JPH0430488U - - Google Patents

Info

Publication number
JPH0430488U
JPH0430488U JP7163990U JP7163990U JPH0430488U JP H0430488 U JPH0430488 U JP H0430488U JP 7163990 U JP7163990 U JP 7163990U JP 7163990 U JP7163990 U JP 7163990U JP H0430488 U JPH0430488 U JP H0430488U
Authority
JP
Japan
Prior art keywords
level
output
low
circuit
latch circuit
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP7163990U
Other languages
English (en)
Japanese (ja)
Other versions
JP2527623Y2 (ja
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP7163990U priority Critical patent/JP2527623Y2/ja
Publication of JPH0430488U publication Critical patent/JPH0430488U/ja
Application granted granted Critical
Publication of JP2527623Y2 publication Critical patent/JP2527623Y2/ja
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Landscapes

  • Tests Of Electronic Circuits (AREA)
JP7163990U 1990-07-04 1990-07-04 Ｉｃ試験装置 Expired - Lifetime JP2527623Y2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP7163990U JP2527623Y2 (ja) 1990-07-04 1990-07-04 Ｉｃ試験装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP7163990U JP2527623Y2 (ja) 1990-07-04 1990-07-04 Ｉｃ試験装置

Publications (2)

Publication Number Publication Date
JPH0430488U true JPH0430488U (enrdf_load_stackoverflow) 1992-03-11
JP2527623Y2 JP2527623Y2 (ja) 1997-03-05

Family

ID=31608849

Family Applications (1)

Application Number Title Priority Date Filing Date
JP7163990U Expired - Lifetime JP2527623Y2 (ja) 1990-07-04 1990-07-04 Ｉｃ試験装置

Country Status (1)

Country Link
JP (1) JP2527623Y2 (enrdf_load_stackoverflow)

Also Published As

Publication number Publication date
JP2527623Y2 (ja) 1997-03-05

Similar Documents

Publication Publication Date Title
EP0600655A3 (en) Method and device for testing integrated circuits.
EP0398816A3 (en) Testing method, testing circuit and semiconductor integrated circuit having testing circuit
TW343282B (en) Testing device for a semiconductor device
KR100393472B1 (ko) 스캔테스트용자동리세트바이패스제어
DK0938663T3 (da) Fremgangsmåde til testning af pålideligheden af et pröveapparat, især et inspektionsapparat for tomme flasker
US4345201A (en) Fault location system with enhanced noise immunity
JPH0430488U (enrdf_load_stackoverflow)
TW200407721A (en) Boundary-scan methods and apparatus
US6949946B1 (en) Integrated semiconductor circuit and method for functional testing of pad cells
JP2837703B2 (ja) 故障診断装置
RU2009518C1 (ru) Способ контроля контактирования кмоп-бис и устройство для его осуществления
JPH03137581A (ja) 半導体集積回路
JPS6217727Y2 (enrdf_load_stackoverflow)
US5841965A (en) System and method for automatically determining test point for DC parametric test
JPS57212539A (en) Arithmetic device
JPS59172384U (ja) 論理回路試験装置
SU1583887A1 (ru) Устройство дл функционального контрол больших интегральных микросхем
JPH0465144A (ja) 半導体試験装置
KR970004768Y1 (ko) 키보드를 이용한 자동써머리 회로
JPS62145171A (ja) ボ−ドテスト装置
KR940002724Y1 (ko) 다중핀 디지탈 ic 시험회로
JPH0465684A (ja) 半導体集積回路試験装置
JPH0484782A (ja) テスト回路
JPS5684570A (en) Testing device for ic
JPS596553A (ja) 論理回路

Legal Events

Date Code Title Description
R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

EXPY Cancellation because of completion of term