JPH0497461A - Memory test system - Google Patents

Abstract

PURPOSE:To automatically display a test result by a test program by re-storing the test program in a main memory device after executing memory tests on all the main storage areas, and re-starting up a system without interposing another's hand. CONSTITUTION:A test completion detecting processing part 240 starts up a test program re-storage processing part 260 when tests on all the areas of the main memory device 20 are performed, or when '1' is stored in a test completion flag area 6621, and makes a test execution processing part 230 execute the next address in the case other than that. The text program re-storage processing part 260 re-stores the test program 200 in the main memory device 20 from an external memory device 70. Thence, a test program re-starting processing part 270 starts up a test result display part 280 in the test program 200 re-stored in the main memory device 20. A started up test result display part 280 displays the test result stored in a test result storage part 660. Thereby, the test result is automatically displayed.

Description

DETAILED DESCRIPTION OF THE INVENTION [Field of Industrial Application] The present invention relates to a memory testing method that has a storage area within a processor and targets the entire area of the main storage device.

[Conventional technology]

Conventionally, in memory tests that target the entire main memory area, the test program stored in the main memory is destroyed after the test execution is completed, so the tester must use the operation panel connected to the data processing device. The test results were confirmed by operating the .

In addition, in order to run the test program again using the conventional memory test method, the tester operates the operation panel connected to the data processing device, stores the test program back into the main memory, and restarts the test program. The method used was to do so.

[Problem to be solved by the invention]

As described above, in the conventional memory test method that targets the entire main storage area, the test program on the main storage device is destroyed after the test is completed. Therefore, to check the test results, the tester must operate the operation panel. or,
In order to run the test program again, the tester must:
Each time, operate the operation panel to restart the system.
The test program must be restored to main memory,
The drawback was that it was time-consuming and difficult to use.

SUMMARY OF THE INVENTION An object of the present invention is to provide a memory test method that can automatically display test results and that does not require manual re-storing of test programs when repeatedly executing tests.

[Means to solve the problem]

The memory test method of the present invention has a storage area in a processor and tests the main storage area of a data processing device. A test section transfer means for transferring to a storage area in the processor, a test execution section activating section for activating the transferred test execution section, and a test result for storing the test result in the main storage area in the storage area in the processor. storage means; test program restorage means for restoring the test program in the main storage device after the test is completed;
The test program is configured to include test restart means for restarting the test program re-stored in the test program re-storage means, and test result display means for displaying the test results stored in the test result storage means.

〔Example〕

Next, embodiments of the book will be described in detail with reference to the drawings. Referring to FIG. 1 showing one embodiment of the present invention, the test system includes a keyboard 7/display 10, a main storage device 20, a processor 30, and an input/output control device 40.
, an external storage device 70 , and a bus bar 90 .

Main storage device 20. Processor 30 and input/output control device 4
0 is connected to a bus bar 90, and the input/output control device 40 is connected to a keyboard/display 10, which is input/output means, and an external storage device 70. A test program 200 is stored in the external storage device 70.

The test program 200 includes a test section transfer processing section 210,
Test start processing section 220, test execution processing section 230, test result determination processing section 240, and test end detection processing section 250
, a test program restorage processing section (test program restorage means) 260, a test restart processing section (test restart means) 270, and a test result display processing section 280.

The in-processor storage area 60 in the processor 30 includes a test execution processing storage section 610 and a test result determination processing storage section 6.
20, a test end detection processing storage section 630, and a test program restorage processing storage section (test program restorage means) 6.
40 and a test restart processing storage unit (test restart means) 65
0 and a test result storage section 660.

FIG. 2 is a block diagram of the test result storage section 660 in FIG. 1. The test result storage section 660 is the error information storage section 66.
1 and a test completion information storage section 662.

The error information storage section 661 includes an error determination flag area 66
11. Address storage area 6612 and data storage area 6
613kr.

It is configured. The test completion information storage area 662 includes a test completion flag area 6621.

Next, a processing flow of an embodiment of the present invention will be explained with reference to FIG. First, the tester operates the keyboard and display 10 to store the test program 200 in the external storage device 70 into the main storage device 20. Then, the tester inputs a command to start a memory test targeting the entire main storage area from the keyboard/display 10. (
Step 100).

When starting a memory test, first the test section transfer processing section 21
Control is transferred to 0. The test section transfer processing section 210 is a test execution processing section 230 . Test result determination processing section 240. Test end detection processing section 250. Test program restorage processing unit 260.
and the test restart processing unit 270 in the processor storage area 6.
Test execution processing storage section 610 in 0. Test result determination processing storage unit 620. Test end detection processing storage unit 630. Test program restorage processing storage unit 640. and the test restart processing storage unit 650 (step 110).

Next, the test startup processing unit 220
The test execution processing section 230 transferred to the test execution processing storage section 610 in 0 is activated. The test execution processing unit 230
First, a test is performed on the first address of the main storage device 20 (step 120). The test results are transferred to the test result determination processing storage section 620 in the internal processor storage area 60,
Determined by the test result determination unit 240 (Step 1
30).

If the test result determination unit 240 determines that the test result is normal, it transfers control to the test end detection processing unit 250 (step 140). Further, if the test result determination unit 240 determines that the test result is an error, it stores '1' in the error determination flag area 6611 in the error information storage unit 661 and the address at the time of the error in the address storage area 6612. Address data is stored in the data storage area 6613. Furthermore, the test result determination section 240 stores °1'' in the test end flag area 6621 in the test end information storage section 662, and transfers control to the test end detection processing section 250 (step 150).

The test completion detection processing unit 250 detects whether the test has been performed on all areas of the main storage device 20 or the test completion flag area 6.
If '1' is stored in 621, the test block restorage process 260 is activated, otherwise the test execution process unit 230 is executed for the next address (step 160). Test program restorage processing unit 26
0 re-stores the test program 200 from the external storage device 70 into the main storage device 20 (step 170).

Next, the test program restart processing section 270 starts up the test result display section 280 in the test program 200 that has been restored in the main storage device t20 (step 180).

The activated test result display section 280 first examines the contents of the error determination area 6611 in the test result storage section 660 (
step 190). If error determination flag area 6611
If the value is 0', display on the keyboard/display 10 that the test has been successfully completed.Step 20
0). Furthermore, if the error determination flag area 6611 is "1", the test has ended abnormally, so the address where the error occurred and the address storage area 6612 and data storage area 6613 where the data of the address where the error occurred are stored. The content of is displayed on the keyboard/display 10 (step 210).

This completes the test and enters the command waiting state. If the user wishes to run the test again, the memory test start command may be input again from the keyboard/display 10 (step 220).

〔Effect of the invention〕

As explained above, the present invention displays the test results in the test program by re-storing the test program in the lost storage device and restarting it without human intervention after executing the memory test on the entire storage area. This has the advantage that it can be performed automatically, and even when the test program is repeatedly executed, it is possible to execute the test program without manually re-storing it.

[Brief explanation of drawings]

FIG. 1 is a configuration diagram showing one embodiment of the present invention, and FIG.
FIG. 3 is a block diagram of the test result storage unit in the storage area within the processor, and FIG. 3 is a flowchart showing the flow of processing in an embodiment of the present invention. DESCRIPTION OF SYMBOLS 10... Keyboard/display, 20... Main storage device, 30... Processor, 40... Input/output control device, 60... Storage area in processor, 70... External storage device, 90. ...Bus bar, 200...Test program, 210...Test section transfer processing section, 220...Test start processing section, 230...Test execution processing section, 240.
...Test result determination processing section, 250... Test completion detection processing section, 260... Test program restorage processing section, 27
0... Test restart processing unit, 280... Test result display processing unit, 610... Test execution processing storage unit, 620...
- Test result determination processing storage section, 630... Test end detection processing storage section, 640... Test program restorage processing storage section, 650... Test restart processing storage section, 660...
・Test result storage unit, 661...Error information storage unit, 6
62...Test end information storage section, 6611...Error judgment flag area, 6612...Address storage area, 6
613...Data storage area, 6621...Test end flag area.

Claims (1)

[Claims] In a memory test method that has a storage area in a processor and tests the main storage area of a data processing device, a test unit that transfers a test execution part of a test program stored in the main storage device to the storage area in the processor. a transfer means; a test execution unit activating unit for activating the transferred test execution unit; a test result storage unit for storing the test results in the main storage area in a storage area in the processor; a test program restoring means for restoring the program in the main storage device; a test restarting means for restarting the test program restored in the test program restoring means; and a test program stored in the test result storage means. A memory test method characterized by comprising a test result display means for displaying the results.