JPH04329378A - Automatic test system for power source control device - Google Patents
Automatic test system for power source control deviceInfo
- Publication number
- JPH04329378A JPH04329378A JP3126804A JP12680491A JPH04329378A JP H04329378 A JPH04329378 A JP H04329378A JP 3126804 A JP3126804 A JP 3126804A JP 12680491 A JP12680491 A JP 12680491A JP H04329378 A JPH04329378 A JP H04329378A
- Authority
- JP
- Japan
- Prior art keywords
- control device
- power
- power supply
- supply control
- command
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000012360 testing method Methods 0.000 title description 3
- 238000010998 test method Methods 0.000 claims description 10
- 230000005540 biological transmission Effects 0.000 description 3
- 238000010586 diagram Methods 0.000 description 3
- 230000005856 abnormality Effects 0.000 description 2
- 238000001514 detection method Methods 0.000 description 2
- 230000000694 effects Effects 0.000 description 2
- 230000007257 malfunction Effects 0.000 description 2
- 238000012790 confirmation Methods 0.000 description 1
- 230000010365 information processing Effects 0.000 description 1
Classifications
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02B—CLIMATE CHANGE MITIGATION TECHNOLOGIES RELATED TO BUILDINGS, e.g. HOUSING, HOUSE APPLIANCES OR RELATED END-USER APPLICATIONS
- Y02B70/00—Technologies for an efficient end-user side electric power management and consumption
- Y02B70/30—Systems integrating technologies related to power network operation and communication or information technologies for improving the carbon footprint of the management of residential or tertiary loads, i.e. smart grids as climate change mitigation technology in the buildings sector, including also the last stages of power distribution and the control, monitoring or operating management systems at local level
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y04—INFORMATION OR COMMUNICATION TECHNOLOGIES HAVING AN IMPACT ON OTHER TECHNOLOGY AREAS
- Y04S—SYSTEMS INTEGRATING TECHNOLOGIES RELATED TO POWER NETWORK OPERATION, COMMUNICATION OR INFORMATION TECHNOLOGIES FOR IMPROVING THE ELECTRICAL POWER GENERATION, TRANSMISSION, DISTRIBUTION, MANAGEMENT OR USAGE, i.e. SMART GRIDS
- Y04S20/00—Management or operation of end-user stationary applications or the last stages of power distribution; Controlling, monitoring or operating thereof
- Y04S20/20—End-user application control systems
- Y04S20/221—General power management systems
Abstract
Description
【０００１】0001
【産業上の利用分野】本発明は、情報処理装置に使用す
る電源制御装置の自動試験方式に関する。BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to an automatic test method for a power supply control device used in an information processing device.
【０００２】0002
【従来の技術】一般に、電源制御装置は、図３に示すよ
うに、上位制御装置４と複数の電源３に接続され、上位
制御装置４から電源３の投入／切断等のコマンドが電源
制御装置２に出力されると、電源制御装置２は、電源３
に対して前記コマンドに対応する信号を出力し、電源制
御を行なっている。2. Description of the Related Art In general, a power supply control device is connected to a host control device 4 and a plurality of power supplies 3, as shown in FIG. 2, the power supply control device 2 outputs the power to the power supply 3.
It outputs a signal corresponding to the above command to control the power supply.
【０００３】また、電源３からの障害情報等のデータは
電源制御装置２を介して上位制御装置４に伝えられる。Further, data such as failure information from the power supply 3 is transmitted to the host control device 4 via the power supply control device 2 .
【０００４】従来、このシステムにおいて、電源制御装
置の試験方式は、上位制御装置４の代わりとして、簡易
な構成の電源制御装置用自動試験器１を用い、電源制御
装置２との間で電源制御コマンドの送受信を行ない、電
源制御装置２から前記コマンドを受信したら、一定時間
後、前記自動試験１からコマンドを送信するというよう
に常に同一タイミングで行なわれていた。[0004] Conventionally, in this system, the test method for the power supply control device has been to use an automatic tester 1 for power supply control device with a simple configuration in place of the host control device 4, and to perform power control between the power supply control device 2 and the power supply control device 2. Commands are transmitted and received, and once the command is received from the power supply control device 2, the command is transmitted from the automatic test 1 after a certain period of time, and so on, and this is always done at the same timing.
【０００５】[0005]
【発明が解決しようとする課題】しかしながら、この従
来の電源制御装置の試験方式にあっては、試験器と電源
制御装置との間の電源制御コマンドの送受信が、一定の
タイミングでしか行なわれないため、タイミングが変化
した場合の電源投入／切断シーケンスが正常に実行され
るか否かについては確認できないという問題があった。[Problem to be Solved by the Invention] However, in this conventional power supply control device testing method, power control commands are sent and received between the tester and the power supply control device only at fixed timings. Therefore, there is a problem in that it is impossible to confirm whether or not the power-on/power-off sequence is normally executed when the timing changes.
【０００６】本発明は、上記の問題点にかんがみてなさ
れたもので、各種のタイミングにおいても電源の投入／
切断シーケンスが正常に実行されるか否かについて確認
できるようにし、もって、電源制御装置の誤動作や異常
の検出率の向上を図った電源制御装置用自動試験方式の
提供を目的とする。[0006] The present invention has been made in view of the above problems, and it is possible to turn on/off the power at various timings.
An object of the present invention is to provide an automatic test method for a power supply control device, which enables confirmation as to whether a disconnection sequence is normally executed or not, thereby improving the detection rate of malfunctions and abnormalities in the power supply control device.
【０００７】[0007]
【課題を解決するための手段】上記目的を達成するため
、本発明の電源制御装置用自動試験方式は、上位制御装
置から電源制御装置へ電源制御用コマンドを送出するこ
とにより、決められた複数電源投入／切断シーケンスを
実行するとともに、前記上位制御装置へ電源からの各種
情報を報告するシステムに用いられ、電源制御装置へ電
源投入／切断コマンドを繰り返し送出する電源投入／切
断コマンド送出機能と、投入／切断コマンドの送出タイ
ミングを逐時変更する送出タイミング変更機能とを備え
た構成としてある。[Means for Solving the Problems] In order to achieve the above object, the automatic test method for a power supply control device of the present invention transmits a predetermined plurality of power control commands from a host control device to a power supply control device. a power-on/off command sending function that is used in a system that executes a power-on/off sequence and reports various information from the power source to the upper control device, and repeatedly sends a power-on/off command to the power control device; The configuration includes a sending timing change function that changes the sending timing of the input/disconnect command as needed.
【０００８】[0008]
【作用】上記構成からなる電源制御装置用自動試験方式
によれば、電源の投入／切断コマンドの送出が１回ごと
に異なるタイミングで送出され、電源制御装置との電源
制御コマンドの送受信がいろいろなタイミングで実行さ
れる。[Operation] According to the automatic test method for a power supply control device having the above configuration, power on/off commands are sent at different timings each time, and the transmission and reception of power supply control commands to and from the power supply control device are performed at various times. executed in time.
【０００９】[0009]
【実施例】以下、本発明の実施例について図面を参照し
て説明する。図１は、本発明の一実施例が適用されるシ
ステムの構成図である。Embodiments Hereinafter, embodiments of the present invention will be described with reference to the drawings. FIG. 1 is a configuration diagram of a system to which an embodiment of the present invention is applied.
【００１０】このシステムは、上記と同様に、上位制御
装置（図示せず）と複数の電源３に接続され、上位制御
装置から電源３の投入／切断等のコマンドが電源制御装
置２に出力されると、電源制御装置２は、電源３に対し
て前記コマンドに対応する信号を出力し、電源制御を行
なうものである。また、電源３からの障害情報等のデー
タは電源制御装置２を介して上位制御装置に伝えられる
。Similar to the above, this system is connected to a host control device (not shown) and a plurality of power supplies 3, and commands such as turning on/off the power supply 3 are output from the host control device to the power supply control device 2. Then, the power supply control device 2 outputs a signal corresponding to the command to the power supply 3 to control the power supply. Furthermore, data such as failure information from the power source 3 is transmitted to the higher-level control device via the power source control device 2.
【００１１】実施例に係る電源制御装置用自動試験方式
は、電源制御装置用自動試験器１を上位装置の代わりに
電源制御装置に接続して実行される。The automatic test method for a power supply control device according to the embodiment is executed by connecting the automatic tester 1 for a power supply control device to the power supply control device instead of the host device.
【００１２】この電源制御装置用自動試験器１は、電源
制御装置２へ電源の投入／切断コマンドを繰り返し送出
する機能と、この送出タイミングを逐時変更するタイミ
ング変更機能とを備えている。The automatic tester 1 for a power supply control device has a function of repeatedly sending power on/off commands to the power supply control device 2, and a timing change function of changing the timing of this sending from time to time.
【００１３】すなわち、電源制御装置用自動試験器１は
、電源制御装置２へ、電源投入／切断等のコマンドを送
出するため、また、電源の各種情報を収集，判断するた
めのプログラムと、電源制御装置２とのインターフェー
スとを有している。すなわち、電源制御装置との間の電
源制御用コマンドの送受信タイミングをマイクロコンピ
ュータのプログラムにより、あらかじめ決められた規定
値の範囲内で変化させ、各種タイミングにおいても、前
記電源の投入／切断シーケンスが成功するか否かを確認
しうる機能を有している。That is, the automatic tester 1 for a power supply control device has a program for sending commands such as power on/off to the power supply control device 2, and a program for collecting and determining various information about the power supply. It has an interface with the control device 2. In other words, the timing of transmission and reception of power control commands to and from the power supply control device is varied within a predetermined value range by a microcomputer program, and the power supply/disconnection sequence is successfully performed at various timings. It has a function that allows you to confirm whether or not to do so.
【００１４】また、電源制御装置２は、電源制御装置用
自動試験器１から、電源の投入／切断を行なうため、あ
るいは電源状態や障害の情報を要求するための各種コマ
ンドを受信後、これを電源制御信号として複数電源３に
出力するとともに、前記自動試験器１に電源情報を送出
する。[0014] Furthermore, after receiving various commands from the automatic tester 1 for power supply control equipment for turning on/off the power or requesting information on the power supply status or failure, It outputs power supply control signals to the plurality of power supplies 3, and also transmits power supply information to the automatic tester 1.
【００１５】図２は、電源制御装置用自動試験器１の機
能を満たすためのマイクロコンピュータプログラムの内
、電源投入／切断シーケンス時のフローチャートの概要
を示す。以下、このフローチャートにしたがって電源制
御装置用自動試験器１の機能を詳しく説明する。FIG. 2 shows an outline of a flowchart during a power-on/off sequence of a microcomputer program for fulfilling the functions of the automatic tester 1 for a power supply control device. Hereinafter, the functions of the automatic tester 1 for a power supply control device will be explained in detail according to this flowchart.
【００１６】電源制御装置用自動試験器１から、電源投
入命令コマンドを電源制御装置２に対して送出すると（
２−１）、電源制御装置２からは、前記電源投入命令コ
マンドに対して、コマンド受付け可能か否かの応答デー
タを電源制御装置用自動試験器１に対して送信する（２
−２）。When the power supply control device automatic tester 1 sends a power-on command to the power supply control device 2 (
2-1) In response to the power-on command, the power supply control device 2 transmits response data indicating whether or not the command can be accepted to the power supply control device automatic tester 1 (2-1).
-2).
【００１７】ここで、前記応答データを判定し、電源投
入コマンド受付け可能であれば、ある一定時間後（２−
３）（２−４）、電源制御装置用自動試験器１から、電
源投入実行コマンドが電源制御装置２に送信され（２−
５）、電源制御装置２から電源３に対して投入指示が実
行される（２−６）。[0017] Here, the response data is judged, and if the power-on command can be accepted, after a certain period of time (2-
3) (2-4), the power supply control device automatic tester 1 sends a power-on execution command to the power supply control device 2 (2-4).
5), the power supply control device 2 issues a power-on instruction to the power supply 3 (2-6).
【００１８】ここで、電源投入が完了すると、次に、電
源切断シーケンスが投入シーケンスとほぼ同様に実行さ
れ（２−７）、その後、再び、電源投入シーケンスが実
行される。When the power-on is completed, a power-off sequence is then executed in substantially the same manner as the power-on sequence (2-7), and then the power-on sequence is executed again.
【００１９】この場合、前回とは異なったタイミングで
電源制御コマンドの送受信が、電源制御装置用自動試験
器１と電源制御装置間で行なわれる（２−９）。In this case, the power supply control command is transmitted and received between the power supply control device automatic tester 1 and the power supply control device at a timing different from the previous time (2-9).
【００２０】以上のように、１サイクル（投入／切断シ
ーケンス各１回）毎に前記コマンドのやり取りのタイミ
ングを変化させ、どのようなタイミングでもシーケンス
が成功するか否かを確認する。[0020] As described above, the timing of the command exchange is changed every cycle (one time for each input/disconnection sequence), and it is confirmed whether the sequence is successful at any timing.
【００２１】[0021]
【発明の効果】以上説明したように、本発明の電源制御
装置用自動試験方式によれば、電源制御装置とのコマン
ドの送受信のタイミングを様々に変化させるので、電源
制御装置のタイミングの違いによってコマンド送受に失
敗がないかを確認することができ、そのため、電源制御
装置の誤動作，異常の検出率をあげることができ、電源
制御装置の性能向上に役立てることができるという効果
がある。[Effects of the Invention] As explained above, according to the automatic test method for a power supply control device of the present invention, the timing of transmitting and receiving commands to and from the power supply control device is variously changed. It is possible to check whether there are any failures in command transmission and reception, thereby increasing the detection rate of malfunctions and abnormalities in the power supply control device, which has the effect of being useful for improving the performance of the power supply control device.
【図１】本発明の一実施例に係る電源制御装置用自動試
験方式が適用されるシステムを示すブロック図である。FIG. 1 is a block diagram showing a system to which an automatic test method for a power supply control device according to an embodiment of the present invention is applied.
【図２】本発明の実施例に係る電源制御装置用自動試験
器の機能を示すフローチャートである。FIG. 2 is a flowchart showing the functions of an automatic tester for a power supply control device according to an embodiment of the present invention.
【図３】従来の電源制御装置用自動試験方式が適用され
るシステムを示すブロック図である。FIG. 3 is a block diagram showing a system to which a conventional automatic test method for power supply control devices is applied.
１ 電源制御装置用自動試験器 ２ 電源制御装置 ３ 電源 ４ 上位制御装置 1 Automatic tester for power supply control equipment 2 Power control device 3 Power supply 4 Upper control device
Claims (1)
制御用コマンドを送出することにより、決められた複数
電源投入／切断シーケンスを実行するとともに、前記上
位制御装置へ電源からの各種情報を報告するシステムに
用いられ、電源制御装置へ電源投入／切断コマンドを繰
り返し送出する電源投入／切断コマンド送出機能と、投
入／切断コマンドの送出タイミングを逐時変更する送出
タイミング変更機能とを備えたことを特徴とする電源制
御装置用自動試験方式。[Claim 1] By sending power control commands from a higher-level control device to a power supply control device, a predetermined multiple power-on/off sequence is executed, and various information from the power source is reported to the higher-level control device. It is used in the system and is characterized by having a power on/off command sending function that repeatedly sends power on/off commands to the power supply control device, and a sending timing change function that changes the sending timing of the on/off commands from time to time. Automatic test method for power supply control equipment.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP3126804A JPH04329378A (en) | 1991-04-30 | 1991-04-30 | Automatic test system for power source control device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP3126804A JPH04329378A (en) | 1991-04-30 | 1991-04-30 | Automatic test system for power source control device |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPH04329378A true JPH04329378A (en) | 1992-11-18 |
Family
ID=14944375
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP3126804A Pending JPH04329378A (en) | 1991-04-30 | 1991-04-30 | Automatic test system for power source control device |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH04329378A (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2007066126A (en) * | 2005-09-01 | 2007-03-15 | Hitachi Global Storage Technologies Netherlands Bv | Test method for data storage device and method of manufacturing data storage device |
-
1991
- 1991-04-30 JP JP3126804A patent/JPH04329378A/en active Pending
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2007066126A (en) * | 2005-09-01 | 2007-03-15 | Hitachi Global Storage Technologies Netherlands Bv | Test method for data storage device and method of manufacturing data storage device |
| US8027801B2 (en) | 2005-09-01 | 2011-09-27 | Hitachi Global Storage Technologies Netherlands B.V. | Multi drive test system for data storage device |
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