JPH045123B2 - - Google Patents
Info
- Publication number
- JPH045123B2 JPH045123B2 JP58147248A JP14724883A JPH045123B2 JP H045123 B2 JPH045123 B2 JP H045123B2 JP 58147248 A JP58147248 A JP 58147248A JP 14724883 A JP14724883 A JP 14724883A JP H045123 B2 JPH045123 B2 JP H045123B2
- Authority
- JP
- Japan
- Prior art keywords
- signal
- edge
- slicer
- video signal
- edge position
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
- 238000001514 detection method Methods 0.000 claims description 21
- 238000003708 edge detection Methods 0.000 claims description 20
- 238000003384 imaging method Methods 0.000 claims description 20
- 238000005259 measurement Methods 0.000 claims description 12
- 230000000630 rising effect Effects 0.000 claims description 12
- 230000003287 optical effect Effects 0.000 claims description 9
- 230000006870 function Effects 0.000 claims description 4
- 230000001360 synchronised effect Effects 0.000 claims description 4
- 239000000463 material Substances 0.000 claims description 3
- 230000015572 biosynthetic process Effects 0.000 claims description 2
- 238000003786 synthesis reaction Methods 0.000 claims description 2
- 229910000831 Steel Inorganic materials 0.000 description 35
- 239000010959 steel Substances 0.000 description 35
- 239000002131 composite material Substances 0.000 description 15
- 238000010586 diagram Methods 0.000 description 13
- 238000000034 method Methods 0.000 description 6
- 238000005096 rolling process Methods 0.000 description 6
- 238000006243 chemical reaction Methods 0.000 description 5
- 239000000835 fiber Substances 0.000 description 5
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 4
- 230000003111 delayed effect Effects 0.000 description 4
- 229910052710 silicon Inorganic materials 0.000 description 4
- 239000010703 silicon Substances 0.000 description 4
- 230000000007 visual effect Effects 0.000 description 4
- 238000004458 analytical method Methods 0.000 description 3
- 238000005098 hot rolling Methods 0.000 description 3
- 238000009434 installation Methods 0.000 description 3
- 239000011159 matrix material Substances 0.000 description 3
- 239000013307 optical fiber Substances 0.000 description 2
- 238000004886 process control Methods 0.000 description 2
- 230000009466 transformation Effects 0.000 description 2
- 230000003321 amplification Effects 0.000 description 1
- 238000007405 data analysis Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 238000003199 nucleic acid amplification method Methods 0.000 description 1
- 238000003672 processing method Methods 0.000 description 1
- 238000003908 quality control method Methods 0.000 description 1
- 230000005855 radiation Effects 0.000 description 1
- 230000035945 sensitivity Effects 0.000 description 1
- 238000000926 separation method Methods 0.000 description 1
- 230000008054 signal transmission Effects 0.000 description 1
- 239000002893 slag Substances 0.000 description 1
- 230000002194 synthesizing effect Effects 0.000 description 1
- 230000007704 transition Effects 0.000 description 1
- 238000002834 transmittance Methods 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/30—Measuring arrangements characterised by the use of optical techniques for measuring roughness or irregularity of surfaces
- G01B11/306—Measuring arrangements characterised by the use of optical techniques for measuring roughness or irregularity of surfaces for measuring evenness
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Length Measuring Devices By Optical Means (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP58147248A JPS6038609A (ja) | 1983-08-10 | 1983-08-10 | 板形状測定装置 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP58147248A JPS6038609A (ja) | 1983-08-10 | 1983-08-10 | 板形状測定装置 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS6038609A JPS6038609A (ja) | 1985-02-28 |
| JPH045123B2 true JPH045123B2 (lt) | 1992-01-30 |
Family
ID=15425930
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP58147248A Granted JPS6038609A (ja) | 1983-08-10 | 1983-08-10 | 板形状測定装置 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS6038609A (lt) |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH0749937B2 (ja) * | 1988-03-22 | 1995-05-31 | 工業技術院長 | 形状測定方法 |
Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS50111941A (lt) * | 1974-02-12 | 1975-09-03 | ||
| JPS5744806A (en) * | 1980-08-29 | 1982-03-13 | Sumitomo Metal Ind Ltd | Method of two-dimensional measurement for pattern |
Family Cites Families (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS58160305U (ja) * | 1982-04-20 | 1983-10-25 | 株式会社東芝 | 形状検出装置 |
-
1983
- 1983-08-10 JP JP58147248A patent/JPS6038609A/ja active Granted
Patent Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS50111941A (lt) * | 1974-02-12 | 1975-09-03 | ||
| JPS5744806A (en) * | 1980-08-29 | 1982-03-13 | Sumitomo Metal Ind Ltd | Method of two-dimensional measurement for pattern |
Also Published As
| Publication number | Publication date |
|---|---|
| JPS6038609A (ja) | 1985-02-28 |
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