JPH046840A - Vapor growth apparatus - Google Patents
Vapor growth apparatusInfo
- Publication number
- JPH046840A JPH046840A JP10947090A JP10947090A JPH046840A JP H046840 A JPH046840 A JP H046840A JP 10947090 A JP10947090 A JP 10947090A JP 10947090 A JP10947090 A JP 10947090A JP H046840 A JPH046840 A JP H046840A
- Authority
- JP
- Japan
- Prior art keywords
- substrate
- gas
- vapor phase
- vapor
- phase growth
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 239000000758 substrate Substances 0.000 claims abstract description 62
- 238000001947 vapour-phase growth Methods 0.000 claims description 33
- 238000009434 installation Methods 0.000 claims description 23
- 239000002994 raw material Substances 0.000 abstract description 17
- 239000013078 crystal Substances 0.000 abstract description 13
- 239000000203 mixture Substances 0.000 abstract description 6
- 238000000034 method Methods 0.000 abstract description 3
- 239000007789 gas Substances 0.000 description 43
- 239000004065 semiconductor Substances 0.000 description 11
- UFHFLCQGNIYNRP-UHFFFAOYSA-N Hydrogen Chemical compound [H][H] UFHFLCQGNIYNRP-UHFFFAOYSA-N 0.000 description 4
- 239000012808 vapor phase Substances 0.000 description 4
- OKTJSMMVPCPJKN-UHFFFAOYSA-N Carbon Chemical compound [C] OKTJSMMVPCPJKN-UHFFFAOYSA-N 0.000 description 3
- VQNPSCRXHSIJTH-UHFFFAOYSA-N cadmium(2+);carbanide Chemical compound [CH3-].[CH3-].[Cd+2] VQNPSCRXHSIJTH-UHFFFAOYSA-N 0.000 description 3
- 229910052799 carbon Inorganic materials 0.000 description 3
- 238000010586 diagram Methods 0.000 description 3
- ILXWFJOFKUNZJA-UHFFFAOYSA-N ethyltellanylethane Chemical compound CC[Te]CC ILXWFJOFKUNZJA-UHFFFAOYSA-N 0.000 description 3
- 229910004613 CdTe Inorganic materials 0.000 description 2
- 229910052581 Si3N4 Inorganic materials 0.000 description 2
- 230000000694 effects Effects 0.000 description 2
- 230000006698 induction Effects 0.000 description 2
- QSHDDOUJBYECFT-UHFFFAOYSA-N mercury Chemical compound [Hg] QSHDDOUJBYECFT-UHFFFAOYSA-N 0.000 description 2
- 229910052753 mercury Inorganic materials 0.000 description 2
- HQVNEWCFYHHQES-UHFFFAOYSA-N silicon nitride Chemical compound N12[Si]34N5[Si]62N3[Si]51N64 HQVNEWCFYHHQES-UHFFFAOYSA-N 0.000 description 2
- JBRZTFJDHDCESZ-UHFFFAOYSA-N AsGa Chemical compound [As]#[Ga] JBRZTFJDHDCESZ-UHFFFAOYSA-N 0.000 description 1
- 235000007575 Calluna vulgaris Nutrition 0.000 description 1
- 229910004262 HgTe Inorganic materials 0.000 description 1
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 1
- 229910052793 cadmium Inorganic materials 0.000 description 1
- 239000012159 carrier gas Substances 0.000 description 1
- 238000005229 chemical vapour deposition Methods 0.000 description 1
- 239000007788 liquid Substances 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 239000000463 material Substances 0.000 description 1
- 229910052710 silicon Inorganic materials 0.000 description 1
- 239000010703 silicon Substances 0.000 description 1
- 229910052714 tellurium Inorganic materials 0.000 description 1
- -1 uniform thickness Substances 0.000 description 1
Abstract
Description
【発明の詳細な説明】
〔概 要〕
気相成長装置に関し、
基板上に気相成長で形成される結晶が、均一な厚さ、或
いは均一な組成で形成できるようにした装置の提供を目
的とし、
反応容器内に設置され、気相成長用基板を載置し、回転
可能な基板設置台と、
該気相成長用基板上に設置され、気相成長用原料ガスを
供給するガス供給管と、
気相成長反応後のガスを排気するガス排気管とより成る
装置に於いて、
前記基板設置台の側面に回転翼を設けるとともに、前記
気相成長用基板の上部でかつ前記反応容器の側面にガス
排気管を設けたことで構成する。[Detailed Description of the Invention] [Summary] Regarding a vapor phase growth apparatus, an object of the present invention is to provide an apparatus that enables crystals to be formed on a substrate by vapor phase growth to have a uniform thickness or a uniform composition. a rotatable substrate installation stand installed in the reaction vessel on which a substrate for vapor phase growth is placed; and a gas supply pipe installed on the substrate for vapor phase growth and supplying raw material gas for vapor phase growth. and a gas exhaust pipe for exhausting gas after a vapor phase growth reaction, wherein a rotary blade is provided on a side surface of the substrate mounting table, and a rotary blade is provided above the vapor phase growth substrate and in the reaction vessel. It consists of a gas exhaust pipe installed on the side.
本発明は気相成長装置に係り、特に気相成長法で形成さ
れるエピタキシャル結晶、或いは半導体被膜等が均一な
厚さで形成される装置に関する。The present invention relates to a vapor phase growth apparatus, and particularly to an apparatus in which epitaxial crystals, semiconductor films, etc. formed by vapor phase growth are formed with a uniform thickness.
従来よりシリコン等の半導体結晶、或いは窒化シリコン
膜等の半導体被膜がCVD等の気相成長方法で形成され
ている。2. Description of the Related Art Conventionally, semiconductor crystals such as silicon or semiconductor films such as silicon nitride films have been formed by vapor phase growth methods such as CVD.
このような従来の気相成長装置について第4図を用いて
説明する。Such a conventional vapor phase growth apparatus will be explained using FIG. 4.
第4図に示すように石英ガラス等で形成された反応容器
1内には、回転可能でカーボン等より形成された基板設
置台2が設置され、この基板設置台2上には気相成長す
べきガリウム砒素(GaAs)のような気相成長用基板
3が載置されている。As shown in FIG. 4, a rotatable substrate installation stand 2 made of carbon or the like is installed in a reaction vessel 1 made of quartz glass or the like, and on this substrate installation stand 2 is placed a substrate installation stand 2 that is made of carbon or the like. A substrate 3 for vapor phase growth such as gallium arsenide (GaAs) is mounted.
また基板設置台2上には、気相成長用のジエチルテルル
や、ジメチルカドミウム等の原料ガスのガス供給管4が
設置され、また前記反応容器1を設置する容器設置台5
には、気相成長後のガスを排気するガス排気管6が設け
られ、このガス排気管6が排気ポンプ(図示せず)に接
続されている。Further, on the substrate installation stand 2, a gas supply pipe 4 for raw material gases such as diethyl tellurium and dimethyl cadmium for vapor phase growth is installed, and a container installation stand 5 on which the reaction vessel 1 is installed.
is provided with a gas exhaust pipe 6 for exhausting gas after vapor phase growth, and this gas exhaust pipe 6 is connected to an exhaust pump (not shown).
そして上記反応容器内に原料ガスを導入し、該ガス排気
管に連なる排気ポンプにて反応容器内を減圧状態にし、
該反応容器の周囲に設けられた高周波誘導コイル7に通
電して基板設置台2を加熱して気相成長用基板に半導体
結晶を気相成長している。Then, a raw material gas is introduced into the reaction vessel, and the pressure inside the reaction vessel is reduced by an exhaust pump connected to the gas exhaust pipe,
A high-frequency induction coil 7 provided around the reaction vessel is energized to heat the substrate mounting table 2 to vapor-phase grow a semiconductor crystal on a substrate for vapor-phase growth.
然し、上記した従来の装置ではガス供給管4より反応容
器1内へ供給される原料ガスは矢印Aに示すように基板
設置台2の側面に沿った状態でガス排気管6の方向に向
かって流れ、特に基板設置台2の側面で渦を巻くような
乱流状態になり、基板設置台の周辺部では基板の上に均
一な層流状態のガスの流れが形成されない。However, in the conventional apparatus described above, the raw material gas supplied from the gas supply pipe 4 into the reaction vessel 1 is directed toward the gas exhaust pipe 6 along the side surface of the substrate installation table 2 as shown by arrow A. The gas flow becomes swirling and turbulent, especially on the side surface of the substrate mounting table 2, and a uniform laminar gas flow is not formed over the substrate in the periphery of the substrate mounting table.
そのため、ガス供給管4の直下と基板設置台周辺部とで
は原料ガスの供給量が異なり、基板設置台上に載置され
た広い面積を有する基板に均一な厚さや、均一な組成の
結晶が形成されない問題がある。Therefore, the supply amount of raw material gas is different between directly below the gas supply pipe 4 and around the substrate mounting table, and the substrate placed on the substrate mounting table with a wide area has a uniform thickness and crystals with a uniform composition. There are problems that are not formed.
本発明は上記した問題点を除去し、基板上に原料ガスが
層流状態で均一に流れるようにした気相成長装置の提供
を目的とする。An object of the present invention is to eliminate the above-mentioned problems and provide a vapor phase growth apparatus in which source gas flows uniformly over a substrate in a laminar flow state.
上記目的を達成する本発明の気相成長装置は、反応容器
内に設置され、気相成長用基板を載置し、回転可能な基
板設置台と、
該基板上に設置され、気相成長用原料ガスを供給するガ
ス供給管と、
気相成長反応後のガスを排気するガス排気管とより成る
装置に於いて、
前記基板設置台の側面に回転翼を設けるとともに、前記
気相成長用基板の上部でかつ前記反応容器の側面にガス
排気管を設ける。更に前記回転翼を基板設置台の水平方
向に対して所定角度に移動可能とする。The vapor phase growth apparatus of the present invention that achieves the above object comprises: a rotatable substrate mounting table installed in a reaction vessel on which a substrate for vapor phase growth is mounted; In an apparatus consisting of a gas supply pipe for supplying raw material gas and a gas exhaust pipe for exhausting gas after a vapor phase growth reaction, a rotary blade is provided on a side surface of the substrate installation table, and a rotary blade is provided on a side surface of the substrate mounting table, and A gas exhaust pipe is provided at the top of the reaction vessel and at the side of the reaction vessel. Further, the rotary blade is movable at a predetermined angle with respect to the horizontal direction of the substrate installation table.
本発明の装置は、第1図および第2図に示すように基板
設置台2の側面に設けた回転翼11で原料ガスの流れを
切ることによって、従来の装置に於けるように該原料ガ
スが基板設置台2の側面で急激に速度が増加して渦を巻
いて乱流状態に成らないようにする。The apparatus of the present invention, as shown in FIGS. 1 and 2, cuts the flow of the raw material gas with a rotary blade 11 provided on the side surface of the substrate installation table 2, thereby reducing the flow of the raw material gas as in the conventional apparatus. This is to prevent the flow from rapidly increasing in speed on the side surface of the substrate mounting table 2 and forming a vortex, resulting in a turbulent state.
また反応容器lの側面に、かつ基板設置台2の上部の近
傍に横方向に延びるガス排気管14を設けることで、原
料ガスの流れが層流状態で基板表面を通過し、均一な濃
度で原料ガスが基板上に供給されるので、均一な厚さ、
および均一な組成の気相成長による結晶が形成できる。In addition, by providing a gas exhaust pipe 14 extending laterally on the side of the reaction vessel l and near the top of the substrate installation stand 2, the flow of the raw material gas passes over the substrate surface in a laminar flow state, with a uniform concentration. Because the raw material gas is supplied onto the substrate, uniform thickness,
And crystals with uniform composition can be formed by vapor phase growth.
第1図は本発明の気相成長装置の模式図、第2図は該気
相成長装置の要部平面図である。FIG. 1 is a schematic diagram of a vapor phase growth apparatus of the present invention, and FIG. 2 is a plan view of a main part of the vapor phase growth apparatus.
第1図、および第2図に図示するように本発明の装置が
従来の装置と異なる点は、基板設置台2の側面に板状の
回転翼11を多数設けた点にある。As shown in FIGS. 1 and 2, the apparatus of the present invention differs from conventional apparatuses in that a large number of plate-shaped rotary blades 11 are provided on the side surface of the substrate installation table 2.
この回転翼は基板設置台の形成材料のカーボンで形成さ
れ、複数個所定のピッチで設けられている。The rotary blades are made of carbon, which is the material used to form the substrate mounting table, and are provided in plural at a predetermined pitch.
そして更に詳細に説明すると第3図に示すように基板設
置台の側面2Aに凹部12を設け、この凹部12にネジ
13等を用いて回転翼11が固定され、このネジによっ
て基板設置台2の水平方向に対して所定の角度θと成る
ように調整でき、適当な角度で原料ガスの流れを切断す
るようにする。To explain in more detail, as shown in FIG. 3, a recess 12 is provided in the side surface 2A of the board installation stand, and the rotary blade 11 is fixed to this recess 12 using screws 13, etc. It can be adjusted to form a predetermined angle θ with respect to the horizontal direction, and the flow of raw material gas is cut off at an appropriate angle.
また第1図、第2図に示すようにガス排気管14を反応
容器1の側面で、かつ基板設置台2より上で、該基板設
置台に近接した位置に水平方向に延びるようにして設け
る。Further, as shown in FIGS. 1 and 2, a gas exhaust pipe 14 is provided on the side of the reaction vessel 1, above the substrate installation table 2, and in a position close to the substrate installation table so as to extend horizontally. .
このような本発明の、装置に於いて、水素ガスをキャリ
アガスとしてジエチルテルル、ジメチルカドミウム、お
よび水銀の原料液体を収容した蒸発器(図示せず)内に
導入する。そして前記ジエチルテルルを担持した水素ガ
スの分圧を2.4 Xl0−’気圧、ジメチルカドミウ
ムを担持した水素ガスの分圧を5.0 Xl0−’気圧
、水銀を担持した水素ガスの分圧を6 Xl0−3気圧
の分圧として反応容器1内に導入する。そして該反応容
器1内をガス排気管14に連なる排気ポンプ(図示せず
)で100torrの圧力になるように減圧調整し、反
応容器の周囲に設けた高周波誘導コイル7に通電して基
板設置台2の温度を390°Cに保ってCdTeの気相
成長用基板3上にHg+−ウCd、 Teの結晶を気相
成長する。In such an apparatus of the present invention, hydrogen gas is introduced as a carrier gas into an evaporator (not shown) containing raw material liquids of diethyl tellurium, dimethyl cadmium, and mercury. The partial pressure of the hydrogen gas supporting diethyl tellurium is 2.4 Xl0-' atm, the partial pressure of the hydrogen gas supporting dimethyl cadmium is 5.0 Xl0-' atm, and the partial pressure of the hydrogen gas supporting mercury is 2.4 Xl0-' atm. Introduced into the reaction vessel 1 at a partial pressure of 6 Xl0-3 atmospheres. Then, the inside of the reaction vessel 1 is depressurized to 100 torr using an exhaust pump (not shown) connected to the gas exhaust pipe 14, and the high-frequency induction coil 7 provided around the reaction vessel is energized to set the substrate mounting table. While maintaining the temperature of step 2 at 390° C., crystals of Hg+-Cd and Te are grown in a vapor phase on a substrate 3 for vapor phase growth of CdTe.
このようにすれば、ガス供給管4より供給された原料ガ
スは、基板設置台2の側面に設けられた回転翼11と、
基板設置台上の近傍で反応容器1の側面に設けられたガ
ス排気管14によって層流状態に成って基板上に供給さ
れ、ガスの流れが安定するので厚さ、および組成変動を
生しないで半導体基板上に気相成長されたHg+−えC
d、 Te結晶が安定して形成できる。In this way, the raw material gas supplied from the gas supply pipe 4 is delivered to the rotary blade 11 provided on the side surface of the substrate installation table 2,
The gas is supplied onto the substrate in a laminar flow state through the gas exhaust pipe 14 installed on the side of the reaction vessel 1 near the substrate installation table, and the gas flow is stabilized so that there is no change in thickness or composition. Hg+-eC grown in vapor phase on a semiconductor substrate
d. Te crystals can be stably formed.
また上記基板設置台の回転速度と、回転翼の基板設置台
の水平方向に対する角度θを反応容器内に導入される原
料ガスの種類によって変化させることで基板上のガスの
流れを変化させ、これによって基板上にCdTe結晶、
HgTe結晶を多層構造に積層形成した超格子構造の結
晶成長も可能となる。In addition, by changing the rotational speed of the substrate mounting table and the angle θ of the rotary blade with respect to the horizontal direction of the substrate mounting table depending on the type of raw material gas introduced into the reaction vessel, the flow of gas on the substrate can be changed. CdTe crystal on the substrate by
It is also possible to grow a superlattice structure in which HgTe crystals are stacked in a multilayer structure.
また回転翼は厚さ方向に対してテーパーを持たせた構造
に形成しても良い。Further, the rotor blade may be formed to have a tapered structure in the thickness direction.
また本実施例では半導体基板上に半導体結晶を気相成長
する場合に付いて述べたが、その他、半導体基板上に窒
化シリコン膜等の半導体被膜をCVD法で形成する場合
に於いても本発明の装置は適用できる。Furthermore, although this embodiment describes the case where a semiconductor crystal is grown in a vapor phase on a semiconductor substrate, the present invention can also be applied to the case where a semiconductor film such as a silicon nitride film is formed on a semiconductor substrate by the CVD method. equipment is applicable.
以上の説明から明らかなように本発明によれば、気相成
長用基板上に原料ガスが層流状態で安定して供給される
ので、組成や厚さが変動しない半導体結晶や、半導体被
膜が気相成長法で形成できる効果がある。As is clear from the above description, according to the present invention, raw material gas is stably supplied onto the substrate for vapor phase growth in a laminar flow state, so that semiconductor crystals and semiconductor films whose composition and thickness do not fluctuate can be grown. It has the effect of being formed by vapor phase growth.
第1図は本発明の一実施例を示す模式図、第2図は本実
施例の要部平面図、
第3図は本実施例の要部側面図、
第4図は従来の気相成長装置の模式図である。
図において、
1は反応容器、2は基板設置台、3は気相成長用基板、
4はガス供給管、5は容器設置台、6.14杢¥兼例−
零卸平面国
第2図
7フ;χ薯ヂにダ・j/l議3L逼1≦イ列I力)C2
]第3図
花ト気硝疾邊軌1ル戎″酬
第4図Fig. 1 is a schematic diagram showing an embodiment of the present invention, Fig. 2 is a plan view of the main part of this embodiment, Fig. 3 is a side view of the main part of this embodiment, and Fig. 4 is a conventional vapor phase growth method. FIG. 2 is a schematic diagram of the device. In the figure, 1 is a reaction container, 2 is a substrate installation stand, 3 is a substrate for vapor phase growth,
4 is a gas supply pipe, 5 is a container installation stand, 6.14 heather ¥ and example -
Zero wholesale plane country Figure 2 7f;
】Figure 3: Flowers, energy, gas, speed, speed, speed, speed, speed, speed, flow
Claims (2)
3)を載置し、かつ回転可能な基板設置台(2)と、該
気相成長用基板(3)上に設置され、気相成長用原料ガ
スを供給するガス供給管(4)と、気相成長反応後のガ
スを排気するガス排気管(14)とより成る装置に於い
て、 前記基板設置台(2)の側面に回転翼(11)を設ける
とともに、前記気相成長用基板(3)の上部でかつ前記
反応容器(1)の側面にガス排気管(14)を設けたこ
とを特徴とする気相成長装置。(1) A substrate for vapor phase growth (
3) and a rotatable substrate installation stand (2); a gas supply pipe (4) installed on the vapor phase growth substrate (3) and supplying a source gas for vapor phase growth; In an apparatus comprising a gas exhaust pipe (14) for exhausting gas after a vapor phase growth reaction, a rotary blade (11) is provided on the side surface of the substrate installation stand (2), and a rotary blade (11) is provided on the side surface of the substrate installation table (2), and 3) A vapor phase growth apparatus characterized in that a gas exhaust pipe (14) is provided above the reaction vessel (1) and on the side surface of the reaction vessel (1).
向に対して所定角度に移動可能としたことを特徴とする
請求項(1)記載の気相成長装置。(2) The vapor phase growth apparatus according to claim (1), wherein the rotary blade (11) is movable at a predetermined angle with respect to the horizontal direction of the substrate installation table (2).
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP10947090A JPH046840A (en) | 1990-04-24 | 1990-04-24 | Vapor growth apparatus |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP10947090A JPH046840A (en) | 1990-04-24 | 1990-04-24 | Vapor growth apparatus |
Publications (1)
Publication Number | Publication Date |
---|---|
JPH046840A true JPH046840A (en) | 1992-01-10 |
Family
ID=14511051
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP10947090A Pending JPH046840A (en) | 1990-04-24 | 1990-04-24 | Vapor growth apparatus |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPH046840A (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH09111457A (en) * | 1995-10-16 | 1997-04-28 | Nissan Motor Co Ltd | Photoexciting cvd device and photoexciting cvd method |
-
1990
- 1990-04-24 JP JP10947090A patent/JPH046840A/en active Pending
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH09111457A (en) * | 1995-10-16 | 1997-04-28 | Nissan Motor Co Ltd | Photoexciting cvd device and photoexciting cvd method |
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