JPH04310815A - Laser type height measuring apparatus - Google Patents

Laser type height measuring apparatus

Info

Publication number
JPH04310815A
JPH04310815A JP7666591A JP7666591A JPH04310815A JP H04310815 A JPH04310815 A JP H04310815A JP 7666591 A JP7666591 A JP 7666591A JP 7666591 A JP7666591 A JP 7666591A JP H04310815 A JPH04310815 A JP H04310815A
Authority
JP
Japan
Prior art keywords
light
laser
measured
signal
output
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP7666591A
Other languages
Japanese (ja)
Inventor
Takehiko Maeda
武彦 前田
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Corp
Original Assignee
NEC Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NEC Corp filed Critical NEC Corp
Priority to JP7666591A priority Critical patent/JPH04310815A/en
Publication of JPH04310815A publication Critical patent/JPH04310815A/en
Pending legal-status Critical Current

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  • Length Measuring Devices By Optical Means (AREA)
  • Measurement Of Optical Distance (AREA)

Abstract

PURPOSE:To eliminate an error in measurement due to a change in the quantity of reflected light from the surface of a substance to be measured. CONSTITUTION:A laser light from a linear polarization laser light source 1 is projected by a projecting lens 4 onto a substance 5 to be measured. A reflected light from the surface of the substance 5 is condensed on a one- dimensional PSD sensor 7 by a light-sensing lens 6. Output signals from the opposite ends of the one-dimensional PSD sensor 7 are computed by a subtracter 8, an adder 9 and a divider 10 and thereby a height signal (b) is determined. Between the linear polarization laser light source 1 and a light-projecting lens 4, an electro-optical crystal element 2 rotating the direction of polarization of the laser light according to a light qnantity signal (a) and a polarizing plate 3 disposed in combination with the electro-optical crystal element 2 so that all of the laser lights be transmitted when the light quantity signal (a) is zero are interposed, and thereby a change in the quantity of the reflected light due to the state of the surface of the substance 5 to be measured and others is reduced.

Description

【発明の詳細な説明】[Detailed description of the invention]

【0001】0001

【産業上の利用分野】本発明は、レーザ式高さ測定装置
に関する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a laser height measuring device.

【0002】0002

【従来の技術】従来のレーザ式高さ測定装置は、レーザ
光源からのレーザ光を被測定物に投光するための投光レ
ンズと、被測定物の表面からの反射光を集光する受光レ
ンズと、受光レンズによる集光ビームスポット位置を検
出する一次元位置検出素子と、一次元位置検出素子の両
端からの出力信号を減算する減算器と、一次元位置検出
素子の両端からの出力信号を加算し光量信号を出力する
加算器と、減算器の出力と加算器の出力から高さ信号を
演算する除算器とを含んで構成されている。
[Prior Art] A conventional laser height measuring device includes a light projection lens for projecting laser light from a laser light source onto an object to be measured, and a light receiving lens for condensing the reflected light from the surface of the object to be measured. A lens, a one-dimensional position detection element that detects the focused beam spot position by the light receiving lens, a subtracter that subtracts output signals from both ends of the one-dimensional position detection element, and output signals from both ends of the one-dimensional position detection element. and a divider that calculates a height signal from the output of the subtracter and the output of the adder.

【0003】次に従来のレーザ式高さ測定装置について
図面を参照して詳細に説明する。図2は従来のレーザ式
高さ測定装置の一例を示す光路図である。
Next, a conventional laser height measuring device will be explained in detail with reference to the drawings. FIG. 2 is an optical path diagram showing an example of a conventional laser height measuring device.

【0004】図2に示す従来のレーザ式高さ測定装置は
、レーザ光源1からのレーザ光を被測定物5に投光する
ための投光レンズ4と、被測定物5の表面からの反射光
を集光する受光レンズ6と、受光レンズ6による集光ビ
ームスポット位置を検出する一次元位置検出素子7と、
一次元位置検出素子7の両端からの出力信号を減算する
減算器8と、一次元位置検出素子7の両端からの出力信
号を加算し光量信号aを出力する加算器9と、減算器8
の出力と加算器9の出力から高さ信号bを演算する除算
器10とを含んで構成されている。
The conventional laser height measuring device shown in FIG. a light-receiving lens 6 that focuses light; a one-dimensional position detection element 7 that detects the position of the focused beam spot by the light-receiving lens 6;
A subtracter 8 that subtracts the output signals from both ends of the one-dimensional position detection element 7, an adder 9 that adds the output signals from both ends of the one-dimensional position detection element 7 and outputs a light amount signal a, and a subtracter 8.
and a divider 10 that calculates a height signal b from the output of the adder 9 and the output of the adder 9.

【0005】[0005]

【発明が解決しようとする課題】上述した従来のレーザ
式高さ測定装置は、被測定物5の表面からの反射光量の
変化による高さ測定精度の悪化を一次元位置検出素子7
からの出力信号を減算器8、加算器9、および除算器1
0を用いて正規化することにより防ぐ構成となっている
が、被測定物5の表面からの反射光量の変化が大きな場
合、除算器10の入力信号のレンジが大きくなり、すべ
ての光量での高さ測定の精度を保証することが困難にな
ると言う欠点があった。
[Problems to be Solved by the Invention] The above-described conventional laser-type height measuring device uses one-dimensional position detecting element 7 to prevent deterioration in height measurement accuracy due to changes in the amount of light reflected from the surface of object 5.
The output signals from subtracter 8, adder 9, and divider 1
The structure is configured to prevent this by normalizing using 0. However, if there is a large change in the amount of reflected light from the surface of the object to be measured 5, the range of the input signal to the divider 10 becomes large, and the There was a drawback that it became difficult to guarantee the accuracy of height measurement.

【0006】また、上記欠点を防ぐためにレーザ光源に
半導体レーザを用いて、その出力を変えて光量を調整す
る方式も考えられるが、そのように半導体レーザを光源
に用いた場合には、光量を絞りすぎると発振が不安定に
なり光量変動を起こしたり、また熱的平衡がくずれ光軸
が変化するなどの問題があり、正確な測定ができなくな
るという欠点がある。
[0006]Also, in order to prevent the above-mentioned drawbacks, it is possible to use a semiconductor laser as a laser light source and adjust the light intensity by changing its output. If the aperture is too narrow, the oscillation becomes unstable, causing fluctuations in the amount of light, and the thermal equilibrium is disrupted, causing the optical axis to change, making accurate measurements impossible.

【0007】[0007]

【課題を解決するための手段】本発明のレーザ式高さ測
定装置は、直線偏光レーザ光源からのレーザ光を被測定
物に投光するための投光レンズと、被測定物の表面から
の反射光を集光する受光レンズと、受光レンズによる集
光ビームスポット位置を検出する一次元位置検出素子と
、一次元位置検出素子の両端からの出力信号を減算する
減算器と、一次元位置検出素子の両端からの出力信号を
加算し光量信号を出力する加算器と、減算器の出力と加
算器の出力から高さ信号を演算する除算器と、光量信号
によりレーザ光の偏光方向を回転させる電気光学的結晶
素子と、光量信号がゼロの場合にすべてのレーザ光が透
過するように電気光学的結晶素子と組み合わせて配置さ
れた偏光板とを含んで構成されている。
[Means for Solving the Problems] The laser height measuring device of the present invention includes a projection lens for projecting laser light from a linearly polarized laser light source onto an object to be measured; A light receiving lens that collects reflected light, a one-dimensional position detecting element that detects the position of the focused beam spot by the light receiving lens, a subtractor that subtracts output signals from both ends of the one-dimensional position detecting element, and a one-dimensional position detecting element. An adder that adds the output signals from both ends of the element and outputs a light intensity signal, a divider that calculates a height signal from the output of the subtracter and the output of the adder, and a divider that rotates the polarization direction of the laser beam using the light intensity signal. It is configured to include an electro-optic crystal element and a polarizing plate arranged in combination with the electro-optic crystal element so that all laser light is transmitted when the light amount signal is zero.

【0008】[0008]

【実施例】次に、本発明について、図面を参照して詳細
に説明する。図1は本発明の一実施例を示す光路図であ
る。
DESCRIPTION OF THE PREFERRED EMBODIMENTS Next, the present invention will be explained in detail with reference to the drawings. FIG. 1 is an optical path diagram showing an embodiment of the present invention.

【0009】図1に示すレーザ式高さ測定装置は、直線
偏光レーザ光源1からのレーザ光を被測定物5に投光す
るための投光レンズ4と、被測定物5の表面からの反射
光を集光する受光レンズ6と、受光レンズ6による集光
ビームスポット位置を検出する一次元位置検出素子7と
、一次元位置検出素子7の両端からの出力信号を減算す
る減算器8と、一次元位置検出素子7の両端からの出力
信号を加算し光量信号aを出力する加算器9と、減算器
8の出力と加算器9の出力から高さ信号bを演算する除
算器10と、光量信号aによりレーザ光の偏光方向を回
転させるという性質を持った電気光学的結晶素子2と、
光量信号aがゼロの場合にすべてのレーザ光が透過する
ように電気光学的結晶素子2と組み合わせて配置された
偏光板3とを含んで構成されている。
The laser-type height measuring device shown in FIG. A light receiving lens 6 that collects light, a one-dimensional position detecting element 7 that detects the position of the focused beam spot by the light receiving lens 6, and a subtracter 8 that subtracts output signals from both ends of the one-dimensional position detecting element 7. an adder 9 that adds output signals from both ends of the one-dimensional position detection element 7 and outputs a light amount signal a; a divider 10 that calculates a height signal b from the output of the subtracter 8 and the output of the adder 9; an electro-optic crystal element 2 having a property of rotating the polarization direction of the laser beam according to the light amount signal a;
It is configured to include a polarizing plate 3 arranged in combination with an electro-optic crystal element 2 so that all the laser beams are transmitted when the light amount signal a is zero.

【0010】0010

【発明の効果】本発明のレーザ式高さ測定装置は、被測
定物から一次元位置検出素子への反射光量を測定し、そ
の光量信号の大きさに従って被測定物への入射光量を電
気光学的結晶素子と偏光板の組合せによる一種の可変フ
ィルターで変化させることで、被測定物の表面状態等に
よる反射光量の変化を抑えることができ、その結果、被
測定物の表面状態にかかわらず高さ測定を高精度で行う
ことができるという効果がある。
[Effects of the Invention] The laser height measuring device of the present invention measures the amount of light reflected from the object to be measured to the one-dimensional position detection element, and measures the amount of light incident on the object according to the magnitude of the light amount signal using an electro-optical method. By changing the amount of reflected light with a type of variable filter that is a combination of a crystal element and a polarizing plate, it is possible to suppress changes in the amount of reflected light due to the surface condition of the object to be measured. This has the effect of making it possible to perform high-precision measurements.

【図面の簡単な説明】[Brief explanation of drawings]

【図1】本発明の一実施例を示す光路図である。FIG. 1 is an optical path diagram showing one embodiment of the present invention.

【図2】従来の一例を示す光路図である。FIG. 2 is an optical path diagram showing a conventional example.

【符号の説明】[Explanation of symbols]

1    レーザ光源 2    電気光学的結晶素子 3    偏光板 4    投光レンズ 5    被測定物 6    集光レンズ 7    一次元位置検出素子 8    減算器 9    加算器 10    除算器 a    光量信号 b    高さ信号 1 Laser light source 2 Electro-optic crystal element 3 Polarizing plate 4      Flooding lens 5 Object to be measured 6. Condensing lens 7 One-dimensional position detection element 8 Subtractor 9 Adder 10 Divider a Light amount signal b Height signal

Claims (1)

【特許請求の範囲】[Claims] 【請求項1】  直線偏光レーザ光源からのレーザ光を
被測定物に投光するための投光レンズと、前記被測定物
の表面からの反射光を集光する受光レンズと、前記受光
レンズによる集光ビームスポット位置を検出する一次元
位置検出素子と、一次元位置検出素子の両端からの出力
信号を減算する減算器と、一次元位置検出素子の両端か
らの出力信号を加算し光量信号を出力する加算器と、前
記減算器の出力と前記加算器の出力から高さ信号を演算
する除算器と、光量信号によりレーザ光の偏光方向を回
転させる電気光学的結晶素子と、光量信号がゼロの場合
にすべてのレーザ光が透過するように電気光学的結晶素
子と組み合わせて配置された偏光板とを含むことを特徴
とするレーザ式高さ測定装置。
1. A light projecting lens for projecting laser light from a linearly polarized laser light source onto an object to be measured, a light receiving lens for condensing reflected light from the surface of the object to be measured, and a light receiving lens configured by the light receiving lens. A one-dimensional position detection element that detects the focused beam spot position, a subtracter that subtracts the output signals from both ends of the one-dimensional position detection element, and a light amount signal that adds the output signals from both ends of the one-dimensional position detection element. an adder for outputting an output, a divider for calculating a height signal from the output of the subtracter and the output of the adder, an electro-optic crystal element for rotating the polarization direction of the laser beam according to the light amount signal, and a light amount signal of zero. 1. A laser height measuring device comprising: a polarizing plate arranged in combination with an electro-optic crystal element so that all laser light passes through in the case of .
JP7666591A 1991-04-10 1991-04-10 Laser type height measuring apparatus Pending JPH04310815A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP7666591A JPH04310815A (en) 1991-04-10 1991-04-10 Laser type height measuring apparatus

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP7666591A JPH04310815A (en) 1991-04-10 1991-04-10 Laser type height measuring apparatus

Publications (1)

Publication Number Publication Date
JPH04310815A true JPH04310815A (en) 1992-11-02

Family

ID=13611709

Family Applications (1)

Application Number Title Priority Date Filing Date
JP7666591A Pending JPH04310815A (en) 1991-04-10 1991-04-10 Laser type height measuring apparatus

Country Status (1)

Country Link
JP (1) JPH04310815A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2016121081A1 (en) * 2015-01-30 2016-08-04 株式会社 日立ハイテクノロジーズ Semiconductor inspection device

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2016121081A1 (en) * 2015-01-30 2016-08-04 株式会社 日立ハイテクノロジーズ Semiconductor inspection device

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