JPH0462600U - - Google Patents

Info

Publication number
JPH0462600U
JPH0462600U JP10395490U JP10395490U JPH0462600U JP H0462600 U JPH0462600 U JP H0462600U JP 10395490 U JP10395490 U JP 10395490U JP 10395490 U JP10395490 U JP 10395490U JP H0462600 U JPH0462600 U JP H0462600U
Authority
JP
Japan
Prior art keywords
circuit
semiconductor memory
external terminal
internal signal
cell
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP10395490U
Other languages
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP10395490U priority Critical patent/JPH0462600U/ja
Publication of JPH0462600U publication Critical patent/JPH0462600U/ja
Pending legal-status Critical Current

Links

Description

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は本考案の一実施例の半導体メモリの回
路図、第2図は従来の半導体メモリの回路である
。 1……制御回路、2……ヒユーズセル、3,4
,6……インバータ、5……NANDゲート、7
……NORゲート、8……高電圧検出回路、9…
…P型エンハンスメント・トランジスタ、10…
…N型エンハンスメント・トランジスタ、A,B
,E,F,G,H……内部信号、C,D……外部
端子。
FIG. 1 is a circuit diagram of a semiconductor memory according to an embodiment of the present invention, and FIG. 2 is a circuit diagram of a conventional semiconductor memory. 1... Control circuit, 2... Fuse cell, 3, 4
, 6... Inverter, 5... NAND gate, 7
...NOR gate, 8...High voltage detection circuit, 9...
...P-type enhancement transistor, 10...
...N-type enhancement transistor, A, B
, E, F, G, H...Internal signal, C, D...External terminal.

Claims (1)

【実用新案登録請求の範囲】[Scope of utility model registration request] 冗長回路を備え、冗長セル切換情報を書き込む
手段として、フローテイングゲートを有し、かつ
消去可能で電気的書き込み可能な読み出し専用メ
モリセルを用いた半導体メモリにおいて、外部端
子に印加された通常電源電圧より高い電圧を検出
して内部信号のレベルを反転せしめる高電圧検出
回路を設け、反転した前記内部信号により前記ヒ
ユーズセルの情報を前記外部端子に出力する回路
を設けたことを特徴とする半導体メモリ。
In a semiconductor memory equipped with a redundant circuit and using an erasable and electrically writable read-only memory cell having a floating gate as a means for writing redundant cell switching information, the normal power supply voltage applied to an external terminal. A semiconductor memory comprising: a high voltage detection circuit that detects a higher voltage and inverts the level of an internal signal; and a circuit that outputs information of the fuse cell to the external terminal based on the inverted internal signal.
JP10395490U 1990-10-01 1990-10-01 Pending JPH0462600U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP10395490U JPH0462600U (en) 1990-10-01 1990-10-01

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP10395490U JPH0462600U (en) 1990-10-01 1990-10-01

Publications (1)

Publication Number Publication Date
JPH0462600U true JPH0462600U (en) 1992-05-28

Family

ID=31849034

Family Applications (1)

Application Number Title Priority Date Filing Date
JP10395490U Pending JPH0462600U (en) 1990-10-01 1990-10-01

Country Status (1)

Country Link
JP (1) JPH0462600U (en)

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH01245497A (en) * 1988-03-28 1989-09-29 Nec Corp Semiconductor memory

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH01245497A (en) * 1988-03-28 1989-09-29 Nec Corp Semiconductor memory

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