JPH0478552U - - Google Patents
Info
- Publication number
- JPH0478552U JPH0478552U JP12173990U JP12173990U JPH0478552U JP H0478552 U JPH0478552 U JP H0478552U JP 12173990 U JP12173990 U JP 12173990U JP 12173990 U JP12173990 U JP 12173990U JP H0478552 U JPH0478552 U JP H0478552U
- Authority
- JP
- Japan
- Prior art keywords
- voltage
- casing
- contact
- current
- pressable
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000001514 detection method Methods 0.000 claims description 3
- 238000005259 measurement Methods 0.000 claims description 2
- 239000000523 sample Substances 0.000 claims description 2
- 238000010586 diagram Methods 0.000 description 5
- 238000000034 method Methods 0.000 description 1
- NJPPVKZQTLUDBO-UHFFFAOYSA-N novaluron Chemical compound C1=C(Cl)C(OC(F)(F)C(OC(F)(F)F)F)=CC=C1NC(=O)NC(=O)C1=C(F)C=CC=C1F NJPPVKZQTLUDBO-UHFFFAOYSA-N 0.000 description 1
Landscapes
- Measuring Leads Or Probes (AREA)
- Investigating Or Analyzing Materials By The Use Of Electric Means (AREA)
Description
第1図は本考案き裂形状検知プローブの一実施
例の斜視図、第2図は第1図の−に沿つた断
面図、第3図は測定要領の説明図、第4図は無次
元化電位差と無次元化き裂深さとの関係の線図、
第5図は無次元化電位差とき裂深さとの関係の線
図である。第6図は従来のき裂形状検知方法を示
す斜視図、第7図は測定電位差分布の線図である
。
1……電圧接触子ケーシング、2……電流接触
子ケーシング、3……ガイド板、4……目盛、5
……マグネツト板、6……接触子ホルダー、7…
…マグネツト板、8……接触子サポート、9……
電圧接触子、10……ばね台座、11……ばね、
12……電流接触子、13……固定用マグネツト
、14……ケーブル取出口、15……電圧ケーブ
ル、16……電流ケーブル、17……測定システ
ム、18……定電流源、19……切換器、20…
…マイクロボルトメーター、21……スキヤナー
、22……パソコン、23……データライン、2
4……被測定物。
Figure 1 is a perspective view of an embodiment of the crack shape detection probe of the present invention, Figure 2 is a cross-sectional view taken along - in Figure 1, Figure 3 is an explanatory diagram of the measurement procedure, and Figure 4 is a dimensionless diagram. Diagram of the relationship between dimensional potential difference and dimensionless crack depth,
FIG. 5 is a diagram of the relationship between dimensionless potential difference and crack depth. FIG. 6 is a perspective view showing a conventional crack shape detection method, and FIG. 7 is a diagram of a measured potential difference distribution. 1... Voltage contact casing, 2... Current contact casing, 3... Guide plate, 4... Scale, 5
...Magnetic plate, 6...Contact holder, 7...
...Magnetic plate, 8...Contact support, 9...
Voltage contactor, 10... Spring pedestal, 11... Spring,
12...Current contact, 13...Fixing magnet, 14...Cable outlet, 15...Voltage cable, 16...Current cable, 17...Measuring system, 18...Constant current source, 19...Switching Vessel, 20...
...Microvoltmeter, 21...Scanner, 22...PC, 23...Data line, 2
4...Object to be measured.
Claims (1)
接触子ケーシング及び電流接触子ケーシングと、
上記電圧接触子ケーシング内に長手方向へ移動可
能に収納された複数並列の接触子ホルダーと、上
記各接触子ホルダーにケーシング横手方向に並び
外部へ押圧可能に挿入された1対の電圧接触子と
、上記電流接触子ケーシング内の電圧ケーシング
を跨ぐ適宜位置に上記電圧接触子と同じ方向で外
部へ押圧可能に挿入された1対の電流接触子と、
上記電圧接触子及び電流接触子にケーブルを介し
接続された測定システムとを具えたことを特徴と
するき裂形状検知プローブ。 a long box-shaped voltage contact casing and a current contact casing that intersect in a criss-cross pattern approximately in the center;
a plurality of parallel contact holders housed in the voltage contact casing so as to be movable in the longitudinal direction; and a pair of voltage contacts inserted in each of the contact holders in a lateral direction of the casing so as to be pressable to the outside. , a pair of current contacts inserted in an appropriate position straddling the voltage casing in the current contact casing so as to be pressable to the outside in the same direction as the voltage contacts;
A crack shape detection probe comprising a measurement system connected to the voltage contactor and the current contactor via a cable.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP12173990U JPH0478552U (en) | 1990-11-20 | 1990-11-20 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP12173990U JPH0478552U (en) | 1990-11-20 | 1990-11-20 |
Publications (1)
Publication Number | Publication Date |
---|---|
JPH0478552U true JPH0478552U (en) | 1992-07-08 |
Family
ID=31869578
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP12173990U Pending JPH0478552U (en) | 1990-11-20 | 1990-11-20 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPH0478552U (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2013044600A (en) * | 2011-08-23 | 2013-03-04 | Jx Nippon Oil & Energy Corp | Method for estimating depth of crack in conductive material-made structure |
Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS63132151A (en) * | 1986-11-21 | 1988-06-04 | Hitachi Ltd | Surface defect detector |
-
1990
- 1990-11-20 JP JP12173990U patent/JPH0478552U/ja active Pending
Patent Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS63132151A (en) * | 1986-11-21 | 1988-06-04 | Hitachi Ltd | Surface defect detector |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2013044600A (en) * | 2011-08-23 | 2013-03-04 | Jx Nippon Oil & Energy Corp | Method for estimating depth of crack in conductive material-made structure |
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