JPH0496081U - - Google Patents

Info

Publication number
JPH0496081U
JPH0496081U JP83191U JP83191U JPH0496081U JP H0496081 U JPH0496081 U JP H0496081U JP 83191 U JP83191 U JP 83191U JP 83191 U JP83191 U JP 83191U JP H0496081 U JPH0496081 U JP H0496081U
Authority
JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP83191U
Other languages
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP83191U priority Critical patent/JPH0496081U/ja
Publication of JPH0496081U publication Critical patent/JPH0496081U/ja
Pending legal-status Critical Current

Links

Landscapes

  • Testing Of Individual Semiconductor Devices (AREA)
  • Measuring Leads Or Probes (AREA)
  • Tests Of Electronic Circuits (AREA)
JP83191U 1991-01-16 1991-01-16 Pending JPH0496081U (enrdf_load_stackoverflow)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP83191U JPH0496081U (enrdf_load_stackoverflow) 1991-01-16 1991-01-16

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP83191U JPH0496081U (enrdf_load_stackoverflow) 1991-01-16 1991-01-16

Publications (1)

Publication Number Publication Date
JPH0496081U true JPH0496081U (enrdf_load_stackoverflow) 1992-08-20

Family

ID=31727804

Family Applications (1)

Application Number Title Priority Date Filing Date
JP83191U Pending JPH0496081U (enrdf_load_stackoverflow) 1991-01-16 1991-01-16

Country Status (1)

Country Link
JP (1) JPH0496081U (enrdf_load_stackoverflow)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH04289467A (ja) * 1991-02-04 1992-10-14 Hitachi Electron Eng Co Ltd Ｉｃデバイスの電気的特性測定装置
WO1999042851A1 (fr) * 1998-02-20 1999-08-26 Advantest Corporation Structure d'interface de dispositif de test
JP2015034795A (ja) * 2013-08-09 2015-02-19 東洋電子技研株式会社 テスト装置と、それを構成するコンタクト装置と、そのテスト装置を構成する種類別中継部

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS61201451A (ja) * 1985-03-04 1986-09-06 Hitachi Electronics Eng Co Ltd Ｉｃソケットの支承構造
JPH01163683A (ja) * 1987-12-21 1989-06-27 Mitsubishi Electric Corp 半導体試験装置

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS61201451A (ja) * 1985-03-04 1986-09-06 Hitachi Electronics Eng Co Ltd Ｉｃソケットの支承構造
JPH01163683A (ja) * 1987-12-21 1989-06-27 Mitsubishi Electric Corp 半導体試験装置

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH04289467A (ja) * 1991-02-04 1992-10-14 Hitachi Electron Eng Co Ltd Ｉｃデバイスの電気的特性測定装置
WO1999042851A1 (fr) * 1998-02-20 1999-08-26 Advantest Corporation Structure d'interface de dispositif de test
JP2015034795A (ja) * 2013-08-09 2015-02-19 東洋電子技研株式会社 テスト装置と、それを構成するコンタクト装置と、そのテスト装置を構成する種類別中継部

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Effective date: 19970805