JPH0478552U - - Google Patents

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Publication number
JPH0478552U
JPH0478552U JP12173990U JP12173990U JPH0478552U JP H0478552 U JPH0478552 U JP H0478552U JP 12173990 U JP12173990 U JP 12173990U JP 12173990 U JP12173990 U JP 12173990U JP H0478552 U JPH0478552 U JP H0478552U
Authority
JP
Japan
Prior art keywords
voltage
casing
contact
current
pressable
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP12173990U
Other languages
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP12173990U priority Critical patent/JPH0478552U/ja
Publication of JPH0478552U publication Critical patent/JPH0478552U/ja
Pending legal-status Critical Current

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  • Measuring Leads Or Probes (AREA)
  • Investigating Or Analyzing Materials By The Use Of Electric Means (AREA)

Description

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は本考案き裂形状検知プローブの一実施
例の斜視図、第2図は第1図の−に沿つた断
面図、第3図は測定要領の説明図、第4図は無次
元化電位差と無次元化き裂深さとの関係の線図、
第5図は無次元化電位差とき裂深さとの関係の線
図である。第6図は従来のき裂形状検知方法を示
す斜視図、第7図は測定電位差分布の線図である
。 1……電圧接触子ケーシング、2……電流接触
子ケーシング、3……ガイド板、4……目盛、5
……マグネツト板、6……接触子ホルダー、7…
…マグネツト板、8……接触子サポート、9……
電圧接触子、10……ばね台座、11……ばね、
12……電流接触子、13……固定用マグネツト
、14……ケーブル取出口、15……電圧ケーブ
ル、16……電流ケーブル、17……測定システ
ム、18……定電流源、19……切換器、20…
…マイクロボルトメーター、21……スキヤナー
、22……パソコン、23……データライン、2
4……被測定物。
Figure 1 is a perspective view of an embodiment of the crack shape detection probe of the present invention, Figure 2 is a cross-sectional view taken along - in Figure 1, Figure 3 is an explanatory diagram of the measurement procedure, and Figure 4 is a dimensionless diagram. Diagram of the relationship between dimensional potential difference and dimensionless crack depth,
FIG. 5 is a diagram of the relationship between dimensionless potential difference and crack depth. FIG. 6 is a perspective view showing a conventional crack shape detection method, and FIG. 7 is a diagram of a measured potential difference distribution. 1... Voltage contact casing, 2... Current contact casing, 3... Guide plate, 4... Scale, 5
...Magnetic plate, 6...Contact holder, 7...
...Magnetic plate, 8...Contact support, 9...
Voltage contactor, 10... Spring pedestal, 11... Spring,
12...Current contact, 13...Fixing magnet, 14...Cable outlet, 15...Voltage cable, 16...Current cable, 17...Measuring system, 18...Constant current source, 19...Switching Vessel, 20...
...Microvoltmeter, 21...Scanner, 22...PC, 23...Data line, 2
4...Object to be measured.

Claims (1)

【実用新案登録請求の範囲】[Scope of utility model registration request] ほぼ中央部で十文字に交叉する長尺箱状の電圧
接触子ケーシング及び電流接触子ケーシングと、
上記電圧接触子ケーシング内に長手方向へ移動可
能に収納された複数並列の接触子ホルダーと、上
記各接触子ホルダーにケーシング横手方向に並び
外部へ押圧可能に挿入された1対の電圧接触子と
、上記電流接触子ケーシング内の電圧ケーシング
を跨ぐ適宜位置に上記電圧接触子と同じ方向で外
部へ押圧可能に挿入された1対の電流接触子と、
上記電圧接触子及び電流接触子にケーブルを介し
接続された測定システムとを具えたことを特徴と
するき裂形状検知プローブ。
a long box-shaped voltage contact casing and a current contact casing that intersect in a criss-cross pattern approximately in the center;
a plurality of parallel contact holders housed in the voltage contact casing so as to be movable in the longitudinal direction; and a pair of voltage contacts inserted in each of the contact holders in a lateral direction of the casing so as to be pressable to the outside. , a pair of current contacts inserted in an appropriate position straddling the voltage casing in the current contact casing so as to be pressable to the outside in the same direction as the voltage contacts;
A crack shape detection probe comprising a measurement system connected to the voltage contactor and the current contactor via a cable.
JP12173990U 1990-11-20 1990-11-20 Pending JPH0478552U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP12173990U JPH0478552U (en) 1990-11-20 1990-11-20

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP12173990U JPH0478552U (en) 1990-11-20 1990-11-20

Publications (1)

Publication Number Publication Date
JPH0478552U true JPH0478552U (en) 1992-07-08

Family

ID=31869578

Family Applications (1)

Application Number Title Priority Date Filing Date
JP12173990U Pending JPH0478552U (en) 1990-11-20 1990-11-20

Country Status (1)

Country Link
JP (1) JPH0478552U (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2013044600A (en) * 2011-08-23 2013-03-04 Jx Nippon Oil & Energy Corp Method for estimating depth of crack in conductive material-made structure

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS63132151A (en) * 1986-11-21 1988-06-04 Hitachi Ltd Surface defect detector

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS63132151A (en) * 1986-11-21 1988-06-04 Hitachi Ltd Surface defect detector

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2013044600A (en) * 2011-08-23 2013-03-04 Jx Nippon Oil & Energy Corp Method for estimating depth of crack in conductive material-made structure

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