JPS63128405U - - Google Patents
Info
- Publication number
- JPS63128405U JPS63128405U JP2164487U JP2164487U JPS63128405U JP S63128405 U JPS63128405 U JP S63128405U JP 2164487 U JP2164487 U JP 2164487U JP 2164487 U JP2164487 U JP 2164487U JP S63128405 U JPS63128405 U JP S63128405U
- Authority
- JP
- Japan
- Prior art keywords
- magnet
- opposing
- center magnet
- center
- plates
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 239000000523 sample Substances 0.000 claims description 3
- 241001422033 Thestylus Species 0.000 claims description 2
- 238000005259 measurement Methods 0.000 claims 1
- 230000007935 neutral effect Effects 0.000 claims 1
- 238000010586 diagram Methods 0.000 description 1
- 238000006073 displacement reaction Methods 0.000 description 1
Description
第1図は本考案測定プローブの正面図、第2図
は同じく測定圧発生部の縦断斜視図、第3図は同
じくスタイラスの変位と測定圧の関係を示す線図
である。
1:固定プレート、2:移動プレート、3:プ
レート連結手段、4:スタイラス、5:中心磁石
、6A,6B:対向磁石、7B:ストツパ、8A
,8B:ばね、9:被測定物、A:移動方向。
FIG. 1 is a front view of the measuring probe of the present invention, FIG. 2 is a vertical perspective view of the measuring pressure generating section, and FIG. 3 is a diagram showing the relationship between the displacement of the stylus and the measuring pressure. 1: Fixed plate, 2: Moving plate, 3: Plate connecting means, 4: Stylus, 5: Center magnet, 6A, 6B: Opposing magnet, 7B: Stopper, 8A
, 8B: Spring, 9: Measured object, A: Movement direction.
Claims (1)
固定プレートに対面して配された移動プレートと
、該移動プレートが前記固定プレートに対してプ
レート面に平行な一方向のみに弾性的に移動する
よう前記両プレートを連結するプレート連結手段
と、前記移動プレートに取付けられ被測定物に接
触させるためのスタイラスと、前記両プレートの
うち一方に中心磁石が取付けられ、前記両プレー
トのうちの他方に移動プレートの移動方向に中心
磁石を挟んで近接離間自在に保持された対向磁石
と、該対向磁石を前記中心磁石側に付勢するばね
と、前記対向磁石の中心磁石側への移動を規制す
るストツパとを具え、前記対向磁石は、前記中心
磁石と同磁極が対向するよう配置され、中心磁石
と両対向磁石の反発力がスタイラスの中立位置で
等しくなるよう中心磁石と両対向磁石との間隙が
設定されたことを特徴とする測定プローブ。 a fixed plate fixed to the probe body; a movable plate disposed facing the fixed plate; a plate connecting means for connecting both plates; a stylus attached to the movable plate for contacting the object to be measured; a center magnet attached to one of the plates; and a movable plate attached to the other of the plates. an opposing magnet held so as to be able to approach and separate from the center magnet in the direction of movement; a spring that urges the opposing magnet toward the center magnet; and a stopper that restricts movement of the opposing magnet toward the center magnet. The opposing magnet is arranged such that the same magnetic pole faces the center magnet, and the gap between the center magnet and both opposing magnets is set so that the repulsive forces of the center magnet and both opposing magnets are equal at the neutral position of the stylus. A measurement probe characterized by:
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP1987021644U JPH062081Y2 (en) | 1987-02-16 | 1987-02-16 | Measurement probe |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP1987021644U JPH062081Y2 (en) | 1987-02-16 | 1987-02-16 | Measurement probe |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS63128405U true JPS63128405U (en) | 1988-08-23 |
JPH062081Y2 JPH062081Y2 (en) | 1994-01-19 |
Family
ID=30818273
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP1987021644U Expired - Lifetime JPH062081Y2 (en) | 1987-02-16 | 1987-02-16 | Measurement probe |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPH062081Y2 (en) |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2007135857A1 (en) * | 2006-05-18 | 2007-11-29 | Panasonic Corporation | Probe for shape measuring apparatus, and shape measuring apparatus |
JP2011085404A (en) * | 2009-10-13 | 2011-04-28 | Mitsutoyo Corp | Detector and measuring device |
JP2017072455A (en) * | 2015-10-06 | 2017-04-13 | 株式会社ミツトヨ | Measurement probe and measurement probe system |
Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5635764U (en) * | 1979-08-28 | 1981-04-07 |
-
1987
- 1987-02-16 JP JP1987021644U patent/JPH062081Y2/en not_active Expired - Lifetime
Patent Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5635764U (en) * | 1979-08-28 | 1981-04-07 |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2007135857A1 (en) * | 2006-05-18 | 2007-11-29 | Panasonic Corporation | Probe for shape measuring apparatus, and shape measuring apparatus |
JP2011085404A (en) * | 2009-10-13 | 2011-04-28 | Mitsutoyo Corp | Detector and measuring device |
JP2017072455A (en) * | 2015-10-06 | 2017-04-13 | 株式会社ミツトヨ | Measurement probe and measurement probe system |
Also Published As
Publication number | Publication date |
---|---|
JPH062081Y2 (en) | 1994-01-19 |
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