JPH0447665Y2 - - Google Patents
Info
- Publication number
- JPH0447665Y2 JPH0447665Y2 JP1985171515U JP17151585U JPH0447665Y2 JP H0447665 Y2 JPH0447665 Y2 JP H0447665Y2 JP 1985171515 U JP1985171515 U JP 1985171515U JP 17151585 U JP17151585 U JP 17151585U JP H0447665 Y2 JPH0447665 Y2 JP H0447665Y2
- Authority
- JP
- Japan
- Prior art keywords
- hole plate
- support member
- cam
- adapter
- upper hole
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
Landscapes
- Measuring Leads Or Probes (AREA)
- Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1985171515U JPH0447665Y2 (enEXAMPLES) | 1985-11-07 | 1985-11-07 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1985171515U JPH0447665Y2 (enEXAMPLES) | 1985-11-07 | 1985-11-07 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS6279172U JPS6279172U (enEXAMPLES) | 1987-05-20 |
| JPH0447665Y2 true JPH0447665Y2 (enEXAMPLES) | 1992-11-10 |
Family
ID=31107210
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP1985171515U Expired JPH0447665Y2 (enEXAMPLES) | 1985-11-07 | 1985-11-07 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH0447665Y2 (enEXAMPLES) |
Family Cites Families (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE3249770C2 (en) * | 1982-11-05 | 1987-11-12 | Martin Maelzer | Device for testing electrical circuit boards |
-
1985
- 1985-11-07 JP JP1985171515U patent/JPH0447665Y2/ja not_active Expired
Also Published As
| Publication number | Publication date |
|---|---|
| JPS6279172U (enEXAMPLES) | 1987-05-20 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| US4896869A (en) | Moving table apparatus | |
| JPH0447665Y2 (enEXAMPLES) | ||
| JPH11174107A (ja) | 自動化取り付け具検査機 | |
| JP4497354B2 (ja) | プリント基板における導電パターンの製造方法および製造装置 | |
| JP2000097985A (ja) | 間隔が密な試験場所用走査試験機 | |
| JP4037225B2 (ja) | Ict用接続治具 | |
| JPH09321099A (ja) | ウェハプローバ | |
| JPH10282172A (ja) | 電子機器、並びにその電子機器の測定方法 | |
| JP2001051008A (ja) | 基板検査装置 | |
| KR100676184B1 (ko) | 디스플레이 소자 테스트 장치 | |
| JP4794065B2 (ja) | 被処理物の支持装置 | |
| JP3418720B2 (ja) | 基板検査装置及び基板検査方法 | |
| JPH01114098A (ja) | ハンダ印刷装置 | |
| CN211603449U (zh) | 一种pcb板测试装置 | |
| JPH0238285Y2 (enEXAMPLES) | ||
| JPH05872Y2 (enEXAMPLES) | ||
| JPH0446217Y2 (enEXAMPLES) | ||
| JPH06300818A (ja) | フレキシブル基板検査装置 | |
| JPH0148618B2 (enEXAMPLES) | ||
| JPH083516B2 (ja) | 半導体装置用テストヘッドおよびテスト方法 | |
| JP2642535B2 (ja) | ガルリード部品の試験装置 | |
| JPH0719811B2 (ja) | プロ−ブ装置によるウエハの検査方法 | |
| JP2004108921A (ja) | 被検査基板の検査装置 | |
| JPS637477Y2 (enEXAMPLES) | ||
| JP2796310B2 (ja) | プローブ装置 |