JPH0459688A - Double crucible for growing single crystal - Google Patents
Double crucible for growing single crystalInfo
- Publication number
- JPH0459688A JPH0459688A JP16689190A JP16689190A JPH0459688A JP H0459688 A JPH0459688 A JP H0459688A JP 16689190 A JP16689190 A JP 16689190A JP 16689190 A JP16689190 A JP 16689190A JP H0459688 A JPH0459688 A JP H0459688A
- Authority
- JP
- Japan
- Prior art keywords
- crucible
- single crystal
- quartz
- melted material
- growing
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 239000013078 crystal Substances 0.000 title claims abstract description 33
- 239000000463 material Substances 0.000 claims abstract description 17
- 239000010453 quartz Substances 0.000 claims abstract description 13
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N silicon dioxide Inorganic materials O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 claims abstract description 13
- 239000011248 coating agent Substances 0.000 claims abstract description 9
- 238000000576 coating method Methods 0.000 claims abstract description 9
- 238000000034 method Methods 0.000 claims abstract description 9
- 239000000155 melt Substances 0.000 claims description 8
- 230000007704 transition Effects 0.000 abstract 1
- 239000002994 raw material Substances 0.000 description 5
- 230000000052 comparative effect Effects 0.000 description 4
- 230000007423 decrease Effects 0.000 description 3
- 230000000694 effects Effects 0.000 description 2
- 241000257465 Echinoidea Species 0.000 description 1
- 238000001816 cooling Methods 0.000 description 1
- 239000007788 liquid Substances 0.000 description 1
- 239000002245 particle Substances 0.000 description 1
Landscapes
- Crystals, And After-Treatments Of Crystals (AREA)
- Liquid Deposition Of Substances Of Which Semiconductor Devices Are Composed (AREA)
Abstract
Description
【発明の詳細な説明】
〔産業上の利用分野]
本発明は、チョクラルスキー法によるSi単結晶育成用
石英二重るつぼに関するものである、[従来の技術]
LSIの基板等に用いられるSi単結晶は、般にチョク
ラルスキー法によって育成され、長大な単結晶を得る方
法として単結晶の育成中に原料を連続的に供給する連続
引上法がある。連続引上法において供給された原料が育
成中の単結晶に付着すると単結晶は多結晶となり、Si
単結晶の歩留りが低下する。[Detailed Description of the Invention] [Industrial Application Field] The present invention relates to a quartz double crucible for growing Si single crystals by the Czochralski method. [Prior Art] Single crystals are generally grown by the Czochralski method, and as a method for obtaining long single crystals, there is a continuous pulling method in which raw materials are continuously supplied during the growth of the single crystal. When the raw material supplied in the continuous pulling method adheres to the growing single crystal, the single crystal becomes polycrystalline and Si
Single crystal yield decreases.
この育成中の単結晶への原料の付着を防止するため、単
結晶の育成部と原料の供給部とを隔離した第2図に縦断
面図を示す二重るつぼが、例えば特開昭58−3697
7号公報に開示されている。In order to prevent the raw materials from adhering to the single crystal during growth, a double crucible, the vertical cross-sectional view of which is shown in FIG. 3697
It is disclosed in Publication No. 7.
図において、lは単結晶育成装置、2は内側るつぼ、4
はヒータ、5は融液、6は単結晶、7はサセプタ、8は
るつぼ支持棒、9は外側るつぼ。In the figure, l is a single crystal growth device, 2 is an inner crucible, and 4
5 is a heater, 5 is a melt, 6 is a single crystal, 7 is a susceptor, 8 is a crucible support rod, and 9 is an outer crucible.
lOは供給原料、11は貫通孔、12はチャンバ、13
は原料供給装置である。lO is the feed material, 11 is the through hole, 12 is the chamber, 13
is a raw material supply device.
2重るつぼは材質が石英で、石英は熱伝導率が低いため
、内側るつぼ2が融液5より露出した部分は低温となる
。The material of the double crucible is quartz, and since quartz has low thermal conductivity, the portion of the inner crucible 2 exposed from the melt 5 has a low temperature.
一方、Si融液は石英るつぼと反応して融液表面からS
iOガスを発生し、SiOガスは内側るつぼ2の上記低
温部分に凝着し、内側るつぼ2の内面に凝着したSiO
は融液5の表面に落下して育成中の単結晶6に付着して
多結晶化し、単結晶の歩留りを低下させる問題点がある
。On the other hand, the Si melt reacts with the quartz crucible and S
iO gas is generated, the SiO gas adheres to the low temperature part of the inner crucible 2, and the SiO gas adheres to the inner surface of the inner crucible 2.
There is a problem in that the particles fall on the surface of the melt 5 and adhere to the growing single crystal 6, turning it into polycrystals, reducing the yield of single crystals.
[発明が解決しようとする課題1
本発明は、内側るつぼの融液より露出した内面の冷却を
防止して、上記従来技術の問題点を解決しようとするも
のである。[Problem to be Solved by the Invention 1] The present invention attempts to solve the problems of the above-mentioned prior art by preventing cooling of the inner surface exposed from the melt in the inner crucible.
[課題を解決するための手段]
本発明は上記課題を解決するために、チョクラルスキー
法によるSi単結晶の育成に用いられる石英2重るつぼ
において、前記2重るつぼが、内側るつぼの融液より露
出した内面に、石英より熱伝導率の高い被覆材を備えた
ことを特徴とする単結晶育成用2重るつぼを提供するも
のである。[Means for Solving the Problems] In order to solve the above problems, the present invention provides a quartz double crucible used for growing Si single crystals by the Czochralski method, in which the double crucible has a molten liquid in an inner crucible. The present invention provides a double crucible for growing a single crystal, characterized in that the more exposed inner surface is provided with a coating material having higher thermal conductivity than quartz.
本発明を実施例の縦断面図を示す第1図を用いて説明す
る。The present invention will be explained using FIG. 1, which shows a longitudinal cross-sectional view of an embodiment.
図において、3は内側るつぼの融液より露出した内面に
備えられた被覆材、他の符号は第2図と同様である。In the figure, numeral 3 denotes a coating material provided on the inner surface exposed from the melt in the inner crucible, and other symbols are the same as in FIG. 2.
被覆材3としては、石英より熱伝導率の高いMo、W等
が好適に用いられる。As the covering material 3, Mo, W, etc., which have higher thermal conductivity than quartz, are preferably used.
内側るつぼ2の融液5より露出している内面は、熱伝導
率の高い被覆材により被層されでいるのて温度の低下が
少なく、したがって、上述の、SiOカスの凝着が軽減
され、凝着物の融液5への落下、単結晶6の多結晶化に
よる歩留りの低下を減少させることができる。The inner surface of the inner crucible 2 exposed from the melt 5 is coated with a coating material having high thermal conductivity, so the temperature decreases less, and therefore the above-mentioned adhesion of SiO scum is reduced. It is possible to reduce the decrease in yield due to the falling of aggregates into the melt 5 and the polycrystallization of the single crystal 6.
[実施例]
第1図に示した型式の装置を用いた。内側るつぼの内径
は300mm、外側るつぼの内径は400mm、被覆材
として厚さ1mmのMOを使用し、単結晶の育成中は融
fi量を一定として直径150mm、長さ800mmの
Si単結晶を20本育成した。[Example] An apparatus of the type shown in FIG. 1 was used. The inner diameter of the inner crucible is 300 mm, the inner diameter of the outer crucible is 400 mm, MO with a thickness of 1 mm is used as a covering material, and the amount of fused fi is kept constant during the growth of the single crystal. This book was raised.
比較例として、実施例に用いた装置と比較し被覆材を欠
く装置を用いたほかは同一として、単結晶を育成した。As a comparative example, a single crystal was grown using the same apparatus as that used in the example except that an apparatus lacking a coating material was used.
実施例及び比較例における、多結晶化した位置の単結晶
の上端からの距離と本数とを第1表に示した6
比較例においては、育成した単結晶は総て600mm以
内で多結晶化し、半数以上が400mm以内で多結晶化
したのに対し、実施例では。Table 1 shows the distance from the top of the single crystal and the number of polycrystallized positions in Examples and Comparative Examples6. In Comparative Examples, all grown single crystals polycrystallized within 600 mm, While more than half of the cases were polycrystalline within 400 mm, in the examples.
育成した20本ウニ5本は全く多結晶化せず、多結晶化
したものでもその位置は比較例に比較して下端に移って
おり1本発明によりSi単結晶の歩留まりが大幅に向上
した。Five of the 20 sea urchins grown did not polycrystallize at all, and even if they did polycrystallize, the position shifted to the lower end compared to the comparative example, and the present invention significantly improved the yield of Si single crystals.
〔発明の効果]
本発明のるつぼを用いることにより、Si単結晶の歩留
りを大幅に向上させることができた。[Effects of the Invention] By using the crucible of the present invention, the yield of Si single crystals could be significantly improved.
第1図は本発明の2重るつぼを用いた単結晶育成装置の
縦断面図、第2図は従来の2重るつぼを用いた単結晶育
成装置の縦断面図である。
l・−・単結晶育成装置 2−・・内…1するつぼ3
−・・被覆材 4・−ヒータ5・・・融液
6・・・単結晶7・・・サセプタ
8−・・るつぼ支持棒9・・−外側るつぼ
10・・−供給原料11・・−貫通孔 12・
・−チャンバ13・−・原料供給装置FIG. 1 is a longitudinal sectional view of a single crystal growth apparatus using a double crucible according to the present invention, and FIG. 2 is a longitudinal sectional view of a conventional single crystal growth apparatus using a double crucible. l・-・Single crystal growth device 2-・Inside...1 Crucible 3
-...Coating material 4-Heater 5...Melt 6...Single crystal 7...Susceptor
8--Crucible support rod 9--Outer crucible
10...-Feed material 11...-Through hole 12.
-Chamber 13--Raw material supply device
Claims (1)
られる石英2重るつぼにおいて、前記2重るつぼが、内
側るつぼの融液より露出した内面に、石英より熱伝導率
の高い被覆材を備えたことを特徴とする単結晶育成用2
重るつぼ。1. In a quartz double crucible used for growing Si single crystals by the Czochralski method, the double crucible is provided with a coating material having higher thermal conductivity than quartz on the inner surface exposed from the melt of the inner crucible. For single crystal growth 2 characterized by
A heavy crucible.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP16689190A JPH0459688A (en) | 1990-06-27 | 1990-06-27 | Double crucible for growing single crystal |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP16689190A JPH0459688A (en) | 1990-06-27 | 1990-06-27 | Double crucible for growing single crystal |
Publications (1)
Publication Number | Publication Date |
---|---|
JPH0459688A true JPH0459688A (en) | 1992-02-26 |
Family
ID=15839544
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP16689190A Pending JPH0459688A (en) | 1990-06-27 | 1990-06-27 | Double crucible for growing single crystal |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPH0459688A (en) |
-
1990
- 1990-06-27 JP JP16689190A patent/JPH0459688A/en active Pending
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