JPH0470653B2 - - Google Patents

Info

Publication number
JPH0470653B2
JPH0470653B2 JP62043235A JP4323587A JPH0470653B2 JP H0470653 B2 JPH0470653 B2 JP H0470653B2 JP 62043235 A JP62043235 A JP 62043235A JP 4323587 A JP4323587 A JP 4323587A JP H0470653 B2 JPH0470653 B2 JP H0470653B2
Authority
JP
Japan
Prior art keywords
shift
latch
chain
latches
cascade
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP62043235A
Other languages
English (en)
Japanese (ja)
Other versions
JPS62232045A (ja
Inventor
Burumu Aanorudo
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
International Business Machines Corp
Original Assignee
International Business Machines Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by International Business Machines Corp filed Critical International Business Machines Corp
Publication of JPS62232045A publication Critical patent/JPS62232045A/ja
Publication of JPH0470653B2 publication Critical patent/JPH0470653B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C19/00—Digital stores in which the information is moved stepwise, e.g. shift registers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3185—Reconfiguring for testing, e.g. LSSD, partitioning
    • G01R31/318533—Reconfiguring for testing, e.g. LSSD, partitioning using scanning techniques, e.g. LSSD, Boundary Scan, JTAG
    • G01R31/318572—Input/Output interfaces

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)
JP62043235A 1986-03-29 1987-02-27 外部からのテストが可能な論理網 Granted JPS62232045A (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
EP19860104357 EP0240578B1 (de) 1986-03-29 1986-03-29 Anordnung und Verfahren für externe Testzugriffe auf die chipinternen funktionellen Speicherelemente hochintegrierter logischer Netzwerke
EP86104357.1 1986-03-29

Publications (2)

Publication Number Publication Date
JPS62232045A JPS62232045A (ja) 1987-10-12
JPH0470653B2 true JPH0470653B2 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) 1992-11-11

Family

ID=8195024

Family Applications (1)

Application Number Title Priority Date Filing Date
JP62043235A Granted JPS62232045A (ja) 1986-03-29 1987-02-27 外部からのテストが可能な論理網

Country Status (3)

Country Link
EP (1) EP0240578B1 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html)
JP (1) JPS62232045A (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html)
DE (1) DE3679313D1 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP6221433B2 (ja) * 2013-07-09 2017-11-01 株式会社ソシオネクスト 半導体集積回路
CN112787665B (zh) * 2020-12-28 2024-08-30 珠海全志科技股份有限公司 相位可调的时钟信号产生方法及装置

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3766534A (en) * 1972-11-15 1973-10-16 Ibm Shift register storage unit with multi-dimensional dynamic ordering
EP0037900A1 (en) * 1980-03-17 1981-10-21 Rockwell International Corporation Two-level major/minor loop organization using current field access for magnetic bubble domain devices
DE3029883A1 (de) * 1980-08-07 1982-03-11 Ibm Deutschland Gmbh, 7000 Stuttgart Schieberegister fuer pruef- und test-zwecke
DE3030299A1 (de) * 1980-08-09 1982-04-08 Ibm Deutschland Gmbh, 7000 Stuttgart Schieberegister fuer pruef- und test-zwecke
EP0146645B1 (de) * 1983-12-08 1987-09-16 Ibm Deutschland Gmbh Prüf- und Diagnoseeinrichtung für Digitalrechner

Also Published As

Publication number Publication date
EP0240578A1 (de) 1987-10-14
DE3679313D1 (de) 1991-06-20
JPS62232045A (ja) 1987-10-12
EP0240578B1 (de) 1991-07-17

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