JPH0429002B2 - - Google Patents

Info

Publication number
JPH0429002B2
JPH0429002B2 JP31512986A JP31512986A JPH0429002B2 JP H0429002 B2 JPH0429002 B2 JP H0429002B2 JP 31512986 A JP31512986 A JP 31512986A JP 31512986 A JP31512986 A JP 31512986A JP H0429002 B2 JPH0429002 B2 JP H0429002B2
Authority
JP
Japan
Prior art keywords
light
film thickness
incident
measurement target
white light
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP31512986A
Other languages
English (en)
Japanese (ja)
Other versions
JPS63163105A (ja
Inventor
Chikayasu Yamazaki
Mutsumi Hayashi
Jun Torikai
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toray Industries Inc
Original Assignee
Toray Industries Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Toray Industries Inc filed Critical Toray Industries Inc
Priority to JP31512986A priority Critical patent/JPS63163105A/ja
Publication of JPS63163105A publication Critical patent/JPS63163105A/ja
Publication of JPH0429002B2 publication Critical patent/JPH0429002B2/ja
Granted legal-status Critical Current

Links

Landscapes

  • Length Measuring Devices By Optical Means (AREA)
JP31512986A 1986-12-25 1986-12-25 光干渉式膜厚測定装置 Granted JPS63163105A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP31512986A JPS63163105A (ja) 1986-12-25 1986-12-25 光干渉式膜厚測定装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP31512986A JPS63163105A (ja) 1986-12-25 1986-12-25 光干渉式膜厚測定装置

Publications (2)

Publication Number Publication Date
JPS63163105A JPS63163105A (ja) 1988-07-06
JPH0429002B2 true JPH0429002B2 (enrdf_load_stackoverflow) 1992-05-15

Family

ID=18061752

Family Applications (1)

Application Number Title Priority Date Filing Date
JP31512986A Granted JPS63163105A (ja) 1986-12-25 1986-12-25 光干渉式膜厚測定装置

Country Status (1)

Country Link
JP (1) JPS63163105A (enrdf_load_stackoverflow)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH049704A (ja) * 1990-04-27 1992-01-14 Toray Ind Inc 光干渉式膜厚測定装置
US12111146B2 (en) 2020-01-20 2024-10-08 Otsuka Electronics Co., Ltd. Optical measurement apparatus and optical measurement method
JP7521993B2 (ja) * 2020-01-20 2024-07-24 大塚電子株式会社 光学測定装置および光学測定方法

Also Published As

Publication number Publication date
JPS63163105A (ja) 1988-07-06

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Legal Events

Date Code Title Description
EXPY Cancellation because of completion of term