JPH04355311A - Device for detecting lift of lead of surface-mount ic - Google Patents

Device for detecting lift of lead of surface-mount ic

Info

Publication number
JPH04355311A
JPH04355311A JP13097391A JP13097391A JPH04355311A JP H04355311 A JPH04355311 A JP H04355311A JP 13097391 A JP13097391 A JP 13097391A JP 13097391 A JP13097391 A JP 13097391A JP H04355311 A JPH04355311 A JP H04355311A
Authority
JP
Japan
Prior art keywords
lead
solder
image
soldering
inspected
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP13097391A
Other languages
Japanese (ja)
Inventor
Yuji Takagi
裕治 高木
Toshifumi Honda
敏文 本田
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Ltd
Original Assignee
Hitachi Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Ltd filed Critical Hitachi Ltd
Priority to JP13097391A priority Critical patent/JPH04355311A/en
Publication of JPH04355311A publication Critical patent/JPH04355311A/en
Pending legal-status Critical Current

Links

Landscapes

  • Length Measuring Devices By Optical Means (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Electric Connection Of Electric Components To Printed Circuits (AREA)

Abstract

PURPOSE:To enable a lift of lead after soldering to be detected highly reliably by using a lighting device which causes positive reflection to be produced when a soldering surface is flat for an image pick-up device and an lighting device which causes positive reflection to be produced when a soldering surface is at a certain inclination angle and then by picking up a soldering portion at a tip of a lead of a surface-mount IC. CONSTITUTION:A CPU 8 selects or switches an upper-stage lighting 12 and a lower- stage lighting 13 through an external equipment control unit 9 for using lightings with different angles, allows an image or reflection lights 17 and 18 which are reflected from a surface of a solder fillet 15 to be picked up by a TV camera 1 and to be input to and recorded at a memory 10 through an image input/output unit 7. An image according to lighting is read out of the memory 10 and the fillet 15 is segment into an inclined surface portion and a flat portion. Then, the CPU 8 performs a second-order approximation of a boundary between the inclined surface portion and the flat portion by an expression. It examines whether the second-order coefficient of the obtained second-order curve is equal to or less than a certain value or not and then determines that the product is a confirming article without any failure such as non-connection and lift of lead in the case of YES in the above.

Description

【発明の詳細な説明】[Detailed description of the invention]

【0001】0001

【産業上の利用分野】本発明は電子部品実装基板検査装
置に関わり、特に基板に実装された多ピンの表面実装部
品のリード浮き状態の自動検査に関する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to an electronic component mounting board inspection apparatus, and more particularly to an automatic inspection of lead floating states of multi-pin surface mount components mounted on a board.

【0002】0002

【従来の技術】従来のはんだ付け外観検査装置では、は
んだの有無・過不足の検査は行っているが、多ピンの表
面実装部品のリード浮きによるはんだ付けパターン変化
の検出までは行っていない。
2. Description of the Related Art Conventional soldering visual inspection apparatuses inspect the presence or absence of solder, excess or deficiency of solder, but do not detect changes in soldering patterns due to floating leads of multi-pin surface mount components.

【0003】0003

【発明が解決しようとする課題】上記従来技術において
は、はんだ付後のリード浮き検出については考慮されて
いなかった。
[Problems to be Solved by the Invention] In the above-mentioned prior art, detection of floating leads after soldering was not considered.

【0004】本発明の目的は、従来技術の課題を解決す
べく、はんだ付後のリード浮き検出を高信頼度で行なう
ことができるようした表面実装ICのリード浮き検出装
置を提供することにある。
SUMMARY OF THE INVENTION An object of the present invention is to provide a surface mount IC lead floating detection device that can detect lead floating after soldering with high reliability in order to solve the problems of the prior art. .

【0005】[0005]

【課題を解決するための手段】上記目的は、撮像装置に
対しはんだ面が平坦な時に正反射を起こすような照射角
度を持つ照明装置と、撮像装置に対しはんだ面がある一
定の傾斜角がある時に正反射を起こすような照明装置を
用いて、表面実装ICのリード先端のはんだ付部を撮像
し、はんだ付部における平坦部及び傾斜部領域の分布状
態、分布面積等を検出することで達成される。即ち、本
発明は、プリント基板の位置決め装置と、前記プリント
基板を撮像する装置と、撮像装置により撮像された画像
を制御装置に入力する回路と、前記位置決め装置の制御
と入力画像の処理を行う制御装置と、基板面の検査面側
に照射角度の違う照明装置を有するシステムであって、
撮像された画像における被検査対象である表面実装IC
のリード浮き状態を、前記画像内におけるリード先端の
はんだ面の一定の傾斜面の2次元分布状態により検出す
ることを特徴とする表面実装ICのリード浮き検出装置
である。
[Means for Solving the Problems] The above object is to provide an illumination device that has an illumination angle that causes specular reflection when the solder surface is flat with respect to the imaging device, and a lighting device that has an illumination angle that causes specular reflection when the solder surface is flat with respect to the imaging device. By using a lighting device that causes specular reflection at certain times to image the soldered area at the tip of the lead of a surface-mounted IC, and detect the distribution state and distribution area of the flat and sloped areas in the soldered area. achieved. That is, the present invention includes a positioning device for a printed circuit board, a device for capturing an image of the printed circuit board, a circuit for inputting an image captured by the image capturing device to a control device, and a circuit for controlling the positioning device and processing the input image. A system comprising a control device and an illumination device with different irradiation angles on the inspection surface side of the board surface,
Surface mount IC that is the object to be inspected in the captured image
This is a lead floating detection device for a surface mount IC, which detects a lead floating state based on a two-dimensional distribution state of a constant slope of a solder surface of a lead tip in the image.

【0006】[0006]

【作用】多ピンの表面実装部品のリード浮きは、部品実
装時の該当リードにおけるはんだ未接続の問題、電気的
接続がある場合でも接続強度的な問題などがある。多ピ
ンの表面実装部品のリード浮きは、形状的にはリード列
の不揃いとして計測されるが、はんだ付け実装後におい
ては、はんだ付けによる接続状態の観点から検査が必要
となってくる。
[Operation] Lifting of the leads of multi-pin surface mount components causes problems such as unsoldered connections on the corresponding leads during component mounting, and problems with connection strength even when electrical connections are made. Lifted leads of multi-pin surface mount components are measured as irregularities in the lead rows, but after soldering and mounting, inspection is required from the viewpoint of the soldered connection state.

【0007】前記の多ピンの表面実装部品のリード不揃
いは表面実装部品の搭載機などで、搭載前にそえれを計
測する機能を持つものもあるが、前述のようにはんだ付
け後における接続状態についての確実な保証とはならず
、リード浮きによるはんだ付不良の可能性が残されてお
り、はんだ付後のリード浮き検出は、高信頼なはんだ付
検査を実現するための課題となっていた。
[0007] The above-mentioned lead misalignment of multi-pin surface mount components is caused by surface mount component mounting machines that have a function to measure the misalignment before mounting, but as mentioned above, the connection state after soldering However, there remains a possibility of soldering defects due to floating leads, and detection of floating leads after soldering has been an issue in achieving highly reliable soldering inspection. .

【0008】そこで、本発明においては、撮像装置に対
しはんだ面が平坦な時に正反射を起こすような照射角度
を持つ照明装置と、撮像装置に対しはんだ面がある一定
の傾斜角がある時に正反射を起こすような照明装置は、
表面実装ICのリード先端のはんだ付部の平坦部及び傾
斜部を顕在化する。このはんだ付部の平坦部及び傾斜部
の分布状態は、リード部が基板上のはんだ付パッド部と
接している場合と、リードがはんだ付パッド部から離れ
た場合では以下のように異なる。リード部が基板上のは
んだ付パッド部と接している場合は図3のように、はん
だの傾斜部はリード先端付近及びはんだ付けパッドの側
面に分布する。リードがはんだ付パッド部からはんだの
接続を保ちながら浮いた場合は図4のように、はんだは
リードとパッドの間に吸い込まれ、リードの周辺に傾斜
部が分布する。リードがはんだ付パッド部から完全に離
れはんだの接続も切れ、はんだはパッド全体に広がった
場合は図6のように、はんだの傾斜部はパッドの縁に分
布する。リードがはんだ付パッド部から完全に離れはん
だの接続も切れた場合でも、図5に示すようにはんだが
パッド全体に広がらない場合は、はんだの傾斜部とリー
ドの間に平坦部が検出される。このようにして、リード
浮き状態でははんだ付部の平坦部及び傾斜部の分布状態
は異なるので、この分布状態の変化を顕在化する方法と
して傾斜部分布領域の2次曲線近似、及び傾斜領域とリ
ードの間の平坦部領域面積計測を行うことによりリード
の浮きを検出することが可能となる。
Therefore, in the present invention, an illumination device has an illumination angle that causes regular reflection when the solder surface is flat with respect to the imaging device, and a lighting device that has an illumination angle that causes specular reflection when the solder surface is flat with respect to the imaging device. Lighting devices that cause reflections are
The flat and sloped parts of the soldered parts at the tips of the leads of a surface-mounted IC are revealed. The distribution of flat parts and sloped parts of the soldering part differs as follows when the lead part is in contact with the soldering pad part on the board and when the lead is separated from the soldering pad part. When the lead portion is in contact with the soldering pad portion on the substrate, as shown in FIG. 3, the sloped portion of the solder is distributed near the tip of the lead and on the side surface of the soldering pad. When the lead floats from the soldering pad portion while maintaining the solder connection, the solder is sucked between the lead and the pad, and an inclined portion is distributed around the lead, as shown in FIG. When the lead is completely separated from the soldering pad and the solder connection is broken, and the solder spreads over the entire pad, the sloped portion of the solder is distributed around the edge of the pad, as shown in FIG. Even if the lead is completely separated from the soldering pad and the solder connection is broken, if the solder does not spread over the entire pad as shown in Figure 5, a flat part will be detected between the sloped part of the solder and the lead. . In this way, in the lead floating state, the distribution state of the flat part and the slope part of the soldering part is different, so the method of making this change in the distribution state obvious is to use quadratic curve approximation of the slope distribution area and the slope area and the slope area. Lifting of the leads can be detected by measuring the area of the flat area between the leads.

【0009】[0009]

【実施例】以下、実施例を示す図面に沿って本発明を詳
述する。図1は本発明を具体化したリード浮き外観検査
装置の構成を示す。4は検査対象となるプリント基板で
ありその上に検査対象であるフラットパッケージ5が搭
載され、はんだ付けされている。被検査対象であるプリ
ント基板4はXYテーブル3に載せられ検査シーケンス
に従って移動する。2は被検査対象を照明するものであ
り、撮像装置に対しはんだ面が平坦な時に正反射を起こ
すような照射角度を持つ照明装置と、撮像装置に対しは
んだ面がある一定の傾斜角がある時に正反射を起こすよ
うな照明装置より構成され、図1に示すように基板上方
に設置されている。1はTVカメラであり、照明2によ
り照明されたプリント基板の被検査対象部分を撮像し、
画像信号を7の画像入力ユニットに入力する。3のXY
テーブル制御及び2の照明装置の点灯制御は9の外部機
器制御ユニットにより処理される。6は本システムの制
御装置、8はCPU、10はメモリ、11はバスである
DESCRIPTION OF THE PREFERRED EMBODIMENTS The present invention will be described in detail below with reference to the drawings showing examples. FIG. 1 shows the configuration of a lead floating appearance inspection device embodying the present invention. 4 is a printed circuit board to be inspected, on which a flat package 5 to be inspected is mounted and soldered. A printed circuit board 4 to be inspected is placed on an XY table 3 and moved according to an inspection sequence. 2 is for illuminating the object to be inspected; the illumination device has an illumination angle that causes specular reflection when the solder surface is flat with respect to the imaging device, and the illumination device has a certain inclination angle where the solder surface is relative to the imaging device. It consists of a lighting device that sometimes causes specular reflection, and is installed above the substrate as shown in FIG. 1 is a TV camera, which images the part to be inspected of the printed circuit board illuminated by the illumination 2;
The image signal is input to the image input unit 7. 3 XY
Table control and lighting control of the lighting device 2 are processed by an external device control unit 9. 6 is a control device of this system, 8 is a CPU, 10 is a memory, and 11 is a bus.

【0010】図2はリード及びはんだ付部分の断面図で
ある。14はリード、18ははんだ付パッド、15はは
んだフィレットである。12は撮像装置に対しはんだ面
が平坦な時に正反射を起こすような照射角度を持つ照明
装置、13は撮像装置に対しはんだ面がある一定の傾斜
角がある時に正反射を起こすような照明装置である。照
明12による照明光17ははんだ面の平坦部で反射し上
部のTVカメラにより強い反射を持つ明るい部分として
撮像される。照明13による照明光16ははんだ面の傾
斜部で反射し上部のTVカメラにより強い反射を持つ明
るい部分として撮像される。撮像された画像内のはんだ
付け部分15において、照明12によって明るくなる部
分及び、照明13によって明るくなる部分をリード浮き
の無い正常なはんだ付状態で識別し、分類した結果を図
3の(c)に示す。図3の(a)はリード浮きの無い正
常なはんだ付形状の鳥籐図、(b)はリード浮きの無い
正常なはんだ付形状の断面図である。リード部が基板上
のはんだ付パッド部と接している場合ははんだ形状は図
3(a)のようになり、はんだの傾斜部はリード先端付
近及びはんだ付けパッドの側面に分布する。図3(c)
に示す19は斜面部、20は平坦部である。リード浮き
の無い正常なはんだ付状態の場合傾斜部19のパッド先
端側(図3(d)に示したY座標のY負方向側)の輪郭
線(以降これを単に傾斜部の輪郭線と呼ぶ。)を抽出し
た結果を図3(d)の21に示す。正常状態の場合輪郭
線21はリード側に凸となり、これを2次近似して図3
(d)に示すX,Y座標系で2次式として表せば、Y=
 A×X×X + B×X + C   …  (式1
)となり、正常状態ではTHをAにたいするしきい値と
すれば、A≦THの時リード浮きは無いと言える。
FIG. 2 is a sectional view of the leads and soldered parts. 14 is a lead, 18 is a soldering pad, and 15 is a solder fillet. Reference numeral 12 denotes an illumination device that has an illumination angle that causes specular reflection when the solder surface is flat with respect to the imaging device, and 13 refers to an illumination device that causes specular reflection when the solder surface has a certain inclination angle with respect to the imaging device. It is. Illumination light 17 from the illumination 12 is reflected by the flat part of the solder surface, and is imaged by the TV camera above as a bright part with strong reflection. Illumination light 16 from the illumination 13 is reflected by the slope of the solder surface, and is imaged by the upper TV camera as a bright portion with strong reflection. In the soldered part 15 in the captured image, the parts brightened by the illumination 12 and the parts brightened by the illumination 13 are identified and classified as normal soldering states without floating leads, and the results are shown in FIG. 3(c). Shown below. FIG. 3(a) is a rattan diagram of a normal soldering shape without floating leads, and FIG. 3(b) is a sectional view of a normal soldering shape without floating leads. When the lead portion is in contact with the soldering pad portion on the substrate, the solder shape is as shown in FIG. 3(a), and the sloped portion of the solder is distributed near the tip of the lead and on the side surface of the soldering pad. Figure 3(c)
19 is a sloped portion, and 20 is a flat portion. In a normal soldering state without floating leads, the contour line of the pad tip side of the sloped part 19 (the negative Y direction side of the Y coordinate shown in FIG. 3(d)) (hereinafter this is simply referred to as the contour line of the sloped part) ) is shown in 21 in FIG. 3(d). In the normal state, the contour line 21 is convex toward the lead side, and this is quadratic approximated as shown in Fig. 3.
If expressed as a quadratic equation in the X, Y coordinate system shown in (d), Y=
A×X×X + B×X + C… (Formula 1
), and if TH is the threshold value for A in a normal state, it can be said that there is no lead floating when A≦TH.

【0011】リードがはんだ付パッド部からはんだの接
続を保ちながら浮いた場合は図4のように、はんだはリ
ードとパッドの間に吸い込まれ、リードの周辺に傾斜部
が分布し、この場合の傾斜部の輪郭線の2次近似式の2
次係数Aは、A>THとなる。
When the lead floats from the soldering pad while maintaining the solder connection, the solder is sucked between the lead and the pad, and slopes are distributed around the lead, as shown in Figure 4. 2 of the quadratic approximation formula for the contour line of the slope
The order coefficient A is A>TH.

【0012】図5及び図6はリードがはんだ付パッド部
から完全に離れはんだの接続が切れた未接の場合である
。この場合はんだはパッドの上にかまぼこ上に広がり、
傾斜部ははんだの周辺に存在し、内側に平坦部を含むよ
うになる。図5ははんだがパッド全体に広がらない場合
であり、はんだの傾斜部23とリードの間に平坦部24
が検出される。これより、傾斜部の輪郭線の近似2次曲
線の2次係数はA>THであり、2次曲線とリードの間
に平坦部がある一定面積以上あればリード浮き(はんだ
未接合)と判断できる。リードがはんだ付パッド部から
完全に離れはんだの接続も切れ、はんだはパッド全体に
広がった場合は図6のように、はんだの傾斜部はパッド
の縁に分布する。現象的には図5で示したケースである
が、この場合は傾斜部輪郭線25がパッド先端あるいは
その付近に位置することでリード浮き(はんだ未接合)
と判断できる。
FIGS. 5 and 6 show the case where the leads are completely separated from the soldering pads and the solder connection is broken, so that they are not connected. In this case, the solder spreads over the pad in a semicircular manner,
The sloped portion exists around the solder and includes a flat portion inside. FIG. 5 shows the case where the solder does not spread over the entire pad, and the flat part 24 is between the sloped part 23 of the solder and the lead.
is detected. From this, the quadratic coefficient of the quadratic curve approximating the contour of the slope is A>TH, and if there is a certain area or more of a flat part between the quadratic curve and the lead, it is determined that the lead is floating (unsoldered). can. When the lead is completely separated from the soldering pad and the solder connection is broken, and the solder spreads over the entire pad, the sloped portion of the solder is distributed around the edge of the pad, as shown in FIG. The phenomenon is the case shown in Fig. 5, but in this case, the sloped part contour line 25 is located at or near the tip of the pad, causing the lead to float (not soldered).
It can be determined that

【0013】次に本実施例の装置の動作を、図8に示す
フローチャートに基いて説明する。即ち、CPU8は、
外部機器制御ユニット9を介して、リング状の上段照明
12とリング状の下段照明13を選択、又は切り替える
ことによって角度の違う照明を用い、各照明によっては
んだフィレット15の表面から反射される反射光17、
18の画像をTVカメラ1で撮像して画像入出力ユニッ
ト7を介してメモリ10に記録させるように入力し、メ
モリ10から各照明による画像を読み出して検査対象は
んだ付け部15を斜面部19と平坦部20にセグメント
分けする。次ぎにCPU8は、斜面部と平坦部の境界を
前記(式1)に基いて、2次近似する。この求められた
2次曲線の2次係数Aはある一定値TH以下であるか否
かを調べ、YESの場合、未接やリード浮きといった不
良の無い図3に示されるような良品と判定する。この条
件を満たさない場合、リード浮き不良が発生したとみな
す。次にこの条件を満たさず、2次曲線がパッドの先端
、あるいはその付近に分布した場合は図6に示されるよ
うにはんだがパッド18全体に広がったはんだ未接合の
リード浮き不良と判定する。次に、この条件を満たさず
、さらに、2次曲線とリード間に平坦部24が、ある一
定面積以上、すなわち、メモリ10に記録された画像に
おいてこの平坦部に対応した領域に、あるしきい値を越
えた画素数があれば、図5に示される、はんだがパッド
18全体には広がらないはんだ未接合のリード浮き不良
と判定する。この条件を満たさなかった場合、図4に示
されるはんだは接合している状態であるがリード浮きが
発生している不良とみなす。一般にメモリ10に取り込
まれた1セット、即ち12、13に示された上段、及び
、下段の照明を用いカメラ1により撮像され画像入出力
ユニット7により入力されたそれぞれの画像、には複数
のはんだ付部が撮像されている。この画像に撮像されて
いるそれぞれのはんだ付部に対し、図4から6に示され
るようなリード浮きに対する不良検査を、前記のように
はんだフィレットの形状パターンにより行なう。画像内
のはんだ付検査を全て終了し、まだ他に検査すべきはん
だ付部が存在すれば、検査シーケンスにしたがい、外部
機器ユニットはXYテーブルを移動させ、検査を続行す
る。
Next, the operation of the apparatus of this embodiment will be explained based on the flowchart shown in FIG. That is, the CPU 8 is
By selecting or switching between the ring-shaped upper stage illumination 12 and the ring-shaped lower stage illumination 13 through the external device control unit 9, the reflected light reflected from the surface of the solder fillet 15 by each illumination is used. 17,
18 images are captured by the TV camera 1 and input to be recorded in the memory 10 via the image input/output unit 7, and the images under each illumination are read out from the memory 10 and the soldered part 15 to be inspected is identified as the slope part 19. Segment into flat parts 20. Next, the CPU 8 performs a quadratic approximation of the boundary between the slope portion and the flat portion based on the above (Formula 1). It is checked whether the quadratic coefficient A of the obtained quadratic curve is less than a certain value TH, and if YES, the product is determined to be a good product as shown in Fig. 3 without any defects such as unconnected or floating leads. . If this condition is not met, it is assumed that a lead floating defect has occurred. Next, if this condition is not met and the quadratic curve is distributed at or near the tip of the pad, it is determined that the solder has spread over the entire pad 18 and is a lead floating defect where the solder is not bonded, as shown in FIG. Next, if this condition is not satisfied, and furthermore, the flat part 24 between the quadratic curve and the lead has a certain threshold area or more, that is, an area corresponding to this flat part in the image recorded in the memory 10. If the number of pixels exceeds this value, it is determined that the solder does not spread over the entire pad 18, resulting in a floating lead defect as shown in FIG. If this condition is not met, the solder shown in FIG. 4 is considered to be defective in that it is in a bonded state but has floating leads. Generally, one set captured in the memory 10, that is, each image captured by the camera 1 using the upper and lower illuminations shown at 12 and 13 and inputted by the image input/output unit 7, includes a plurality of solder pieces. The attached part is imaged. For each soldered portion captured in this image, a defective inspection for lead floating as shown in FIGS. 4 to 6 is performed using the shape pattern of the solder fillet as described above. If all the soldering inspections in the image are completed and there are still other soldering parts to be inspected, the external equipment unit moves the XY table and continues the inspection according to the inspection sequence.

【0014】以上によりはんだフィレットの形状パター
ンによりリードの浮き状態が検出できる。本実施例では
2段の照明を用いて説明したが、図7の26に示す様に
多段の照明を用いてはんだ面の傾斜度を検出し、平坦部
と傾斜部のセグメント分けをしても構わない。この他に
はんだの有無、過不足等の検査項目もあるが、それらの
はんだ検査のための光学系は図1の光学系に示された照
明2のみに限定されることは無く、検出原理に応じた光
学系を図1に示したカメラ1、照明2よりなる検出系に
付加して構わない。
As described above, the floating state of the lead can be detected based on the shape pattern of the solder fillet. Although this embodiment has been explained using two stages of illumination, it is also possible to use multi-stage illumination to detect the degree of inclination of the solder surface and segment it into flat parts and sloped parts, as shown in 26 in Fig. 7. I do not care. In addition, there are inspection items such as the presence or absence of solder, excess or deficiency, etc., but the optical system for these solder inspections is not limited to the illumination 2 shown in the optical system in Figure 1, and is based on the detection principle. A corresponding optical system may be added to the detection system consisting of the camera 1 and illumination 2 shown in FIG.

【0015】[0015]

【発明の効果】本発明によれば、表面実装部品のリード
浮きがはんだ接合状態に基づいて検出されるので、未接
合のような電気的接合不良の他、はんだ接合があっても
リードが浮いて強度的に問題があるような不良も検出可
能となり、これと他のはんだ不良検出組み合わせること
により、信頼性の高いはんだ付検査が実現できる。これ
により実装部品はんだ付け検査の自動化ができ、はんだ
付けプロセスの省人化、および信頼性の向上という効果
がある。
[Effects of the Invention] According to the present invention, floating leads of surface mount components are detected based on the solder joint state, so in addition to defective electrical connections such as non-bonding, lead floating even when solder joints are present. This makes it possible to detect defects that pose problems in terms of strength, and by combining this with other solder defect detection methods, highly reliable soldering inspection can be achieved. This makes it possible to automate the soldering inspection of mounted components, resulting in labor savings and improved reliability in the soldering process.

【図面の簡単な説明】[Brief explanation of drawings]

【図1】本発明の一実施例を示す装置の概略図である。FIG. 1 is a schematic diagram of an apparatus showing an embodiment of the present invention.

【図2】検査対象部の断面図である。FIG. 2 is a sectional view of a portion to be inspected.

【図3】正常状態のはんだ付けパターンを示す図である
FIG. 3 is a diagram showing a soldering pattern in a normal state.

【図4】はんだは接合しているがリードは浮いている状
態のはんだ付けパターンを示す図である。
FIG. 4 is a diagram showing a soldering pattern in which the solder is connected but the leads are floating.

【図5】リード浮きではんだが未接合状態のはんだ付け
パターンを示す図である。
FIG. 5 is a diagram showing a soldering pattern in which the leads are floating and the solder is not bonded.

【図6】リード浮きではんだが未接合状態のはんだ付け
パターンを示す図である。
FIG. 6 is a diagram showing a soldering pattern in which the leads are floating and the solder is not bonded.

【図7】光学系の代案を示す図である。FIG. 7 is a diagram showing an alternative optical system.

【図8】装置全体としての動作のフローチャートである
FIG. 8 is a flowchart of the operation of the apparatus as a whole.

【符号の説明】[Explanation of symbols]

1…TVカメラ、            2…照明、
              3…XYテーブル 4…プリント基板、          5…フラット
パッケージ、6…制御装置 7…画像入出力ユニット、    8…CPU9…外部
機器制御ユニット、  10…メモリ、       
     11…バス 12…上段照明、              13…
下段照明、          14…リード 15…はんだフィレット、      16…下段照明
による照射光線 17…上段照明による照射光線、18…はんだ付パッド
19…はんだ面上の傾斜部、    20はんだ面上の
平坦部21、22、23、25…はんだ面上の傾斜部の
境界24…はんだ傾斜面輪郭線とリード間のはんだ平坦
部、    26…多段環状照明
1...TV camera, 2...lighting,
3...XY table 4...Printed circuit board, 5...Flat package, 6...Control device 7...Image input/output unit, 8...CPU9...External device control unit, 10...Memory,
11...Bath 12...Upper lighting, 13...
Lower stage illumination, 14...Lead 15...Solder fillet, 16...Irradiation light beam by lower stage illumination 17...Irradiation light beam by upper stage illumination, 18...Soldering pad 19...Slanted part on solder surface, 20 Flat part 21, 22 on solder surface , 23, 25...Boundary of the slope on the solder surface 24...Solder flat part between the solder slope contour line and the lead, 26...Multi-stage annular illumination

Claims (5)

【特許請求の範囲】[Claims] 【請求項1】プリント基板の位置決め装置と、前記プリ
ント基板を撮像する装置と、撮像装置により撮像された
画像を制御装置に入力する回路と、前記位置決め装置の
制御と入力画像の処理を行う制御装置と、基板面の検査
面側に照射角度の違う照明装置を有するシステムであっ
て、撮像された画像における被検査対象である表面実装
ICのリード浮き状態を、前記画像内におけるリード先
端のはんだ面の一定の傾斜面の2次元分布状態により検
出することを特徴とする表面実装ICのリード浮き検出
装置。
1. A device for positioning a printed circuit board, a device for capturing an image of the printed circuit board, a circuit for inputting an image captured by the image capturing device to a control device, and a control for controlling the positioning device and processing the input image. The system has a device and an illumination device with different irradiation angles on the inspection side of the board surface, and the lead floating state of the surface mount IC to be inspected in the captured image is detected by the solder at the lead tip in the image. A lead floating detection device for a surface mount IC, characterized in that detection is performed based on a two-dimensional distribution state of a constant inclined surface.
【請求項2】撮像された画像における被検査対象である
表面実装ICのリード浮き状態を検出する手段が、2次
元に分布する前記画像内におけるリード先端のはんだ面
の一定の傾斜面領域の湾曲度合いであることを特徴とす
る請求項1記載の表面実装ICのリード浮き検出装置。
2. A means for detecting a lead floating state of a surface-mounted IC to be inspected in a captured image, the means detecting a floating state of a lead of a surface-mounted IC to be inspected includes curvature of a predetermined slope area of a solder surface of a lead tip in the image distributed two-dimensionally. 2. The lead floating detection device for a surface mount IC according to claim 1, wherein the lead floating detection device is of a certain degree.
【請求項3】撮像された画像における被検査対象である
表面実装ICのリード浮き状態を検出する手段が、2次
元に分布する前記画像内におけるリード先端のはんだ面
の一定の傾斜面領域を2次曲線近似し、その2次係数を
用いることを特徴とする請求項1記載の表面実装ICの
リード浮き検出装置。
3. Means for detecting a lead floating state of a surface mount IC to be inspected in a captured image is configured to detect a predetermined slope area of a solder surface of a lead tip in a two-dimensionally distributed image. 2. The lead floating detection device for a surface-mounted IC according to claim 1, wherein the device approximates the following curve and uses its quadratic coefficient.
【請求項4】撮像された画像における被検査対象である
表面実装ICのリード浮き状態を検出する手段が、2次
元に分布する前記画像内におけるリード先端のはんだ面
の一定の傾斜面領域がはんだ付けパッドの先端部にある
ことを検出することを特徴とする請求項1記載の表面実
装ICのリード浮き検出装置。
4. A means for detecting a lead floating state of a surface-mounted IC to be inspected in a captured image, wherein a certain inclined surface area of a solder surface of a lead tip in the two-dimensionally distributed image is configured to 2. The lead floating detection device for a surface mount IC according to claim 1, wherein the lead floating detection device for a surface mount IC detects that the lead is located at the tip of a mounting pad.
【請求項5】はんだの一定の傾斜面領域を近似した2次
曲線とリードとの間にあるはんだの平坦部面積を検出す
ることを特徴とする請求項3記載の表面実装ICのリー
ド浮き検出装置。
5. Lead floating detection for a surface mount IC according to claim 3, characterized in that the area of a flat part of the solder between the lead and a quadratic curve approximating a certain slope area of the solder is detected. Device.
JP13097391A 1991-06-03 1991-06-03 Device for detecting lift of lead of surface-mount ic Pending JPH04355311A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP13097391A JPH04355311A (en) 1991-06-03 1991-06-03 Device for detecting lift of lead of surface-mount ic

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP13097391A JPH04355311A (en) 1991-06-03 1991-06-03 Device for detecting lift of lead of surface-mount ic

Publications (1)

Publication Number Publication Date
JPH04355311A true JPH04355311A (en) 1992-12-09

Family

ID=15046934

Family Applications (1)

Application Number Title Priority Date Filing Date
JP13097391A Pending JPH04355311A (en) 1991-06-03 1991-06-03 Device for detecting lift of lead of surface-mount ic

Country Status (1)

Country Link
JP (1) JPH04355311A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6362877B1 (en) 1993-04-21 2002-03-26 Omron Corporation Visual inspection supporting apparatus and printed circuit board inspecting apparatus, and methods of soldering inspection and correction using the apparatuses

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6362877B1 (en) 1993-04-21 2002-03-26 Omron Corporation Visual inspection supporting apparatus and printed circuit board inspecting apparatus, and methods of soldering inspection and correction using the apparatuses

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