JPH04278454A - Method for setting flaw detection sensitivity of eddy current flaw detection method - Google Patents
Method for setting flaw detection sensitivity of eddy current flaw detection methodInfo
- Publication number
- JPH04278454A JPH04278454A JP6550391A JP6550391A JPH04278454A JP H04278454 A JPH04278454 A JP H04278454A JP 6550391 A JP6550391 A JP 6550391A JP 6550391 A JP6550391 A JP 6550391A JP H04278454 A JPH04278454 A JP H04278454A
- Authority
- JP
- Japan
- Prior art keywords
- flaw detection
- eddy current
- flaw
- detection sensitivity
- phase angle
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Withdrawn
Links
- 238000001514 detection method Methods 0.000 title claims abstract description 33
- 230000035945 sensitivity Effects 0.000 title claims abstract description 20
- 238000000034 method Methods 0.000 title claims description 7
- 239000000463 material Substances 0.000 claims abstract description 30
- 230000007547 defect Effects 0.000 claims description 5
- 238000012360 testing method Methods 0.000 abstract description 18
- 230000000052 comparative effect Effects 0.000 description 4
- 230000004323 axial length Effects 0.000 description 2
- 238000012937 correction Methods 0.000 description 2
- 230000000694 effects Effects 0.000 description 2
- 229910000831 Steel Inorganic materials 0.000 description 1
- 238000007796 conventional method Methods 0.000 description 1
- 238000012423 maintenance Methods 0.000 description 1
- 239000010959 steel Substances 0.000 description 1
- 239000002436 steel type Substances 0.000 description 1
Landscapes
- Investigating Or Analyzing Materials By The Use Of Magnetic Means (AREA)
Abstract
Description
【０００１】0001
【産業上の利用分野】この発明は、鋼材など被検査材の
表面の疵を検査する渦流探傷法の探傷感度設定方法に関
するものである。BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a method for setting flaw detection sensitivity in an eddy current flaw detection method for inspecting flaws on the surface of a material to be inspected such as steel.
【０００２】0002
【従来の技術】一般に、被検査材の表面の疵を検査する
方法として、ＪＩＳ規格番号Ｇ０５６８に示される渦流
探傷方法が知られている。この渦流探傷方法は、図４に
プローブ型コイルによる被検査材の探傷例を示すように
、交流を流した試験コイル１内に被検査材２を入れると
、その被検査材２の表面に疵など不健全部分がある場合
、被検査材２を流れる渦電流に変化が起こり、試験コイ
ル１のインピーダンスまたはコイルに誘起される電圧に
変化が生じ、この変化する電気信号の振幅および位相等
から不健全部分の存在とその程度を判断する。2. Description of the Related Art Generally, the eddy current flaw detection method shown in JIS standard number G0568 is known as a method for inspecting flaws on the surface of a material to be inspected. In this eddy current flaw detection method, as shown in Fig. 4, which shows an example of flaw detection of a material to be inspected using a probe-type coil, when a material to be inspected 2 is placed inside a test coil 1 through which alternating current is passed, flaws are detected on the surface of the material to be inspected. If there is an unsound part, such as a change in the eddy current flowing through the material to be inspected 2, a change occurs in the impedance of the test coil 1 or the voltage induced in the coil, and the amplitude and phase of the electrical signal change. Determine the presence and extent of healthy parts.
【０００３】前記の渦流探傷方法において探傷感度を設
定するには、ＪＩＳ規格番号Ｇ０５６８で規定されてい
る如く、被検査材２と材質および寸法が同一（理想的に
は同一ロットであることとされている。）で、表面を切
欠して形成した人工疵を有する対比試験材を用いて行う
ようになっている。すなわち、対比試験材３の表面に幅
Ｗ、深さＤおよび軸方向の長さの人工疵４をつけて試験
コイル１内に入れる。すると、図示しない渦流探傷装置
に装備したＣＲＴディスプレイに該人工疵４の波高値が
でる。尚、人工疵４は、例えば対比試験材３の表面に軸
方向の角溝を切欠することにより形成され、ＪＩＳ規格
により決められている。[0003] In order to set the flaw detection sensitivity in the above-mentioned eddy current flaw detection method, as specified in JIS standard number G0568, the material and dimensions of the material to be inspected 2 are the same (ideally, they should be from the same lot). ), the test is conducted using a comparative test material that has artificial flaws formed by cutting out the surface. That is, an artificial flaw 4 having a width W, a depth D, and an axial length is made on the surface of the comparison test material 3, and the material is placed into the test coil 1. Then, the peak value of the artificial flaw 4 is displayed on a CRT display installed in an eddy current flaw detection device (not shown). The artificial flaw 4 is formed, for example, by cutting out a square groove in the axial direction on the surface of the comparative test material 3, and is determined by the JIS standard.
【０００４】0004
【発明が解決しようとする課題】ところで、従来の探傷
感度の設定においては、前記のように表面を切欠して形
成した人工疵を有する対比試験材を用いて行うものであ
るため、被検査材ごとにそれに対応するそれぞれ異なる
対比試験材を製作しなければならない。したがって、被
検査材がピーリング、センターレス加工材等、多鋼種、
多寸法の場合は、多数の対比試験材を必要とし、渦流探
傷に際する探傷感度の設定に時間と労力を要して作業能
率が悪いばかりでなく、対比試験材の維持管理も大変な
ものとなるという問題点があった。[Problems to be Solved by the Invention] By the way, in the conventional flaw detection sensitivity setting, it is carried out using a comparison test material having artificial flaws formed by cutting out the surface as described above. Different comparative test materials must be manufactured for each case. Therefore, the material to be inspected is peeled, centerless processed material, etc., multi-steel type,
In the case of multiple dimensions, a large number of contrast test materials are required, and it takes time and effort to set the flaw detection sensitivity during eddy current flaw detection, which not only reduces work efficiency but also makes maintenance and management of the contrast test materials difficult. There was a problem that.
【０００５】そこでこの発明は、前記従来の問題点を排
除し、探傷感度の設定を迅速、かつ容易にできて作業能
率の向上を図ることができる探傷感度設定方法を提供す
ることを目的とする。SUMMARY OF THE INVENTION Therefore, an object of the present invention is to provide a flaw detection sensitivity setting method that eliminates the above-mentioned conventional problems, allows flaw detection sensitivity to be set quickly and easily, and improves work efficiency. .
【０００６】[0006]
【課題を解決するための手段】前記目的を達成するため
、この発明の探傷感度設定方法は、渦流探傷法において
探傷感度を設定するに際し、被検査材の表面に貼付した
基準試片を疑似欠陥として波高値を測定し、この波高値
を予め測定された人工疵の波高値に補正するとともに、
前記基準試片の位相角を測定し、この位相角を前記人工
疵の位相角に合うように補正することを特徴とする。基
準試片としては極細線が好ましい。[Means for Solving the Problem] In order to achieve the above object, the flaw detection sensitivity setting method of the present invention uses a reference specimen attached to the surface of the material to be inspected to simulate a pseudo defect when setting the flaw detection sensitivity in the eddy current flaw detection method. The wave height value is measured as follows, and this wave height value is corrected to the wave height value of the artificial flaw measured in advance.
The present invention is characterized in that the phase angle of the reference specimen is measured, and this phase angle is corrected to match the phase angle of the artificial flaw. An ultrafine wire is preferable as the reference specimen.
【０００７】[0007]
【作用】この発明の探傷感度設定方法によると、従来の
ように人工疵を切欠形成した対比試験材による感度設定
をする必要がなく、基準試片を被検査材の表面に貼付す
るだけでよい。[Operation] According to the flaw detection sensitivity setting method of the present invention, there is no need to set the sensitivity using a comparison test material with artificial flaws cut out as in the conventional method, and it is only necessary to attach a reference specimen to the surface of the material to be inspected. .
【０００８】[0008]
【実施例】図１，２，３はこの発明の一実施例を示す。
図１，２に示すように探傷感度を設定するに際しては、
被検査材１３の表面に基準試片１４を疑似欠陥としてテ
ープ１５等で覆って貼付するようにしている。基準試片
１４としてこの実施例では極細線を用いている。基準試
片１４の寸法は、例えば径が０．１ｍｍ、軸方向の長さ
が１０ｍｍに設定されている。DESCRIPTION OF THE PREFERRED EMBODIMENTS FIGS. 1, 2 and 3 show an embodiment of the present invention. When setting the flaw detection sensitivity as shown in Figures 1 and 2,
A reference specimen 14 is covered with a tape 15 or the like and attached as a pseudo defect to the surface of the material 13 to be inspected. In this embodiment, an extremely thin wire is used as the reference specimen 14. The dimensions of the reference specimen 14 are set to, for example, a diameter of 0.1 mm and an axial length of 10 mm.
【０００９】次に、前記実施例での探傷感度の設定を説
明する。まず、前記した基準試片１４を被検査材１３の
表面にテープ１５等で覆って貼付し、疑似欠陥とする。
次に、基準試片１４を表面に貼付した被検査材１３を交
流を流した試験コイル１内に入れる。すると、図３のグ
ラフの上半部に示されているようにＣＲＴディスプレイ
に基準試片１４の波高値がでる。これを予め相関性を調
査したＪＩＳ規格により切欠形成された人工疵と基準試
片の補正値を用い、人工疵レベルにデシベル補正する。Next, the setting of flaw detection sensitivity in the above embodiment will be explained. First, the reference specimen 14 described above is attached to the surface of the material to be inspected 13 covered with tape 15 or the like to form a pseudo defect. Next, the test material 13 with the reference specimen 14 affixed to its surface is placed into the test coil 1 through which alternating current is applied. Then, as shown in the upper half of the graph in FIG. 3, the peak value of the reference specimen 14 appears on the CRT display. This is decibel-corrected to the artificial flaw level using the correction value of the reference specimen and the artificial flaw formed by notches according to the JIS standard whose correlation has been investigated in advance.
【００１０】前記補正が終了したら、今度は基準試片１
４の位相角をＣＲＴディスプレイでみて測定する。例え
ば基準試片１４の位相角が１００°のときは、図３のグ
ラフの下半部に示されるように位相差がプラス側に１０
°とでるので、このプラス１０°を引算することにより
、基準試片１４の位相角１００°を人工疵の位相角９０
°に合うように補正する。これで感度の設定が終了する
。[0010] After the above correction is completed, the reference specimen 1 is
Measure the phase angle of 4 by looking at it on a CRT display. For example, when the phase angle of the reference specimen 14 is 100°, the phase difference shifts 10° to the positive side, as shown in the lower half of the graph in FIG.
By subtracting this plus 10°, the phase angle of 100° of the reference specimen 14 becomes the phase angle of 90° of the artificial flaw.
Correct to match °. This completes the sensitivity setting.
【００１１】[0011]
【発明の効果】この発明は前記のように、渦流探傷法に
おいて探傷感度を設定するに際し、被検査材の表面に貼
付した基準試片を疑似欠陥として波高値を測定し、この
波高値を予め測定された人工疵の波高値に補正するとと
もに、前記基準試片の位相角を測定し、この位相角を前
記人工疵の位相角に合うように補正するので、基準試片
を被検査材の表面に貼付するだけでよい。したがって、
探傷感度の設定を迅速、かつ容易にできて作業能率の向
上を図ることができるという優れた効果がある。[Effects of the Invention] As described above, when setting the flaw detection sensitivity in the eddy current flaw detection method, this invention measures the wave height value using a reference specimen attached to the surface of the material to be inspected as a pseudo defect, and measures this wave height value in advance. In addition to correcting the wave height value of the measured artificial flaw, the phase angle of the reference specimen is also measured and this phase angle is corrected to match the phase angle of the artificial flaw. Just paste it on the surface. therefore,
This has the excellent effect of allowing flaw detection sensitivity to be set quickly and easily, thereby improving work efficiency.
【図１】この発明の一実施例の基準試片を被検査材の表
面に貼付した状態の要部拡大側面図である。FIG. 1 is an enlarged side view of a main part of a reference specimen according to an embodiment of the present invention attached to the surface of a material to be inspected.
【図２】同上の平面図である。FIG. 2 is a plan view of the same as above.
【図３】同上の基準試片と人工疵の関係を表すグラフで
ある。FIG. 3 is a graph showing the relationship between the reference specimen and artificial flaws.
【図４】従来公知のプローブ型コイルによる渦流探傷方
法を示す概略斜視図である。FIG. 4 is a schematic perspective view showing a conventionally known eddy current flaw detection method using a probe-type coil.
【図５】従来の基準試片を対比試験材の表面に貼付した
状態の要部拡大側面図である。FIG. 5 is an enlarged side view of a main part of a conventional reference specimen attached to the surface of a comparative test material.
１ 試験コイル １３ 被検査材 １４ 基準試片 １５ 貼付用テープ 1 Test coil 13 Material to be inspected 14 Standard specimen 15 Paste tape
Claims (1)
るに際し、被検査材の表面に貼付した基準試片を疑似欠
陥として波高値を測定し、この波高値を予め測定された
人工疵の波高値に補正するとともに、前記基準試片の位
相角を測定し、この位相角を前記人工疵の位相角に合う
ように補正することを特徴とする渦流探傷法の探傷感度
設定方法。Claim 1: When setting the flaw detection sensitivity in the eddy current flaw detection method, the wave height value is measured using a reference specimen attached to the surface of the material to be inspected as a pseudo defect, and this wave height value is used as the wave height value of the artificial flaw measured in advance. A flaw detection sensitivity setting method for an eddy current flaw detection method, characterized in that the phase angle of the reference specimen is corrected, and the phase angle is corrected to match the phase angle of the artificial flaw.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP6550391A JPH04278454A (en) | 1991-03-06 | 1991-03-06 | Method for setting flaw detection sensitivity of eddy current flaw detection method |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP6550391A JPH04278454A (en) | 1991-03-06 | 1991-03-06 | Method for setting flaw detection sensitivity of eddy current flaw detection method |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPH04278454A true JPH04278454A (en) | 1992-10-05 |
Family
ID=13288945
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP6550391A Withdrawn JPH04278454A (en) | 1991-03-06 | 1991-03-06 | Method for setting flaw detection sensitivity of eddy current flaw detection method |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH04278454A (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2014115720A1 (en) * | 2013-01-22 | 2014-07-31 | 新日鐵住金株式会社 | Method for correcting defect location |
-
1991
- 1991-03-06 JP JP6550391A patent/JPH04278454A/en not_active Withdrawn
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2014115720A1 (en) * | 2013-01-22 | 2014-07-31 | 新日鐵住金株式会社 | Method for correcting defect location |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| A300 | Application deemed to be withdrawn because no request for examination was validly filed |
Free format text: JAPANESE INTERMEDIATE CODE: A300 Effective date: 19980514 |