JPH0444940B2 - - Google Patents
Info
- Publication number
- JPH0444940B2 JPH0444940B2 JP21246583A JP21246583A JPH0444940B2 JP H0444940 B2 JPH0444940 B2 JP H0444940B2 JP 21246583 A JP21246583 A JP 21246583A JP 21246583 A JP21246583 A JP 21246583A JP H0444940 B2 JPH0444940 B2 JP H0444940B2
- Authority
- JP
- Japan
- Prior art keywords
- mirror
- reflectance
- light beam
- measured
- parallel light
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
- 230000003287 optical effect Effects 0.000 claims description 18
- 238000006243 chemical reaction Methods 0.000 claims description 17
- 238000010586 diagram Methods 0.000 description 15
- 238000005259 measurement Methods 0.000 description 9
- 238000003384 imaging method Methods 0.000 description 4
- 238000002834 transmittance Methods 0.000 description 4
- 238000003491 array Methods 0.000 description 3
- 101700004678 SLIT3 Proteins 0.000 description 2
- 102100027339 Slit homolog 3 protein Human genes 0.000 description 2
- 238000002835 absorbance Methods 0.000 description 2
- 238000012634 optical imaging Methods 0.000 description 2
- RRLHMJHRFMHVNM-BQVXCWBNSA-N [(2s,3r,6r)-6-[5-[5-hydroxy-3-(4-hydroxyphenyl)-4-oxochromen-7-yl]oxypentoxy]-2-methyl-3,6-dihydro-2h-pyran-3-yl] acetate Chemical compound C1=C[C@@H](OC(C)=O)[C@H](C)O[C@H]1OCCCCCOC1=CC(O)=C2C(=O)C(C=3C=CC(O)=CC=3)=COC2=C1 RRLHMJHRFMHVNM-BQVXCWBNSA-N 0.000 description 1
- 238000004140 cleaning Methods 0.000 description 1
- 230000003247 decreasing effect Effects 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 230000004907 flux Effects 0.000 description 1
- 230000007274 generation of a signal involved in cell-cell signaling Effects 0.000 description 1
- 229910052736 halogen Inorganic materials 0.000 description 1
- 150000002367 halogens Chemical class 0.000 description 1
- 230000010354 integration Effects 0.000 description 1
- 238000000034 method Methods 0.000 description 1
- 239000010453 quartz Substances 0.000 description 1
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N silicon dioxide Inorganic materials O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 1
- 230000001360 synchronised effect Effects 0.000 description 1
- 238000007740 vapor deposition Methods 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/55—Specular reflectivity
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
- G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
- G01M11/005—Testing of reflective surfaces, e.g. mirrors
Landscapes
- Physics & Mathematics (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- General Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Investigating Or Analysing Materials By Optical Means (AREA)
- Testing Of Optical Devices Or Fibers (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP58212465A JPS60105935A (ja) | 1983-11-14 | 1983-11-14 | 反射率測定装置 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP58212465A JPS60105935A (ja) | 1983-11-14 | 1983-11-14 | 反射率測定装置 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS60105935A JPS60105935A (ja) | 1985-06-11 |
| JPH0444940B2 true JPH0444940B2 (fr) | 1992-07-23 |
Family
ID=16623088
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP58212465A Granted JPS60105935A (ja) | 1983-11-14 | 1983-11-14 | 反射率測定装置 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS60105935A (fr) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN109070373A (zh) * | 2016-04-18 | 2018-12-21 | 株式会社瑞光 | 坯料卷的表皮的切断方法以及装置 |
Families Citing this family (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN1308670C (zh) * | 2000-11-10 | 2007-04-04 | 爱科来株式会社 | 使用图像传感器的测定方法及装置 |
| DE10225820B4 (de) * | 2002-06-11 | 2004-08-12 | Bundesrepublik Deutschland, vertreten durch das Bundesministerium der Verteidigung, dieses vertreten durch den Präsidenten des Bundesamtes für Wehrtechnik und Beschaffung | Anordnung zur optischen Prüfung von Winkelspiegeln |
-
1983
- 1983-11-14 JP JP58212465A patent/JPS60105935A/ja active Granted
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN109070373A (zh) * | 2016-04-18 | 2018-12-21 | 株式会社瑞光 | 坯料卷的表皮的切断方法以及装置 |
Also Published As
| Publication number | Publication date |
|---|---|
| JPS60105935A (ja) | 1985-06-11 |
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