JPH047305U - - Google Patents

Info

Publication number
JPH047305U
JPH047305U JP4660090U JP4660090U JPH047305U JP H047305 U JPH047305 U JP H047305U JP 4660090 U JP4660090 U JP 4660090U JP 4660090 U JP4660090 U JP 4660090U JP H047305 U JPH047305 U JP H047305U
Authority
JP
Japan
Prior art keywords
film
rotating shaft
measuring device
thickness
film thickness
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP4660090U
Other languages
English (en)
Japanese (ja)
Other versions
JP2510367Y2 (ja
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP1990046600U priority Critical patent/JP2510367Y2/ja
Publication of JPH047305U publication Critical patent/JPH047305U/ja
Application granted granted Critical
Publication of JP2510367Y2 publication Critical patent/JP2510367Y2/ja
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Landscapes

  • Length Measuring Devices By Optical Means (AREA)
JP1990046600U 1990-05-02 1990-05-02 膜厚測定装置 Expired - Fee Related JP2510367Y2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP1990046600U JP2510367Y2 (ja) 1990-05-02 1990-05-02 膜厚測定装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1990046600U JP2510367Y2 (ja) 1990-05-02 1990-05-02 膜厚測定装置

Publications (2)

Publication Number Publication Date
JPH047305U true JPH047305U (me) 1992-01-23
JP2510367Y2 JP2510367Y2 (ja) 1996-09-11

Family

ID=31561823

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1990046600U Expired - Fee Related JP2510367Y2 (ja) 1990-05-02 1990-05-02 膜厚測定装置

Country Status (1)

Country Link
JP (1) JP2510367Y2 (me)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH06248778A (ja) * 1993-02-26 1994-09-06 Misawa Ceramics Kk パラペット版下部の取付け構造
JP2006349530A (ja) * 2005-06-16 2006-12-28 Nippon Zeon Co Ltd シート状光学積層体の膜厚測定システム及び膜厚測定方法

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5381151A (en) * 1976-12-27 1978-07-18 Oki Electric Ind Co Ltd Surface film thickness detector
JPS5622903A (en) * 1979-08-01 1981-03-04 Kanai Hiroyuki Measuring instrument for web unevenness

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5381151A (en) * 1976-12-27 1978-07-18 Oki Electric Ind Co Ltd Surface film thickness detector
JPS5622903A (en) * 1979-08-01 1981-03-04 Kanai Hiroyuki Measuring instrument for web unevenness

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH06248778A (ja) * 1993-02-26 1994-09-06 Misawa Ceramics Kk パラペット版下部の取付け構造
JP2006349530A (ja) * 2005-06-16 2006-12-28 Nippon Zeon Co Ltd シート状光学積層体の膜厚測定システム及び膜厚測定方法

Also Published As

Publication number Publication date
JP2510367Y2 (ja) 1996-09-11

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Legal Events

Date Code Title Description
LAPS Cancellation because of no payment of annual fees