JPH0469164A - Polishing method for aggregate of head piece - Google Patents

Polishing method for aggregate of head piece

Info

Publication number
JPH0469164A
JPH0469164A JP2181122A JP18112290A JPH0469164A JP H0469164 A JPH0469164 A JP H0469164A JP 2181122 A JP2181122 A JP 2181122A JP 18112290 A JP18112290 A JP 18112290A JP H0469164 A JPH0469164 A JP H0469164A
Authority
JP
Japan
Prior art keywords
jig
polishing
head piece
face
optical flat
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2181122A
Other languages
Japanese (ja)
Inventor
Shunichi Katase
駿一 片瀬
Yoshiaki Itou
善映 伊藤
Toshiaki Yamashita
山下 俊朗
Yoshiaki Tanaka
良明 田中
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
TDK Corp
Original Assignee
TDK Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by TDK Corp filed Critical TDK Corp
Priority to JP2181122A priority Critical patent/JPH0469164A/en
Publication of JPH0469164A publication Critical patent/JPH0469164A/en
Pending legal-status Critical Current

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  • Finish Polishing, Edge Sharpening, And Grinding By Specific Grinding Devices (AREA)

Abstract

PURPOSE:To polish the polishing face of the head piece aggregate surface in a high accuracy, even in case of the coating thickness of the adhesive sticking a head piece aggregate being fluctuated, by sticking the head piece aggregate onto the face of the polishing side of a 2nd jig and aligning 1st and 2nd jigs with the face of the polishing side as the reference. CONSTITUTION:On one face of an optically transparent optical flat 1, 1st jig 3 and 2nd jig 4 are placed. Then, an optical system 2 for interference detection is arranged at the other face side opposed to one face side of this optical flat, the interference fringe on the contact interface of the head piece aggregate 6 sticked to the optical flat and 2nd jig is detected by the optical system for detecting interference, and the alignment of the 2nd jig to the 1st jig and the joining of the both are performed so as to obtain the specified interference fringe. Consequently, the polishing face of the surface of the head piece aggregate is conformed to an alignment reference face even in case of the coating thickness of the adhesive sticking the head piece aggregate being fluctuated and the adhesive coating thickness fluctuation is absorbed.

Description

【発明の詳細な説明】 〈産業上の利用分野〉 本発明は、第1の治具と、研磨側の面にヘットピース集
合体を貼付した第2の治具とを、研磨側の面を基準にし
て位置合せし、かつ、側端面を互いに接合し、次に、ヘ
ッドピース集合体を研磨側の面を基準として研磨するヘ
ットピース集合体の研磨方法に関し、第1の治具及び第
2の治具をオプチカルフラットの一面上に載せ、オプチ
カルフラットと第2の治具に貼付されたベツドピース集
合体の接触界面における光学干渉縞を干渉縞検出用光学
系で検出し、得られた干渉縞に基づいて第1の治具に対
する第2の治具の位置合せ及び両者の接合を行なうこと
により、第2の治具に貼付されたベツドピース集合体の
表面とオプチカルフラットの表面との間の接触界面の接
触状態を高感度、高精度で検出し、ヘッドピース集合体
を高精度で研磨し得る研磨方法を提供できるようにした
ものである。
[Detailed Description of the Invention] <Industrial Application Field> The present invention provides a first jig and a second jig having a head piece assembly affixed to the polishing side surface, with the polishing side surface being the reference point. A method for polishing a head piece assembly, in which the head piece assembly is aligned, the side end surfaces are joined to each other, and then the head piece assembly is polished with the polishing side surface as a reference, a first jig and a second jig are used. The tool is placed on one side of the optical flat, and the optical interference fringes at the contact interface between the optical flat and the bed piece assembly affixed to the second jig are detected by an interference fringe detection optical system, and based on the obtained interference fringes, By aligning the second jig with respect to the first jig and joining them together, the contact interface between the surface of the bed piece assembly attached to the second jig and the surface of the optical flat is adjusted. It is possible to provide a polishing method that detects the contact state with high sensitivity and high precision and can polish a head piece assembly with high precision.

〈従来の技術〉 ヘットピース集合体の研磨方法は、例えば特開平0f−
153264号公報、特開平0f−153265号公報
に開示されている。これらの従来技術においては、第1
の治具と、研磨側の面にヘッドピース集合体を貼付した
複数個の第2の治具とを、研磨側の面を基準にして位置
合せし、かつ、側端面を互いに接合し、次に、前記ヘッ
ドピース集合体を、研磨側の面を基準として研磨するよ
うになっている。
<Prior art> A method of polishing a head piece assembly is described, for example, in Japanese Patent Application Laid-open No.
It is disclosed in Japanese Patent Application Laid-open No. 153264 and Japanese Patent Application Laid-Open No. 0F-153265. In these conventional technologies, the first
The jig and a plurality of second jigs with head piece assemblies affixed to the polishing side surface are aligned with the polishing side surface as a reference, and the side end surfaces are joined to each other, and then Second, the head piece assembly is polished with the polishing side surface as a reference.

第1の治具及び第2の治具の位置合せに当っては、両者
の研磨側の面を、オプチカルフラット上に載せ、ヘッド
ピース集合体の表面を、オプチカルフラットの表面を基
準にして位置合せし、かつ、第1の治具及び第2の治具
の側端面を当接させ、接着剤で接合する。
When aligning the first jig and the second jig, place the polishing side surfaces of both on the optical flat, and position the surface of the head piece assembly with reference to the surface of the optical flat. Then, the side end surfaces of the first jig and the second jig are brought into contact with each other and joined with an adhesive.

上述の位置合せによると、ヘッドピース集合体を治具に
接着固定する接着剤の厚みが異なった場合でも、それに
影響されずに、研磨面となるヘッドピース集合体の表面
を、オプチカルフラットの表面位置によって定まる所定
の平面位置に高精度で設定できる。
According to the alignment described above, even if the thickness of the adhesive that fixes the headpiece assembly to the jig differs, the surface of the headpiece assembly that will be the polished surface can be aligned with the surface of the optical flat without being affected by the difference in thickness. A predetermined plane position determined by the position can be set with high precision.

〈発明が解決しようとする課題〉 しかしながら、上述した従来技術においては、第2の治
具に貼付されたベツドピース集合体の表面と、オプチカ
ルフラットの表面との接触界面かどのような状態にある
かを知ることができない。
<Problems to be Solved by the Invention> However, in the above-mentioned prior art, it is difficult to determine in what state the contact interface between the surface of the bed piece assembly attached to the second jig and the surface of the optical flat is. cannot know.

例えばヘッドピース集合体の表面またはオプチカルフラ
ットの表面に塵埃があり、ヘッドピース集合体の表面が
オプチカルフラットの表面に対して傾斜しているかも知
れないし、接合前に適正に配置されていた接触界面が、
接合工程における接着歪等によって傾斜しているかもし
れない。もしこのような不正状態を生じたとしたら、ヘ
ッドピース集合体の研磨側の面を基準として研磨する研
磨工程において、基準面が変動してしまい、研磨精度が
低下する。ところが、従来は、上述のような不正位置合
せを知る術がない。
For example, there may be dust on the surface of the headpiece assembly or the surface of the optical flat, the surface of the headpiece assembly may be inclined to the surface of the optical flat, or the contact interface may have been properly positioned before joining. but,
It may be tilted due to adhesive strain etc. during the bonding process. If such an incorrect condition occurs, the reference plane will fluctuate during the polishing process in which the polishing side surface of the head piece assembly is used as a reference, and the polishing accuracy will deteriorate. However, conventionally, there is no way to detect incorrect alignment as described above.

ヘッドピース集合体の研磨工程においては、研磨によっ
てスロートハイドを定めるという重要な作業を伴ない、
しかもスロートハイドは0.1μm以下の高精度で研磨
調整しなければならないため、上述のような不正位置合
せを生じると、スロートハイドを所定値に調整すること
が困難になり、所定の電磁変換特性を有する磁気ヘッド
を得ることができなくなる。
The polishing process of the headpiece assembly involves the important work of defining the throat hide by polishing.
Moreover, the throat hide must be polished and adjusted with high accuracy of 0.1 μm or less, so if the above-mentioned incorrect alignment occurs, it becomes difficult to adjust the throat hide to a predetermined value, and the electromagnetic conversion characteristics are Therefore, it becomes impossible to obtain a magnetic head having the following characteristics.

そこで、本発明の課題は、上述した従来の問題点を解決
し、第2の治具に貼付されたベットピース集合体の表面
とオプチカルフラットの表面との間の接触界面の接触状
態を高感度、高精度を検出し、ヘットピース集合体を高
精度で研磨し得る研磨方法を提供することである。
SUMMARY OF THE INVENTION Therefore, an object of the present invention is to solve the above-mentioned conventional problems and to detect the contact state of the contact interface between the surface of the bed piece assembly attached to the second jig and the surface of the optical flat with high sensitivity. An object of the present invention is to provide a polishing method capable of detecting high precision and polishing a head piece assembly with high precision.

く課題を解決するための手段〉 上述した課題解決のため、本発明は、第1の治具と、研
磨側の面にヘッドピース集合体を貼付した複数個の$2
の治具とを、研磨側の面を基準にして位置合せし、かつ
、側端面を互いに接合し、次に、前記ヘッドピース集合
体を研磨側の面を基準として研磨する研磨方法であって
、 前記第1の治具及び前記第2の治具を光学的に透明なオ
プチカルフラットの一面上に載せ、前記オプチカルフラ
ットの前記一面側と対向する他面側に干渉縞検出用光学
系を配置し、前記オプチカルフラットと前記第2の治具
に貼付された前記ヘッドピース集合体の接触界面におけ
る光学干渉縞を、前記干渉縞検出用光学系で検出し、得
られた干渉縞に基づいて前記第1の治具に対する前記第
2の治具の位置合せ及び両者の接合を行なうこと を特徴とする。
Means for Solving the Problems> In order to solve the problems described above, the present invention provides a first jig and a plurality of $2.
and a jig with respect to the polishing side surface, and joining the side end surfaces to each other, and then polishing the head piece assembly with the polishing side surface as a reference, the polishing method comprising: , the first jig and the second jig are placed on one side of an optically transparent optical flat, and an optical system for detecting interference fringes is arranged on the other side of the optical flat opposite to the one side. The optical interference fringes at the contact interface between the optical flat and the head piece assembly attached to the second jig are detected by the interference fringe detection optical system, and the interference fringes are detected based on the obtained interference fringes. The method is characterized in that the second jig is aligned with the first jig and the two are joined.

く作用〉 第2の治具の研磨側の面にヘッドピース集合体を貼付し
、第1の治具及び第2の治具を研磨側の面を基準にして
位置合せすることにより、ヘッドピース集合体を貼付し
ている接着剤の塗布厚みが変動した場合でも、ヘッドピ
ース集合体の表面の研磨面を、位置合せ基準面に一致さ
せ、接着剤塗布厚み変動を吸収できる。
Effect> By attaching the head piece assembly to the polishing side surface of the second jig and aligning the first jig and the second jig with reference to the polishing side surface, the head piece Even if the applied thickness of the adhesive that adheres the aggregate varies, the polished surface of the head piece aggregate can be brought into alignment with the alignment reference plane, thereby absorbing the variation in the adhesive applied thickness.

第1の治具及び前記第2の治具を光学的に透明なオプチ
カルフラットの一面上に載せ、オブチカルフラットと第
2の治具に貼付されたベツドピース集合体の接触界面に
おける光学干渉縞を、干渉縞検出用光学系で検出するの
で、第2の治具に貼付されたベツドピース集合体の表面
とオプチカルフラットの表面との間の接触界面の接触状
態を高感度、高精度で検出できる。
The first jig and the second jig are placed on one surface of an optically transparent optical flat, and optical interference fringes are detected at the contact interface between the optical flat and the bed piece assembly attached to the second jig. Since the interference fringe detection optical system is used for detection, the contact state of the contact interface between the surface of the bed piece assembly attached to the second jig and the surface of the optical flat can be detected with high sensitivity and precision.

そして、得られた干渉縞に基づいて第1の治具に対する
第2の治具の位置合せ及び両者の接合を行なうことによ
り、第2の治具に貼付されたベツドピース集合体の表面
とオプチカルフラットの表面との間の接触界面の接触状
態を高精度で設定し、ヘッドピース集合体を高精度で研
磨し、所定のスロートハイドに設定できる。
Then, by aligning the second jig with respect to the first jig and joining them based on the obtained interference fringes, the surface of the bed piece assembly attached to the second jig and the optical flat are aligned. The contact state of the contact interface with the surface of the head piece can be set with high precision, the head piece assembly can be polished with high precision, and a predetermined throat hide can be set.

〈実施例〉 第1図は本発明に係る研磨方法のうち位置合わせ及び接
合工程を示す図、第2図は同じくその拡大図である。図
において、1はオプチカルフラット、2は干渉縞検出用
光学系である。オプチカルフラット1は光学的に透明で
あり、その表面101は例えばJIS1級の高度の平面
性を有している。干渉縞検出用光学系2はオプチカルフ
ラット1の表面101と対向する下面102の下方に配
置されている。図示では、水平方向に対して所定の角度
θマ斜めに配置された反射鏡である。
<Example> FIG. 1 is a diagram showing the positioning and bonding steps of the polishing method according to the present invention, and FIG. 2 is an enlarged view thereof. In the figure, 1 is an optical flat, and 2 is an optical system for detecting interference fringes. The optical flat 1 is optically transparent, and its surface 101 has a high degree of flatness, for example, JIS class 1. The interference fringe detection optical system 2 is arranged below the lower surface 102 of the optical flat 1, which faces the surface 101. In the illustration, the reflecting mirror is disposed obliquely at a predetermined angle θ with respect to the horizontal direction.

3は第1の治具、4は第2の治具である。第1の治具3
は、研磨側の面31上に、表面鏡面仕上げとした基準片
5を接着剤等で接着固定しである。第1の治具3の側端
面32は研磨側の面31に対して垂直な面となっている
。第2の治具4は研磨側の面41上にヘッドピース集合
体6を接着剤7によって貼付しである。第2の治具4の
側端面42は研磨側の面41に対して垂直である。接着
剤7は接着歪を防止するためにホットメルト樹脂を用い
る。
3 is a first jig, and 4 is a second jig. First jig 3
In this case, a reference piece 5 whose surface is mirror-finished is adhesively fixed onto the surface 31 on the polishing side using an adhesive or the like. The side end surface 32 of the first jig 3 is a surface perpendicular to the polishing side surface 31. The second jig 4 has a head piece assembly 6 pasted on the polishing side surface 41 with an adhesive 7. The side end surface 42 of the second jig 4 is perpendicular to the polishing side surface 41. Hot melt resin is used as the adhesive 7 to prevent adhesive distortion.

ヘッドピース集合体6は、第7図に拡大して示すように
、セラミック構造体61を共用して、複数の磁気変換素
子Ql、Q2、Q31.、、、を一方向に形成したもの
である。
As shown in an enlarged view in FIG. 7, the headpiece assembly 6 includes a plurality of magnetic transducers Ql, Q2, Q31 . , , are formed in one direction.

磁気変換素子は、周知のように、IC製造テクノロジー
と同様の、フォトリソグラフィを主体とした高精度パタ
ーン形成技術によって形成される。第8図は磁気変換素
子の平面拡大部分破断面図、第9図は同じく第8図A、
−A、線上における断面図を示している。セラミック構
造体61はAl、0.−TiCでなる基体611の表面
ニAl2O3でなる絶縁膜612を被着させ、この絶縁
膜612の上に、磁気変換素子を形成しである。磁気変
換素子は、下部磁性膜62、ギャップ膜63、上部磁性
膜64、コイル膜65及び層間絶縁膜66の薄膜積層構
造を有し、全体を^l、03等の保護膜67によって被
覆した構造となっている。
As is well known, the magnetic transducer element is formed using high-precision pattern forming technology mainly based on photolithography, similar to IC manufacturing technology. FIG. 8 is an enlarged plan view partially broken sectional view of the magnetic transducer, FIG. 9 is also FIG. 8A,
-A shows a cross-sectional view on the line. The ceramic structure 61 is made of Al, 0. An insulating film 612 made of Al2O3 is deposited on the surface of a base 611 made of -TiC, and a magnetic transducer element is formed on this insulating film 612. The magnetic conversion element has a thin film laminated structure of a lower magnetic film 62, a gap film 63, an upper magnetic film 64, a coil film 65, and an interlayer insulating film 66, and the entire structure is covered with a protective film 67 such as ^l, 03, etc. It becomes.

下部磁性膜62及び上部磁性膜64はギャップ膜63を
介して対向するボール部621.641と、ポール部6
21.641に連続するヨーク部622.642とを有
している。上部磁性膜64のポール部641は絶縁膜6
12の面に対して実買的に平行となるように形成された
先端部領域643の後方に、絶縁膜612の面から離れ
る方向に立ち上がる変位領域644を有し、変位領域6
44を経てヨーク部642に連なっている。
The lower magnetic film 62 and the upper magnetic film 64 are connected to the ball portions 621 and 641 and the pole portion 6 facing each other with the gap film 63 interposed therebetween.
21.641 and a continuous yoke portion 622.642. The pole portion 641 of the upper magnetic film 64 is connected to the insulating film 6.
A displacement region 644 that rises in a direction away from the surface of the insulating film 612 is provided behind the tip region 643 which is formed to be parallel to the surface of the insulating film 612 in actual terms.
44 and continues to the yoke portion 642.

ボール部641の先端の位置する端面C1から変位開始
点Yまでの深さThがスロートハイドである。このスロ
ートハイドThが所定の寸法となるように端面C1を研
磨する。ヨーク部622及びヨーク642は後方領域で
磁気回路を完成するように結合されており、結合部を渦
巻状に回るようにコイル[65が形成されている。
The depth Th from the end surface C1 where the tip of the ball portion 641 is located to the displacement start point Y is the throat hide. The end face C1 is polished so that the throat hide Th has a predetermined dimension. The yoke portion 622 and the yoke 642 are coupled in the rear region to complete a magnetic circuit, and a coil [65 is formed to spiral around the coupled portion.

第1の治具3及び第2の治具4の位置合せに当っては、
両者の研磨側の面31.41を、オプチカルフラット1
上に載せる。第1の治具3の研磨側の面31には基準片
5が接着されており、第2の治具4の研磨側の面41に
はへッドビース集合体6が接着されている。従って、′
s1の治具3は基準片5の下面によってオプチカルフラ
ット1の面101に接触し、第2の治具4はへッドビー
ス集合体6の端面CIがオプチカルフラット1の面10
1と接触する。
When aligning the first jig 3 and the second jig 4,
The polishing side surfaces 31 and 41 of both are optically flat 1
Put it on top. A reference piece 5 is bonded to the polishing side surface 31 of the first jig 3, and a head bead assembly 6 is bonded to the polishing side surface 41 of the second jig 4. Therefore,′
The jig 3 of s1 contacts the surface 101 of the optical flat 1 with the lower surface of the reference piece 5, and the second jig 4 contacts the surface 101 of the optical flat 1 with the lower surface of the reference piece 5.
Contact with 1.

そして、オプチカルフラット1の面101と第2の治具
4に貼付されたヘッドピース集合体6の端面C8との接
触界面に生じる干渉縞を光路ILI、IL2を通して、
干渉縞検出用光学系2で検出する。もし何等かの理由で
、第2図の一点鎖線で示すように、第2の治具4が角度
βで傾斜していれば、傾斜角度βに対応した形状、数、
間隔及び幅のニュートン縞NLが現れる。そこで、所定
のニュートン縞が得られるように位置合せをし、接着す
る。傾斜角度βとニュートン縞との関係を予め測定して
おく。
Then, the interference fringes generated at the contact interface between the surface 101 of the optical flat 1 and the end surface C8 of the head piece assembly 6 attached to the second jig 4 are passed through the optical paths ILI and IL2,
The interference fringe detection optical system 2 detects the interference fringes. If for some reason the second jig 4 is tilted at an angle β as shown by the dashed line in FIG.
Newtonian fringes NL of spacing and width appear. Therefore, they are aligned and bonded so that a predetermined Newtonian stripe is obtained. The relationship between the inclination angle β and the Newtonian fringe is measured in advance.

本発明による位置合せの別の利点は、第2図に示すよう
に、ヘッドピース集合体6を接着固定する接着剤7の厚
みがh+、h2のように異なりた場合でも、それに影響
されずに、研磨面となる端面C8の表面を、オプチカル
フラット1の表面101の位置によって定まる所定の平
面位置に設定し、端面C1を基準にして所定の研磨を行
なうことがで診ることである。これにより、スロートハ
イドTh(第8図及び第9図参照)を高精度で研磨調整
し、所定の電磁変換特性を有する磁気ヘッドを得ること
ができる。
Another advantage of the alignment according to the present invention is that, as shown in FIG. This can be determined by setting the surface of the end surface C8, which will be the polished surface, at a predetermined plane position determined by the position of the surface 101 of the optical flat 1, and performing a predetermined polishing with reference to the end surface C1. Thereby, the throat hide Th (see FIGS. 8 and 9) can be polished and adjusted with high precision, and a magnetic head having predetermined electromagnetic conversion characteristics can be obtained.

次に研磨工程について説明する。第3図は第1図及び第
2図の位置合せ接合工程を経て得られた研磨治具の正面
断面図、第4図は同じくその底面図で、ヘッドピース集
合体6を有する複数の′i42の治具4を、第1の治具
3の側端面32に接着した構造となる。8は第1の治具
3と第2の治具4とを接合する接着剤である。
Next, the polishing process will be explained. FIG. 3 is a front sectional view of the polishing jig obtained through the alignment and bonding process shown in FIGS. 1 and 2, and FIG. The jig 4 is bonded to the side end surface 32 of the first jig 3. 8 is an adhesive for joining the first jig 3 and the second jig 4.

第5図及び第6図は第3図及び第4図に示した研磨治具
の研磨工程を示している。図において、9は回転体、1
0は第3図及び第4図に示した研磨治具である0回転体
9は図示しないモータ等により、矢印で示すa、方向に
回転駆動される。この回転体9は、例えばスズ等の軟質
金属部材を用いて円板状に形成された研磨部材91の背
面に、例えばステンレス等の金属材料によって円板状に
形成された支持部材92を、接着剤93によって一体的
に面接合させである。支持部材92は、スズ等の軟質金
属材料で構成されていて機械的強度の不充分な研磨部材
91を支持するために設けられたものである。
5 and 6 show the polishing process of the polishing jig shown in FIGS. 3 and 4. FIG. In the figure, 9 is a rotating body, 1
0 is the polishing jig shown in FIGS. 3 and 4. The rotating body 9 is rotationally driven in the direction a indicated by the arrow by a motor (not shown) or the like. This rotating body 9 has a support member 92 formed in the shape of a disk made of a metal material such as stainless steel, attached to the back surface of a polishing member 91 formed in the shape of a disk made of a soft metal material such as tin. They are integrally bonded face-to-face by the agent 93. The support member 92 is made of a soft metal material such as tin and is provided to support the polishing member 91 which has insufficient mechanical strength.

研磨に当っては、回転体9を矢印a、方向に面回転させ
、かつ、研磨部材910表面(イ)にダイヤモンド粒子
等を含む研磨材を供給しながら、研磨部材91の表面(
イ)に研磨治具10のヘッドピース集合体6の端面C3
を接触させる。研磨治具10は矢印す、またはす、で示
す回転半径方向に平行移動させ、研磨部材91の表面(
イ)の全面で研磨が行なわれるようにする。矢印a2は
研磨治具10の自転の方向を示している。
During polishing, the rotating body 9 is rotated in the direction of arrow a, and the surface of the polishing member 91 (A) is supplied with an abrasive material containing diamond particles etc.
b) End face C3 of head piece assembly 6 of polishing jig 10
contact. The polishing jig 10 is moved in parallel in the direction of the rotation radius indicated by the arrows 1 and 2, and the surface of the polishing member 91 (
b) Ensure that polishing is performed on the entire surface. Arrow a2 indicates the direction of rotation of polishing jig 10.

上述の研磨により、ヘッドピース集合体6は、所定の位
置合せに基づき、高精度のスロートハイドを有するよう
に研磨される。
By the above-described polishing, the head piece assembly 6 is polished to have a highly accurate throat hide based on predetermined alignment.

〈発明の効果〉 以上述べたように、本発明によれば、次のような効果が
得られる。
<Effects of the Invention> As described above, according to the present invention, the following effects can be obtained.

(a)第2の治具の研磨側の面にヘッドピース集合体を
貼付し、第1の治具及び第2の治具を研磨側の面を基準
にして位置合せすることにより、ヘッドピース集合体を
貼付している接着剤の塗布厚みが変動した場合でも、ヘ
ッドピース集合体の表面の研磨面を、位置合せ基準面に
一致させ、接着剤塗布厚み変動を吸収し、高精度で研磨
し得る研磨方法を提供でミる。
(a) By attaching the head piece assembly to the polishing side surface of the second jig and aligning the first jig and the second jig with reference to the polishing side surface, the head piece Even if the thickness of the adhesive applied to the headpiece assembly changes, the polished surface on the surface of the headpiece assembly matches the alignment reference plane, absorbing variations in the adhesive application thickness, and polishing with high precision. We will provide a polishing method that can be used.

(b)第1の治具及び第2の治具を光学的に透明なオプ
チカルフラットの一面上に載せ、オプチカルフラットと
第2の治具に貼付されたベットピース集合体の接触界面
における光学干渉縞を、干渉縞検出用光学系で検出する
ので、第2の治具に貼付されたヘッドピース集合体の表
面とオプチカルフラットの表面との間の接触界面の接触
状態を高感度、高精度で検出し、ヘッドピース集合体を
高精度で研磨し、所定のスロートハイドに設定し得る研
磨方法を提供できる。
(b) The first jig and the second jig are placed on one surface of an optically transparent optical flat, and optical interference occurs at the contact interface between the optical flat and the bed piece assembly affixed to the second jig. Since the fringes are detected by an optical system for detecting interference fringes, the contact state of the contact interface between the surface of the headpiece assembly attached to the second jig and the surface of the optical flat can be detected with high sensitivity and precision. It is possible to provide a polishing method that can detect, polish a headpiece assembly with high precision, and set a predetermined throat hide.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は本発明に係る研磨方法のうち位置合わせ及び接
合工程を示す図、第2図は同じくその拡大図、′s3図
は第1図及び第2図の位置合せ接合工程を経て得られた
研磨治具の正面断面図、′s4図は同じくその底面図、
第5図は第3図及び′s4図に示した研磨治具の研磨工
程を示す平面図、第第 図 第 図 第 図 第 図 第 図 第 図 第 図 I
Figure 1 is a diagram showing the alignment and bonding process in the polishing method according to the present invention, Figure 2 is an enlarged view thereof, and Figure 's3 is a diagram showing the alignment and bonding process of the polishing method according to the present invention. The front cross-sectional view of the polishing jig, Figure 's4 is also the bottom view,
Figure 5 is a plan view showing the polishing process of the polishing jig shown in Figures 3 and 4;

Claims (1)

【特許請求の範囲】[Claims] (1)第1の治具と、研磨側の面にヘッドピース集合体
を貼付した複数個の第2の治具とを、研磨側の面を基準
にして位置合せし、かつ、側端面を互いに接合し、次に
、前記ヘッドピース集合体を、研磨側の面を基準として
研磨する研磨方法であって、 前記第1の治具及び前記第2の治具を光学的に透明なオ
プチカルフラットの一面上に載せ、前記オプチカルフラ
ットの前記一面側と対向する他面側に干渉縞検出用光学
系を配置し、 前記オプチカルフラットと前記第2の治具に貼付された
前記ヘッドピース集合体の接触界面における干渉縞を、
前記干渉縞検出用光学系で検出し、所定の干渉縞が得ら
れるように、前記第1の治具に対する前記第2の治具の
位置合せ及び両者の接合を行なうこと を特徴とする研磨方法。
(1) Align the first jig and a plurality of second jigs with head piece assemblies affixed to the polishing side surface using the polishing side surface as a reference, and align the side end surfaces. A polishing method in which the head piece assembly is bonded to each other and then polished with the polishing side surface as a reference, the first jig and the second jig being optically transparent optical flats. an optical system for detecting interference fringes is placed on one surface of the optical flat, and an optical system for detecting interference fringes is disposed on the other surface opposite to the one surface side of the optical flat, and the head piece assembly is attached to the optical flat and the second jig. The interference fringes at the contact interface are
A polishing method characterized by aligning the second jig with respect to the first jig and joining the two so that predetermined interference fringes are detected by the interference fringe detection optical system. .
JP2181122A 1990-07-09 1990-07-09 Polishing method for aggregate of head piece Pending JPH0469164A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2181122A JPH0469164A (en) 1990-07-09 1990-07-09 Polishing method for aggregate of head piece

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2181122A JPH0469164A (en) 1990-07-09 1990-07-09 Polishing method for aggregate of head piece

Publications (1)

Publication Number Publication Date
JPH0469164A true JPH0469164A (en) 1992-03-04

Family

ID=16095244

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2181122A Pending JPH0469164A (en) 1990-07-09 1990-07-09 Polishing method for aggregate of head piece

Country Status (1)

Country Link
JP (1) JPH0469164A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN111069985A (en) * 2020-01-08 2020-04-28 东莞市瑞立达玻璃盖板科技股份有限公司 2.5D glass cover plate polishing method

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN111069985A (en) * 2020-01-08 2020-04-28 东莞市瑞立达玻璃盖板科技股份有限公司 2.5D glass cover plate polishing method

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