JPH04325669A - Material for vacuum deposition - Google Patents
Material for vacuum depositionInfo
- Publication number
- JPH04325669A JPH04325669A JP3121751A JP12175191A JPH04325669A JP H04325669 A JPH04325669 A JP H04325669A JP 3121751 A JP3121751 A JP 3121751A JP 12175191 A JP12175191 A JP 12175191A JP H04325669 A JPH04325669 A JP H04325669A
- Authority
- JP
- Japan
- Prior art keywords
- ta2o5
- vacuum
- vapor deposition
- deposition
- pentoxide
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 239000000463 material Substances 0.000 title claims abstract description 26
- 238000001771 vacuum deposition Methods 0.000 title abstract description 5
- 238000007740 vapor deposition Methods 0.000 claims abstract description 28
- 238000005245 sintering Methods 0.000 claims abstract description 8
- GUVRBAGPIYLISA-UHFFFAOYSA-N tantalum atom Chemical compound [Ta] GUVRBAGPIYLISA-UHFFFAOYSA-N 0.000 claims description 16
- 230000008018 melting Effects 0.000 abstract description 11
- 238000002844 melting Methods 0.000 abstract description 11
- PBCFLUZVCVVTBY-UHFFFAOYSA-N tantalum pentoxide Inorganic materials O=[Ta](=O)O[Ta](=O)=O PBCFLUZVCVVTBY-UHFFFAOYSA-N 0.000 abstract description 10
- 238000000151 deposition Methods 0.000 abstract description 8
- 230000008021 deposition Effects 0.000 abstract description 8
- 238000001704 evaporation Methods 0.000 abstract description 8
- 238000010438 heat treatment Methods 0.000 abstract description 8
- 238000000034 method Methods 0.000 abstract description 4
- 239000000203 mixture Substances 0.000 abstract description 4
- 239000000843 powder Substances 0.000 abstract description 3
- 238000010894 electron beam technology Methods 0.000 abstract description 2
- 238000009835 boiling Methods 0.000 abstract 1
- 238000004519 manufacturing process Methods 0.000 abstract 1
- 239000011812 mixed powder Substances 0.000 abstract 1
- 239000008188 pellet Substances 0.000 description 12
- QVGXLLKOCUKJST-UHFFFAOYSA-N atomic oxygen Chemical compound [O] QVGXLLKOCUKJST-UHFFFAOYSA-N 0.000 description 9
- 239000001301 oxygen Substances 0.000 description 9
- 229910052760 oxygen Inorganic materials 0.000 description 9
- 239000002245 particle Substances 0.000 description 9
- 230000008020 evaporation Effects 0.000 description 6
- 239000010408 film Substances 0.000 description 6
- 230000000052 comparative effect Effects 0.000 description 4
- 238000004090 dissolution Methods 0.000 description 4
- 239000000758 substrate Substances 0.000 description 4
- 239000007789 gas Substances 0.000 description 3
- 238000002156 mixing Methods 0.000 description 3
- 230000000694 effects Effects 0.000 description 2
- 230000031700 light absorption Effects 0.000 description 2
- 238000001819 mass spectrum Methods 0.000 description 2
- 239000000155 melt Substances 0.000 description 2
- 239000012788 optical film Substances 0.000 description 2
- BPUBBGLMJRNUCC-UHFFFAOYSA-N oxygen(2-);tantalum(5+) Chemical compound [O-2].[O-2].[O-2].[O-2].[O-2].[Ta+5].[Ta+5] BPUBBGLMJRNUCC-UHFFFAOYSA-N 0.000 description 2
- 230000002411 adverse Effects 0.000 description 1
- 238000006243 chemical reaction Methods 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 238000005566 electron beam evaporation Methods 0.000 description 1
- 239000011521 glass Substances 0.000 description 1
- 239000008187 granular material Substances 0.000 description 1
- 239000011261 inert gas Substances 0.000 description 1
- 229910052751 metal Inorganic materials 0.000 description 1
- 239000002184 metal Substances 0.000 description 1
- 238000000465 moulding Methods 0.000 description 1
- 238000004904 shortening Methods 0.000 description 1
- 229910052715 tantalum Inorganic materials 0.000 description 1
- 229910001936 tantalum oxide Inorganic materials 0.000 description 1
- 238000002834 transmittance Methods 0.000 description 1
Landscapes
- Physical Vapour Deposition (AREA)
- Optical Filters (AREA)
- Compositions Of Oxide Ceramics (AREA)
- Inorganic Compounds Of Heavy Metals (AREA)
Abstract
Description
【0001】0001
【産業上の利用分野】本発明は真空蒸着により五酸化二
タンタル膜を形成する際に使用する蒸着用材料に関する
。BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a deposition material used in forming a ditantalum pentoxide film by vacuum deposition.
【0002】0002
【従来の技術】真空蒸着は、真空チャンバー中で蒸着用
材料を電子銃や抵抗加熱によって完全に溶融して蒸着さ
せ、これにより対象物面に蒸着膜を形成するものである
。蒸着用材料として五酸化二タンタルを用いて形成した
五酸化二タンタル蒸着膜は屈折率が高く、また硬度が高
いため、従来からフィルター・ダイクロイックミラー等
の多層膜の高屈折物質として使用されている。2. Description of the Related Art Vacuum deposition is a process in which a material for deposition is completely melted and deposited in a vacuum chamber using an electron gun or resistance heating, thereby forming a deposited film on the surface of an object. The ditantalum pentoxide vapor deposited film formed using ditantalum pentoxide as a deposition material has a high refractive index and high hardness, so it has traditionally been used as a high refractive material for multilayer films such as filters and dichroic mirrors. .
【0003】通常の五酸化二タンタル蒸着用材料は、五
酸化二タンタル粉末をプレス成形し燒結体としたペレッ
トやターゲットが用いられる。[0003] Typical ditantalum pentoxide vapor deposition materials include pellets and targets formed by press-molding ditantalum pentoxide powder into sintered bodies.
【0004】0004
【発明が解決しようとする課題】上記の蒸着用ペレット
は、溶解時に分解して酸素の放出が著しいため、チャン
バー内が蒸着可能な真空度に達するまで時間かかかるう
え、その加熱時間の長さは大量の輻射熱を発生させ、熱
に弱いプラスチック表面に蒸着を行なう場合には、基板
に変形などの悪影響を与えることがある。また、蒸着材
料の完全な溶融が起きないと蒸発が起こらず、部分的に
溶融した状態では、その部分から溶けて流れだした材料
が冷却された容器で急激に冷やされ、あたかも突沸現象
のような状態を起こす等の問題がある。[Problems to be Solved by the Invention] The above-mentioned deposition pellets decompose during melting and release significant oxygen, so it takes time for the chamber to reach a vacuum level that allows deposition, and the heating time is long. generates a large amount of radiant heat, and when vapor deposition is performed on a plastic surface that is sensitive to heat, it may have an adverse effect such as deformation on the substrate. In addition, evaporation does not occur unless the vapor deposition material completely melts, and if it is partially melted, the material that melts and flows from that part is rapidly cooled in a cooled container, similar to a bumping phenomenon. There are problems such as causing a situation.
【0005】本発明は上記事情に鑑みてなされたもので
、その目的とする所は溶融の際の酸素の発生量が少なく
、従って溶融時間を短縮し得、更にあたかも突沸のよう
な現象を生じることなく蒸発し易い蒸着用材料を提供す
ることにある。The present invention was made in view of the above circumstances, and its purpose is to reduce the amount of oxygen generated during melting, thereby shortening the melting time, and furthermore, to reduce the occurrence of a phenomenon similar to bumping. An object of the present invention is to provide a material for vapor deposition that can be easily evaporated without causing any evaporation.
【0006】[0006]
【課題を解決するための手段】本発明の目的は、五酸化
二タンタルと金属タンタルを所定の割合で混合し、その
混合物を不活性雰囲気中で、少なくとも燒結できる程度
の高温で加熱処理してペレット状等の各種形状にして得
られる蒸着材料によって達成される。即ち、本発明は五
酸化二タンタルと、前記五酸化二タンタルに対して4〜
55重量%の割合の金属タンタルとを燒結してなる蒸着
用材料に関するものである。[Means for Solving the Problems] The object of the present invention is to mix ditantalum pentoxide and tantalum metal in a predetermined ratio, and heat-treat the mixture in an inert atmosphere at a high temperature at least high enough to sinter the mixture. This is achieved by using vapor deposition materials that can be made into various shapes such as pellets. That is, the present invention uses ditantalum pentoxide and the ditantalum pentoxide.
This relates to a material for vapor deposition formed by sintering 55% by weight of tantalum metal.
【0007】以下、本発明を詳細に説明する。The present invention will be explained in detail below.
【0008】本発明において使用する五酸化二タンタル
及び金属タンタルは特に制限はなく、いずれのものでも
使用できるが、燒結し易いように適度の粒度の粉末状の
ものが好ましい。これらの平均粒径としては五酸化二タ
ンタルは0.5〜1μm程度で、金属タンタルとしては
10〜50μm程度であることが好ましい。[0008] The ditantalum pentoxide and tantalum metal used in the present invention are not particularly limited, and any of them can be used, but it is preferably in the form of powder with an appropriate particle size so that it can be easily sintered. The average particle diameter of these particles is preferably about 0.5 to 1 μm for ditantalum pentoxide, and about 10 to 50 μm for tantalum metal.
【0009】本発明においては、上記五酸化二タンタル
及び金属タンタルを燒結するものであるが、燒結前に予
め両者を混合することが望ましい。混合方法としてはボ
ールミルを用いる方法等がある。In the present invention, the ditantalum pentoxide and tantalum metal are sintered, but it is desirable to mix the two in advance before sintering. Examples of the mixing method include a method using a ball mill.
【0010】五酸化二タンタルと、金属タンタルとの配
合割合は、五酸化二タンタルに対して4〜55重量%と
するものである。この場合、金属タンタルの量が4重量
%以下であると、加熱溶融時における酸素の放出防止に
対する効果があまり無い。55重量%以上であると金属
タンタル自体の突沸現象が逆に激しくなり、また金属タ
ンタルの影響により形成した蒸着膜の光透過性が悪くな
り、光吸収が多くなるので好ましくない。The blending ratio of ditantalum pentoxide and tantalum metal is 4 to 55% by weight based on ditantalum pentoxide. In this case, if the amount of tantalum metal is 4% by weight or less, it will not be very effective in preventing the release of oxygen during heating and melting. If it is more than 55% by weight, the bumping phenomenon of the tantalum metal itself becomes more intense, and the light transmittance of the deposited film deteriorates due to the influence of the tantalum metal, resulting in increased light absorption, which is not preferable.
【0011】本発明においては、上記割合の混合物を燒
結して本発明に係る蒸着用材料とするものである。In the present invention, the mixture in the above ratio is sintered to obtain the vapor deposition material according to the present invention.
【0012】燒結は不活性な状態で行なうものである。
このため真空中又はN2 やAr等の不活性ガス中で加
熱することが好ましい。加熱温度は金属タンタルの配合
割合によっても異なるが、1450〜1600℃とする
ことが好ましい。加熱時間は2〜6時間程度である。上
記燒結を行なう装置としては、例えば真空電気炉等があ
る。Sintering is carried out in an inert state. For this reason, it is preferable to heat in vacuum or in an inert gas such as N2 or Ar. Although the heating temperature varies depending on the blending ratio of tantalum metal, it is preferably 1450 to 1600°C. The heating time is about 2 to 6 hours. Examples of the apparatus for performing the above-mentioned sintering include a vacuum electric furnace and the like.
【0013】本発明に係る蒸着用材料の形状としては、
ペレット状、顆粒状、その他の形状にすることができる
。[0013] The shape of the material for vapor deposition according to the present invention is as follows:
It can be made into pellets, granules, or other shapes.
【0014】従来の五酸化二タンタルは、蒸着時に電子
銃を使用した場合その溶け始める温度が2100℃、蒸
発する温度が2500℃なのに対して、上記のようにし
て製造した本発明に係る蒸着用材料は、溶け始める温度
が2300℃、蒸発する温度が2500℃で、溶ける温
度と蒸発する温度の差が小さい。そのために溶解が始ま
るとすぐ蒸発を起こさせることができ、蒸着に際し基板
に対する輻射熱の影響を少なくする。また、溶融温度と
蒸発温度の差が少ないため粘性が大きく、材料が流れ出
すのを防ぐことができる。Conventional ditantalum pentoxide has a melting temperature of 2100° C. and an evaporation temperature of 2500° C. when an electron gun is used during vapor deposition. The temperature at which the material begins to melt is 2,300°C and the temperature at which it evaporates is 2,500°C, and the difference between the melting and evaporating temperatures is small. Therefore, evaporation can occur immediately after melting begins, reducing the influence of radiant heat on the substrate during vapor deposition. In addition, since the difference between the melting temperature and the evaporation temperature is small, the viscosity is high and it is possible to prevent the material from flowing out.
【0015】[0015]
【実施例】以下、実施例により本発明を更に具体的に説
明する。
実施例 1
五酸化二タンタル(平均粒径0.7μm)と金属タンタ
ル(平均粒径45μm)を87:13の重量比で混合し
プレス成形した後、真空中で約4時間1500℃で燒結
を行なって蒸着用ペレットを得た。次いで真空槽(チャ
ンバー)中に配置された電子ビーム蒸着用ハースにその
ペレットをセットし、装置内を1×10−5Torrに
なるまで排気した後、電子ビームによってこれを溶解し
、光学的膜厚nd=375nmになるように蒸着した。
ペレットの溶解時の真空槽の全圧の経時変化を図1に、
また酸素の分圧を図2に示した。比較例として測定した
五酸化二タンタル単体においての蒸発時の全圧変化(図
3)及び酸素分圧(図4)に比べ、本発明のペレットは
明らかに分解ガスが少なかった。通常、五酸化二タンタ
ルを蒸着用材料として用いて蒸着を行なう際には、生成
する蒸着膜の光吸収防止のため1×10−4Torrの
酸素雰囲気下で蒸着する。本実施例による蒸着用材料も
同様に1×10−4Torrの酸素雰囲気下で、300
℃に保ったガラス基板上に光学的膜厚nd=125nm
となるように蒸着した結果、屈折率は2.10であり、
通常の五酸化二タンタルを蒸着した場合となんら変わり
はなかった。この場合、材料から発生する酸素量が少な
いため溶融時間は従来の10%と少ないものであった。
また、材料は図5の様に溶けるため、流れ出すことなく
、突沸に類似した現象も起こらなかった。[Examples] The present invention will be explained in more detail with reference to Examples below. Example 1 Dtantalum pentoxide (average particle size 0.7 μm) and tantalum metal (average particle size 45 μm) were mixed at a weight ratio of 87:13, press-molded, and then sintered at 1500°C for about 4 hours in a vacuum. A pellet for deposition was obtained. Next, the pellets are set in an electron beam evaporation hearth placed in a vacuum chamber, and the inside of the apparatus is evacuated to 1 x 10-5 Torr, and then melted with an electron beam to determine the optical film thickness. Vapor deposition was performed so that nd=375 nm. Figure 1 shows the change in total pressure in the vacuum chamber over time during pellet dissolution.
Further, the partial pressure of oxygen is shown in FIG. Compared to the total pressure change (FIG. 3) and oxygen partial pressure (FIG. 4) during evaporation of ditantalum pentoxide alone, which were measured as a comparative example, the pellets of the present invention clearly contained less decomposed gas. Normally, when ditantalum pentoxide is used as a material for vapor deposition, the vapor deposition is carried out under an oxygen atmosphere of 1.times.10@-4 Torr in order to prevent light absorption in the resulting vapor deposited film. The material for vapor deposition according to this example was similarly evaporated at 300 m
Optical film thickness nd = 125 nm on a glass substrate kept at ℃
As a result of vapor deposition, the refractive index was 2.10,
There was no difference from the case where ordinary tantalum pentoxide was deposited. In this case, since the amount of oxygen generated from the material was small, the melting time was 10% shorter than that of the conventional material. Furthermore, since the material melted as shown in Figure 5, it did not flow out and a phenomenon similar to bumping did not occur.
【0016】本実施例の蒸着材料は、金属タンタルと五
酸化二タンタルの混合燒結体であるが、両者の間での反
応はほとんど進んでいない。しかし、燒結条件によって
多少の酸素含有量の異なるタンタル酸化物が生成するこ
とがあるが、これは本発明の蒸着用ペレットになんら影
響を与えるものではない。
実施例 2
五酸化二タンタル(平均粒径0.7μm)と金属タンタ
ル(平均粒径45μm)を95:5の重量比で混合し、
実施例1と同様に真空雰囲気中において1500℃で4
時間加熱して蒸着用ペレットを作成し、同様な蒸着を行
なったところ、蒸着時に放出ガスが発生したが、五酸化
二タンタル単体蒸着ペレットの場合の放出ガスの約50
%で、はるかに少なかった。
実施例 3
五酸化二タンタル(平均粒径0.7μm)と金属タンタ
ル(平均粒径45μm)を50:50の重量比で混合し
、蒸着ペレットを作成した。燒結は真空雰囲気中におい
て1500℃で4時間の加熱であった。実施例1と同様
に蒸着を行なったところ、実施例1と同様に蒸着できた
が、金属タンタルの影響によりわずかな突沸のような現
象がみられた。The vapor deposition material of this example is a mixed sintered body of tantalum metal and ditantalum pentoxide, but the reaction between the two has hardly progressed. However, depending on the sintering conditions, tantalum oxides with slightly different oxygen contents may be produced, but this does not affect the pellets for deposition of the present invention in any way. Example 2 Ditantalum pentoxide (average particle size 0.7 μm) and tantalum metal (average particle size 45 μm) were mixed at a weight ratio of 95:5,
4 at 1500°C in a vacuum atmosphere as in Example 1.
When a pellet for vapor deposition was created by heating for a certain period of time and a similar vapor deposition was performed, gas was released during vapor deposition, but about 50% of the gas released in the case of a single vapor deposition pellet of ditantalum pentoxide was generated.
%, it was much less. Example 3 Dtantalum pentoxide (average particle size: 0.7 μm) and tantalum metal (average particle size: 45 μm) were mixed at a weight ratio of 50:50 to prepare vapor-deposited pellets. Sintering was done by heating at 1500° C. for 4 hours in a vacuum atmosphere. When vapor deposition was carried out in the same manner as in Example 1, the vapor deposition was successful in the same manner as in Example 1, but a phenomenon such as slight bumping was observed due to the influence of the metal tantalum.
【0017】[0017]
【発明の効果】以上説明したように本発明の蒸着用材料
によれば、酸素の放出量が減少し、また蒸着し易くなっ
たために蒸着時間の短縮、及び基板への熱的影響の減少
、突沸のような現象の防止が可能となった。Effects of the Invention As explained above, according to the vapor deposition material of the present invention, the amount of oxygen released is reduced, and the vapor deposition becomes easier, so the vapor deposition time is shortened, and the thermal influence on the substrate is reduced. This makes it possible to prevent phenomena such as bumping.
【図1】本発明品を用いて溶解を行なった場合のチャン
バー内の全圧力の経時変化を示すグラフである。FIG. 1 is a graph showing the change over time in the total pressure inside the chamber when dissolution is performed using the product of the present invention.
【図2】本発明品を用いて溶解を行なった場合のチャン
バー内の分圧の経時変化を示すマススペクトルである。FIG. 2 is a mass spectrum showing the change in partial pressure in the chamber over time when dissolution is performed using the product of the present invention.
【図3】比較品を用いて溶解を行なった場合のチャンバ
ー内の全圧力の経時変化を示すグラフである。FIG. 3 is a graph showing the change over time in the total pressure inside the chamber when melting was performed using a comparative product.
【図4】比較品を用いて溶解を行なった場合のチャンバ
ー内の分圧の経時変化を示すマススペクトルである。FIG. 4 is a mass spectrum showing the change in partial pressure in the chamber over time when dissolution was performed using a comparative product.
【図5】それぞれ比較品(Ta2O5)と本発明品(T
a2 O5 +Ta)の蒸着残渣を示す概略図である。[Figure 5] Comparative product (Ta2O5) and inventive product (T
FIG. 2 is a schematic diagram showing a vapor deposition residue of a2 O5 +Ta).
Claims (1)
ンタルに対して4〜55重量%の割合の金属タンタルと
を燒結してなる蒸着用材料。1. A vapor deposition material obtained by sintering ditantalum pentoxide and tantalum metal in a proportion of 4 to 55% by weight based on the ditantalum pentoxide.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP12175191A JP3160309B2 (en) | 1991-04-25 | 1991-04-25 | Thin film formation method |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP12175191A JP3160309B2 (en) | 1991-04-25 | 1991-04-25 | Thin film formation method |
Publications (2)
Publication Number | Publication Date |
---|---|
JPH04325669A true JPH04325669A (en) | 1992-11-16 |
JP3160309B2 JP3160309B2 (en) | 2001-04-25 |
Family
ID=14818987
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP12175191A Expired - Lifetime JP3160309B2 (en) | 1991-04-25 | 1991-04-25 | Thin film formation method |
Country Status (1)
Country | Link |
---|---|
JP (1) | JP3160309B2 (en) |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP1648034A1 (en) | 2004-10-14 | 2006-04-19 | MERCK PATENT GmbH | Evaporation material comprising Ta2Ox with x = 4.81 bis 4.88, for the deposition of layers with high refraction |
JP2009235564A (en) * | 2008-03-03 | 2009-10-15 | Toho Titanium Co Ltd | Vapor-deposition material of tantalum oxide, production method therefor, and method for producing vapor-deposition film of tantalum oxide |
JP2010095754A (en) * | 2008-10-16 | 2010-04-30 | Toho Titanium Co Ltd | Vapor-deposition material of tantalum oxide, production method therefor, and method for producing vapor-deposition film of tantalum oxide |
-
1991
- 1991-04-25 JP JP12175191A patent/JP3160309B2/en not_active Expired - Lifetime
Cited By (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP1648034A1 (en) | 2004-10-14 | 2006-04-19 | MERCK PATENT GmbH | Evaporation material comprising Ta2Ox with x = 4.81 bis 4.88, for the deposition of layers with high refraction |
JP2006111974A (en) * | 2004-10-14 | 2006-04-27 | Merck Patent Gmbh | Vapor-deposition material for production of layer of high refractive index |
US7598196B2 (en) | 2004-10-14 | 2009-10-06 | Merck Patent Gmbh | Vapor-deposition material for the production of layers of high refractive index |
JP2009235564A (en) * | 2008-03-03 | 2009-10-15 | Toho Titanium Co Ltd | Vapor-deposition material of tantalum oxide, production method therefor, and method for producing vapor-deposition film of tantalum oxide |
JP2010095754A (en) * | 2008-10-16 | 2010-04-30 | Toho Titanium Co Ltd | Vapor-deposition material of tantalum oxide, production method therefor, and method for producing vapor-deposition film of tantalum oxide |
Also Published As
Publication number | Publication date |
---|---|
JP3160309B2 (en) | 2001-04-25 |
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