JPS62232045A - 外部からのテストが可能な論理網 - Google Patents
外部からのテストが可能な論理網Info
- Publication number
- JPS62232045A JPS62232045A JP62043235A JP4323587A JPS62232045A JP S62232045 A JPS62232045 A JP S62232045A JP 62043235 A JP62043235 A JP 62043235A JP 4323587 A JP4323587 A JP 4323587A JP S62232045 A JPS62232045 A JP S62232045A
- Authority
- JP
- Japan
- Prior art keywords
- shift
- latch
- chain
- latches
- cascade
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 238000012360 testing method Methods 0.000 claims description 42
- 238000010586 diagram Methods 0.000 description 42
- 125000002485 formyl group Chemical group [H]C(*)=O 0.000 description 25
- 238000000034 method Methods 0.000 description 20
- 230000008569 process Effects 0.000 description 14
- 230000006870 function Effects 0.000 description 12
- 239000000872 buffer Substances 0.000 description 11
- 238000013461 design Methods 0.000 description 11
- 230000008901 benefit Effects 0.000 description 7
- 238000012545 processing Methods 0.000 description 7
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 6
- 239000011159 matrix material Substances 0.000 description 6
- 229910052710 silicon Inorganic materials 0.000 description 6
- 239000010703 silicon Substances 0.000 description 6
- 101100410783 Arabidopsis thaliana PXG2 gene Proteins 0.000 description 5
- 101100410782 Arabidopsis thaliana PXG1 gene Proteins 0.000 description 3
- 230000010354 integration Effects 0.000 description 3
- 230000004044 response Effects 0.000 description 3
- 230000003213 activating effect Effects 0.000 description 2
- 230000004913 activation Effects 0.000 description 2
- 230000001419 dependent effect Effects 0.000 description 2
- 238000003745 diagnosis Methods 0.000 description 2
- 238000005516 engineering process Methods 0.000 description 2
- 239000004065 semiconductor Substances 0.000 description 2
- 101000654316 Centruroides limpidus Beta-toxin Cll2 Proteins 0.000 description 1
- 230000003139 buffering effect Effects 0.000 description 1
- 101150102678 clu1 gene Proteins 0.000 description 1
- 239000002131 composite material Substances 0.000 description 1
- 230000001934 delay Effects 0.000 description 1
- 238000007599 discharging Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 238000012423 maintenance Methods 0.000 description 1
- 238000012546 transfer Methods 0.000 description 1
Classifications
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C19/00—Digital stores in which the information is moved stepwise, e.g. shift registers
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/3181—Functional testing
- G01R31/3185—Reconfiguring for testing, e.g. LSSD, partitioning
- G01R31/318533—Reconfiguring for testing, e.g. LSSD, partitioning using scanning techniques, e.g. LSSD, Boundary Scan, JTAG
- G01R31/318572—Input/Output interfaces
Landscapes
- Engineering & Computer Science (AREA)
- General Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Tests Of Electronic Circuits (AREA)
- Test And Diagnosis Of Digital Computers (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| EP19860104357 EP0240578B1 (de) | 1986-03-29 | 1986-03-29 | Anordnung und Verfahren für externe Testzugriffe auf die chipinternen funktionellen Speicherelemente hochintegrierter logischer Netzwerke |
| EP86104357.1 | 1986-03-29 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS62232045A true JPS62232045A (ja) | 1987-10-12 |
| JPH0470653B2 JPH0470653B2 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) | 1992-11-11 |
Family
ID=8195024
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP62043235A Granted JPS62232045A (ja) | 1986-03-29 | 1987-02-27 | 外部からのテストが可能な論理網 |
Country Status (3)
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2015017843A (ja) * | 2013-07-09 | 2015-01-29 | 富士通セミコンダクター株式会社 | 半導体集積回路 |
| CN112787665A (zh) * | 2020-12-28 | 2021-05-11 | 珠海全志科技股份有限公司 | 相位可调的时钟信号产生方法及装置 |
Family Cites Families (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US3766534A (en) * | 1972-11-15 | 1973-10-16 | Ibm | Shift register storage unit with multi-dimensional dynamic ordering |
| EP0037900A1 (en) * | 1980-03-17 | 1981-10-21 | Rockwell International Corporation | Two-level major/minor loop organization using current field access for magnetic bubble domain devices |
| DE3029883A1 (de) * | 1980-08-07 | 1982-03-11 | Ibm Deutschland Gmbh, 7000 Stuttgart | Schieberegister fuer pruef- und test-zwecke |
| DE3030299A1 (de) * | 1980-08-09 | 1982-04-08 | Ibm Deutschland Gmbh, 7000 Stuttgart | Schieberegister fuer pruef- und test-zwecke |
| EP0146645B1 (de) * | 1983-12-08 | 1987-09-16 | Ibm Deutschland Gmbh | Prüf- und Diagnoseeinrichtung für Digitalrechner |
-
1986
- 1986-03-29 EP EP19860104357 patent/EP0240578B1/de not_active Expired - Lifetime
- 1986-03-29 DE DE8686104357T patent/DE3679313D1/de not_active Expired - Lifetime
-
1987
- 1987-02-27 JP JP62043235A patent/JPS62232045A/ja active Granted
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2015017843A (ja) * | 2013-07-09 | 2015-01-29 | 富士通セミコンダクター株式会社 | 半導体集積回路 |
| CN112787665A (zh) * | 2020-12-28 | 2021-05-11 | 珠海全志科技股份有限公司 | 相位可调的时钟信号产生方法及装置 |
| CN112787665B (zh) * | 2020-12-28 | 2024-08-30 | 珠海全志科技股份有限公司 | 相位可调的时钟信号产生方法及装置 |
Also Published As
| Publication number | Publication date |
|---|---|
| EP0240578A1 (de) | 1987-10-14 |
| JPH0470653B2 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) | 1992-11-11 |
| DE3679313D1 (de) | 1991-06-20 |
| EP0240578B1 (de) | 1991-07-17 |
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| JPS62232045A (ja) | 外部からのテストが可能な論理網 |