JPH04318997A - Copper foil for printed circuit and manufacture thereof - Google Patents
Copper foil for printed circuit and manufacture thereofInfo
- Publication number
- JPH04318997A JPH04318997A JP3317503A JP31750391A JPH04318997A JP H04318997 A JPH04318997 A JP H04318997A JP 3317503 A JP3317503 A JP 3317503A JP 31750391 A JP31750391 A JP 31750391A JP H04318997 A JPH04318997 A JP H04318997A
- Authority
- JP
- Japan
- Prior art keywords
- copper foil
- copper
- nickel
- cobalt
- zinc
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 title claims abstract description 62
- 239000011889 copper foil Substances 0.000 title claims abstract description 49
- 238000004519 manufacturing process Methods 0.000 title claims abstract description 9
- PXHVJJICTQNCMI-UHFFFAOYSA-N Nickel Chemical compound [Ni] PXHVJJICTQNCMI-UHFFFAOYSA-N 0.000 claims abstract description 30
- HEMHJVSKTPXQMS-UHFFFAOYSA-M Sodium hydroxide Chemical compound [OH-].[Na+] HEMHJVSKTPXQMS-UHFFFAOYSA-M 0.000 claims abstract description 18
- 238000000034 method Methods 0.000 claims abstract description 18
- 239000000758 substrate Substances 0.000 claims abstract description 17
- ATJFFYVFTNAWJD-UHFFFAOYSA-N Tin Chemical compound [Sn] ATJFFYVFTNAWJD-UHFFFAOYSA-N 0.000 claims abstract description 16
- 229910052718 tin Inorganic materials 0.000 claims abstract description 16
- ZCDOYSPFYFSLEW-UHFFFAOYSA-N chromate(2-) Chemical compound [O-][Cr]([O-])(=O)=O ZCDOYSPFYFSLEW-UHFFFAOYSA-N 0.000 claims abstract description 15
- 229910052759 nickel Inorganic materials 0.000 claims abstract description 15
- 239000010941 cobalt Substances 0.000 claims abstract description 13
- 229910017052 cobalt Inorganic materials 0.000 claims abstract description 13
- GUTLYIVDDKVIGB-UHFFFAOYSA-N cobalt atom Chemical compound [Co] GUTLYIVDDKVIGB-UHFFFAOYSA-N 0.000 claims abstract description 13
- 229910052802 copper Inorganic materials 0.000 claims abstract description 13
- 239000010949 copper Substances 0.000 claims abstract description 13
- 229910002058 ternary alloy Inorganic materials 0.000 claims abstract description 13
- XLOMVQKBTHCTTD-UHFFFAOYSA-N Zinc monoxide Chemical compound [Zn]=O XLOMVQKBTHCTTD-UHFFFAOYSA-N 0.000 claims abstract description 12
- 229910052785 arsenic Inorganic materials 0.000 claims abstract description 12
- RQNWIZPPADIBDY-UHFFFAOYSA-N arsenic atom Chemical compound [As] RQNWIZPPADIBDY-UHFFFAOYSA-N 0.000 claims abstract description 12
- 239000011135 tin Substances 0.000 claims abstract description 12
- 238000007747 plating Methods 0.000 claims abstract description 11
- HCHKCACWOHOZIP-UHFFFAOYSA-N Zinc Chemical compound [Zn] HCHKCACWOHOZIP-UHFFFAOYSA-N 0.000 claims abstract description 10
- 229910052725 zinc Inorganic materials 0.000 claims abstract description 10
- 239000011701 zinc Substances 0.000 claims abstract description 10
- HELHAJAZNSDZJO-OLXYHTOASA-L sodium L-tartrate Chemical compound [Na+].[Na+].[O-]C(=O)[C@H](O)[C@@H](O)C([O-])=O HELHAJAZNSDZJO-OLXYHTOASA-L 0.000 claims abstract description 6
- 235000011121 sodium hydroxide Nutrition 0.000 claims abstract description 6
- 239000001433 sodium tartrate Substances 0.000 claims abstract description 6
- 229960002167 sodium tartrate Drugs 0.000 claims abstract description 6
- 235000011004 sodium tartrates Nutrition 0.000 claims abstract description 6
- 239000011787 zinc oxide Substances 0.000 claims abstract description 6
- 229910000365 copper sulfate Inorganic materials 0.000 claims abstract description 4
- ARUVKPQLZAKDPS-UHFFFAOYSA-L copper(II) sulfate Chemical compound [Cu+2].[O-][S+2]([O-])([O-])[O-] ARUVKPQLZAKDPS-UHFFFAOYSA-L 0.000 claims abstract description 4
- 239000010410 layer Substances 0.000 claims description 27
- TVQLLNFANZSCGY-UHFFFAOYSA-N disodium;dioxido(oxo)tin Chemical group [Na+].[Na+].[O-][Sn]([O-])=O TVQLLNFANZSCGY-UHFFFAOYSA-N 0.000 claims description 6
- 229940079864 sodium stannate Drugs 0.000 claims description 6
- 239000008367 deionised water Substances 0.000 claims description 4
- 229910021641 deionized water Inorganic materials 0.000 claims description 4
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Chemical compound O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 claims description 4
- AQLMHYSWFMLWBS-UHFFFAOYSA-N arsenite(1-) Chemical compound O[As](O)[O-] AQLMHYSWFMLWBS-UHFFFAOYSA-N 0.000 claims description 3
- 239000011247 coating layer Substances 0.000 claims description 2
- 229910000361 cobalt sulfate Inorganic materials 0.000 claims description 2
- 229940044175 cobalt sulfate Drugs 0.000 claims description 2
- KTVIXTQDYHMGHF-UHFFFAOYSA-L cobalt(2+) sulfate Chemical compound [Co+2].[O-]S([O-])(=O)=O KTVIXTQDYHMGHF-UHFFFAOYSA-L 0.000 claims description 2
- 238000009713 electroplating Methods 0.000 claims description 2
- 150000004688 heptahydrates Chemical class 0.000 claims description 2
- 150000004687 hexahydrates Chemical class 0.000 claims description 2
- LGQLOGILCSXPEA-UHFFFAOYSA-L nickel sulfate Chemical compound [Ni+2].[O-]S([O-])(=O)=O LGQLOGILCSXPEA-UHFFFAOYSA-L 0.000 claims description 2
- 229910000363 nickel(II) sulfate Inorganic materials 0.000 claims description 2
- 150000004686 pentahydrates Chemical class 0.000 claims 1
- 238000005406 washing Methods 0.000 claims 1
- 238000004070 electrodeposition Methods 0.000 abstract description 3
- 239000007788 liquid Substances 0.000 abstract description 3
- 238000007788 roughening Methods 0.000 abstract description 3
- 239000011888 foil Substances 0.000 abstract 1
- 239000000243 solution Substances 0.000 description 15
- 229920005989 resin Polymers 0.000 description 11
- 239000011347 resin Substances 0.000 description 11
- 229910045601 alloy Inorganic materials 0.000 description 8
- 239000000956 alloy Substances 0.000 description 8
- 239000000126 substance Substances 0.000 description 7
- 238000000576 coating method Methods 0.000 description 5
- 238000005530 etching Methods 0.000 description 5
- JPVYNHNXODAKFH-UHFFFAOYSA-N Cu2+ Chemical compound [Cu+2] JPVYNHNXODAKFH-UHFFFAOYSA-N 0.000 description 4
- 239000000853 adhesive Substances 0.000 description 4
- 230000001070 adhesive effect Effects 0.000 description 4
- 239000011248 coating agent Substances 0.000 description 4
- 230000000052 comparative effect Effects 0.000 description 4
- 229910001431 copper ion Inorganic materials 0.000 description 4
- 239000008151 electrolyte solution Substances 0.000 description 4
- 239000000203 mixture Substances 0.000 description 4
- 230000007423 decrease Effects 0.000 description 3
- 238000009792 diffusion process Methods 0.000 description 3
- 230000000694 effects Effects 0.000 description 3
- JHWIEAWILPSRMU-UHFFFAOYSA-N 2-methyl-3-pyrimidin-4-ylpropanoic acid Chemical compound OC(=O)C(C)CC1=CC=NC=N1 JHWIEAWILPSRMU-UHFFFAOYSA-N 0.000 description 2
- 229910001369 Brass Inorganic materials 0.000 description 2
- XFXPMWWXUTWYJX-UHFFFAOYSA-N Cyanide Chemical compound N#[C-] XFXPMWWXUTWYJX-UHFFFAOYSA-N 0.000 description 2
- OAICVXFJPJFONN-UHFFFAOYSA-N Phosphorus Chemical compound [P] OAICVXFJPJFONN-UHFFFAOYSA-N 0.000 description 2
- QAOWNCQODCNURD-UHFFFAOYSA-N Sulfuric acid Chemical compound OS(O)(=O)=O QAOWNCQODCNURD-UHFFFAOYSA-N 0.000 description 2
- 229910001297 Zn alloy Inorganic materials 0.000 description 2
- 239000012670 alkaline solution Substances 0.000 description 2
- ROOXNKNUYICQNP-UHFFFAOYSA-N ammonium persulfate Chemical compound [NH4+].[NH4+].[O-]S(=O)(=O)OOS([O-])(=O)=O ROOXNKNUYICQNP-UHFFFAOYSA-N 0.000 description 2
- 239000010951 brass Substances 0.000 description 2
- TVZPLCNGKSPOJA-UHFFFAOYSA-N copper zinc Chemical compound [Cu].[Zn] TVZPLCNGKSPOJA-UHFFFAOYSA-N 0.000 description 2
- 239000003792 electrolyte Substances 0.000 description 2
- 238000010438 heat treatment Methods 0.000 description 2
- JEIPFZHSYJVQDO-UHFFFAOYSA-N iron(III) oxide Inorganic materials O=[Fe]O[Fe]=O JEIPFZHSYJVQDO-UHFFFAOYSA-N 0.000 description 2
- 229910052698 phosphorus Inorganic materials 0.000 description 2
- 239000011574 phosphorus Substances 0.000 description 2
- 229910000906 Bronze Inorganic materials 0.000 description 1
- FEWJPZIEWOKRBE-JCYAYHJZSA-N Dextrotartaric acid Chemical compound OC(=O)[C@H](O)[C@@H](O)C(O)=O FEWJPZIEWOKRBE-JCYAYHJZSA-N 0.000 description 1
- 229910001128 Sn alloy Inorganic materials 0.000 description 1
- 229910000756 V alloy Inorganic materials 0.000 description 1
- HFPUDQMSWREXAL-UHFFFAOYSA-N [Cu].[Zn].[As] Chemical compound [Cu].[Zn].[As] HFPUDQMSWREXAL-UHFFFAOYSA-N 0.000 description 1
- PDYXSJSAMVACOH-UHFFFAOYSA-N [Cu].[Zn].[Sn] Chemical compound [Cu].[Zn].[Sn] PDYXSJSAMVACOH-UHFFFAOYSA-N 0.000 description 1
- FFDNCLQDXZUPCF-UHFFFAOYSA-N [V].[Zn] Chemical compound [V].[Zn] FFDNCLQDXZUPCF-UHFFFAOYSA-N 0.000 description 1
- DBQFKMXHMSMNRU-UHFFFAOYSA-N [Zn].[Co].[Cu] Chemical compound [Zn].[Co].[Cu] DBQFKMXHMSMNRU-UHFFFAOYSA-N 0.000 description 1
- 239000002253 acid Substances 0.000 description 1
- 230000002378 acidificating effect Effects 0.000 description 1
- 229910001870 ammonium persulfate Inorganic materials 0.000 description 1
- 239000010974 bronze Substances 0.000 description 1
- MEYVLGVRTYSQHI-UHFFFAOYSA-L cobalt(2+) sulfate heptahydrate Chemical compound O.O.O.O.O.O.O.[Co+2].[O-]S([O-])(=O)=O MEYVLGVRTYSQHI-UHFFFAOYSA-L 0.000 description 1
- 238000007796 conventional method Methods 0.000 description 1
- -1 copper ions form hydroxides Chemical class 0.000 description 1
- KUNSUQLRTQLHQQ-UHFFFAOYSA-N copper tin Chemical compound [Cu].[Sn] KUNSUQLRTQLHQQ-UHFFFAOYSA-N 0.000 description 1
- JZCCFEFSEZPSOG-UHFFFAOYSA-L copper(II) sulfate pentahydrate Chemical compound O.O.O.O.O.[Cu+2].[O-]S([O-])(=O)=O JZCCFEFSEZPSOG-UHFFFAOYSA-L 0.000 description 1
- CGPVLUCOFNAVGV-UHFFFAOYSA-N copper;pentahydrate Chemical compound O.O.O.O.O.[Cu] CGPVLUCOFNAVGV-UHFFFAOYSA-N 0.000 description 1
- 230000006866 deterioration Effects 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 238000010292 electrical insulation Methods 0.000 description 1
- 239000003822 epoxy resin Substances 0.000 description 1
- 239000011521 glass Substances 0.000 description 1
- 229910052738 indium Inorganic materials 0.000 description 1
- APFVFJFRJDLVQX-UHFFFAOYSA-N indium atom Chemical compound [In] APFVFJFRJDLVQX-UHFFFAOYSA-N 0.000 description 1
- 150000002500 ions Chemical class 0.000 description 1
- 238000005259 measurement Methods 0.000 description 1
- UHXUZOCRWCRNSJ-QPJJXVBHSA-N methomyl Chemical compound CNC(=O)O\N=C(/C)SC UHXUZOCRWCRNSJ-QPJJXVBHSA-N 0.000 description 1
- RRIWRJBSCGCBID-UHFFFAOYSA-L nickel sulfate hexahydrate Chemical compound O.O.O.O.O.O.[Ni+2].[O-]S([O-])(=O)=O RRIWRJBSCGCBID-UHFFFAOYSA-L 0.000 description 1
- QELJHCBNGDEXLD-UHFFFAOYSA-N nickel zinc Chemical compound [Ni].[Zn] QELJHCBNGDEXLD-UHFFFAOYSA-N 0.000 description 1
- 238000005554 pickling Methods 0.000 description 1
- 229920000647 polyepoxide Polymers 0.000 description 1
- 239000000843 powder Substances 0.000 description 1
- 150000003839 salts Chemical class 0.000 description 1
- 229940095064 tartrate Drugs 0.000 description 1
- NWONKYPBYAMBJT-UHFFFAOYSA-L zinc sulfate Chemical compound [Zn+2].[O-]S([O-])(=O)=O NWONKYPBYAMBJT-UHFFFAOYSA-L 0.000 description 1
- 229910000368 zinc sulfate Inorganic materials 0.000 description 1
- 229960001763 zinc sulfate Drugs 0.000 description 1
Classifications
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K1/00—Printed circuits
- H05K1/02—Details
- H05K1/09—Use of materials for the conductive, e.g. metallic pattern
Landscapes
- Engineering & Computer Science (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Parts Printed On Printed Circuit Boards (AREA)
- Manufacturing Of Printed Wiring (AREA)
- Electroplating Methods And Accessories (AREA)
Abstract
Description
【0001】0001
【産業上の利用分野】この発明は、樹脂製の絶縁基板に
対する結合特性が改良された印刷回路用銅箔に関し、さ
らに詳しくは絶縁基板との結合性を向上させるために、
基本銅箔の絶縁基板との接合面に、スズ,コバルト,ニ
ッケルおよびヒ素の内の或る一つの元素と、銅と、およ
び亜鉛とで構成された3元合金層が電着された後、クロ
メート処理される印刷回路用銅箔及びその製造方法に関
する。[Field of Industrial Application] This invention relates to a copper foil for printed circuits that has improved bonding characteristics to resin-made insulating substrates, and more specifically, to improve bonding characteristics to insulating substrates.
After a ternary alloy layer composed of one element among tin, cobalt, nickel, and arsenic, copper, and zinc is electrodeposited on the bonding surface of the basic copper foil with the insulating substrate, This invention relates to a chromate-treated copper foil for printed circuits and a method for manufacturing the same.
【0002】0002
【従来の技術】印刷回路は、ラジオ、テレビ、電話交換
機、コンピュータ等の各種電子機器の回路で広く利用さ
れている。特に、最近では小型化、高集積化された印刷
回路に対する要求に応じて、樹脂製の絶縁基板に銅箔を
接合させた印刷回路基板が提案されているが、銅イオン
が樹脂層に拡散して入るため、銅箔と基板樹脂層との接
合面にしばしば茶色のしみ(brown spotti
ng) が発生し、これが回路の外観を悪くするだけで
なく、絶縁基板の電気絶縁性を弱化させることが問題に
なっている。2. Description of the Related Art Printed circuits are widely used in the circuits of various electronic devices such as radios, televisions, telephone exchanges, and computers. In particular, recently, in response to the demand for smaller, more highly integrated printed circuits, printed circuit boards in which copper foil is bonded to resin insulating substrates have been proposed, but copper ions diffuse into the resin layer. brown spots often appear on the bonding surface between the copper foil and the substrate resin layer.
ng) occurs, which not only deteriorates the appearance of the circuit but also weakens the electrical insulation of the insulating substrate, which is a problem.
【0003】また、最近の印刷回路板の製作工程には、
高温処理工程がますます増えている。このため熱劣化に
よる銅箔と樹脂層間の接合力の低下が発生して、実用上
大きな問題となっている。このような問題を解決するた
めの方法として、次のような方法が提案されている。[0003] Also, in the recent manufacturing process of printed circuit boards,
High temperature processing processes are becoming more and more popular. For this reason, the bonding strength between the copper foil and the resin layer decreases due to thermal deterioration, which poses a serious problem in practice. The following methods have been proposed to solve these problems.
【0004】米国特許第3,585,010号の公報に
は、絶縁基板と接合する銅箔の面に、インジウム,亜鉛
,スズ,ニッケル,コバルト,黄銅(銅−亜鉛合金)あ
るいは青銅(銅−スズ合金)を、4×10−6inch
以上の厚さで電着する方法が記載されている。US Pat. No. 3,585,010 discloses that indium, zinc, tin, nickel, cobalt, brass (copper-zinc alloy) or bronze (copper-zinc alloy) is used on the surface of the copper foil to be bonded to the insulating substrate. tin alloy), 4 x 10-6 inch
A method of electrodepositing to a thickness greater than or equal to the above is described.
【0005】しかし、黄銅をメッキする方法においては
、シアン化物浴を使用する場合以外には実用的な方法が
存在せず、また、シアン化物浴は作業環境上の問題だけ
でなく公害問題も有している。また、亜鉛メッキは、酸
性エッチング液でエッチングする際、銅箔と樹脂層間を
エッチング液が浸蝕して、いわゆるアンダーカット現象
を起こす。However, there is no practical method for plating brass other than using a cyanide bath, and cyanide baths pose not only problems in the working environment but also pollution problems. are doing. Furthermore, when zinc plating is etched with an acidic etching solution, the etching solution corrodes the space between the copper foil and the resin layer, causing a so-called undercut phenomenon.
【0006】大韓民国特許公告第84−1643号の公
報には、絶縁基板と接合する銅箔面に0.02〜15重
量%のリンを含有するニッケル等を被覆する方法が記載
されている。[0006] Korean Patent Publication No. 84-1643 describes a method of coating a copper foil surface to be bonded to an insulating substrate with nickel or the like containing 0.02 to 15% by weight of phosphorus.
【0007】しかし、この方法は50℃以上の電解液を
使用してニッケルを被覆させるので非経済的であり、ま
た上記の範囲内でリン含有量を調節することが非常に難
しいのが欠点である。[0007] However, this method is uneconomical because it uses an electrolytic solution at a temperature of 50°C or higher to coat the nickel, and also has the disadvantage that it is very difficult to control the phosphorus content within the above range. be.
【0008】大韓民国特許公告第83−2611号の公
報には、銅箔の両面あるいは片面上にスズ層を被覆して
、このスズ層の上に亜鉛−バナジウム合金層を被覆する
方法が記載されている。[0008] Republic of Korea Patent Publication No. 83-2611 describes a method of coating a tin layer on both or one side of a copper foil and then coating a zinc-vanadium alloy layer on the tin layer. There is.
【0009】しかし、スズは、印刷回路の技術において
通常用いられているエッチング液の一種である過硫酸ア
ンモニウム溶液により、エッチングが殆ど不可能になる
という欠点を有している。However, tin has the disadvantage that it is almost impossible to etch with ammonium persulfate solution, a type of etchant commonly used in printed circuit technology.
【0010】0010
【発明が解決しようとする課題】この発明の目的は、高
温の熱処理後でも薬品処理後でも良好な接着力を維持し
、どのようなエッチング液でも回路のアンダーカット現
象が発生することなく良好なエッチング性を有すると共
に、絶縁樹脂層の中に銅イオンが拡散するのを抑制する
銅箔を提供することにある。[Problems to be Solved by the Invention] The object of the present invention is to maintain good adhesion even after high-temperature heat treatment or chemical treatment, and to maintain good adhesion with any etching solution without causing circuit undercut phenomenon. An object of the present invention is to provide a copper foil that has etching properties and suppresses diffusion of copper ions into an insulating resin layer.
【0011】[0011]
【課題を解決するための手段】前記課題を解決するため
、本発明の印刷回路用銅箔は、絶縁基板に接合される側
の面が粗面化処理され、該面が銅と亜鉛と第3の元素で
あるスズ,コバルト,ニッケル,ヒ素の中のある一つの
元素とを添加した3元合金層で被覆され、該3元合金層
がクロメ−ト処理されて成るものとした。[Means for Solving the Problems] In order to solve the above-mentioned problems, the copper foil for printed circuits of the present invention has a surface roughened on the side to be bonded to an insulating substrate, and the surface is made of copper and zinc. It was coated with a ternary alloy layer to which one of the three elements tin, cobalt, nickel, and arsenic was added, and the ternary alloy layer was chromate-treated.
【0012】また、本発明の印刷回路用銅箔の製造方法
では、銅箔の絶縁基板と接合される側の粗面化処理され
た面に、被覆層を電気めっき法で形成するに当たり、硫
酸銅(五水和物)24〜50g/l(リットル)、酒石
酸ナトリウム40〜60g/l、酸化亜鉛2.4〜5.
0g/l、苛性ソーダ40〜60g/l、及び第3の元
素であるスズ,コバルト,ニッケル,ヒ素の中のある一
つの元素を0.3〜3.0g/l添加しためっき液の中
で、上記粗面化処理された銅箔を陰極にして、めっき液
温35°C,直流電流密度10〜20A/dm2 で1
0sec 間処理した後、脱イオン水で水洗いし、クロ
メート処理を電解法で行うこととした。[0012] In addition, in the method for manufacturing copper foil for printed circuits of the present invention, when forming a coating layer by electroplating on the roughened surface of the copper foil on the side to be bonded to the insulating substrate, sulfuric acid is used. Copper (pentahydrate) 24-50 g/l (liter), sodium tartrate 40-60 g/l, zinc oxide 2.4-5.
In a plating solution containing 0 g/l, 40 to 60 g/l of caustic soda, and 0.3 to 3.0 g/l of one of the third elements tin, cobalt, nickel, and arsenic, Using the roughened copper foil as a cathode, plating solution temperature is 35°C and DC current density is 10 to 20 A/dm2.
After treatment for 0 seconds, it was washed with deionized water, and chromate treatment was performed by electrolytic method.
【0013】なお、前記の印刷回路用銅箔の製造方法に
おいて、第3の元素は、スズ酸ナトリウム,硫酸コバル
ト(七水和物),硫酸ニッケル(六水和物),亜ヒ酸の
中の或るひとつを選択することにより添加することがで
きる。[0013] In the above method for manufacturing copper foil for printed circuits, the third element is selected from sodium stannate, cobalt sulfate (heptahydrate), nickel sulfate (hexahydrate), and arsenite. It can be added by selecting one of them.
【0014】[0014]
【作 用】印刷回路用銅箔を、絶縁基板に接合さ
れる側の面が粗面化処理され、該面が銅と亜鉛と第3の
元素であるスズ,コバルト,ニッケル,ヒ素の中のある
一つの元素とを添加した3元合金層で被覆されたものに
することにより、耐熱性,耐薬品性が向上する。これに
より、絶縁樹脂層との間の接着力は良好に維持されると
共にアンダーカット現象が防止され、更には絶縁樹脂層
への銅イオンの拡散が防止される。また、前記3元合金
層をクロメート処理することにより、錆が防止される。[Function] The surface of the copper foil for printed circuits that is bonded to the insulating substrate is roughened, and the surface is made of copper, zinc, and the third elements tin, cobalt, nickel, and arsenic. By coating with a ternary alloy layer containing one certain element, heat resistance and chemical resistance are improved. This maintains good adhesion with the insulating resin layer, prevents undercut phenomena, and furthermore prevents copper ions from diffusing into the insulating resin layer. Further, by subjecting the ternary alloy layer to chromate treatment, rust is prevented.
【0015】[0015]
【実施例】以下、本発明の実施例を詳細に説明する。前
記のような目的を達成するため提供されるこの発明の印
刷回路用銅箔は、絶縁基板に接合される面に、直流電流
を利用して銅−亜鉛−スズ,銅−亜鉛−コバルト,銅−
亜鉛−ニッケル,あるいは銅−亜鉛−ヒ素等の3元合金
層を電着した後、電解法でクロメート処理することによ
って製造される。EXAMPLES Examples of the present invention will be described in detail below. The copper foil for printed circuits of the present invention, which is provided to achieve the above-mentioned object, has copper-zinc-tin, copper-zinc-cobalt, copper, etc. −
It is manufactured by electrodepositing a ternary alloy layer such as zinc-nickel or copper-zinc-arsenic, and then subjecting it to chromate treatment using an electrolytic method.
【0016】さらに具体的に説明すると、この発明の印
刷回路用銅箔は、基本銅層のために銅箔(以下、「基本
銅箔」と言う)を通常の方法で粗面化処理した後、硫酸
銅濃度24〜50g/l,酒石酸ナトリウム濃度40〜
60g/l,酸化亜鉛濃度2.5〜5.0g/l,苛性
ソーダ濃度40〜60g/l,及び第3の元素であるス
ズ,コバルト,ニッケルまたはヒ素の中の或る一つの元
素の濃度0.3〜3.0g/lを有するめっき液の中で
、めっき液温を25〜35°Cにし、電流密度7〜30
A/dm2 の直流電流で5〜15秒間電着して3元系
合金層を被覆した後、クロメート処理することによって
製造される。More specifically, the copper foil for printed circuits of the present invention is obtained by roughening a copper foil (hereinafter referred to as "basic copper foil") for a basic copper layer using a conventional method. , copper sulfate concentration 24~50g/l, sodium tartrate concentration 40~
60 g/l, zinc oxide concentration 2.5-5.0 g/l, caustic soda concentration 40-60 g/l, and 0 concentration of one of the third elements tin, cobalt, nickel or arsenic. In a plating solution having .3 to 3.0 g/l, the plating solution temperature is 25 to 35 °C, and the current density is 7 to 30 °C.
It is produced by electrodepositing with a direct current of A/dm2 for 5 to 15 seconds to coat a ternary alloy layer, and then subjecting it to chromate treatment.
【0017】上記基本銅箔としては、通常の印刷回路用
銅箔で使用されるものならどのようなものでも使用可能
だが、電解銅箔または圧延銅箔が好ましい。As the basic copper foil, any copper foil commonly used for printed circuits can be used, but electrolytic copper foil or rolled copper foil is preferable.
【0018】基本銅箔面に対する合金層の結合力を向上
させるためには、粗面化処理は、酸洗によるエッチング
であるが、米国特許第3,220,897号または第3
,293,910号の公報に記載された電着等により行
うのが適している。In order to improve the bonding strength of the alloy layer to the basic copper foil surface, the surface roughening treatment is etching by pickling, which is described in US Pat. No. 3,220,897 or 3
, 293,910 is suitable.
【0019】硫酸銅濃度を20g/l以下にすれば処理
時ガス発生が多く、濃度維持が難しい。50g/l以上
で高いと薬品が多く消耗される。酒石酸ナトリウムは4
0g/l未満だと、銅イオンがアルカリ溶液に水酸化物
を形成し、沈澱される。60g/l以上は、大きい差は
ないがやはり薬品の消耗が多い。If the copper sulfate concentration is lower than 20 g/l, a large amount of gas will be generated during treatment, making it difficult to maintain the concentration. If it is high (more than 50g/l), a lot of chemicals will be consumed. Sodium tartrate is 4
Below 0 g/l, copper ions form hydroxides in alkaline solutions and are precipitated. At 60 g/l or more, there is not a big difference, but the consumption of chemicals is still large.
【0020】亜鉛は銅と比率が4:1になるように量を
調節し、この比率を大きく外れると耐薬品性と耐熱性が
悪くなって合金の効果が減少する。苛性ソーダは充分に
入れて酸化亜鉛を溶解させ、銅と酒石酸塩が、安定され
た錯イオンで結合するようにする。又溶液の電気伝導度
を向上させる。The amount of zinc is adjusted so that the ratio with copper is 4:1, and if the ratio is significantly out of this range, the chemical resistance and heat resistance will deteriorate and the effectiveness of the alloy will decrease. Add enough caustic soda to dissolve the zinc oxide and allow the copper and tartrate to bond with a stable complex ion. It also improves the electrical conductivity of the solution.
【0021】そして第3の元素であるスズ,コバルト,
ニッケル,ヒ素等が0.3g/l未満で少なくすると、
合金の効果が現れず、耐薬品性及び耐熱性が低下する。
そして、3.0g/l以上になると合金の全体の組成比
が変わり、電着性が悪くなって均一なめっきが得難くな
り、非経済的である。[0021] And the third element tin, cobalt,
If nickel, arsenic, etc. are reduced to less than 0.3g/l,
The effect of the alloy will not be apparent, and the chemical resistance and heat resistance will decrease. If it exceeds 3.0 g/l, the overall composition ratio of the alloy changes, electrodepositability deteriorates, and it becomes difficult to obtain uniform plating, which is uneconomical.
【0022】また、温度が低いと電着特性が悪く、40
°C以上になると合金に銅の成分が残って耐熱性が劣る
。In addition, if the temperature is low, the electrodeposition characteristics are poor, and 40
If the temperature exceeds °C, copper components remain in the alloy, resulting in poor heat resistance.
【0023】電流密度が5A/dm2 以下では合金電
着にならない。30A/dm2 以上になるとガス発生
が甚だしくなり、液の組成が変化して合金粉末が形成さ
れ、銅箔に密着されない。[0023] If the current density is less than 5 A/dm2, alloy electrodeposition will not occur. If it exceeds 30 A/dm2, gas generation will be severe, the composition of the liquid will change, alloy powder will be formed, and it will not adhere to the copper foil.
【0024】第3の元素であるスズ,コバルト,ニッケ
ル,ヒ素等は、銅の拡散を抑制し亜鉛が酸で早く溶解さ
れるのを抑制する効果があった。これらの元素はアルカ
リ性溶液に溶ける塩の形態で添加すれば良い。この合金
層が形成されると、クロメート処理には電解法を用いる
。ここで、クロメート処理法は、液の組成をニクロム酸
ナトリウム5g/lとし、常温で電位約30vにして、
ガスが発生されるように約5秒間実行する。ガス発生は
、銅箔の表面が酸化されるのを防止する。以下に、この
発明の具体的な実施態様例及び比較例を示すが、この発
明は下記実施態様例に限定されず、発明の範囲内で自由
に変更できる。The third element, tin, cobalt, nickel, arsenic, etc., has the effect of suppressing copper diffusion and preventing zinc from being quickly dissolved by acid. These elements may be added in the form of salts that are soluble in an alkaline solution. Once this alloy layer is formed, an electrolytic method is used for chromate treatment. Here, in the chromate treatment method, the composition of the solution is 5 g/l of sodium dichromate, the potential is about 30 V at room temperature,
Run for about 5 seconds to allow gas to evolve. Gas generation prevents the surface of the copper foil from being oxidized. Specific embodiments and comparative examples of the present invention are shown below, but the present invention is not limited to the following embodiments and can be freely modified within the scope of the invention.
【0025】(実施態様例1)硫酸銅(五水和物)48
g/l,酒石酸ナトリウム60g/l,酸化亜鉛4.1
g/l,苛性ソーダ60g/l及びスズ酸ナトリウム0
.5g/lで組成された溶液を電解液として使用し、3
5μm厚さの銅箔を陰極とした。液温を35°Cにし、
直流電流密度を10,15,20A/dm2 とし、そ
れぞれ10sec 間めっき処理した後、めっきされた
銅箔を脱イオン水で水洗いした。つぎに、ニクロム酸ナ
トリウム5g/lの溶液中で、液温25°C、電位30
Vで5sec 間クロメート処理した。(Embodiment Example 1) Copper sulfate (pentahydrate) 48
g/l, sodium tartrate 60g/l, zinc oxide 4.1
g/l, caustic soda 60g/l and sodium stannate 0
.. A solution composed of 5 g/l was used as the electrolyte, and 3
A 5 μm thick copper foil was used as the cathode. Set the liquid temperature to 35°C,
After plating for 10 seconds at DC current densities of 10, 15, and 20 A/dm2, the plated copper foil was washed with deionized water. Next, in a solution of 5 g/l of sodium dichromate, the solution temperature was 25°C and the potential was 30°C.
Chromate treatment was performed with V for 5 seconds.
【0026】(実施態様例2)実施態様例1の電解液の
組成として、スズ酸ナトリウムのかわりに硫酸コバルト
(七水和物)0.5g/lを含有させることを除き、実
施態様例1と同一の方法で銅箔の表面を処理した。(Embodiment Example 2) Embodiment Example 1 except that the electrolytic solution of Embodiment Example 1 contains 0.5 g/l of cobalt sulfate (heptahydrate) instead of sodium stannate. The surface of the copper foil was treated in the same manner as above.
【0027】(実施態様例3)実施態様例1の電解液の
組成として、スズ酸ナトリウムのかわりに硫酸ニッケル
(六水和物)0.5g/lを含有させることを除き、実
施態様例1と同一の方法で銅箔表面を処理した。(Embodiment Example 3) Embodiment Example 1 except that the electrolytic solution of Embodiment Example 1 contains 0.5 g/l of nickel sulfate (hexahydrate) instead of sodium stannate. The copper foil surface was treated in the same manner as above.
【0028】(実施態様例4)実施態様例1の電解液の
組成として、スズ酸ナトリウムのかわりに亜ヒ酸0.5
gを含有させることを除き、実施態様例1と同一の方法
で銅箔表面を処理した。(Embodiment Example 4) As the composition of the electrolytic solution of Embodiment Example 1, 0.5 arsenite was added instead of sodium stannate.
The surface of the copper foil was treated in the same manner as in Embodiment Example 1, except for containing g.
【0029】(比較例)硫酸亜鉛濃度10g/l,pH
5の溶液を電解液として使用し、35μ厚さの銅箔を陰
極にして、液温30°C、電流密度5A/dm2 で5
sec 間処理した後、脱イオン水で水洗いし、上記実
施態様例1と同一の条件でクロメート処理する。(Comparative example) Zinc sulfate concentration 10 g/l, pH
5 was used as the electrolyte, a 35 μ thick copper foil was used as the cathode, the solution temperature was 30°C, and the current density was 5 A/dm2.
After being treated for 20 seconds, the sample is washed with deionized water and chromate treated under the same conditions as in Embodiment 1 above.
【0030】以上の実施態様例と比較例の被膜を、ガラ
ス繊維−エポキシ樹脂絶縁基板と積層成形し、その接着
強度を測定した。また温度210°Cの熱風で630分
間熱処理した後に、接着強度を測定した。さらに5N−
HCI溶液に1時浸漬処理した後、接着強度低下率(%
)を測定した。その測定結果を図1に示す。The coatings of the embodiment examples and comparative examples described above were laminated and molded on a glass fiber-epoxy resin insulating substrate, and the adhesive strength thereof was measured. Furthermore, the adhesive strength was measured after heat treatment with hot air at a temperature of 210°C for 630 minutes. Further 5N-
After being immersed in HCI solution for 1 hour, the adhesive strength reduction rate (%
) was measured. The measurement results are shown in FIG.
【0031】[0031]
【発明の効果】以上述べた如く、本発明の印刷回路用銅
箔及びその製造方法によれば、絶縁基板に接合される側
の面が粗面化処理され、該面が銅と亜鉛と第3の元素で
あるスズ,コバルト,ニッケル,ヒ素の中のある一つの
元素とを添加した3元合金層で被覆されるので、耐熱性
,耐薬品性が向上する。そのため、絶縁樹脂層との間の
接着力は良好に維持されると共にアンダーカット現象が
防止され、更には絶縁樹脂層への銅イオンの拡散が防止
される。また、前記3元合金層をクロメート処理するこ
とにより、印刷回路用銅箔の表面に錆が発生するのが防
止される。Effects of the Invention As described above, according to the copper foil for printed circuits and the manufacturing method thereof of the present invention, the surface to be bonded to the insulating substrate is roughened, and the surface is roughened with copper, zinc, and copper foil. Since it is coated with a ternary alloy layer containing one of the three elements tin, cobalt, nickel, and arsenic, heat resistance and chemical resistance are improved. Therefore, the adhesion between the insulating resin layer and the insulating resin layer is maintained well, the undercut phenomenon is prevented, and furthermore, the diffusion of copper ions into the insulating resin layer is prevented. Furthermore, by subjecting the ternary alloy layer to the chromate treatment, rust is prevented from forming on the surface of the copper foil for printed circuits.
【図1】実施態様例と比較例とにおける接着強度を対比
する図[Figure 1] Diagram comparing adhesive strength between embodiment examples and comparative examples
Claims (3)
処理され、該面が銅と亜鉛と第3の元素であるスズ,コ
バルト,ニッケル,ヒ素の中のある一つの元素とを添加
した3元合金層で被覆され、該3元合金層がクロメート
処理されて成ることを特徴とする印刷回路用銅箔。Claim 1: The surface to be bonded to the insulating substrate is roughened, and the surface contains copper, zinc, and one of the third elements tin, cobalt, nickel, and arsenic. A copper foil for printed circuits, characterized in that it is coated with an added ternary alloy layer, and the ternary alloy layer is chromate-treated.
化処理された面に、被覆層を電気めっき法で形成するに
当たり、硫酸銅(五水和物)24〜50g/l、酒石酸
ナトリウム40〜60g/l、酸化亜鉛2.4〜5.0
g/l、苛性ソーダ40〜60g/l、及び第3の元素
であるスズ,コバルト,ニッケル,ヒ素の中のある一つ
の元素を0.3〜3.0g/l添加しためっき液の中で
、上記粗面化処理された銅箔を陰極にして、めっき液温
35°C,直流電流密度10〜20A/dm2 で10
sec 間処理した後、脱イオン水で水洗いし、クロメ
−ト処理を電解法で行うことを特徴とする印刷回路用銅
箔の製造方法。2. When forming a coating layer by electroplating on the roughened surface of the copper foil to be bonded to the insulating substrate, 24 to 50 g/l of copper sulfate (pentahydrate), Sodium tartrate 40-60g/l, zinc oxide 2.4-5.0
g/l, 40 to 60 g/l of caustic soda, and 0.3 to 3.0 g/l of one of the third elements tin, cobalt, nickel, and arsenic, in a plating solution. Using the roughened copper foil as a cathode, plating solution temperature is 35°C and DC current density is 10 to 20 A/dm2.
1. A method for manufacturing a copper foil for printed circuits, which comprises treating the copper foil for 20 seconds, washing with deionized water, and performing a chromate treatment using an electrolytic method.
酸コバルト(七水和物),硫酸ニッケル(六水和物),
亜ヒ酸の中の或るひとつを選択することにより添加する
ことを特徴とする請求項2記載の印刷回路用銅箔の製造
方法。Claim 3: The third element is sodium stannate, cobalt sulfate (heptahydrate), nickel sulfate (hexahydrate),
3. The method for producing a copper foil for printed circuits according to claim 2, wherein one selected from arsenite is added.
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR1991-P-3871 | 1991-03-11 | ||
KR1019910003871A KR930006103B1 (en) | 1991-03-11 | 1991-03-11 | Printed circuit for electrolysis copper foil & method |
Publications (1)
Publication Number | Publication Date |
---|---|
JPH04318997A true JPH04318997A (en) | 1992-11-10 |
Family
ID=19311976
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP3317503A Pending JPH04318997A (en) | 1991-03-11 | 1991-11-05 | Copper foil for printed circuit and manufacture thereof |
Country Status (2)
Country | Link |
---|---|
JP (1) | JPH04318997A (en) |
KR (1) | KR930006103B1 (en) |
Cited By (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP1006763A2 (en) * | 1998-11-30 | 2000-06-07 | Mitsui Mining & Smelting Co., Ltd. | Copper foil for printed wiring board having excellent chemical resistance and heat resistance |
US6342308B1 (en) * | 1999-09-29 | 2002-01-29 | Yates Foil Usa, Inc. | Copper foil bonding treatment with improved bond strength and resistance to undercutting |
EP1185152A1 (en) * | 2000-01-28 | 2002-03-06 | Mitsui Mining & Smelting Co., Ltd. | Surface treated copper foil and method for preparing the same and copper-clad laminate using the same |
EP1185151A1 (en) * | 2000-01-28 | 2002-03-06 | Mitsui Mining & Smelting Co., Ltd. | Surface treated copper foil and method for preparing the same and copper-clad laminate using the same |
JP2004349693A (en) * | 2003-04-30 | 2004-12-09 | Mec Kk | Resin adhesive layer on surface of copper |
JP2009286071A (en) * | 2008-05-30 | 2009-12-10 | Mitsui Mining & Smelting Co Ltd | Copper clad laminate, surface treated copper foil used for manufacturing the same, and printed wiring board obtained using this copper clad laminate |
JP2012094918A (en) * | 2003-04-30 | 2012-05-17 | Mec Kk | To-resin adhesive layer on surface of copper, wiring board, and method for forming adhesive layer |
Families Citing this family (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR100294394B1 (en) * | 1997-12-13 | 2001-09-17 | 권문구 | Electro-deposited copper foil for printing circuit board and method for manufacturing the same |
Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH0471292A (en) * | 1990-06-05 | 1992-03-05 | Fukuda Metal Foil & Powder Co Ltd | Copper foil for printed circuit and surface treatment thereof |
-
1991
- 1991-03-11 KR KR1019910003871A patent/KR930006103B1/en not_active IP Right Cessation
- 1991-11-05 JP JP3317503A patent/JPH04318997A/en active Pending
Patent Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH0471292A (en) * | 1990-06-05 | 1992-03-05 | Fukuda Metal Foil & Powder Co Ltd | Copper foil for printed circuit and surface treatment thereof |
Cited By (10)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP1006763A2 (en) * | 1998-11-30 | 2000-06-07 | Mitsui Mining & Smelting Co., Ltd. | Copper foil for printed wiring board having excellent chemical resistance and heat resistance |
EP1006763A3 (en) * | 1998-11-30 | 2002-06-19 | Mitsui Mining & Smelting Co., Ltd. | Copper foil for printed wiring board having excellent chemical resistance and heat resistance |
US6342308B1 (en) * | 1999-09-29 | 2002-01-29 | Yates Foil Usa, Inc. | Copper foil bonding treatment with improved bond strength and resistance to undercutting |
EP1185152A1 (en) * | 2000-01-28 | 2002-03-06 | Mitsui Mining & Smelting Co., Ltd. | Surface treated copper foil and method for preparing the same and copper-clad laminate using the same |
EP1185151A1 (en) * | 2000-01-28 | 2002-03-06 | Mitsui Mining & Smelting Co., Ltd. | Surface treated copper foil and method for preparing the same and copper-clad laminate using the same |
EP1185151A4 (en) * | 2000-01-28 | 2006-11-22 | Mitsui Mining & Smelting Co | Surface treated copper foil and method for preparing the same and copper-clad laminate using the same |
EP1185152A4 (en) * | 2000-01-28 | 2006-11-22 | Mitsui Mining & Smelting Co | Surface treated copper foil and method for preparing the same and copper-clad laminate using the same |
JP2004349693A (en) * | 2003-04-30 | 2004-12-09 | Mec Kk | Resin adhesive layer on surface of copper |
JP2012094918A (en) * | 2003-04-30 | 2012-05-17 | Mec Kk | To-resin adhesive layer on surface of copper, wiring board, and method for forming adhesive layer |
JP2009286071A (en) * | 2008-05-30 | 2009-12-10 | Mitsui Mining & Smelting Co Ltd | Copper clad laminate, surface treated copper foil used for manufacturing the same, and printed wiring board obtained using this copper clad laminate |
Also Published As
Publication number | Publication date |
---|---|
KR930006103B1 (en) | 1993-07-07 |
KR920019222A (en) | 1992-10-22 |
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