JPH0483793A - Apparatus for vapor growth - Google Patents
Apparatus for vapor growthInfo
- Publication number
- JPH0483793A JPH0483793A JP19836290A JP19836290A JPH0483793A JP H0483793 A JPH0483793 A JP H0483793A JP 19836290 A JP19836290 A JP 19836290A JP 19836290 A JP19836290 A JP 19836290A JP H0483793 A JPH0483793 A JP H0483793A
- Authority
- JP
- Japan
- Prior art keywords
- liquid source
- source material
- liquid
- sectional area
- vapor phase
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 239000007788 liquid Substances 0.000 claims abstract description 62
- 239000000463 material Substances 0.000 claims abstract description 44
- 239000000758 substrate Substances 0.000 claims abstract description 22
- QSHDDOUJBYECFT-UHFFFAOYSA-N mercury Chemical compound [Hg] QSHDDOUJBYECFT-UHFFFAOYSA-N 0.000 claims abstract description 12
- 229910052753 mercury Inorganic materials 0.000 claims abstract description 12
- 239000007787 solid Substances 0.000 claims description 18
- 238000001947 vapour-phase growth Methods 0.000 claims description 14
- 239000013078 crystal Substances 0.000 claims description 11
- 238000007738 vacuum evaporation Methods 0.000 claims description 5
- 238000010438 heat treatment Methods 0.000 claims description 3
- 238000003860 storage Methods 0.000 abstract description 3
- MARUHZGHZWCEQU-UHFFFAOYSA-N 5-phenyl-2h-tetrazole Chemical compound C1=CC=CC=C1C1=NNN=N1 MARUHZGHZWCEQU-UHFFFAOYSA-N 0.000 description 6
- 239000004065 semiconductor Substances 0.000 description 6
- 150000001875 compounds Chemical class 0.000 description 5
- 238000010586 diagram Methods 0.000 description 5
- 238000001704 evaporation Methods 0.000 description 4
- 238000000034 method Methods 0.000 description 4
- 230000008020 evaporation Effects 0.000 description 3
- GYHNNYVSQQEPJS-UHFFFAOYSA-N Gallium Chemical compound [Ga] GYHNNYVSQQEPJS-UHFFFAOYSA-N 0.000 description 2
- 229910000661 Mercury cadmium telluride Inorganic materials 0.000 description 2
- 229910052733 gallium Inorganic materials 0.000 description 2
- 238000009434 installation Methods 0.000 description 2
- 239000002994 raw material Substances 0.000 description 2
- 235000015067 sauces Nutrition 0.000 description 2
- 229910052714 tellurium Inorganic materials 0.000 description 2
- PORWMNRCUJJQNO-UHFFFAOYSA-N tellurium atom Chemical compound [Te] PORWMNRCUJJQNO-UHFFFAOYSA-N 0.000 description 2
- 239000012808 vapor phase Substances 0.000 description 2
- HCHKCACWOHOZIP-UHFFFAOYSA-N Zinc Chemical compound [Zn] HCHKCACWOHOZIP-UHFFFAOYSA-N 0.000 description 1
- MDPILPRLPQYEEN-UHFFFAOYSA-N aluminium arsenide Chemical compound [As]#[Al] MDPILPRLPQYEEN-UHFFFAOYSA-N 0.000 description 1
- 229910052793 cadmium Inorganic materials 0.000 description 1
- BDOSMKKIYDKNTQ-UHFFFAOYSA-N cadmium atom Chemical compound [Cd] BDOSMKKIYDKNTQ-UHFFFAOYSA-N 0.000 description 1
- 238000006243 chemical reaction Methods 0.000 description 1
- 238000000151 deposition Methods 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 229910052710 silicon Inorganic materials 0.000 description 1
- 239000010703 silicon Substances 0.000 description 1
- 238000001771 vacuum deposition Methods 0.000 description 1
- 229910052725 zinc Inorganic materials 0.000 description 1
- 239000011701 zinc Substances 0.000 description 1
Landscapes
- Crystals, And After-Treatments Of Crystals (AREA)
- Physical Deposition Of Substances That Are Components Of Semiconductor Devices (AREA)
Abstract
Description
【発明の詳細な説明】
〔概 要〕
真空蒸着型、或いはホットウォール型の気相エピタキシ
ャル成長装置に関し、
常温では液体のソース材料の蒸発成分が所定量制御され
てエピタキシャル成長用の基板に供給される装置を目的
とし、
基板と、該基板上に形成すべきエピタキシャル結晶の形
成成分を含む固体、或いは液体ソース材料の収容容器と
、上記基板と固体、或いは液体ソ−ス材料収容容器とを
収容する真空容器とより成り、
前記固体、或いは液体ソース材料を加熱蒸発させて該ソ
ース材料の成分を基板上に被着してエピタキシャル結晶
を形成する装置に於いて、前記液体ソース材料の収容容
器として先端部で断面積がそれぞれ異なるU字管を用い
、該断面積が小さいU字管の細管部を少なくとも一箇所
以上絞って前記真空容器内に設け、断面積が大きいU字
管の太管部を真空容器外に設けて液溜と成し、該液溜内
に液体のソース材料を収容したことで構成する。[Detailed Description of the Invention] [Summary] Regarding a vacuum evaporation type or hot wall type vapor phase epitaxial growth apparatus, an apparatus in which a predetermined amount of evaporated components of a source material, which is liquid at room temperature, is controlled and supplied to a substrate for epitaxial growth. A vacuum accommodating a substrate, a container for storing a solid or liquid source material containing a component for forming an epitaxial crystal to be formed on the substrate, and a container for storing the substrate and the solid or liquid source material. In an apparatus for heating and evaporating the solid or liquid source material and depositing components of the source material on a substrate to form an epitaxial crystal, the tip part serves as a storage container for the liquid source material. Using U-shaped tubes with different cross-sectional areas, the thin tube section of the U-shaped tube with a small cross-sectional area is squeezed in at least one place and placed in the vacuum container, and the thick tube section of the U-shaped tube with a large cross-sectional area is evacuated. It is constructed by providing a liquid reservoir outside the container and storing a liquid source material in the liquid reservoir.
本発明は真空蒸着型、或いはホットウォール型気相成長
装置に係り、特に液体のソース材料を供給する機構を備
えた気相成長装置に関する。The present invention relates to a vacuum deposition type or hot wall type vapor phase growth apparatus, and particularly to a vapor phase growth apparatus equipped with a mechanism for supplying a liquid source material.
近年、シリコンのような単体の半導体に無い特徴、例え
ばエネルギーバンドギヤツブの狭い特徴を持った化合物
半導体の結晶成長技術の開発が、光電変換素子形成材料
として使用するために要望されている。In recent years, there has been a demand for the development of crystal growth techniques for compound semiconductors that have features that are not found in single semiconductors such as silicon, such as narrow energy band gears, for use as materials for forming photoelectric conversion elements.
このような化合物半導体として、水銀・カドミウム・テ
ルル(HgCdTe) 、水銀・亜鉛・テルル(HgZ
nTe) 、ガリウム・アルミニウム・砒素(GaAl
As)等を成長する場合、該化合物半導体を構成する
元素として水銀(Hg)、ガリウム(Ga)等の常温で
は液体のソース材料を蒸発して気相成長する必要がある
。Examples of such compound semiconductors include mercury, cadmium, and tellurium (HgCdTe), and mercury, zinc, and tellurium (HgZ).
nTe), gallium aluminum arsenic (GaAl
When growing a material such as As), it is necessary to evaporate a source material such as mercury (Hg) or gallium (Ga), which is liquid at room temperature, as an element constituting the compound semiconductor, and perform vapor phase growth.
このような液体のソース材料を所定量、基板に供給され
ることが要望されている。It is desired that a predetermined amount of such liquid source material be provided to the substrate.
従来、このような真空蒸着型気相成長装置に於いて、基
本的な液体のソース材料を基板に供給する方法は、第4
図に示すように、真空容器1内にテルル化カドミウム(
CdTe)等の常温では固体の固体ソース材料2を収容
した固体ソース収容容器3や、Hgのような常温では液
体の液体ソース材料4を収容した液体ソース収容容器5
を設置する。Conventionally, in such a vacuum evaporation type vapor phase growth apparatus, the method of supplying the basic liquid source material to the substrate is the fourth method.
As shown in the figure, cadmium telluride (
A solid source container 3 containing a solid source material 2 that is solid at room temperature, such as CdTe), and a liquid source container 5 containing a liquid source material 4 that is liquid at room temperature, such as Hg.
Set up.
そして該収容容器3.5と対向して加熱ヒータ6を有す
る基板設置台7にカドミウムテルル(CdTe)等のエ
ピタキシャル成長用の基板8を設置し、前記収容容器4
,5の周囲に設けたヒータ9にてソース材料を加熱し、
蒸発したソース材料の成分を基板上に供給して基板上に
HgCdTeの化合物半導体結晶を気相成長している。Then, a substrate 8 for epitaxial growth such as cadmium telluride (CdTe) is placed on a substrate installation stand 7 having a heater 6 facing the storage container 3.5.
, 5, the source material is heated by a heater 9 provided around the
A compound semiconductor crystal of HgCdTe is grown on the substrate in a vapor phase by supplying the evaporated source material components onto the substrate.
然し、上記したHHのような液体ソース材料は、CdT
eのような固体ソース材料に比較して通常蒸発量が大き
く、エピタキシャル結晶の成長過程で液体ソース材料の
減少割合が大きい。このように減少割合が大きいと、液
体ソース材料の液面の位置が変動し易いため、蒸発量が
変動し、従って基板に供給される液体原料の供給量が大
幅に変動し、形成されるエピタキシャル結晶の厚さ方向
に対して組成の違いを生じ、所定の組成や、厚さを有す
るエピタキシャル結晶が得難い問題がある。However, liquid source materials such as HH mentioned above are CdT
The amount of evaporation is usually large compared to a solid source material such as e, and the rate of reduction of the liquid source material is large during the growth process of the epitaxial crystal. If the reduction rate is large in this way, the position of the liquid level of the liquid source material is likely to fluctuate, causing the amount of evaporation to fluctuate, and therefore the amount of liquid raw material supplied to the substrate to fluctuate significantly, resulting in an increase in the amount of epitaxial material that is formed. There is a problem in that the composition varies in the thickness direction of the crystal, making it difficult to obtain an epitaxial crystal having a predetermined composition and thickness.
本発明は上記した問題点を解決し、このような蒸発の激
しい、つまり消耗の激しい液体ソース材料を用いても、
蒸発成分、蒸発量が安定して得られ、基板上に液体ソー
ス材料の成分が安定して供給されるような装置の提供を
目的とする。The present invention solves the above-mentioned problems, and even when using liquid source materials that evaporate rapidly, that is, are rapidly consumed,
The object of the present invention is to provide an apparatus that can stably obtain evaporated components and evaporated amounts, and can stably supply components of a liquid source material onto a substrate.
上記した目的は、第1図の原理図に示すように断面積が
それぞれ異なるU字管のうちの、前記断面積が小さいU
字管の細管部11Aを少なくとも一箇所以上絞って気相
成長装置の真空容器12内に設け、断面積が大きいU字
管の太管部11Bを拡大して真空容器外に設けて液溜1
3と成し、該液溜内に液体ソース材料を収容したことに
よって達成される。As shown in the principle diagram of FIG. 1, the above purpose is to
The narrow tube part 11A of the tube is squeezed at least in one place and placed inside the vacuum vessel 12 of the vapor phase growth apparatus, and the thick tube part 11B of the U-shaped tube with a large cross-sectional area is expanded and placed outside the vacuum vessel to form the liquid reservoir 1.
3, and a liquid source material is accommodated in the liquid reservoir.
本発明の装置は第1図に示すように、真空容器12内に
、それぞれ断面積が異なるU字管11のうちの断面積の
小さい細管部11Aを挿入する。そしてU字管のうちの
断面積の大きい太管部11Bを真空容器12より外部に
設け、この太管部11Bの断面積を更に拡大して液溜1
3となし、この液溜13内に水銀のような液体ソース材
料14を収容する。As shown in FIG. 1, the apparatus of the present invention inserts into a vacuum container 12 a narrow tube portion 11A having a small cross-sectional area among the U-shaped tubes 11 having different cross-sectional areas. Then, a thick tube portion 11B having a large cross-sectional area of the U-shaped tube is provided outside the vacuum container 12, and the cross-sectional area of this thick tube portion 11B is further expanded to form a liquid reservoir 1.
3, and a liquid source material 14 such as mercury is contained within this liquid reservoir 13.
このようにすると、マノメータ(圧力計)と同様の原理
により、真空容器外部の大気側と真空容器側に一定の液
面差(液体のソース材料が水銀である場合、760mm
)を持って気密封止される。In this way, based on the same principle as a manometer (pressure gauge), a certain liquid level difference (760 mm if the liquid source material is mercury) can be established between the atmosphere side outside the vacuum vessel and the vacuum vessel side.
) and hermetically sealed.
更に真空容器12の大気側に口径の大きい液溜13を設
けると、真空容器12内での液体の蒸発が多い場合でも
、液溜の液面の高さを一定に保つように液溜内に水銀を
供給すれば、真空容器内の細管部11Aの液面の位置は
殆ど変化せず、従って蒸発量が変動しない。この液面の
位置の変化量は細管部と太管部との断面積比、つまり口
径比が大きい程小さい。Furthermore, if a liquid reservoir 13 with a large diameter is provided on the atmosphere side of the vacuum container 12, even if a large amount of liquid evaporates in the vacuum container 12, the liquid level in the reservoir can be kept constant. When mercury is supplied, the position of the liquid level in the thin tube portion 11A within the vacuum container hardly changes, and therefore the amount of evaporation does not change. The amount of change in the position of the liquid level becomes smaller as the cross-sectional area ratio, that is, the aperture ratio, between the narrow tube portion and the thick tube portion increases.
更に液体ソース材料の蒸発成分を基板に安定して供給す
るには、液面の高さを一定に保つ丈では不十分であり、
第2図に示すU字管の細管部で真空容器側の形状に示す
ように、U字管の細管部11Aの先端部をヒータ15に
て加熱し、水銀14を100〜200°C程度に加熱し
て常に一定温度にして供給する。Furthermore, in order to stably supply the evaporated components of the liquid source material to the substrate, the length to maintain a constant liquid level is insufficient;
As shown in the shape of the thin tube part of the U-shaped tube on the vacuum vessel side shown in FIG. It is heated and supplied at a constant temperature.
図示するように真空容器内に設置されたU字管の細管部
11八を1箇所以上絞り、U字管の口径の細い部分11
Cを設け、その細管部11Aの最先端部の中側、或いは
周囲からヒータ15にて水銀を加熱する。この時、U字
管の細管部11Aの最先端部では、液体が対流を起こし
、略一定の温度に保たれるが、口径の細い部分11Cで
それより下への対流は妨げられ、下部への熱の流出が防
止される。このような口径の細い部分11Cを複数個設
けると更に効果は大になる。As shown in the figure, the narrow tube part 118 of the U-shaped tube installed in the vacuum container is squeezed at one or more places, and the narrow diameter part 11 of the U-shaped tube is
C is provided, and the mercury is heated by the heater 15 from the inside or around the tip of the thin tube portion 11A. At this time, the liquid causes convection at the tip of the thin tube section 11A of the U-shaped tube and is kept at a substantially constant temperature, but the convection below is blocked by the narrow diameter section 11C and flows downward. This prevents heat from escaping. Providing a plurality of such narrow diameter portions 11C will further increase the effect.
このような構造により、真空容器の外部の大気側の殆ど
室温に近い液体原料ソースを真空容器側へ所望の温度に
した状態で常に安定して供給することが出来る。With this structure, it is possible to always stably supply a liquid raw material source at a temperature close to room temperature on the atmosphere side outside the vacuum container to the vacuum container side at a desired temperature.
以下、本発明の一実施例に付き図面を用いて詳細に説明
する。Hereinafter, one embodiment of the present invention will be described in detail using the drawings.
第3図に真空蒸着装置の一種であるホットウォール型気
相成長装置に於ける一実施例を示す。FIG. 3 shows an embodiment of a hot wall type vapor phase growth apparatus, which is a type of vacuum evaporation apparatus.
第3図に於いて、前記した第1図に示したように液体ソ
ース収容容器16は同様な構造を有している。この容器
の細管部11Aの先端部にCdTeより成る固体ソース
材料17を収容する固体ソース収容容器18を設ける。In FIG. 3, the liquid source container 16 has a structure similar to that shown in FIG. 1 described above. A solid source container 18 containing a solid source material 17 made of CdTe is provided at the tip of the thin tube portion 11A of this container.
そしてこの固体ソース収容容器の周囲にも固体ソースを
加熱するためのヒータ19を設ける。A heater 19 for heating the solid sauce is also provided around the solid sauce container.
このようにしてエピタキシャル成長用の基板21を基板
設置台22に備えた加熱ヒータ23によって180〜3
00°C程度の温度に加熱し、上記固体ソースを収容容
器18の周囲に設けたヒータ19にて500°C程度の
温度に加熱し、前記細管部11Aの先端部に設けたヒー
タ15を200 ”C程度に加熱して上記室温の液体ソ
ース材料の水銀14を加熱して基板に供給する。このよ
うにすれば、液体ソース材料の蒸発量が安定した状態に
て基板に供給されるので、蒸発量が激しく、蒸発量の制
御が困難な液体ソース材料を用いても組成の安定した均
一な厚さのHg+−xCdx Teのエピタキシャル結
晶が得られる。In this way, the substrate 21 for epitaxial growth is heated to 180-3
The solid source is heated to a temperature of about 500°C using a heater 19 provided around the container 18, and the heater 15 provided at the tip of the thin tube portion 11A is heated to a temperature of about 200°C. The mercury 14, which is the liquid source material at room temperature, is heated to a temperature of about 100.degree. Even if a liquid source material that evaporates rapidly and is difficult to control is used, an epitaxial crystal of Hg+-xCdx Te with a stable composition and a uniform thickness can be obtained.
なお、本実施例ではホットウォール型の気相成長装置に
例を用いて述べたが、分子線エピタキシャル装置のよう
な真空蒸着型気相成長装置においても、液体ソース材料
を用いる場合に本発明の装置は適用可能である。Although this embodiment has been described using a hot wall type vapor phase growth apparatus as an example, the present invention can also be applied to a vacuum evaporation type vapor phase growth apparatus such as a molecular beam epitaxial apparatus when using a liquid source material. The device is applicable.
以上の説明から明らかなように本発明によれば、液体ソ
ース材料を用いても組成の安定した均一な厚さの化合物
半導体のエピタキシャル結晶が得られる。As is clear from the above description, according to the present invention, an epitaxial crystal of a compound semiconductor having a stable composition and a uniform thickness can be obtained even when a liquid source material is used.
第1図は本発明の装置の原理図、
第2図は本発明の装置の要部の説明図、第3図は本発明
の装置の一実施例の説明図、第4図は従来の装置を示す
模式図である。
図において、
11はU字管、12は真空容器、13は液溜、14は液
体ソース材料(水銀) 、15.19はヒータ、16は
液体ソース収容容器、17は固体ソース材料(CdTe
)、18は固体ソース収容容器、21は基板、22は基
板設置台、23は加熱ヒータを示す。
第 l 凶Fig. 1 is a diagram of the principle of the device of the present invention, Fig. 2 is an explanatory diagram of the main parts of the device of the present invention, Fig. 3 is an explanatory diagram of an embodiment of the device of the present invention, and Fig. 4 is a diagram of the conventional device. FIG. In the figure, 11 is a U-shaped tube, 12 is a vacuum container, 13 is a liquid reservoir, 14 is a liquid source material (mercury), 15.19 is a heater, 16 is a liquid source container, and 17 is a solid source material (CdTe).
), 18 is a solid source container, 21 is a substrate, 22 is a substrate installation stand, and 23 is a heater. The first evil
Claims (3)
シャル結晶の形成成分を含む固体、或いは液体ソース材
料(17、14)を収容する固体、或いは液体ソース収
容容器(18、16)と、 上記基板(21)と固体、或いは液体ソース収容容器(
18、16)とを収容する真空容器(12)とより成り
、前記固体、或いは液体ソース材料(17、14)を加
熱蒸発させて該ソース材料の成分を基板(21)上に被
着してエピタキシャル結晶を形成する装置に於いて、 前記液体ソース収容容器(16)を断面積がそれぞれ先
端部で異なるU字管(11)を用い、かつ断面積が小さ
いU字管の細管部(11A)を少なくとも一箇所以上絞
って前記真空容器(12)内に設け、断面積が大きいU
字管の太管部(11B)を真空容器外に設けて液溜(1
3)と成し、該液溜内に液体ソース材料(14)を収容
したことを特徴とする気相成長装置。(1) A substrate (21) and a solid containing a forming component of an epitaxial crystal to be formed on the substrate, or a solid or liquid source containing container (18, 16) containing a liquid source material (17, 14); , the substrate (21) and a solid or liquid source container (
18, 16), the solid or liquid source material (17, 14) is heated and evaporated to deposit the components of the source material on the substrate (21). In an apparatus for forming epitaxial crystals, the liquid source container (16) is formed by using U-shaped tubes (11) each having a different cross-sectional area at its tip, and using a narrow tube portion (11A) of the U-shaped tube having a small cross-sectional area. is provided in the vacuum container (12) by squeezing at least one place, and the U having a large cross-sectional area is
The thick pipe part (11B) of the shape pipe is installed outside the vacuum container and the liquid reservoir (1
3) A vapor phase growth apparatus characterized in that a liquid source material (14) is accommodated in the liquid reservoir.
に加熱手段(15)を設けたことを特徴とする請求項(
1)記載の気相成長装置。(2) Claim (2) characterized in that a heating means (15) is provided at the tip of the thin tube portion (11A) of the U-shaped tube (11).
1) The vapor phase growth apparatus described above.
成長装置がホットウォール型気相成長装置、或いは真空
蒸着型気相成長装置であることを特徴とする請求項(1
)、或いは(2)に記載の気相成長装置。(3) Claim (1) characterized in that the liquid source material (14) is mercury and the vapor phase growth apparatus is a hot wall type vapor phase growth apparatus or a vacuum evaporation type vapor phase growth apparatus.
), or the vapor phase growth apparatus described in (2).
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP19836290A JPH0483793A (en) | 1990-07-24 | 1990-07-24 | Apparatus for vapor growth |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP19836290A JPH0483793A (en) | 1990-07-24 | 1990-07-24 | Apparatus for vapor growth |
Publications (1)
Publication Number | Publication Date |
---|---|
JPH0483793A true JPH0483793A (en) | 1992-03-17 |
Family
ID=16389848
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP19836290A Pending JPH0483793A (en) | 1990-07-24 | 1990-07-24 | Apparatus for vapor growth |
Country Status (1)
Country | Link |
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JP (1) | JPH0483793A (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2012530852A (en) * | 2010-02-23 | 2012-12-06 | サエス・ゲッターズ・エッセ・ピ・ア | Method and system for controlled supply of mercury and apparatus manufactured using this method |
-
1990
- 1990-07-24 JP JP19836290A patent/JPH0483793A/en active Pending
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2012530852A (en) * | 2010-02-23 | 2012-12-06 | サエス・ゲッターズ・エッセ・ピ・ア | Method and system for controlled supply of mercury and apparatus manufactured using this method |
US8453892B2 (en) | 2010-02-23 | 2013-06-04 | Saes Getters S.P.A. | Method and system for the controlled dispensing of mercury and devices manufactured through this method |
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