JPH0476426B2 - - Google Patents

Info

Publication number
JPH0476426B2
JPH0476426B2 JP14766585A JP14766585A JPH0476426B2 JP H0476426 B2 JPH0476426 B2 JP H0476426B2 JP 14766585 A JP14766585 A JP 14766585A JP 14766585 A JP14766585 A JP 14766585A JP H0476426 B2 JPH0476426 B2 JP H0476426B2
Authority
JP
Japan
Prior art keywords
measured
brightness
reflection
diffuse reflection
measuring
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP14766585A
Other languages
English (en)
Japanese (ja)
Other versions
JPS629256A (ja
Inventor
Hirotaka Kubota
Yoshihiko Nakano
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Oki Electric Industry Co Ltd
Original Assignee
Oki Electric Industry Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Oki Electric Industry Co Ltd filed Critical Oki Electric Industry Co Ltd
Priority to JP14766585A priority Critical patent/JPS629256A/ja
Publication of JPS629256A publication Critical patent/JPS629256A/ja
Publication of JPH0476426B2 publication Critical patent/JPH0476426B2/ja
Granted legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/47Scattering, i.e. diffuse reflection
    • G01N21/4738Diffuse reflection, e.g. also for testing fluids, fibrous materials
    • G01N21/474Details of optical heads therefor, e.g. using optical fibres

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Photometry And Measurement Of Optical Pulse Characteristics (AREA)
JP14766585A 1985-07-06 1985-07-06 拡散反射輝度測定方法 Granted JPS629256A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP14766585A JPS629256A (ja) 1985-07-06 1985-07-06 拡散反射輝度測定方法

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP14766585A JPS629256A (ja) 1985-07-06 1985-07-06 拡散反射輝度測定方法

Publications (2)

Publication Number Publication Date
JPS629256A JPS629256A (ja) 1987-01-17
JPH0476426B2 true JPH0476426B2 (enrdf_load_stackoverflow) 1992-12-03

Family

ID=15435500

Family Applications (1)

Application Number Title Priority Date Filing Date
JP14766585A Granted JPS629256A (ja) 1985-07-06 1985-07-06 拡散反射輝度測定方法

Country Status (1)

Country Link
JP (1) JPS629256A (enrdf_load_stackoverflow)

Families Citing this family (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0786432B2 (ja) * 1987-10-06 1995-09-20 日本電子株式会社 赤外放射分光測定装置
JPH079395B2 (ja) * 1990-06-12 1995-02-01 明星電気株式会社 視程測定方式
US6002895A (en) * 1994-05-13 1999-12-14 Canon Kabushiki Kaisha Process cartridge
EP0686882B1 (en) * 1994-05-13 1999-08-11 Canon Kabushiki Kaisha Toner for developing electrostatic images, process cartridge, and image forming method
US5972553A (en) * 1995-10-30 1999-10-26 Canon Kabushiki Kaisha Toner for developing electrostatic image, process-cartridge and image forming method
US6020102A (en) * 1997-07-04 2000-02-01 Canon Kabushiki Kaisha Positive-chargeable toner, image forming method and apparatus unit
JP3363856B2 (ja) 1998-12-17 2003-01-08 キヤノン株式会社 正帯電性トナー、画像形成方法及び画像形成装置
US6670087B2 (en) 2000-11-07 2003-12-30 Canon Kabushiki Kaisha Toner, image-forming apparatus, process cartridge and image forming method
DE602004002137T2 (de) 2003-03-27 2007-07-19 Canon K.K. Toner
US7306889B2 (en) 2004-02-20 2007-12-11 Canon Kabushiki Kaisha Process for producing toner, and toner

Also Published As

Publication number Publication date
JPS629256A (ja) 1987-01-17

Similar Documents

Publication Publication Date Title
EP2745073B1 (en) Systems and methods for performing machine vision using diffuse structured light
WO1992009880A3 (en) Method and apparatus for automatic optical inspection
JPH0476426B2 (enrdf_load_stackoverflow)
KR20000058081A (ko) 섬광의 정량적 평가방법, 평가장치, 방현성 필름 및 그제조방법
Kelley et al. Display reflectance model based on the BRDF
JPS6355020B2 (enrdf_load_stackoverflow)
JP2672563B2 (ja) 観察方向の関数としてデイスプレイスクリーンのコントラストを測定する装置
JP2005249764A (ja) 物体色測定方式
KR940018064A (ko) 방사선 카메라 시스템
JPH0797024B2 (ja) 反射像歪の測定方法
CN218271933U (zh) 一种应用于线缆检测的划痕识别装置
JP3410231B2 (ja) カメラ受光位置補正用標板およびカメラ位置補正装置
RU94020635A (ru) Измеритель углов
Becker Measurement and evaluation of display scattering
Miettinen et al. Optical scattering measurement instrument for the design of machine vision illumination
JPS61217708A (ja) 表面性状測定方法および装置
Boynton et al. Stray light compensation in small area contrast measurements of projection displays
CN114729879A (zh) 使用显示屏后的传感器进行的光学特性测量
JP2569092Y2 (ja) 表面検出装置
JPH0517645Y2 (enrdf_load_stackoverflow)
KR20070023809A (ko) 방현성 필름
KR100487261B1 (ko) 물체의결함검사방법및검사장치
SU1682765A1 (ru) Способ измерени линейных параметров детали на микроинтерферометре
JPH0412255A (ja) 鏡面検査装置
Huang A novel direct structured-light inspection technique for contaminant and defect detection