JPH0434800B2 - - Google Patents

Info

Publication number
JPH0434800B2
JPH0434800B2 JP58150430A JP15043083A JPH0434800B2 JP H0434800 B2 JPH0434800 B2 JP H0434800B2 JP 58150430 A JP58150430 A JP 58150430A JP 15043083 A JP15043083 A JP 15043083A JP H0434800 B2 JPH0434800 B2 JP H0434800B2
Authority
JP
Japan
Prior art keywords
microprocessor
line
analog data
voltage source
measurement
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP58150430A
Other languages
English (en)
Japanese (ja)
Other versions
JPS5965399A (ja
Inventor
Nootsudo Rendaakingu Buruusu
Donarudo Koochi Robaato
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Westinghouse Electric Corp
Original Assignee
Westinghouse Electric Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Westinghouse Electric Corp filed Critical Westinghouse Electric Corp
Publication of JPS5965399A publication Critical patent/JPS5965399A/ja
Publication of JPH0434800B2 publication Critical patent/JPH0434800B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01K—MEASURING TEMPERATURE; MEASURING QUANTITY OF HEAT; THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR
    • G01K15/00—Testing or calibrating of thermometers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01K—MEASURING TEMPERATURE; MEASURING QUANTITY OF HEAT; THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR
    • G01K1/00—Details of thermometers not specially adapted for particular types of thermometer
    • G01K1/02—Means for indicating or recording specially adapted for thermometers
    • G01K1/026—Means for indicating or recording specially adapted for thermometers arrangements for monitoring a plurality of temperatures, e.g. by multiplexing

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Measuring Temperature Or Quantity Of Heat (AREA)
  • Arrangements For Transmission Of Measured Signals (AREA)
JP58150430A 1982-08-19 1983-08-19 多重化したアナログ・データ収集装置 Granted JPS5965399A (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US06/409,688 US4532601A (en) 1982-08-19 1982-08-19 Automatic temperature calibration method and apparatus
US409688 1982-08-19

Publications (2)

Publication Number Publication Date
JPS5965399A JPS5965399A (ja) 1984-04-13
JPH0434800B2 true JPH0434800B2 (OSRAM) 1992-06-09

Family

ID=23621573

Family Applications (1)

Application Number Title Priority Date Filing Date
JP58150430A Granted JPS5965399A (ja) 1982-08-19 1983-08-19 多重化したアナログ・データ収集装置

Country Status (2)

Country Link
US (1) US4532601A (OSRAM)
JP (1) JPS5965399A (OSRAM)

Families Citing this family (32)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB8317224D0 (en) * 1983-06-24 1983-07-27 Atomic Energy Authority Uk Monitoring system
DE3468943D1 (en) * 1983-07-20 1988-02-25 Tokyo Tatsuno Kk Device for measuring liquid flow volume with temperature compensating
US4642636A (en) * 1983-11-16 1987-02-10 Westinghouse Electric Corp. Method and apparatus for auto-calibration of signal conditioning electronics
US4591855A (en) * 1983-12-27 1986-05-27 Gte Communication Products Corporation Apparatus for controlling a plurality of current sources
US4755958A (en) * 1985-07-17 1988-07-05 Mitsubishi Denki Kabushiki Kaisha Temperature measuring apparatus
DE3531118A1 (de) * 1985-08-30 1987-03-12 Micro Epsilon Messtechnik Verfahren zur fehlerkompensation fuer messwertaufnehmer mit nicht linearen kennlinien, sowie anordnung zur durchfuehrung des verfahrens
US4931938A (en) * 1986-03-07 1990-06-05 David Hass Microcomputer controlled faucet
JPH0638062B2 (ja) * 1987-04-08 1994-05-18 テルモ株式会社 予測型温度測定機器の自動検査装置
US5038304A (en) * 1988-06-24 1991-08-06 Honeywell Inc. Calibration of thermal conductivity and specific heat devices
US5095453A (en) * 1990-11-13 1992-03-10 Johnson Service Company Sensor monitoring arrangement with error correction
FR2671178A1 (fr) * 1990-12-28 1992-07-03 Framatome Sa Methode de test de chaines de temperature et testeur utilisant cette methode.
DE69232673T2 (de) * 1991-04-23 2003-03-13 Kabushiki Kaisha Toshiba, Kawasaki Tiefsttemperaturmessausrüstung
AU687468B2 (en) * 1994-01-05 1998-02-26 Becton Dickinson & Company Continuously calibrating temperature controller
US5822225A (en) * 1994-09-21 1998-10-13 Ericsson Raynet Corporation Self-calibrating data processors and methods for calibrating same
US5669713A (en) * 1994-09-27 1997-09-23 Rosemount Inc. Calibration of process control temperature transmitter
US6179785B1 (en) 1996-10-17 2001-01-30 Sherwood Services, Ag Ambient sensing feature for thermometer recalibration system
US6334093B1 (en) * 1997-12-24 2001-12-25 Edward S. More Method and apparatus for economical drift compensation in high resolution difference measurements and exemplary low cost, high resolution differential digital thermometer
WO1999060579A2 (en) * 1998-05-20 1999-11-25 The Foxboro Company Three-wire rtd interface
DE19936329B4 (de) 1999-08-02 2008-03-27 Infineon Technologies Ag Verfahren zum A/D-Wandeln analoger Signale und entsprechende A/D-Wandleranordnung
US6612737B1 (en) 1999-12-29 2003-09-02 Affymetrix, Inc. System and method for self-calibrating measurement
US6688119B2 (en) 2000-12-22 2004-02-10 General Electric Company Methods and apparatus for increasing appliance measuring system accuracy
GB0515715D0 (en) * 2005-07-30 2005-09-07 Rolls Royce Plc Sensor measurement error
DE102011107856A1 (de) * 2011-07-18 2013-01-24 Abb Technology Ag Temperatursensor mit Mitteln zur in-situ Kalibrierung
CN102928123A (zh) * 2012-11-01 2013-02-13 苏州新亚科技有限公司 能自动识别纠错的双温区单探头及其自动纠错方法
KR101604916B1 (ko) * 2014-08-06 2016-03-25 엘에스산전 주식회사 입력 채널별 절연 구조 및, 상기 구조를 포함하는 온도 제어 장치 및, 온도 제어 방법
CN104198091B (zh) * 2014-09-19 2018-01-26 国家电网公司 一种智能型铂电阻温度测量校验仪及其校验方法
US9823154B2 (en) * 2014-11-12 2017-11-21 Kidde Technologies, Inc. Bleed air duct leak system real-time fault detection
KR101704222B1 (ko) * 2015-06-24 2017-02-08 엘에스산전 주식회사 열전대를 이용한 온도 측정 장치의 온도 드리프트 보정 방법
DE102015120072A1 (de) * 2015-11-19 2017-05-24 Endress + Hauser Wetzer Gmbh + Co. Kg Verfahren zur in-situ Kalibrierung einer analogen Messübertragungsstrecke und entsprechende Vorrichtung
CN106802196B (zh) * 2017-01-16 2023-07-18 中国计量大学 用于自动检定的电子体温计蜂鸣器声音检测装置及方法
CN115712013B (zh) * 2022-10-26 2025-07-29 中国航空工业集团公司西安航空计算技术研究所 可配置多通道模拟量采集系统及校准方法
CN118111662B (zh) * 2024-04-25 2024-07-19 中国空气动力研究与发展中心设备设计与测试技术研究所 一种风洞温度场测试一致性校准数据处理方法

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4150433A (en) * 1977-10-17 1979-04-17 Digital Equipment Corporation Automatic common mode rejection in an analog measuring system
US4254469A (en) * 1979-03-01 1981-03-03 Ncr Corporation Method and apparatus for offset error correction
US4303984A (en) * 1979-12-14 1981-12-01 Honeywell Inc. Sensor output correction circuit
JPS5711634A (en) * 1980-06-26 1982-01-21 Tokyo Shibaura Electric Co Apparatus for measuring live body information
US4437164A (en) * 1981-03-05 1984-03-13 Bristol Babcock Inc. Ridge circuit compensation for environmental effects
US4446715A (en) * 1982-06-07 1984-05-08 Camino Laboratories, Inc. Transducer calibration system

Also Published As

Publication number Publication date
US4532601A (en) 1985-07-30
JPS5965399A (ja) 1984-04-13

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