JP
Japan
Prior art keywords
gate
output
column selection
basic
level
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP60258472A
Other languages
English (en)
Japanese (ja)
Other versions
JPS62229867A (ja
Inventor
Satoru Tanizawa
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fujitsu Ltd
Original Assignee
Fujitsu Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fujitsu Ltd filed Critical Fujitsu Ltd
Priority to JP60258472A priority Critical patent/JPS62229867A/ja
Priority to US06/932,261 priority patent/US4739250A/en
Priority to KR1019860009810A priority patent/KR900006048B1/ko
Priority to EP86402572A priority patent/EP0223714B1/de
Priority to DE86402572T priority patent/DE3689031T2/de
Publication of JPS62229867A publication Critical patent/JPS62229867A/ja
Publication of JPH0511424B2 publication Critical patent/JPH0511424B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G06F11/2205—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing using arrangements specific to the hardware being tested
    • G06F11/2236—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing using arrangements specific to the hardware being tested to test CPU or processors
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3185—Reconfiguring for testing, e.g. LSSD, partitioning
    • G01R31/318516—Test of programmable logic devices [PLDs]
JP60258472A 1985-11-20 1985-11-20 試験回路を有する半導体集積回路装置 Granted JPS62229867A (ja)

Priority Applications (5)

Application Number Priority Date Filing Date Title
JP60258472A JPS62229867A (ja) 1985-11-20 1985-11-20 試験回路を有する半導体集積回路装置
US06/932,261 US4739250A (en) 1985-11-20 1986-11-19 Semiconductor integrated circuit device with test circuit
KR1019860009810A KR900006048B1 (ko) 1985-11-20 1986-11-20 검사회로를 갖는 반도체 집적회로 장치
EP86402572A EP0223714B1 (de) 1985-11-20 1986-11-20 Integrierte Halbleiterschaltung mit Prüfschaltung
DE86402572T DE3689031T2 (de) 1985-11-20 1986-11-20 Integrierte Halbleiterschaltung mit Prüfschaltung.

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP60258472A JPS62229867A (ja) 1985-11-20 1985-11-20 試験回路を有する半導体集積回路装置

Publications (2)

Publication Number Publication Date
JPS62229867A JPS62229867A (ja) 1987-10-08
JPH0511424B2 true JPH0511424B2 (de) 1993-02-15

Family

ID=17320696

Family Applications (1)

Application Number Title Priority Date Filing Date
JP60258472A Granted JPS62229867A (ja) 1985-11-20 1985-11-20 試験回路を有する半導体集積回路装置

Country Status (1)

Country Link
JP (1) JPS62229867A (de)

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS4832490A (de) * 1971-09-01 1973-04-28
JPS5487142A (en) * 1977-12-23 1979-07-11 Fujitsu Ltd Lsi circuit

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS4832490A (de) * 1971-09-01 1973-04-28
JPS5487142A (en) * 1977-12-23 1979-07-11 Fujitsu Ltd Lsi circuit

Also Published As

Publication number Publication date
JPS62229867A (ja) 1987-10-08

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Legal Events

Date Code Title Description
EXPY Cancellation because of completion of term