JPH0453012A - Manufacture of thin film magnetic head - Google Patents
Manufacture of thin film magnetic headInfo
- Publication number
- JPH0453012A JPH0453012A JP16343990A JP16343990A JPH0453012A JP H0453012 A JPH0453012 A JP H0453012A JP 16343990 A JP16343990 A JP 16343990A JP 16343990 A JP16343990 A JP 16343990A JP H0453012 A JPH0453012 A JP H0453012A
- Authority
- JP
- Japan
- Prior art keywords
- mask
- magnetic pole
- film
- magnetic
- insulating layer
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 239000010409 thin film Substances 0.000 title claims abstract description 45
- 238000004519 manufacturing process Methods 0.000 title claims description 18
- 239000010410 layer Substances 0.000 claims abstract description 127
- 239000010408 film Substances 0.000 claims abstract description 96
- 238000005530 etching Methods 0.000 claims abstract description 23
- 239000011229 interlayer Substances 0.000 claims abstract description 23
- 238000000034 method Methods 0.000 claims description 44
- 239000000758 substrate Substances 0.000 claims description 28
- 238000000059 patterning Methods 0.000 claims description 17
- 238000010030 laminating Methods 0.000 claims description 4
- 238000007747 plating Methods 0.000 description 10
- 238000004544 sputter deposition Methods 0.000 description 9
- 238000000992 sputter etching Methods 0.000 description 9
- 229910003271 Ni-Fe Inorganic materials 0.000 description 6
- 239000000919 ceramic Substances 0.000 description 4
- 239000000463 material Substances 0.000 description 3
- PNEYBMLMFCGWSK-UHFFFAOYSA-N aluminium oxide Inorganic materials [O-2].[O-2].[O-2].[Al+3].[Al+3] PNEYBMLMFCGWSK-UHFFFAOYSA-N 0.000 description 2
- 229910052593 corundum Inorganic materials 0.000 description 2
- 238000005520 cutting process Methods 0.000 description 2
- 238000010586 diagram Methods 0.000 description 2
- 230000000694 effects Effects 0.000 description 2
- 229910001845 yogo sapphire Inorganic materials 0.000 description 2
- 206010011732 Cyst Diseases 0.000 description 1
- 229910018499 Ni—F Inorganic materials 0.000 description 1
- 208000031513 cyst Diseases 0.000 description 1
- 230000007423 decrease Effects 0.000 description 1
- 238000000151 deposition Methods 0.000 description 1
- 239000012530 fluid Substances 0.000 description 1
- 239000002184 metal Substances 0.000 description 1
- 229910052751 metal Inorganic materials 0.000 description 1
- 229920000620 organic polymer Polymers 0.000 description 1
- 229920001721 polyimide Polymers 0.000 description 1
- 239000009719 polyimide resin Substances 0.000 description 1
- 239000002861 polymer material Substances 0.000 description 1
- 230000001681 protective effect Effects 0.000 description 1
- 239000002689 soil Substances 0.000 description 1
Landscapes
- Magnetic Heads (AREA)
Abstract
Description
【発明の詳細な説明】
〔概 要〕
磁気ディスク装置に用いられる薄膜磁気ヘッドの製造方
法に関し、
下部磁極と上部磁極の相対位が正確な高精度の磁極を形
成することを目的とし、
基板上に磁性膜を形成した後、該磁性膜を第一マスクを
用いたエツチング法によりパターニングして下部磁極を
形成する工程と、前記下部磁極と第一マスクとの積層体
を含む基板上に絶縁層を被着形成し、該絶縁層の表面を
第一マスクの表面が露出するまで平坦加工を行った後、
該第一マスクを除去する工程と、前記第一マスク除去跡
の開口部を有する絶縁層上に、ギャップ層、層間絶縁層
で挟まれたFi1膜コイル、磁性膜を順次積層形成した
後、該磁性膜を第二マスクを用いたエツチング法により
パターニングして上部磁極を形成する工程とを含み構成
する。[Detailed Description of the Invention] [Summary] A method for manufacturing a thin-film magnetic head used in a magnetic disk device, the purpose of which is to form a high-precision magnetic pole in which the relative position of a lower magnetic pole and an upper magnetic pole is accurate. After forming a magnetic film, the magnetic film is patterned by an etching method using a first mask to form a lower magnetic pole, and an insulating layer is formed on a substrate including a laminated body of the lower magnetic pole and the first mask. After depositing and flattening the surface of the insulating layer until the surface of the first mask is exposed,
After the step of removing the first mask and sequentially forming a gap layer, a Fi1 film coil sandwiched between interlayer insulating layers, and a magnetic film on the insulating layer having the opening where the first mask was removed, The method includes a step of patterning the magnetic film by an etching method using a second mask to form an upper magnetic pole.
また、基板上に下部磁極用の磁性膜及びギャップ層を順
次形成した後、該磁性膜とギャップ層を第一マスクを用
いたエツチング法により所定形状にパターニングする工
程と、前記磁性膜からなる下部磁極、ギャップ層、第一
マスクの積層体を含む基板上に絶縁層を被着形成し、該
絶縁層の表面を第一マスクの表面が露出するまで平坦加
工を行った後、該第一マスクを除去する工程と、前記絶
縁層及び第一マスク除去跡の開口部に露出するギャップ
層の上に層間絶縁層で挟まれた薄膜コイルと磁性膜とを
順次積層形成した後、該磁性膜を第二マスクを用いたエ
ツチング法によりパターニングして上部磁極を形成する
工程とを含み構成する。Further, a step of sequentially forming a magnetic film and a gap layer for a lower magnetic pole on a substrate, and then patterning the magnetic film and gap layer into a predetermined shape by etching using a first mask; An insulating layer is deposited on a substrate including a laminate of a magnetic pole, a gap layer, and a first mask, and the surface of the insulating layer is flattened until the surface of the first mask is exposed. After sequentially forming a thin film coil sandwiched between interlayer insulating layers and a magnetic film on the insulating layer and the gap layer exposed in the opening where the first mask was removed, the magnetic film is removed. The method includes a step of patterning by an etching method using a second mask to form an upper magnetic pole.
更に、基板上に磁性膜を形成した後、該磁性膜を第一マ
スクを用いたエツチング法によりパターニングして下部
磁極を形成する工程と、前記第一マスクを除去した後の
下部磁極を含む基板上に第一絶縁層を被着形成し、該第
一絶縁層の表面を下部磁極の表面が露出するまで平坦加
工する工程と、該加工後の平坦面に第二絶縁層を被着形
成した後、該第二絶縁層の下部磁極の直上部部分を第二
マスクを用いたエツチング法により除去して開口する工
程と、前記下部磁極の露出する開口部を有する第二絶縁
層上にギャップ層及び層間絶縁層で挟まれた薄膜コイル
と磁性膜とを順次積層形成した後、該磁性膜を第三マス
クを用いたエツチング法によりパターニングして上部磁
極(52)を形成する工程とを含み構成する。Further, a step of forming a magnetic film on the substrate and patterning the magnetic film by an etching method using a first mask to form a lower magnetic pole, and a step of forming a substrate including the lower magnetic pole after removing the first mask. forming a first insulating layer thereon, flattening the surface of the first insulating layer until the surface of the lower magnetic pole is exposed, and forming a second insulating layer on the flat surface after the processing; Thereafter, a step of removing a portion of the second insulating layer directly above the bottom pole by an etching method using a second mask to form an opening, and forming a gap layer on the second insulating layer having the opening through which the bottom pole is exposed. and a step of sequentially laminating a thin film coil and a magnetic film sandwiched between interlayer insulating layers, and then patterning the magnetic film by an etching method using a third mask to form an upper magnetic pole (52). do.
本発明は磁気ディスク装置に用いられる薄膜磁気ヘッド
の製造方法に係り、特に薄膜磁気ヘッドの磁極を精度良
く形成する方法に関するものである。The present invention relates to a method of manufacturing a thin film magnetic head used in a magnetic disk drive, and more particularly to a method of forming magnetic poles of a thin film magnetic head with high precision.
近年、磁気ディスク装置においては、高密度記録化、大
容量化に伴って薄膜磁気ヘッドの記録・再生に直接関与
する磁極先端部の幅も益々狭められる傾向にある。この
ため、かかる薄膜磁気ヘッドの狭められる磁極先端部を
高精度に形成する方法が必要とされている。In recent years, in magnetic disk drives, the width of the magnetic pole tip, which is directly involved in recording and reproduction of thin-film magnetic heads, has tended to become narrower as the recording density and capacity have increased. Therefore, there is a need for a method of forming the narrowed magnetic pole tip of such a thin film magnetic head with high precision.
(従来の技術〕
従来の薄膜磁気ヘッドの一例としては第4図の(a)の
平面図、(b)のA−A’断面図及び(C)のB−B’
断面図で示ずように、セラミック等からなる非磁性基、
板1上にNi−Fe膜からなる下部磁極2が配設され、
その下部磁極2]二にAl2O3膜からなるギャップ層
3、層間絶縁層4で挟まれた薄膜コイル5及びNi−F
e膜からなるL部磁極6が順に積層され、更にそれらの
1面ばAl2O3からなる保護膜7によって被覆されて
いる。(Prior Art) Examples of a conventional thin film magnetic head include a plan view of (a) in FIG. 4, a sectional view along line AA' in FIG.
As shown in the cross-sectional view, a non-magnetic group made of ceramic etc.
A lower magnetic pole 2 made of a Ni-Fe film is arranged on a plate 1,
The lower magnetic pole 2], a gap layer 3 made of an Al2O3 film, a thin film coil 5 sandwiched between an interlayer insulating layer 4, and a Ni-F
L portion magnetic poles 6 made of e-films are laminated in order, and one side of them is further covered with a protective film 7 made of Al2O3.
そして前記ギャップ層3を挟んで直接対向する下部磁極
2と1部磁極6の先端部は所定の磁気ギャップ深さとな
るように切断され、か・つその切断面は平坦に研磨され
て記録媒体に対する記録・再生のための媒体対向面8を
形成した構成としている。The tips of the lower magnetic pole 2 and the first magnetic pole 6, which are directly opposed to each other with the gap layer 3 in between, are cut to have a predetermined magnetic gap depth, and the cut surfaces are polished flat so that they are suitable for recording media. The structure is such that a medium facing surface 8 for recording and reproduction is formed.
ところで上記したような従来の薄膜磁気ヘッドでは、下
部磁極2上にギャップ層3及び層間絶縁層4で挟まれた
薄膜コイル5を介して上部磁極6を形成する際に、フォ
トマスクの位置合わせ誤差等により前記上下の磁極に位
置ずれが生して位置合わせ精度が低下する問題がある。By the way, in the conventional thin film magnetic head as described above, when forming the upper magnetic pole 6 on the lower magnetic pole 2 via the thin film coil 5 sandwiched between the gap layer 3 and the interlayer insulating layer 4, alignment errors of the photomask may occur. There is a problem in that positional deviation occurs between the upper and lower magnetic poles due to such factors, and alignment accuracy decreases.
またこの位置ずれが最悪な場合には第5図の磁極先端部
分の断面図で示されるように上部磁極6の片端が土部磁
極2の上面より垂れ下がった状態になることがあり、こ
の垂れ下がった上部磁極6部分が下部磁極2の縁端の角
で薄くなったギャップ層3部分を通して電気的に接触す
るといった問題があった。In addition, in the worst case of this misalignment, one end of the upper magnetic pole 6 may hang down from the top surface of the soil part magnetic pole 2, as shown in the cross-sectional view of the tip of the magnetic pole in FIG. There is a problem in that the upper magnetic pole 6 portion electrically contacts through the gap layer 3 portion which is thinned at the corner of the edge of the lower magnetic pole 2.
そこでかかる問題を防止するために、例えば前記上下の
磁極を形成する方法として第6図(a)に示すように、
非磁性基板11上にめっき用下地導電膜(図示省略)を
介してレジスト膜を塗着し、該レジスト膜をパターニン
グして下部磁極の形状パターンを画定する第一めっきフ
レーム12を形成し、この第一めっきフレーム12内の
露出領域にめっき法によりNi−Feからなる磁性膜1
3を形成した後、前記第一めっきフレーム12を熔解除
去して第6図(b)に示すように下部磁極14を形成す
る。In order to prevent this problem, for example, as a method of forming the upper and lower magnetic poles, as shown in FIG. 6(a),
A resist film is applied onto the non-magnetic substrate 11 via a base conductive film for plating (not shown), and the resist film is patterned to form the first plating frame 12 that defines the shape pattern of the lower magnetic pole. Magnetic film 1 made of Ni-Fe is deposited on the exposed area within first plating frame 12 by plating method.
3, the first plating frame 12 is melted and removed to form a lower magnetic pole 14 as shown in FIG. 6(b).
次に第6図(C)に示すように下部磁極14を含む非磁
性基板11上にスパッタリング法等によりA f!20
3膜からなるギャップ層15を形成し、更に図示しない
層間絶縁層で挟まれた薄膜コイルを形成した後、該ギャ
ップ層15及び図示しない層間絶縁層で挟まれた薄膜コ
イル上にめっき用下地導電膜(図示省略)を介してレジ
スト膜を塗着し、該レジスト膜をパターニングして第6
図(d)に示すように下部磁極14よりも小さい上部磁
極の形状パターンを画定する第二めっきフレーム16を
形成し、引き続き該第二めっきフレーム16内の露出領
域にめっき法によりNi−Feからなる磁性膜17を形
成した後、前記第二めっきフレーム16を溶解除去して
第6図(e)に示すように上部磁極18を前記下部磁極
14上に小さい形状パターンで形成していた。Next, as shown in FIG. 6(C), A f! 20
After forming a gap layer 15 consisting of three films and further forming a thin film coil sandwiched between interlayer insulating layers (not shown), a conductive base for plating is applied on the gap layer 15 and the thin film coil sandwiched between interlayer insulating layers (not shown). A resist film is applied through a film (not shown), and the resist film is patterned to form a sixth pattern.
As shown in Figure (d), a second plating frame 16 is formed that defines the shape pattern of the upper magnetic pole smaller than the lower magnetic pole 14, and then the exposed area within the second plating frame 16 is coated with Ni-Fe by a plating method. After forming the magnetic film 17, the second plating frame 16 was dissolved and removed to form an upper magnetic pole 18 in a small pattern on the lower magnetic pole 14, as shown in FIG. 6(e).
しかし第6図(e)に示すように下部磁極14と上部磁
極18の先端部の幅が異なると、記録媒体に対してオフ
トラックした場合のクロストークが大きくなり、また高
トラツク密度化に対しても大きな障害となる欠点を有し
ていた。However, as shown in FIG. 6(e), if the widths of the tips of the lower magnetic pole 14 and the upper magnetic pole 18 are different, crosstalk will increase when off-tracking with respect to the recording medium, and it will also be difficult to increase the track density. However, it had drawbacks that were a major hindrance.
本発明は上記した従来の欠点に鑑み、下部磁極が形成さ
れた基板上に、該下部磁極が露出する開口部を有する絶
縁層を形成し、その開口部にギャップ層及び層間絶縁層
で挟まれた薄膜コイルを介して上部磁極を形成する方法
によって、下部磁極に対する上部磁極の位置合わせ精度
を高めるようにした新規な薄膜磁気ヘッドの製造方法を
折供することを目的とするものである。In view of the above-mentioned conventional drawbacks, the present invention forms an insulating layer having an opening through which the lower magnetic pole is exposed on a substrate on which the lower magnetic pole is formed, and is sandwiched between a gap layer and an interlayer insulating layer in the opening. The present invention aims to provide a novel method for manufacturing a thin-film magnetic head in which the accuracy of alignment of the upper magnetic pole with respect to the lower magnetic pole is improved by forming the upper magnetic pole through a thin-film coil.
上記した目的を達成するため、請求項1の発明による薄
膜磁気ヘッドの製造方法は、基板上に磁性膜を形成した
後、該磁性膜を第一マスクを用いたエツチング法により
パターニングして下部磁極を形成する工程と、前記下部
磁極と第一マスクとの積層体を含む基板上に絶縁層を被
着形成し、該絶縁層の表面を第一マスクの表面が露出す
るまで平坦加工を行った後、該第一マスクを除去する工
程と、前記第一マスク除去跡の開口部を有する絶縁層上
に、ギャップ層、層間絶縁層で挟まれた薄膜コイル、磁
性膜を順次積層形成した後、該磁性膜を第二マスクを用
いたエツチング法によりパターニングして上部磁極を形
成する工程とを含み構成する。In order to achieve the above object, a method for manufacturing a thin film magnetic head according to the invention of claim 1 includes forming a magnetic film on a substrate, and then patterning the magnetic film by an etching method using a first mask to form a lower magnetic pole. forming an insulating layer on a substrate including a laminate of the lower magnetic pole and the first mask, and flattening the surface of the insulating layer until the surface of the first mask is exposed. After that, a step of removing the first mask, and sequentially laminating a gap layer, a thin film coil sandwiched between interlayer insulating layers, and a magnetic film on the insulating layer having the opening where the first mask was removed, The method includes a step of patterning the magnetic film by an etching method using a second mask to form an upper magnetic pole.
また請求項2の発明による薄膜磁気ヘッドの製造方法は
、基板上に下部磁極用の磁性膜及びギャップ層を順次形
成した後、該磁性膜とギャップ層を第一マスクを用いた
エツチング法により所定形状にパターニングする工程と
、前記磁性膜からなる下部磁極、ギャップ層、第一マス
クの積層体を含む基板上に絶縁層を被着形成し、該絶縁
層の表面を第一マスクの表面が露出するまで平坦加工を
行った後、該第一マスクを除去する工程と、前記絶縁層
及び第一マスク除去跡の開口部に露出するギャップ層の
上に層間絶縁層で挟まれた薄膜コイルと磁性膜とを順次
積層形成した後、該磁性膜を第二マスクを用いたエツチ
ング法によりパターニングし、て上部磁極を形成する工
程とを含み構成する。Further, in the method of manufacturing a thin film magnetic head according to the invention of claim 2, after sequentially forming a magnetic film for a lower magnetic pole and a gap layer on a substrate, the magnetic film and the gap layer are etched in a predetermined manner using a first mask. a step of patterning the magnetic film into a shape, and forming an insulating layer on a substrate including a laminate of a lower magnetic pole, a gap layer, and a first mask made of the magnetic film, and exposing the surface of the insulating layer to the surface of the first mask. After flattening the first mask, a thin film coil sandwiched between an interlayer insulating layer and a magnetic The structure includes a step of sequentially laminating the magnetic films and patterning the magnetic films by an etching method using a second mask to form an upper magnetic pole.
また請求項3の発明による薄膜磁気ヘッドの製造方法は
、基板上に磁性膜を形成した後、該磁性膜を第一マスク
を用いたエツチング法によりパタニングして下部磁極を
形成する工程と、前記第一マスクを除去した後の下部磁
極を含む基板上に第一絶縁層を被着形成し、該第一絶縁
層の表面を下部磁極の表面が露出するまで平坦加−1−
する工程と、該加工後の平坦面に第二絶縁層を被着形成
した後、該第二絶縁層の下部磁極の直上部部分を第二マ
スクを用いたエツチング法により除去して開口する工程
と、前記下部磁極の露出する開口部を有する第二絶縁層
上にギャップ層及び層間絶縁層で挟まれた薄膜コイルと
磁性膜とを順次積層形成した後、該磁性膜を第三マスク
を用いたエツチング法によりパターニングして上部磁極
(52)を形成する工程とを含み構成する。The method for manufacturing a thin film magnetic head according to the invention of claim 3 includes the steps of forming a magnetic film on a substrate and then patterning the magnetic film by an etching method using a first mask to form a lower magnetic pole; After removing the first mask, a first insulating layer is formed on the substrate including the lower magnetic pole, and the surface of the first insulating layer is flattened until the surface of the lower magnetic pole is exposed.
and a step of forming a second insulating layer on the flat surface after the processing, and then removing and opening a portion of the second insulating layer directly above the lower magnetic pole by an etching method using a second mask. After sequentially forming a thin film coil sandwiched between a gap layer and an interlayer insulating layer and a magnetic film on a second insulating layer having an opening through which the lower magnetic pole is exposed, the magnetic film is layered using a third mask. The structure includes a step of patterning using an etching method to form an upper magnetic pole (52).
本発明の製造方法では、下部磁極が形成された基板上に
、該下部磁極が露出する開L」部を有する平坦な絶縁層
を形成し、その間口部にギャップ層及び層間絶縁層で挟
まれた薄膜コイルを介して上部磁極を形成する方法、ま
たは下部磁極とギャップ層が同一パターン形状で積層形
成された基板上に、該ギャップ層が露出する開口部を有
する平坦な絶縁層を形成し、その開口部に層間絶縁層で
挟まれた薄膜コイルを介して上部磁極を形成する方法、
更に下部磁極が形成された基板上に、該下部磁極が露出
する平坦な絶縁層を形成し、該絶縁層上に更に下部磁極
が露出する開口部を有する絶縁層を形成し、その開口部
にギャップ層及び層間絶縁層で挟まれた薄膜コイルを介
して上部磁極を形成する方法によって、下部磁極に対し
て上部磁極を位置ずれがなく、精度良く形成することが
できる。In the manufacturing method of the present invention, a flat insulating layer having an open L' portion through which the lower magnetic pole is exposed is formed on a substrate on which the lower magnetic pole is formed, and the flat insulating layer is sandwiched between a gap layer and an interlayer insulating layer at the opening thereof. A method of forming an upper magnetic pole through a thin film coil, or forming a flat insulating layer having an opening through which the gap layer is exposed on a substrate on which a lower magnetic pole and a gap layer are laminated in the same pattern shape, A method of forming an upper magnetic pole through a thin film coil sandwiched between interlayer insulating layers in the opening,
Further, on the substrate on which the lower magnetic pole is formed, a flat insulating layer is formed to expose the lower magnetic pole, an insulating layer having an opening through which the lower magnetic pole is exposed is further formed on the insulating layer, and an insulating layer is formed in the opening. By forming the upper magnetic pole via a thin film coil sandwiched between a gap layer and an interlayer insulating layer, the upper magnetic pole can be formed with high precision without misalignment with respect to the lower magnetic pole.
以下図面を用いて本発明の実施例について詳細に説明す
る。Embodiments of the present invention will be described in detail below with reference to the drawings.
第1図(a)〜げ)は本発明に係る薄膜磁気ヘッドの製
造方法の第一実施例を工程順に示す要部断面図である。FIGS. 1(a) to 1(a) are sectional views of main parts showing the first embodiment of the method for manufacturing a thin film magnetic head according to the present invention in order of steps.
先ず、第1図(a)に示すようにセラミックス等からな
る41′磁性基板21上にスパッタリング法等によりN
i−Feからなる磁性膜22を被着形成した後、該磁性
膜22上にレジスト膜を塗着し、該レジスト膜をパター
ニングして下部磁極形成用の第一マスク23を形成する
。First, as shown in FIG. 1(a), N is deposited on a 41' magnetic substrate 21 made of ceramics or the like by sputtering or the like.
After the magnetic film 22 made of i-Fe is deposited, a resist film is applied on the magnetic film 22, and the resist film is patterned to form a first mask 23 for forming the lower magnetic pole.
次に該第一マスク23を介して前記磁性膜22をイオン
エツチング法によりパターニングして第1図(b)に示
すように下部磁極24を形成する。この時、前記第一マ
スク23もイオンエツチングにより多少はエツチングさ
れて膜厚がある程度薄くなるが、エツチング後も除去せ
ずに下部磁極24上に残置しておく。Next, the magnetic film 22 is patterned by ion etching through the first mask 23 to form a lower magnetic pole 24 as shown in FIG. 1(b). At this time, the first mask 23 is also etched to some extent by the ion etching and its film thickness is reduced to some extent, but it is left on the lower magnetic pole 24 without being removed even after etching.
次に第1図(C)に示すように前記下部磁極24上の第
一マスク23を含む非磁性基板21上にスパッタリング
法等によりA f 203等からなる無機絶縁層25を
下部磁極24よりも厚く被着形成した後、該無機絶縁層
25を前記第一マスク23が露出するまで機械的に平坦
研磨する加工法、或いは該無機絶縁層25の表面に該無
機絶縁層25と等速エツチングが可能な流動性材料を塗
布して平坦化し、かかる表面を等速でエツチングするエ
ッチハック法により平坦加工を行う。Next, as shown in FIG. 1C, an inorganic insulating layer 25 made of A f 203 or the like is deposited on the nonmagnetic substrate 21 including the first mask 23 on the lower magnetic pole 24 by sputtering or the like. After forming a thick layer, the inorganic insulating layer 25 is mechanically polished to a flat surface until the first mask 23 is exposed, or the surface of the inorganic insulating layer 25 is etched at the same speed as the inorganic insulating layer 25. Flattening is performed by applying a fluid material that can be used to flatten the surface, and then etching the surface at a constant speed using an etch hack method.
次に第1図(d)に示すように前記第一マスク23を溶
解除去して下部磁極24が露出する開口部26を設けた
後、該開口部26を有する無機絶縁層25上に、スパッ
タリング法等によりAj!t(h等からなるギャップ層
27及び図示しない層間絶縁層で挟まれた薄膜コイルと
Ni−Feからなる磁性膜28とを順次積層形成する。Next, as shown in FIG. 1(d), after dissolving and removing the first mask 23 to provide an opening 26 through which the lower magnetic pole 24 is exposed, sputtering is performed on the inorganic insulating layer 25 having the opening 26. By law etc. Aj! A thin film coil sandwiched between a gap layer 27 made of t(h, etc.) and an interlayer insulating layer (not shown) and a magnetic film 28 made of Ni--Fe are sequentially laminated.
その後、前記磁性膜28上にレジスト膜を塗着し、該レ
ジスト膜をパターニングして第1図(e)で示すように
前記下部磁極24と対応する領域に上部磁極形成用の第
二マスク29を形成した後、該第二マスク29を介して
前記磁性膜28及びギャップ層27をイオンエツチング
法によりパターニングし、引き続き第二マスク29を溶
解除去することにより、第1図げ)に示すように前記下
部磁極24に対して上部磁極30が精度良く位置合わせ
された状態に容易に形成することができる。Thereafter, a resist film is applied on the magnetic film 28, and the resist film is patterned to form a second mask 29 for forming an upper magnetic pole in a region corresponding to the lower magnetic pole 24, as shown in FIG. 1(e). After forming the magnetic film 28 and the gap layer 27 through the second mask 29, the magnetic film 28 and the gap layer 27 are patterned by ion etching, and then the second mask 29 is dissolved and removed, as shown in Fig. 1). The upper magnetic pole 30 can be easily formed in a state in which the upper magnetic pole 30 is precisely aligned with the lower magnetic pole 24.
また、第2図(a)〜げ)は本発明に係る薄膜磁気ヘッ
ドの製造方法の第二実施例を工程順に示す要部断面図で
ある。Further, FIGS. 2(a) to 2(a) are sectional views of essential parts showing a second embodiment of the method for manufacturing a thin film magnetic head according to the present invention in order of steps.
本実施例では第2図(a)に示すようにセラミックス等
からなる非磁性基板32上にスパッタリング法等により
Ni−Feからなる磁性膜32とAAz03等からなる
ギャップ層33を被着形成した後、該ギャップ層33上
にレジスト膜を塗着し、該レジスト膜をパターニングし
て下部磁極形成用の第一マスク34を形成する。In this embodiment, as shown in FIG. 2(a), after a magnetic film 32 made of Ni-Fe and a gap layer 33 made of AAz03 etc. are deposited and formed on a non-magnetic substrate 32 made of ceramic etc. by sputtering method etc. A resist film is applied on the gap layer 33, and the resist film is patterned to form a first mask 34 for forming the lower magnetic pole.
次に該第一マスク34を介して前記ギャップ層33及び
磁性膜32をイオンエツチング法によりパターニングし
て第2図(b)に示すようにパターン化したギヤツブ層
33及び下部磁極35を形成する。この時、前記第一マ
スク34もイオンエツチングによす多少はエツチングさ
れて膜厚がある程度薄くなるが、エツチング後も除去せ
ずにギャップ層33上に残置しておく。Next, the gap layer 33 and magnetic film 32 are patterned by ion etching through the first mask 34 to form a patterned gear layer 33 and lower magnetic pole 35 as shown in FIG. 2(b). At this time, the first mask 34 is also etched to some extent by ion etching and its film thickness is reduced to some extent, but it is left on the gap layer 33 without being removed even after etching.
次に第2図(C)に示すように前記ギャップ層33上の
第一マスク34を含む非磁性基板31上にスパッタリン
グ法等によI’J A 720.等からなる無機絶縁層
36を下部磁極35よりも厚く被着形成した後、該無機
絶縁1i36を前記第一マスク34が露出する状態に機
械的に平坦研磨、或いは前記エッチバック法により平坦
加工を行う。Next, as shown in FIG. 2(C), I'J A 720. After forming an inorganic insulating layer 36 thicker than the lower magnetic pole 35, the inorganic insulating layer 36 is mechanically flattened to expose the first mask 34, or flattened by the etch-back method. conduct.
次に第2図(ロ)に示すように前記第一マスク34を除
去してギャップ層33が露出する開口部37を設けた無
機絶縁層36上に、図示しない層間絶縁層で挟まれた薄
膜コイルとNi−Feからなる磁性膜38とをスパッタ
リング法等により順次積層形成する。Next, as shown in FIG. 2(B), the first mask 34 is removed and a thin film sandwiched between interlayer insulating layers (not shown) is placed on the inorganic insulating layer 36 in which an opening 37 through which the gap layer 33 is exposed is provided. A coil and a magnetic film 38 made of Ni--Fe are sequentially laminated by sputtering or the like.
その後、前記磁性膜38上にレジスト膜を塗着し、該レ
ジスト膜をパターニングして第2図(e)で示すように
前記下部磁極35と対応する領域に上部磁極形成用の第
二マスク39を形成した後、該第二マスク39を介して
前記磁性膜38をイオンエツチング法によりパターニン
グし、引き続き第二マスク39を熔解除去することによ
り、第2図(f)に示すように前記下部磁極35に対し
て上部磁極40が第一実施例と同様に精度良く位置合わ
せされた状態に容易に形成することができる。Thereafter, a resist film is applied on the magnetic film 38, and the resist film is patterned to form a second mask 39 for forming an upper magnetic pole in a region corresponding to the lower magnetic pole 35, as shown in FIG. 2(e). After forming the magnetic film 38, the magnetic film 38 is patterned by ion etching through the second mask 39, and the second mask 39 is subsequently melted and removed, thereby forming the lower magnetic pole as shown in FIG. 2(f). The upper magnetic pole 40 can be easily formed in a state in which it is accurately aligned with respect to the upper magnetic pole 35 as in the first embodiment.
更に、第3図(a)〜・げ)は本発明ムこ係る薄膜磁気
ヘッドの製造方法の第三実施例を工程順に示す要部断面
図である。Furthermore, FIGS. 3(a) to 3(a) are sectional views of essential parts showing the third embodiment of the method for manufacturing a thin film magnetic head according to the present invention in order of steps.
本実施例では第3図(a)に示すようにセラミックス等
からなる非磁性基板41上にスパッタリング法等により
Ni−Feからなる磁性膜42を被着形成した後、該磁
性膜42上にレジスト膜を塗着し、更にパターニングし
て下部磁極形成用の第一マスク43を形成する。In this embodiment, as shown in FIG. 3(a), a magnetic film 42 made of Ni-Fe is deposited on a non-magnetic substrate 41 made of ceramic or the like by sputtering or the like, and then a resist is applied on the magnetic film 42. A film is applied and further patterned to form a first mask 43 for forming the lower magnetic pole.
次に該第一マスク43を介して前記磁性膜42をイオン
エツチング法によりパターニングして第3図ら)に示す
ように下部磁極44を形成した後、その第一マスク43
を溶解除去して該下部磁極44を含む前記非磁性基板4
1上にスパッタリング法等によってA j2 t03等
からなる第一無機絶縁層45を下部磁極44よりも厚く
被着形成し、該第一無機絶縁Ji45を前記下部磁極4
4が露出するまで機械的な平坦研磨、或いは前記エッチ
バック法により平坦加工を行う。Next, the magnetic film 42 is patterned by ion etching through the first mask 43 to form a lower magnetic pole 44 as shown in FIG.
The non-magnetic substrate 4 containing the lower magnetic pole 44 by dissolving and removing the
A first inorganic insulating layer 45 made of A j2 t03 or the like is deposited on the lower magnetic pole 44 by sputtering or the like, and the first inorganic insulating layer 45 is formed to be thicker than the lower magnetic pole 44.
Flattening is performed by mechanical flattening or the etch-back method described above until 4 is exposed.
次に第3図(C)に示すように該下部磁極44が露出す
る第一無機絶縁層45上にスパッタリング法等により更
にAf2O3等からなる第二無機絶縁層46を被着形成
し、その第二無機絶縁層46上にL/シスト膜を塗着し
、該レジスト膜をパターニングして上部磁極と同形状の
開[]パターンを有する第二マスク47を形成する。Next, as shown in FIG. 3(C), a second inorganic insulating layer 46 made of Af2O3 or the like is further formed by sputtering or the like on the first inorganic insulating layer 45 where the lower magnetic pole 44 is exposed. An L/cyst film is applied on the second inorganic insulating layer 46, and the resist film is patterned to form a second mask 47 having an open [] pattern having the same shape as the upper magnetic pole.
次に該第二マスク47を介して前記第二無機絶縁層46
をイオンエツチング法によりパターニングして第3図(
d)に示すように前記下部磁極44Fに、上部磁極形成
用の開口部48を形成する。引き続き前記第二マスク4
7を溶解除去した後、前記開U11部48を有する第二
無機絶縁層46上にA1.2O3等からなるギャップ1
4.9及び図示しない層間絶縁層で挟まれた薄膜コイル
とNi−Feからなる磁性膜50どをスパッタリング法
等により順次積層形成する。Next, the second inorganic insulating layer 46 is
is patterned by ion etching method as shown in Figure 3 (
As shown in d), an opening 48 for forming an upper magnetic pole is formed in the lower magnetic pole 44F. Continuing with the second mask 4
After dissolving and removing 7, a gap 1 made of A1.2O3 or the like is formed on the second inorganic insulating layer 46 having the open U11 portion 48.
4.9 and a thin film coil sandwiched between interlayer insulating layers (not shown), a magnetic film 50 made of Ni-Fe, etc. are sequentially laminated by sputtering or the like.
次に前記磁性膜50上にレジスト膜を塗着し、該レジス
ト膜をパターニングして第3図(e)で示すように前記
下部磁極44と対応する領域に上部磁極形成用の第三マ
スク51を形成した後、該第三マスク5】を介して前記
磁性膜50、ギャップ14.9及び第二無機絶縁層46
をイオンエツチング法により順にパターニングし、引き
続き第三マスク51を溶解除去することにより、第3図
げ)に示すように前記下部磁極44に対して一ト部磁極
52が第一実施例と同様乙こ精度良く位置合わせされた
状態に容易に形成1−ることが可能となる。Next, a resist film is applied on the magnetic film 50, and the resist film is patterned to form a third mask 51 for forming an upper magnetic pole in a region corresponding to the lower magnetic pole 44, as shown in FIG. 3(e). After forming the magnetic film 50, the gap 14.9 and the second inorganic insulating layer 46 through the third mask 5]
By sequentially patterning the mask by ion etching and subsequently dissolving and removing the third mask 51, as shown in Fig. It is possible to easily form this in a highly precisely aligned state.
なお、以りの実施例では第一、第二及び第一Z、マスク
を形成するマスク材料とし2てレジストを用いた場合の
例について説明し7たが、本発明はこの例に限定される
ものではなく、例えば光硬化性のポリイミド樹脂材等の
有機高分子材料、或いは磁性膜とは選択エツチング性の
ある例えばTi、 Cr等の金属膜を用いるようにして
も良い。In addition, in the following embodiments, an example in which a resist is used as the mask material 2 for forming the first, second, and first Z masks has been described, but the present invention is limited to this example. For example, an organic polymer material such as a photo-curable polyimide resin material, or a metal film such as Ti or Cr, which has selective etching properties with respect to the magnetic film, may be used instead.
以上の説明から明らかなように、本発明に係る薄膜磁気
ヘッドの製造方法によれば、下部磁極上にギャップ層及
び層間絶縁層で挟まれた薄膜コイルを介して上部磁極を
形成する際に、該下部磁極乙こ対する上部磁極の正確な
位置合わせが容易となり、磁極位置合わせ精度を高める
ことか可能となる優れた効果を奏する。As is clear from the above description, according to the method for manufacturing a thin film magnetic head according to the present invention, when forming the upper magnetic pole via the thin film coil sandwiched between the gap layer and the interlayer insulating layer on the lower magnetic pole, This facilitates accurate positioning of the upper magnetic pole with respect to the lower magnetic pole, and provides an excellent effect of increasing the accuracy of magnetic pole positioning.
第1図(a)〜げ)は本発明に係る薄膜磁気ヘッドの製
造方法の第一実施例を工程順に示す
要部断面図、
第2図(a)〜(f)は本発明に係る薄膜磁気ヘッドの
製造方法の第二実施例を工程順に示す
要部断面図、
第3図(a)〜(f)は本発明に係る薄膜磁気ヘッドの
製造方法の第三実施例を工程順に示す
要部断面図、
第4図(a)〜(C)は従来の薄膜磁気ヘッドを説明す
るための図であり、図(a)は平面図、図(b)は図(
a)に示すA−A’切断線に沿う要部断面図、図(C)
はB−B’切断線に沿う要部断面図、
第5図は従来の薄膜磁気ヘッドの製造上の問題点を説明
するための要部断面図、
第6図(a)〜(e)は従来の薄膜磁気ヘッドの磁極の
形成方法を説明するための要部断面図
である。
第1図(a)〜げ)乃至第3図(a)〜げ)において、
21.31.41は非磁性基板、22.28,32.3
8,42゜50は磁性膜、23,34.43は第一マス
ク、24゜35、44は下部磁極、25.36は無機絶
縁層、26.37.48は開口部、27,33.49は
ギャップ層、29.39.47は第二マスク、30.4
0.52は上部磁極、45は第一無機絶縁層、46は第
二無機絶縁層、51は第三マスクをそれぞれ示す。
第
閣
(C)
第
図FIGS. 1(a) to 1) are cross-sectional views of main parts showing the first embodiment of the method for manufacturing a thin film magnetic head according to the present invention in the order of steps, and FIGS. 3(a) to 3(f) are main part sectional views showing a second embodiment of a method for manufacturing a magnetic head in the order of steps, and FIGS. 4(a) to 4(C) are diagrams for explaining a conventional thin-film magnetic head, where FIG. 4(a) is a plan view and FIG. 4(b) is a diagram (
Main part sectional view along the A-A' cutting line shown in a), Figure (C)
5 is a sectional view of the main part taken along the cutting line B-B', FIG. 5 is a sectional view of the main part for explaining the manufacturing problems of the conventional thin film magnetic head, and FIGS. FIG. 2 is a cross-sectional view of a main part for explaining a method of forming a magnetic pole of a conventional thin-film magnetic head. In Fig. 1 (a) - ge) to Fig. 3 (a) - ge),
21.31.41 is a non-magnetic substrate, 22.28, 32.3
8, 42゜50 are magnetic films, 23, 34.43 are first masks, 24゜35, 44 are lower magnetic poles, 25.36 are inorganic insulating layers, 26.37.48 are openings, 27, 33.49 is the gap layer, 29.39.47 is the second mask, 30.4
0.52 is an upper magnetic pole, 45 is a first inorganic insulating layer, 46 is a second inorganic insulating layer, and 51 is a third mask. Daikaku (C) Figure
Claims (3)
該磁性膜(22)を第一マスク(23)を用いたエッチ
ング法によりパターニングして下部磁極(24)を形成
する工程と、 前記下部磁極(24)と第一マスク(23)との積層体
を含む基板(21)上に絶縁層(25)を被着形成し、
該絶縁層(25)の表面を第一マスク(23)の表面が
露出するまで平坦加工を行った後、該第一マスク(23
)を除去する工程と、 前記第一マスク除去跡の開口部(26)を有する絶縁層
(25)上に、ギャップ層(27)、層間絶縁層で挟ま
れた薄膜コイル、磁性膜(28)を順次積層形成した後
、該磁性膜(28)を第二マスク(29)を用いたエッ
チング法によりパターニングして上部磁極(30)を形
成する工程とを含むことを特徴とする薄膜磁気ヘッドの
製造方法。(1) After forming the magnetic film (22) on the substrate (21),
forming a lower magnetic pole (24) by patterning the magnetic film (22) by an etching method using a first mask (23); and a laminate of the lower magnetic pole (24) and the first mask (23). forming an insulating layer (25) on a substrate (21) containing
After flattening the surface of the insulating layer (25) until the surface of the first mask (23) is exposed, the first mask (23)
), and a gap layer (27), a thin film coil sandwiched between interlayer insulating layers, and a magnetic film (28) are placed on the insulating layer (25) having the opening (26) where the first mask was removed. A thin film magnetic head characterized by comprising the step of sequentially laminating the magnetic film (28) and patterning the magnetic film (28) by an etching method using a second mask (29) to form an upper magnetic pole (30). Production method.
びギャップ層(33)を順次形成した後、該磁性膜(3
2)とギャップ層(33)を第一マスク(34)を用い
たエッチング法により所定形状にパターニングする工程
と、前記磁性膜(32)からなる下部磁極(35)、ギ
ャップ層(33)、第一マスク(34)の積層体を含む
基板(31)上に絶縁層(36)を被着形成し、該絶縁
層(36)の表面を第一マスク(34)の表面が露出す
るまで平坦加工を行った後、該第一マスク(34)を除
去する工程と、 前記絶縁層(36)及び第一マスク除去跡の開口部(3
7)に露出するギャップ層(33)の上に層間絶縁層で
挟まれた薄膜コイルと磁性膜(38)とを順次積層形成
した後、該磁性膜(38)を第二マスク(39)を用い
たエッチング法によりパターニングして上部磁極(40
)を形成する工程とを含むことを特徴とする薄膜磁気ヘ
ッドの製造方法。(2) After sequentially forming a magnetic film (32) for the lower magnetic pole and a gap layer (33) on the substrate (31), the magnetic film (3
2) patterning the gap layer (33) and the gap layer (33) into a predetermined shape by etching using the first mask (34); An insulating layer (36) is deposited on a substrate (31) including a laminate of a first mask (34), and the surface of the insulating layer (36) is flattened until the surface of the first mask (34) is exposed. After performing this step, the step of removing the first mask (34), and the step of removing the insulating layer (36) and the opening (3) where the first mask was removed
7), a thin film coil sandwiched between interlayer insulating layers and a magnetic film (38) are sequentially laminated on the gap layer (33) exposed in the gap layer (33), and then the magnetic film (38) is covered with a second mask (39). The upper magnetic pole (40
) A method for manufacturing a thin film magnetic head, the method comprising: forming a thin film magnetic head.
該磁性膜(42)を第一マスク(43)を用いたエッチ
ング法によりパターニングして下部磁極(44)を形成
する工程と、 前記第一マスク(43)を除去した後の下部磁極(44
)を含む基板(41)上に第一絶縁層(45)を被着形
成し、該第一絶縁層(45)の表面を下部磁極(44)
の表面が露出するまで平坦加工する工程と、該加工後の
平坦面に第二絶縁層(46)を被着形成した後、該第二
絶縁層(46)の下部磁極(44)の直上部部分を第二
マスク(47)を用いたエッチング法により除去して開
口する工程と、 前記下部磁極(44)の露出する開口部(48)を有す
る第二絶縁層(46)上にギャップ層(49)及び層間
絶縁層で挟まれた薄膜コイルと磁性膜(50)とを順次
積層形成した後、該磁性膜(50)を第三マスク(51
)を用いたエッチング法によりパターニングして上部磁
極(52)を形成する工程とを含むことを特徴とする薄
膜磁気ヘッドの製造方法。(3) After forming the magnetic film (42) on the substrate (41),
a step of patterning the magnetic film (42) by an etching method using a first mask (43) to form a lower magnetic pole (44); and a step of forming a lower magnetic pole (44) after removing the first mask (43).
), a first insulating layer (45) is deposited on a substrate (41) including a lower magnetic pole (44), and the surface of the first insulating layer (45)
A process of flattening until the surface of A gap layer (46) is formed on the second insulating layer (46) having the opening (48) through which the lower magnetic pole (44) is exposed. 49), a thin film coil sandwiched between interlayer insulating layers, and a magnetic film (50) are sequentially laminated, and then the magnetic film (50) is covered with a third mask (51).
) forming an upper magnetic pole (52) by patterning using an etching method.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP16343990A JPH0453012A (en) | 1990-06-20 | 1990-06-20 | Manufacture of thin film magnetic head |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP16343990A JPH0453012A (en) | 1990-06-20 | 1990-06-20 | Manufacture of thin film magnetic head |
Publications (1)
Publication Number | Publication Date |
---|---|
JPH0453012A true JPH0453012A (en) | 1992-02-20 |
Family
ID=15773913
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP16343990A Pending JPH0453012A (en) | 1990-06-20 | 1990-06-20 | Manufacture of thin film magnetic head |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPH0453012A (en) |
Cited By (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5744193A (en) * | 1995-05-20 | 1998-04-28 | Kitano Engineering Co., Ltd. | Method of manufacturing an optical disc and a placing platform to be used by the same |
US5800670A (en) * | 1995-05-20 | 1998-09-01 | Kitano Engineering Co., Ltd. | Spreader of an optical disc |
US5938891A (en) * | 1996-02-27 | 1999-08-17 | Origin Electric Company, Limited | Disk bonding system |
US5951806A (en) * | 1995-11-30 | 1999-09-14 | Kitano Engineering Co., Ltd. | Method of manufacturing a storage disc |
US5954908A (en) * | 1995-10-13 | 1999-09-21 | Kitano Engineering Co., Ltd. | Developing storage disc boss |
US6465151B1 (en) | 1991-03-20 | 2002-10-15 | Hitachi, Ltd. | Method of manufacturing optical discs |
-
1990
- 1990-06-20 JP JP16343990A patent/JPH0453012A/en active Pending
Cited By (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6465151B1 (en) | 1991-03-20 | 2002-10-15 | Hitachi, Ltd. | Method of manufacturing optical discs |
US6573025B2 (en) | 1991-03-20 | 2003-06-03 | Hitachi, Ltd. | Optical disc |
US5744193A (en) * | 1995-05-20 | 1998-04-28 | Kitano Engineering Co., Ltd. | Method of manufacturing an optical disc and a placing platform to be used by the same |
US5800670A (en) * | 1995-05-20 | 1998-09-01 | Kitano Engineering Co., Ltd. | Spreader of an optical disc |
US5954908A (en) * | 1995-10-13 | 1999-09-21 | Kitano Engineering Co., Ltd. | Developing storage disc boss |
US5951806A (en) * | 1995-11-30 | 1999-09-14 | Kitano Engineering Co., Ltd. | Method of manufacturing a storage disc |
US5938891A (en) * | 1996-02-27 | 1999-08-17 | Origin Electric Company, Limited | Disk bonding system |
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