JPH04305914A - Substrate carrying method in photoresist processing equipment - Google Patents

Substrate carrying method in photoresist processing equipment

Info

Publication number
JPH04305914A
JPH04305914A JP9807091A JP9807091A JPH04305914A JP H04305914 A JPH04305914 A JP H04305914A JP 9807091 A JP9807091 A JP 9807091A JP 9807091 A JP9807091 A JP 9807091A JP H04305914 A JPH04305914 A JP H04305914A
Authority
JP
Japan
Prior art keywords
processing
substrate
equipment
processing equipment
substrates
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP9807091A
Other languages
Japanese (ja)
Other versions
JP3043094B2 (en
Inventor
Tetsuya Hamada
哲也 濱田
Kensho Yokono
憲昭 横野
Nobutoshi Ogami
大神 信敏
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Dainippon Screen Manufacturing Co Ltd
Original Assignee
Dainippon Screen Manufacturing Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Dainippon Screen Manufacturing Co Ltd filed Critical Dainippon Screen Manufacturing Co Ltd
Priority to JP3098070A priority Critical patent/JP3043094B2/en
Publication of JPH04305914A publication Critical patent/JPH04305914A/en
Application granted granted Critical
Publication of JP3043094B2 publication Critical patent/JP3043094B2/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

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  • Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
  • Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)

Abstract

PURPOSE:To improve the degree of freedom in the arrangement of a processing equipment by simplifying the control of a carrying robot for carrying a substrate. CONSTITUTION:Carrying processes successively carrying substrates in the ascending order of numeric values are prepared including equipments (fourteen kinds), which must carry the substrates, at the sixteen positions of IND, HP1, CP1, SC1, HP2, CP2, IFA, EEW, IFB, HP3, CP3, SC2, HP4, CP4, IFA and IND as carrying processes. When the substrates are carried according to the carrying processes, the substrates carried and passed through each treating equipment in a pre-stage module M1 are not only passed simply in a post-module M2 but also edge-exposed by the edge exposure treating equipment EEW in the post-stage module M2.

Description

【発明の詳細な説明】[Detailed description of the invention]

【0001】0001

【産業上の利用分野】本発明は、外部機器により施され
る外部工程を挟んでその前後に異なるフォトレジスト処
理用の処理工程とこれに付随する種々の工程を行なうフ
ォトレジスト処理装置における基板搬送方法に関する。
[Industrial Application Field] The present invention relates to substrate transportation in a photoresist processing apparatus that performs different photoresist processing steps and various accompanying steps before and after an external step performed by external equipment. Regarding the method.

【0002】0002

【従来の技術】従来、この種のフォトレジスト処理装置
は、例えば、露光工程である外部工程以前に使用される
レジスト塗布機器及び熱処理機器並びにこれに付随する
種々の工程に使用する各処理機器を集合配置して一つの
モジュールを構成し、外部工程以後に使用される現像処
理機器及び熱処理機器並びにこれに付随する種々の工程
に使用する各処理機器を集合配置して別のモジュールを
構成している。
2. Description of the Related Art Conventionally, this type of photoresist processing apparatus has, for example, resist coating equipment and heat treatment equipment used before an external process such as an exposure process, as well as processing equipment used in various processes associated therewith. One module is configured by arranging them together, and another module is configured by arranging development processing equipment and heat treatment equipment used after the external process, and each processing equipment used in various processes associated therewith. There is.

【0003】つまり、図4に示すように、前段モジュー
ルM1として、レジスト塗布機器SC1と、この前後に
加熱処理を施すための加熱処理機器HP1,HP2と、
冷却処理を施すための冷却処理機器CP1,CP2とを
備え、後段モジュールM2として、現像処理機器SC2
と、この前後に加熱処理を施すための加熱処理機器HP
3,HP4と、冷却処理を施すための冷却処理機器CP
3,CP4とを備える。
That is, as shown in FIG. 4, the front module M1 includes a resist coating device SC1, heat treatment devices HP1 and HP2 for performing heat treatment before and after the resist coating device SC1.
It includes cooling processing equipment CP1 and CP2 for performing cooling processing, and a developing processing equipment SC2 as a subsequent module M2.
And heat treatment equipment HP to perform heat treatment before and after this
3. HP4 and cooling processing equipment CP for performing cooling processing
3, CP4.

【0004】また、前段モジュールM1に基板を受け渡
したり前段モジュールM1から受け取った基板を図示し
ないカセット内に収納する基板収納ユニットINDと、
前段モジュールM1と後段モジュールM2との間で基板
授受を行なう中間基板授受ユニットIFAと、後段モジ
ュールM2と露光処理機器EPとの間で基板授受を行な
う終端基板授受ユニットIFBとを備える。なお、上記
各モジュールには、前段モジュールM1内の各処理機器
間における基板搬送と基板収納ユニットIND及び中間
基板授受ユニットIFAに対する基板授受とを行なうた
めの搬送ロボットR1と、後段モジュールM2内の各処
理機器間における基板搬送と中間基板授受ユニットIF
A及び終端基板授受ユニットIFBに対する基板授受と
を行なうための搬送ロボットR2とを備えている。
[0004] Also, a substrate storage unit IND that delivers the substrate to the front module M1 or stores the substrate received from the front module M1 in a cassette (not shown);
It includes an intermediate substrate transfer unit IFA that transfers substrates between the front module M1 and the rear module M2, and a terminal substrate transfer unit IFB that transfers substrates between the rear module M2 and the exposure processing equipment EP. Each of the above modules includes a transfer robot R1 for transferring substrates between each processing device in the front module M1 and transferring substrates to and from the substrate storage unit IND and the intermediate substrate transfer unit IFA, and a transfer robot R1 for transferring substrates between each processing device in the front module M1, and a transfer robot R1 for transferring substrates between each processing device in the front module M1 and transferring substrates to and from the substrate storage unit IND and the intermediate substrate transfer unit IFA, and each module in the rear module M2. Substrate transport between processing equipment and intermediate substrate transfer unit IF
A and a transfer robot R2 for transferring substrates to and from the terminal substrate transfer unit IFB.

【0005】そして上記構成のフォトレジスト処理装置
で基板に所定の処理を施すに当たっては、各モジュール
毎に作成された搬送プロセスに従って基板搬送が行なわ
れている。
[0005] When performing a predetermined process on a substrate using the photoresist processing apparatus having the above structure, the substrate is transferred according to a transfer process created for each module.

【0006】具体的には、露光工程以前に行なう前段処
理の搬送プロセスとして、 M1−■  基板収納ユニットIND M1−■  加熱処理機器HP1 M1−■  冷却処理機器CP1 M1−■  レジスト塗布機器SC1 M1−■  加熱処理機器HP2 M1−■  冷却処理機器CP2 M1−■  中間基板授受ユニットIFAの7箇所の基
板搬送対象機器を含む搬送プロセスを作成し、この搬送
プロセスに従った順序で、基板収納ユニットINDから
中間基板授受ユニットIFAまで、基板を搬送すること
で前段モジュールM1内にて上記前段処理を施す。
[0006] Specifically, the transport process of the pre-processing performed before the exposure process is as follows: M1-■ Substrate storage unit IND M1-■ Heating processing equipment HP1 M1-■ Cooling processing equipment CP1 M1-■ Resist coating equipment SC1 M1- ■Heating processing equipment HP2 M1-■Cooling processing equipment CP2 M1-■Create a transport process that includes the seven substrate transport target devices of the intermediate board transfer unit IFA, and in the order according to this transport process, from the board storage unit IND. By transporting the substrate to the intermediate board transfer unit IFA, the above-mentioned pre-processing is performed in the pre-stage module M1.

【0007】また、前段処理の施された基板を受け取っ
て露光工程に搬送し当該露光工程以後に行なう後段処理
の搬送プロセスとして、 M2−■  中間基板授受ユニットIFAM2−■  
終端基板授受ユニットIFBM2−■  加熱処理機器
HP3 M2−■  冷却処理機器CP3 M2−■  現像処理機器SC2 M2−■  加熱処理機器HP4 M2−■  冷却処理機器CP4 M2−■  中間基板授受ユニットIFAの8箇所の基
板搬送対象機器を含む搬送プロセスを作成し、この搬送
プロセスに従った順序で、中間基板授受ユニットIFA
から終端基板授受ユニットIFBまで一旦基板を搬送す
る。その後、外部の露光処理機器EPで露光処理の施さ
れた基板を終端基板授受ユニットIFBから中間基板授
受ユニットIFAまで搬送する間に、後段モジュールM
2内にて上記後段処理を施す。
[0007] Furthermore, as a transport process for receiving the substrate subjected to the pre-processing and transporting it to the exposure process and performing the post-processing after the exposure process, an intermediate substrate transfer unit IFAM2-■ is used.
Termination board transfer unit IFBM2-■ Heat processing equipment HP3 M2-■ Cooling processing equipment CP3 M2-■ Development processing equipment SC2 M2-■ Heat processing equipment HP4 M2-■ Cooling processing equipment CP4 M2-■ 8 locations of intermediate board transfer unit IFA Create a transfer process that includes the devices to be transferred to the intermediate board transfer unit IFA in the order according to this transfer process.
The board is once transported from there to the terminal board transfer unit IFB. After that, while the substrate subjected to exposure processing by the external exposure processing equipment EP is transported from the terminal board transfer unit IFB to the intermediate board transfer unit IFA, the subsequent module M
The above-mentioned post-processing is performed in step 2.

【0008】[0008]

【発明が解決しようとする課題】しかしながら、上記従
来の基板搬送方法では、後段処理の完了した基板を中間
基板授受ユニットIFAから基板収納ユニットINDま
で直接搬送する搬送プロセスが更に必要となる。このた
め、基板収納ユニットINDから取り出されてこの基板
収納ユニットINDに返送されるまでの基板搬送を行な
うためには、いく種類もの搬送プロセスを用いつつ搬送
ロボットR1,R2を制御しなければならず、煩雑であ
る。
However, the conventional substrate transport method described above requires a further transport process for directly transporting the substrates that have undergone post-processing from the intermediate substrate transfer unit IFA to the substrate storage unit IND. Therefore, in order to transport the substrate from being taken out from the substrate storage unit IND to being returned to this substrate storage unit IND, it is necessary to control the transport robots R1 and R2 while using various types of transport processes. , is complicated.

【0009】また、前段処理完了後に中間基板授受ユニ
ットIFAから露光処理機器EPまで基板を搬送する間
や、後段処理完了後に中間基板授受ユニットIFAから
基板収納ユニットINDまで基板を搬送する間は、ただ
単純に基板が周辺の処理機器間を通り過ぎる搬送プロセ
スに過ぎないため、次のような問題がある。
[0009] Furthermore, while the substrate is being transported from the intermediate substrate transfer unit IFA to the exposure processing equipment EP after the completion of the first-stage processing, and while the substrate is being transferred from the intermediate substrate transfer unit IFA to the substrate storage unit IND after the completion of the second-stage processing, the Since this is simply a transport process in which the substrate passes between peripheral processing equipment, there are the following problems.

【0010】例えば、フォトレジスト液塗布後に、既に
設置された加熱処理機器では実現できない加熱温度での
加熱処理が必要になったり、いままでとは異なる長時間
の加熱処理を行なうようになった場合に、新たな加熱処
理機器を設置することになる。しかしながら、この新た
な加熱処理機器の設置余裕が前段モジュールM1には無
く後段モジュールM2のみにその設置余裕がある場合に
は、前段処理に該当する上記新たな加熱処理に使用する
加熱処理機器を、前段モジュールM1における処理機器
として取り扱うことができない。つまり、各モジュール
毎に搬送プロセスを取り扱うと、処理機器の配置におけ
る自由度が低くなる。
For example, after applying a photoresist solution, it becomes necessary to perform heat treatment at a heating temperature that cannot be achieved with the heat treatment equipment already installed, or when heat treatment is required for a longer period of time than before. New heat treatment equipment will be installed. However, if there is no room for installation of this new heat treatment equipment in the former module M1, but only in the latter module M2, the heat treatment equipment used for the new heat treatment that corresponds to the first stage treatment is It cannot be handled as a processing device in the preceding module M1. In other words, if the transport process is handled for each module, the degree of freedom in arranging the processing equipment will be reduced.

【0011】本発明は、上記問題点を解決するためにな
され、基板搬送のための搬送ロボットの制御を単純化さ
せるとともに、処理機器の配置の自由度を上げることを
目的とする。
The present invention has been made to solve the above-mentioned problems, and aims to simplify the control of a transport robot for transporting substrates and to increase the degree of freedom in the arrangement of processing equipment.

【0012】0012

【課題を解決するための手段】かかる目的を達成するた
めに本発明の採用した手段は、外部機器により施される
外部工程を挟んだフォトレジスト処理用処理液の前段処
理工程及び後段処理工程と、該各処理工程に付随した前
段処理付随工程及び後段処理付随工程とを基板に施すた
めに、各工程毎に使用される複数の処理機器と、前記外
部機器との間で基板授受を行なう基板外部授受機器とを
備え、前記前段処理工程用の処理機器と前段処理付随工
程用の処理機器とに基板を搬送して前段処理し、該前段
処理の施された基板を基板外部授受機器に搬送し、前記
外部工程が施されて基板外部授受機器に受け渡された基
板を、後段処理工程用の処理機器と後段処理付随工程用
の処理機器とに搬送して後段処理するフォトレジスト処
理装置における基板搬送方法であって、前記前段処理に
おける最先工程用の処理機器から前記基板外部授受機器
を経て前記後段処理における最終工程用の処理機器に到
るまでの基板の搬送順序を一括して規定する搬送プロセ
スに従って、基板を搬送することをその要旨とする。
[Means for Solving the Problems] The means adopted by the present invention to achieve the above object is a pre-processing process and a post-processing process of a photoresist processing solution sandwiching an external process performed by an external device. , a substrate for transferring substrates between a plurality of processing equipment used for each process and the external equipment in order to subject the substrate to a pre-processing incidental process and a post-processing incidental process accompanying each processing process; The substrate is transported to the processing equipment for the pre-processing step and the processing equipment for the pre-processing incidental process for pre-processing, and the substrate subjected to the pre-processing is transported to the external substrate transfer equipment. In a photoresist processing apparatus, the substrate that has been subjected to the external process and delivered to the external substrate transfer device is transported to a processing device for a subsequent processing step and a processing device for an incidental process of the subsequent processing for subsequent processing. A substrate transport method, which collectively defines the order in which substrates are transported from a processing device for the first step in the pre-processing to a processing device for the final step in the post-processing via the substrate external transfer device. The gist is to transport the substrate according to the transport process.

【0013】[0013]

【作用】上記構成を有するフォトレジスト処理装置にお
ける基板搬送方法は、ただ一つの搬送プロセスに従って
、前段処理における最先工程用の処理機器から基板外部
授受機器を経て後段処理における最終工程用の処理機器
に到るまでの各処理機器に順次基板を搬送する。
[Operation] The substrate transport method in the photoresist processing apparatus having the above configuration is based on a single transport process, from the processing equipment for the earliest process in the pre-processing to the processing equipment for the final process in the post-processing via the substrate external transfer equipment. The substrates are sequentially transported to each processing device up to the point where they are processed.

【0014】このため、前段処理におけるある工程用の
処理機器が後段処理における処理機器周辺に配置された
場合には、外部工程用の外部機器まで基板を搬送するた
めに後段処理における処理機器周辺を通り過ぎる間に、
上記前段処理におけるある工程用の処理機器に基板が搬
送される。同様に、後段処理におけるある工程用の処理
機器が前段処理における処理機器周辺に配置された場合
には、外部工程用の外部機器から基板を受け取り前段処
理における処理機器周辺を通り過ぎる間に、上記後段処
理におけるある工程用の処理機器に基板が搬送される。
For this reason, when processing equipment for a certain process in the pre-processing is placed around the processing equipment in the post-processing, the area around the processing equipment in the post-processing is placed in order to transport the substrate to the external equipment for the external process. While passing by,
The substrate is transported to processing equipment for a certain step in the above-mentioned pre-processing. Similarly, if processing equipment for a certain process in the downstream process is placed around the processing equipment in the upstream process, while receiving the substrate from the external device for the external process and passing around the processing equipment in the upstream process, A substrate is transported to processing equipment for a certain step in processing.

【0015】[0015]

【実施例】次に、本発明に係るフォトレジスト処理装置
における基板搬送方法の実施例について、図面に基づき
説明する。
[Embodiment] Next, an embodiment of a substrate transport method in a photoresist processing apparatus according to the present invention will be described with reference to the drawings.

【0016】図1は、フォトレジスト処理装置の概略平
面図である。同図に示すように、実施例のフォトレジス
ト処理装置は、種々のレジスト処理液を基板に塗布する
レジスト塗布機器SC1と、レジスト処理液の塗布の前
後に加熱処理を施すための加熱処理機器HP1,HP2
及び冷却処理を施すための冷却処理機器CP1,CP2
を対向して前段モジュールM1を構成する。また、露光
処理の施された基板を現像する現像処理機器SC2及び
レジスト処理後の基板のエッジのみを対象に予め露光す
るエッジ露光処理機器EEWと、現像前後に加熱処理を
施すための加熱処理機器HP3,HP4及び冷却処理を
施すための冷却処理機器CP3,CP4を対向して後段
モジュールM2を構成する。
FIG. 1 is a schematic plan view of a photoresist processing apparatus. As shown in the figure, the photoresist processing apparatus of the embodiment includes a resist coating device SC1 that applies various resist processing solutions to a substrate, and a heat processing device HP1 that performs heat treatment before and after applying the resist processing solution. ,HP2
and cooling treatment equipment CP1, CP2 for performing cooling treatment.
The front-stage module M1 is configured by facing each other. Additionally, there is a development processing device SC2 that develops the exposed substrate, an edge exposure processing device EEW that pre-exposes only the edge of the substrate after resist processing, and a heat processing device that performs heat treatment before and after development. HP3, HP4 and cooling processing equipment CP3, CP4 for performing cooling processing face each other to constitute a subsequent module M2.

【0017】また、未処理基板や処理済み基板をカセッ
ト内に収納する基板収納ユニットINDを前段モジュー
ルM1に連結して備え、前段モジュールM1と後段モジ
ュールM2との間に基板授受を行なう中間基板授受ユニ
ットIFAと、後段モジュールM2と露光処理機器EP
との間に基板授受を行なう終端基板授受ユニットIFB
とを備える。なお、上記各モジュールには、前段モジュ
ールM1内の各処理機器間における基板搬送と基板収納
ユニットIND及び中間基板授受ユニットIFAに対す
る基板授受とを行なうための搬送ロボットR1と、後段
モジュールM2内の各処理機器間における基板搬送と中
間基板授受ユニットIFA及び終端基板授受ユニットI
FBに対する基板授受とを行なうための搬送ロボットR
2とを備えている。
Further, a substrate storage unit IND for storing unprocessed substrates and processed substrates in a cassette is connected to the front module M1, and an intermediate board transfer unit for transferring substrates between the front module M1 and the rear module M2 is provided. Unit IFA, rear module M2 and exposure processing equipment EP
Terminating board transfer unit IFB that transfers and receives boards between
Equipped with. Each of the above-mentioned modules includes a transfer robot R1 for transferring substrates between each processing device in the front module M1 and transferring substrates to and from the substrate storage unit IND and intermediate substrate transfer unit IFA, and a transfer robot R1 for transferring substrates between each processing device in the front module M1, and each robot in the rear module M2. Substrate transport between processing equipment, intermediate board transfer unit IFA, and terminal board transfer unit I
Transfer robot R for transferring substrates to and from FB
2.

【0018】このフォトレジスト処理装置における搬送
プロセスとして、次のような16箇所の基板搬送対象機
器(14種類)を含み、数値の昇順に順次基板を搬送す
る搬送プロセスが用意されている。 1  基板収納ユニットIND 2  加熱処理機器HP1 3  冷却処理機器CP1 4  レジスト塗布機器SC1 5  加熱処理機器HP2 6  冷却処理機器CP2 7  中間基板授受ユニットIFA 8  エッジ露光処理機器EEW 9  終端基板授受ユニットIFB 10  加熱処理機器HP3 11  冷却処理機器CP3 12  現像処理機器SC2 13  加熱処理機器HP4 14  冷却処理機器CP4 15  中間基板授受ユニットIFA 16  基板収納ユニットIND
As a transport process in this photoresist processing apparatus, a transport process is prepared in which the following 16 locations (14 types) of substrate transport target devices are included and the substrates are sequentially transported in ascending numerical order. 1 Substrate storage unit IND 2 Heat processing equipment HP1 3 Cooling processing equipment CP1 4 Resist coating equipment SC1 5 Heat processing equipment HP2 6 Cooling processing equipment CP2 7 Intermediate substrate transfer unit IFA 8 Edge exposure processing equipment EEW 9 End substrate transfer unit IFB 10 Heating Processing equipment HP3 11 Cooling processing equipment CP3 12 Developing processing equipment SC2 13 Heat processing equipment HP4 14 Cooling processing equipment CP4 15 Intermediate substrate transfer unit IFA 16 Substrate storage unit IND

【0019】従って、この搬送プロセスに従って基板を
搬送すると、第1番目の基板収納ユニットINDから第
7番目の中間基板授受ユニットIFAを経て第8番目の
エッジ露光処理機器EEWまで基板が搬送される間に、
レジスト液塗布前加熱・冷却処理,レジスト液塗布,レ
ジスト液塗布後加熱・冷却処理,エッジ露光処理が順次
施されて、露光処理以前の前段処理が基板に施される。
Therefore, when the substrate is transported according to this transport process, the period during which the substrate is transported from the first substrate storage unit IND to the eighth edge exposure processing device EEW via the seventh intermediate substrate transfer unit IFA is To,
A heating/cooling process before applying the resist solution, applying the resist solution, a heating/cooling process after applying the resist solution, and an edge exposure process are sequentially performed on the substrate to perform a preliminary process before the exposure process.

【0020】更に、第9番目の終端基板授受ユニットI
FBで外部の露光処理機器EPとの間で基板授受が行な
われ、露光処理機器EPで露光処理の施された基板がこ
の第9番目の終端基板授受ユニットIFBから第15番
目の中間基板授受ユニットIFAまで搬送される間に、
現像前加熱・冷却処理,現像処理,現像後加熱・冷却処
理が順次施されて、露光処理以後の後段処理が基板に施
される。その後、第15番目の中間基板授受ユニットI
FAから第16番目の基板収納ユニットINDまで基板
が搬送される。なお、図示しない制御装置を介した搬送
ロボットR1,R2の駆動制御により、基板搬送が行な
われるのは勿論である。
Furthermore, the ninth terminal board transfer unit I
Substrates are transferred to and from the external exposure processing equipment EP at the FB, and the substrates subjected to exposure processing at the exposure processing equipment EP are transferred from this 9th terminal board transfer unit IFB to the 15th intermediate board transfer unit. While being transported to IFA,
A pre-development heating/cooling process, a development process, and a post-development heating/cooling process are sequentially performed to perform post-processing after the exposure process on the substrate. After that, the 15th intermediate board transfer unit I
The substrate is transported from the FA to the 16th substrate storage unit IND. It goes without saying that the substrates are transported by drive control of the transport robots R1 and R2 via a control device (not shown).

【0021】以上説明したように、本実施例の基板搬送
方法によれば、前段モジュールM1を各処理機器に搬送
されて通過した基板は、露光処理機器EP(終端基板授
受ユニットIFB)まで後段モジュールM2内を搬送さ
れる間に、エッジ露光処理機器EEWに搬送されてエッ
ジ露光処理を受ける。つまり、後段モジュールM2内を
ただ単純に基板が通り過ぎるだけでなく、後段モジュー
ルM2におけるエッジ露光処理機器EEWにてエッジ露
光が施されることになり、処理機器配置の自由度が向上
する。しかも、搬送ロボットによる基板搬送先を規定す
る搬送プロセスは、上記ただ一つの搬送プロセスでよく
、単純となる。
As explained above, according to the substrate transport method of this embodiment, the substrate that has been transported and passed through the front module M1 to each processing device is transferred to the rear module until it reaches the exposure processing device EP (terminal board transfer unit IFB). While being transported within M2, it is transported to edge exposure processing equipment EEW and subjected to edge exposure processing. In other words, the substrate does not simply pass through the rear module M2, but is subjected to edge exposure by the edge exposure processing equipment EEW in the latter module M2, improving the degree of freedom in the arrangement of processing equipment. Furthermore, the transport process for defining the substrate transport destination by the transport robot is simple, as the single transport process described above is sufficient.

【0022】また、現像後の加熱・冷却処理をもう一工
程追加し、追加した加熱・冷却処理に、例えば前段モジ
ュールM1における熱処理機器(HP2,CP2)をそ
の温度特性により使用せざる得ないときには、上記搬送
プロセスにおける第15番目の中間基板授受ユニットI
FA以降を次のようにすればよい。 15  中間基板授受ユニットIFA 16  加熱処理機器HP2 17  冷却処理機器CP2 18  基板収納ユニットIND
[0022] Furthermore, if one more step of heating/cooling treatment is added after development, and the heat treatment equipment (HP2, CP2) in the front module M1 cannot be avoided due to its temperature characteristics, for example, the additional heating/cooling treatment must be used. , the 15th intermediate substrate transfer unit I in the above transfer process
The steps after FA can be done as follows. 15 Intermediate substrate transfer unit IFA 16 Heat processing equipment HP2 17 Cooling processing equipment CP2 18 Substrate storage unit IND

【0023】このようにすれば、後段モジュールM2を
通過して基板収納ユニットINDに到る間に、前段モジ
ュールM1内をただ単純に基板が通り過ぎるだけでなく
、前段モジュールM1における加熱処理機器HP2及び
冷却処理機器CP2にて加熱・冷却処理が施されること
になる。
[0023] In this way, the substrate does not simply pass through the front module M1 while passing through the rear module M2 and reaches the substrate storage unit IND, but also the heat processing equipment HP2 and the heat processing equipment HP2 in the front module M1 Heating and cooling processing will be performed in the cooling processing equipment CP2.

【0024】以上本発明の一実施例について説明したが
、本発明はこの様な実施例になんら限定されるものでは
なく、本発明の要旨を逸脱しない範囲において種々なる
態様で実施し得ることは勿論である。例えば、図2に示
すように、中間基板授受ユニットIFAを省略し前段モ
ジュールM1と後段モジュールM2とを直接連結し、1
台の搬送ロボットR1で各処理機器への基板搬送を行な
うようにすることもできる。また、エッジ露光処理機器
EEWを現像処理機器SC2の右となりに配置してもよ
い。
Although one embodiment of the present invention has been described above, the present invention is not limited to this embodiment in any way, and can be implemented in various ways without departing from the gist of the present invention. Of course. For example, as shown in FIG. 2, the intermediate board transfer unit IFA is omitted and the front module M1 and the rear module M2 are directly connected, and one
It is also possible to use a single transfer robot R1 to transfer substrates to each processing device. Furthermore, the edge exposure processing device EEW may be placed to the right of the development processing device SC2.

【0025】更に、図3に示すように、露光処理機器E
Pに代わる外部機器として、モジュール内加熱処理機器
より高温度の加熱処理が可能な加熱処理機器を用い、こ
れを終端基板授受ユニットIFBに接続したフォトレジ
スト処理装置についても適用できることは勿論である。 この場合、レジスト塗布機器SC1の位置には、基板表
面にそれぞれ下地調整処理液を塗布する第1の下地層塗
布機器SC3と第2の下地層塗布機器SC4が配置され
、現像処理機器SC2の位置には、レジスト塗布機器S
C1が配置されている。
Furthermore, as shown in FIG.
Of course, it is also applicable to a photoresist processing apparatus in which a heat treatment device capable of heat treatment at a higher temperature than the in-module heat treatment device is used as an external device in place of P, and this is connected to the terminal board transfer unit IFB. In this case, a first base layer coating device SC3 and a second base layer coating device SC4 that respectively apply a base conditioning treatment liquid to the substrate surface are arranged at the position of the resist coating device SC1, and a second base layer coating device SC4 is arranged at the position of the development processing device SC2. The resist coating equipment S
C1 is placed.

【0026】このような処理機器配置のフォトレジスト
処理装置においては、その搬送プロセスは、次のように
なる。 1  基板収納ユニットIND 2  加熱処理機器HP1 3  冷却処理機器CP1 4  第1の下地層塗布機器SC3 5  終端基板授受ユニットIFB 6  冷却処理機器CP2 7  第2の下地層塗布機器SC4 8  加熱処理機器HP3 9  冷却処理機器CP3 10  レジスト塗布機器SC1 13  加熱処理機器HP4 14  冷却処理機器CP4 15  基板収納ユニットIND
In the photoresist processing apparatus with such a processing equipment arrangement, the transport process is as follows. 1 Substrate storage unit IND 2 Heat processing equipment HP1 3 Cooling processing equipment CP1 4 First base layer coating equipment SC3 5 Termination board transfer unit IFB 6 Cooling processing equipment CP2 7 Second base layer coating equipment SC4 8 Heat processing equipment HP3 9 Cooling processing equipment CP3 10 Resist coating equipment SC1 13 Heat processing equipment HP4 14 Cooling processing equipment CP4 15 Substrate storage unit IND

【0027】また、前段処理における最先工程用の処理
機器(基板収納ユニットIND又は加熱処理機器HP1
)から終端基板授受ユニットIFBを経て後段処理にお
ける最終工程用の処理機器(冷却処理機器CP4又は中
間基板授受ユニットIFA)に到るまでの基板の搬送順
序を一括して規定する搬送プロセスを、前段処理におけ
る最先工程用の処理機器(基板収納ユニットIND又は
加熱処理機器HP1)から終端基板授受ユニットIFB
に到るまでの前段搬送プロセスと、終端基板授受ユニッ
トIFBから後段処理における最終工程用の処理機器(
冷却処理機器CP4又は中間基板授受ユニットIFA)
に到るまでの後段搬送プロセスとに分けて独立に作成し
、この両搬送プロセスを終端基板授受ユニットIFBを
境に接合して用意することもできる。
[0027] In addition, processing equipment for the earliest step in the pre-processing (substrate storage unit IND or heat processing equipment HP1
) to the terminal board transfer unit IFB to the processing equipment for the final process in the subsequent processing (cooling processing equipment CP4 or intermediate substrate transfer unit IFA). From the processing equipment for the earliest step in processing (substrate storage unit IND or heat processing equipment HP1) to the terminal board transfer unit IFB
The processing equipment (
Cooling processing equipment CP4 or intermediate board transfer unit IFA)
It is also possible to prepare the transfer process separately and separately from the post-transfer process up to , and connect these two transfer processes with the terminal board transfer unit IFB as a boundary.

【0028】[0028]

【発明の効果】以上詳述したように本発明のフォトレジ
スト処理装置における基板搬送方法によれば、ただ一つ
の搬送プロセスに従って、最先工程用の処理機器から最
終工程用の処理機器に到るまでの各処理機器に順次基板
を搬送するので、基板搬送のための搬送ロボットの制御
が単純化する。また、工程上の制約を受けて処理機器の
配置が制限されないので、処理機器配置の自由度が向上
する。
[Effects of the Invention] As detailed above, according to the substrate transport method in the photoresist processing apparatus of the present invention, the processing equipment for the first process is transferred to the processing equipment for the final process according to a single transport process. Since the substrates are sequentially transferred to each processing device up to the present time, control of the transfer robot for substrate transfer is simplified. Further, since the arrangement of processing equipment is not restricted due to process constraints, the degree of freedom in arrangement of processing equipment is improved.

【図面の簡単な説明】[Brief explanation of drawings]

【図1】実施例のフォトレジスト処理装置における基板
搬送方法を説明するために用いた概略平面図。
FIG. 1 is a schematic plan view used to explain a substrate transport method in a photoresist processing apparatus according to an embodiment.

【図2】実施例のフォトレジスト処理装置の機器構成を
変更した場合の概略平面図。
FIG. 2 is a schematic plan view when the device configuration of the photoresist processing apparatus of the embodiment is changed.

【図3】他の実施例のフォトレジスト処理装置における
基板搬送方法を説明するために用いた概略平面図。
FIG. 3 is a schematic plan view used to explain a substrate transport method in a photoresist processing apparatus according to another embodiment.

【図4】従来のフォトレジスト処理装置における基板搬
送方法を説明するために用いた概略平面図。
FIG. 4 is a schematic plan view used to explain a substrate transport method in a conventional photoresist processing apparatus.

【符号の説明】[Explanation of symbols]

CP1  冷却処理機器 CP2  冷却処理機器 CP3  冷却処理機器 CP4  冷却処理機器 EEW  エッジ露光処理機器 EP  露光処理機器 HP1  加熱処理機器 HP2  加熱処理機器 HP3  加熱処理機器 HP4  加熱処理機器 IFA  中間基板授受ユニット IFB  終端基板授受ユニット IND  基板収納ユニット M1  前段モジュール M2  後段モジュール R1  搬送ロボット R2  搬送ロボット SC1  レジスト塗布機器 SC2  現像処理機器 SC3  第1の下地層塗布機器 SC4  第2の下地層塗布機器 CP1 Cooling processing equipment CP2 Cooling processing equipment CP3 Cooling processing equipment CP4 Cooling processing equipment EEW edge exposure processing equipment EP exposure processing equipment HP1 Heat treatment equipment HP2 Heat treatment equipment HP3 Heat treatment equipment HP4 Heat treatment equipment IFA Intermediate board transfer unit IFB Termination board transfer unit IND board storage unit M1 front module M2 rear module R1 Transfer robot R2 Transfer robot SC1 Resist coating equipment SC2 Development processing equipment SC3 First base layer coating equipment SC4 Second base layer coating equipment

Claims (1)

【特許請求の範囲】[Claims] 【請求項1】  外部機器により施される外部工程を挟
んだフォトレジスト処理用の前段処理工程及び後段処理
工程と、該各処理工程に付随した前段処理付随工程及び
後段処理付随工程とを基板に施すために、各工程毎に使
用される複数の処理機器と、前記外部機器との間で基板
授受を行なう基板外部授受機器とを備え、前記前段処理
工程用の処理機器と前段処理付随工程用の処理機器とに
基板を搬送して前段処理し、該前段処理の施された基板
を基板外部授受機器に搬送し、前記外部工程が施されて
基板外部授受機器に受け渡された基板を、後段処理工程
用の処理機器と後段処理付随工程用の処理機器とに搬送
して後段処理するフォトレジスト処理装置における基板
搬送方法であって、前記前段処理における最先工程用の
処理機器から前記基板外部授受機器を経て前記後段処理
における最終工程用の処理機器に到るまでの基板の搬送
順序を一括して規定する搬送プロセスに従って、基板を
搬送することを特徴とするフォトレジスト処理装置にお
ける基板搬送方法。
Claim 1: A pre-processing step and a post-processing step for photoresist processing sandwiching an external process performed by an external device, and a pre-processing incidental process and a post-processing incidental process accompanying each of the processing steps, on a substrate. In order to carry out the process, it is equipped with a plurality of processing equipment used for each process, and an external substrate transfer device that transfers substrates to and from the external equipment, and includes processing equipment for the pre-processing process and processing equipment for the pre-processing incidental process. The substrate is transferred to a processing device for pre-processing, the pre-processed substrate is transferred to an external substrate transfer device, and the substrate subjected to the external process and transferred to the external substrate transfer device is A method for transporting a substrate in a photoresist processing apparatus in which the substrate is transported to a processing device for a subsequent processing step and a processing device for an incidental process of the subsequent processing for subsequent processing, the substrate being transferred from the processing device for the earliest step in the preceding processing. Substrate transport in a photoresist processing apparatus, characterized in that the substrates are transported according to a transport process that collectively defines the transport order of the substrates via external transfer equipment to the processing equipment for the final process in the post-processing. Method.
JP3098070A 1991-04-02 1991-04-02 Photoresist processing equipment Expired - Fee Related JP3043094B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP3098070A JP3043094B2 (en) 1991-04-02 1991-04-02 Photoresist processing equipment

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP3098070A JP3043094B2 (en) 1991-04-02 1991-04-02 Photoresist processing equipment

Related Child Applications (1)

Application Number Title Priority Date Filing Date
JP29947899A Division JP3197541B2 (en) 1999-10-21 1999-10-21 Photoresist processing equipment

Publications (2)

Publication Number Publication Date
JPH04305914A true JPH04305914A (en) 1992-10-28
JP3043094B2 JP3043094B2 (en) 2000-05-22

Family

ID=14210085

Family Applications (1)

Application Number Title Priority Date Filing Date
JP3098070A Expired - Fee Related JP3043094B2 (en) 1991-04-02 1991-04-02 Photoresist processing equipment

Country Status (1)

Country Link
JP (1) JP3043094B2 (en)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6287067B1 (en) 1996-06-21 2001-09-11 Tokyo Ohka Kogyo Co., Ltd. Processing unit and processing unit structure by assembling thereof
US6893171B2 (en) 2002-05-01 2005-05-17 Dainippon Screen Mfg. Co., Ltd. Substrate treating apparatus
JP2008034870A (en) * 2007-09-28 2008-02-14 Dainippon Screen Mfg Co Ltd Substrate processing apparatus
JP2008034869A (en) * 2007-09-28 2008-02-14 Dainippon Screen Mfg Co Ltd Substrate processing apparatus

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS63234530A (en) * 1987-03-24 1988-09-29 Nec Corp Resist periphery removing device
JPH01179317A (en) * 1988-01-05 1989-07-17 Nikon Corp Substrate treatment system
JPH01227451A (en) * 1988-03-07 1989-09-11 Tokyo Electron Ltd Treating device
JPH02244612A (en) * 1989-03-15 1990-09-28 Tokyo Electron Ltd Coating and developing device

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS63234530A (en) * 1987-03-24 1988-09-29 Nec Corp Resist periphery removing device
JPH01179317A (en) * 1988-01-05 1989-07-17 Nikon Corp Substrate treatment system
JPH01227451A (en) * 1988-03-07 1989-09-11 Tokyo Electron Ltd Treating device
JPH02244612A (en) * 1989-03-15 1990-09-28 Tokyo Electron Ltd Coating and developing device

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6287067B1 (en) 1996-06-21 2001-09-11 Tokyo Ohka Kogyo Co., Ltd. Processing unit and processing unit structure by assembling thereof
US6893171B2 (en) 2002-05-01 2005-05-17 Dainippon Screen Mfg. Co., Ltd. Substrate treating apparatus
JP2008034870A (en) * 2007-09-28 2008-02-14 Dainippon Screen Mfg Co Ltd Substrate processing apparatus
JP2008034869A (en) * 2007-09-28 2008-02-14 Dainippon Screen Mfg Co Ltd Substrate processing apparatus
JP4505006B2 (en) * 2007-09-28 2010-07-14 大日本スクリーン製造株式会社 Substrate processing equipment
JP4505005B2 (en) * 2007-09-28 2010-07-14 大日本スクリーン製造株式会社 Substrate processing equipment

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