JPH04267322A - X-ray mask - Google Patents

X-ray mask

Info

Publication number
JPH04267322A
JPH04267322A JP3047384A JP4738491A JPH04267322A JP H04267322 A JPH04267322 A JP H04267322A JP 3047384 A JP3047384 A JP 3047384A JP 4738491 A JP4738491 A JP 4738491A JP H04267322 A JPH04267322 A JP H04267322A
Authority
JP
Japan
Prior art keywords
ray
exposure
reverse
plating electrode
pattern
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP3047384A
Other languages
Japanese (ja)
Other versions
JP2952063B2 (en
Inventor
Tsutomu Ikeda
勉 池田
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Canon Inc
Original Assignee
Canon Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Canon Inc filed Critical Canon Inc
Priority to JP4738491A priority Critical patent/JP2952063B2/en
Publication of JPH04267322A publication Critical patent/JPH04267322A/en
Application granted granted Critical
Publication of JP2952063B2 publication Critical patent/JP2952063B2/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

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  • Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
  • Preparing Plates And Mask In Photomechanical Process (AREA)

Abstract

PURPOSE:To enable a highly accurate circuit pattern transfer through exposure to X-rays by preventing a multiple exposure to X-rays through forming a multiple-exposure prevention film on both surfaces of the frame edge of an X-ray transmission film. CONSTITUTION:An X-ray transmission film 42 of SiN, SiC, BN, etc., is formed to 1-3mum thickness on an X-ray transmission film support 41 by a CVD method or sputtering method. Then, the reverse of the X-ray transmission film support 41 is treated by wet etching so that an exposure window is formed. Subsequently, a plating electrode 43 is formed by a method such as EB or resistance heating deposition. In this case, the plating electrode on the reverse side is the external size of the pattern of a circuit on the obverse. After that, a resist pattern 44 is formed on the plating electrode 43 by a method such as electron- beam exposure. Also in this case, the position of the resist pattern 44 is caused to coincide with the plating electrode on the reverse. That is, the outsides of the obverse and reverse of the circuit pattern are caused to coincide with each other. Subsequently, the obverse and reverse are simultaneously plated 45 with gold so that a resist and plating substrate are peeled off.

Description

【発明の詳細な説明】[Detailed description of the invention]

【0001】0001

【産業上の利用分野】本発明は半導体製造用X線リソグ
ラフィーに使用するX線マスクに関する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to an X-ray mask used in X-ray lithography for semiconductor manufacturing.

【0002】0002

【従来の技術】従来、IC、LSI等の電子デバイスの
リソグラフィー加工方法として種々の方法が使用されて
いるが、その中でもX線リソグラフィーはX線固有の高
透過率や単波長等の性質に基づき、これ迄の可視光や紫
外線によるリソグラフィー方法に比べて多くの優れた点
を有しており、クォーターミクロンリソグラフィー方法
の有力な手段として注目されている。一般にX線リソグ
ラフィーに使用するX線マスクは、図2に示す模式マス
ク断面図の様に、厚さ0.4〜2mmのSiウエハー基
板21及びX線透過膜22及びX線吸収体23よりなっ
ている。Si基板は中央部で円形又は多角形にエッチン
グされ、エッチング後はX線透過膜の自立膜となってい
る。X線吸収体はこの自立膜上で回路パターンとして形
成される。回路パターンの外側にはX線の透過防止の為
にX線吸収体24がベタ状に形成されている。
[Prior Art] Conventionally, various methods have been used as lithographic processing methods for electronic devices such as ICs and LSIs. This method has many advantages over conventional lithography methods using visible light and ultraviolet light, and is attracting attention as a promising means for quarter-micron lithography. Generally, an X-ray mask used in X-ray lithography is composed of a Si wafer substrate 21 with a thickness of 0.4 to 2 mm, an X-ray transparent film 22, and an X-ray absorber 23, as shown in the schematic cross-sectional view of the mask shown in FIG. ing. The Si substrate is etched into a circular or polygonal shape at the center, and after etching becomes a self-supporting X-ray transparent film. The X-ray absorber is formed as a circuit pattern on this self-supporting film. On the outside of the circuit pattern, an X-ray absorber 24 is formed in a solid shape to prevent X-rays from passing through.

【0003】0003

【発明が解決しようとしている課題】上記X線マスクを
用いたX線リソグラフィーは通常ステップ&リピートで
露光が行われる。このとき多重露光が問題となる。X線
マスクの回路パターン23の外側はX線の透過防止の為
に内側の回路パターンと同一厚のX線吸収体24がベタ
状に形成されている。しかしながら、回路パターンと同
一厚のX線吸収体ではX線を完全には吸収出来ず、数〜
十数%が透過してしまう。ステップ&リピートで露光を
行う場合、この数〜十数%の透過X線が問題となる。つ
まり、多重露光である。ステップ&リピートで露光を行
うと、図3に示す様に必要な露光領域31の外側領域3
2が吸収体24を透過してきたX線によって露光される
[Problems to be Solved by the Invention] In X-ray lithography using the above-mentioned X-ray mask, exposure is normally performed in a step-and-repeat manner. At this time, multiple exposure becomes a problem. On the outside of the circuit pattern 23 of the X-ray mask, an X-ray absorber 24 having the same thickness as the inside circuit pattern is formed in a solid shape to prevent X-rays from passing through. However, an X-ray absorber with the same thickness as the circuit pattern cannot completely absorb X-rays, and several to
More than 10% of the light passes through. When performing step-and-repeat exposure, this number of transmitted X-rays of several to ten-odd percent becomes a problem. In other words, it is multiple exposure. When exposure is performed step and repeat, the outer area 3 of the required exposure area 31 as shown in FIG.
2 is exposed to X-rays transmitted through the absorber 24.

【0004】特に斜線の部分33が3重の露光にさらさ
れることになる。この露光によって、線幅精度の低下や
膜減りが引き起こされ、大きな問題となっている。これ
を解決する為の方法として、回路パターンの外側の吸収
体の厚さを厚くする、或いはマスクとは別にアパーチャ
ーを設ける等の提案がなされているが、前者は吸収体の
厚さを厚くすることによって吸収体の内部応力制御が困
難になり、マスクパターンの位置歪みを増大させ、後者
はアパーチャーの位置決めが非常に困難であると共に装
置の機構を複雑化させてしまうという問題があった(特
開昭62−158323号参照)従って、本発明の目的
は上記従来技術の問題点を解決し、X線の多重露光を防
止し、X線露光による高精度な回路パターン転写が可能
となるX線マスクを提供することにある。
In particular, the shaded area 33 is exposed to triple exposure. This exposure causes a decrease in line width accuracy and film thinning, which is a major problem. To solve this problem, proposals have been made such as increasing the thickness of the absorber outside the circuit pattern or providing an aperture separate from the mask, but the former method requires increasing the thickness of the absorber. This makes it difficult to control the internal stress of the absorber, increasing the positional distortion of the mask pattern, and the latter makes it extremely difficult to position the aperture and complicates the mechanism of the device (in particular, Therefore, the purpose of the present invention is to solve the problems of the prior art described above, to prevent multiple X-ray exposures, and to develop an X-ray system that enables highly accurate circuit pattern transfer by X-ray exposure. The purpose is to provide masks.

【0005】[0005]

【課題を解決する為の手段】上記目的は以下の本発明に
よって達成される。即ち、本発明は、X線透過膜、X線
吸収体及びX線透過膜支持体からなるX線マスクにおい
て、X線透過膜の枠縁の両面に多重露光防止膜が形成さ
れていることを特徴とするX線マスクである。
[Means for Solving the Problems] The above objects are achieved by the present invention as described below. That is, the present invention provides an X-ray mask consisting of an X-ray transparent film, an X-ray absorber, and an X-ray transparent film support, in which multiple exposure prevention films are formed on both sides of the frame edge of the X-ray transparent film. This is a characteristic X-ray mask.

【0006】[0006]

【作用】本発明によれば、X線マスクのX線透過膜中の
回路パターンの外側に多重露光防止用の膜をX線透過膜
の両面に形成することによって、X線の多重露光を防止
すると共に、多重露光防止膜を設置することによって発
生するマスクパターンの位置歪みを低減させることが出
来る。更にこの多重露光防止用膜の両面形成に金めっき
膜を用いることにより、多重露光防止膜形成に起因する
パターン位置歪みをほぼ無くすることことが出来る。
[Operation] According to the present invention, multiple exposure prevention films are formed on both sides of the X-ray transparent film on the outside of the circuit pattern in the X-ray transparent film of the X-ray mask, thereby preventing multiple exposure to X-rays. At the same time, it is possible to reduce positional distortion of the mask pattern caused by providing the multiple exposure prevention film. Furthermore, by using a gold plating film to form both sides of the multiple exposure prevention film, pattern position distortion caused by the formation of the multiple exposure prevention film can be substantially eliminated.

【0007】[0007]

【実施例】以下、図面を参照しつつ本発明の実施例につ
いて説明する。図1は本発明に係るX線マスクの1実施
例を示す図である。図1において、1はX線透過膜支持
体、2はX線透過膜、3はX線吸収体、4は多重露光防
止膜を示す。
Embodiments Hereinafter, embodiments of the present invention will be described with reference to the drawings. FIG. 1 is a diagram showing one embodiment of an X-ray mask according to the present invention. In FIG. 1, 1 is an X-ray transparent membrane support, 2 is an X-ray transparent membrane, 3 is an X-ray absorber, and 4 is a multiple exposure prevention membrane.

【0008】実施例1 図4に上記本発明のX線マスクの製造工程の1例を示す
。先ず、図4(a)に示す様にSiや石英等からなる基
板(X線透過膜支持体41)上にSiN、SiC、BN
等のX線透過膜42を1〜3μm厚みにCVD法又はス
パッター法等により形成する。次に、図4(b)に示す
様に、X線透過膜支持体41の裏面をウェットエッチン
グ処理することにより露光窓を形成する。次に、図4(
c)に示す様にめっき用電極43をEB又は抵抗加熱蒸
着法等の方法により形成する。このとき、裏面側のめっ
き電極は表面の回路パターンの外側の大きさにする。 次に、図4(d)に示す様に、めっき電極43上にレジ
ストパターン44を電子線露光等の方法により形成する
。この時も、レジストパターンの位置は裏面のめっき電
極に合わせる。つまり、回路パターンの外側を表裏で合
わせる。続いて、図4(e)に示す様に表裏同時に金め
っき45を行い、レジスト及びめっき下地を剥離して本
発明のX線マスクとする。又、金めっきは、同時でなく
逐次表裏でめっきを行ってもよいが、この場合は膜厚を
出来るだけ同一にする。
Example 1 FIG. 4 shows an example of the manufacturing process of the X-ray mask of the present invention. First, as shown in FIG. 4(a), SiN, SiC, and BN are deposited on a substrate (X-ray transparent membrane support 41) made of Si, quartz, etc.
An X-ray transmitting film 42 such as the above is formed to a thickness of 1 to 3 μm by CVD or sputtering. Next, as shown in FIG. 4(b), an exposure window is formed by subjecting the back surface of the X-ray transparent film support 41 to a wet etching process. Next, Figure 4 (
As shown in c), a plating electrode 43 is formed by a method such as EB or resistance heating vapor deposition. At this time, the plating electrode on the back side is made to have a size outside the circuit pattern on the front side. Next, as shown in FIG. 4(d), a resist pattern 44 is formed on the plating electrode 43 by a method such as electron beam exposure. Also at this time, the position of the resist pattern is aligned with the plating electrode on the back side. In other words, match the outside of the circuit pattern face to face. Subsequently, as shown in FIG. 4(e), gold plating 45 is performed on the front and back surfaces at the same time, and the resist and plating base are peeled off to obtain the X-ray mask of the present invention. Further, gold plating may be performed sequentially on the front and back sides instead of at the same time, but in this case, the film thickness should be made as uniform as possible.

【0009】実施例2 図5に本発明のX線マスクの製造工程の他の例を示す。 先ず、図5(a)に示す様にSiや石英等からなる基板
(X線透過膜支持体51)上にSiN、SiC、BN等
のX線透過膜52を1〜3μm厚みにCVD法又はスパ
ッター法等により形成する。次に、図5(b)に示す様
に多重露光防止膜の形成位置にめっき電極53を形成す
る。次に、図5(c)に示す様にX線透過膜52上にス
パッター法、CVD法等によりWNx、Ta、W等から
なるX線吸収体層54を形成する。次に、図5(d)に
示す様に、X線吸収体上にレジストパターン55を電子
線露光等の方法により形成する。次に、図5eに示す様
にレジストパターン55をエッチングマスクとしてX線
吸収体パターン56を形成し、エッチング後レジストを
剥離する。次に図5(f)に示す様に、めっき電極53
を回路パターンの外側の位置の裏側に形成する。次に図
5(g)に示す様にめっき電極上に金めっきを同時又は
逐次行い、本発明のX線マスクとする。尚、本発明は上
記の実施例に限定されるものではなく、種々の変形が可
能である。
Example 2 FIG. 5 shows another example of the manufacturing process of the X-ray mask of the present invention. First, as shown in FIG. 5(a), an X-ray transparent film 52 made of SiN, SiC, BN, etc. is deposited on a substrate (X-ray transparent film support 51) made of Si, quartz, etc. to a thickness of 1 to 3 μm by CVD or Formed by sputtering method or the like. Next, as shown in FIG. 5(b), a plating electrode 53 is formed at the position where the multiple exposure prevention film is to be formed. Next, as shown in FIG. 5C, an X-ray absorber layer 54 made of WNx, Ta, W, etc. is formed on the X-ray transparent film 52 by sputtering, CVD, or the like. Next, as shown in FIG. 5(d), a resist pattern 55 is formed on the X-ray absorber by a method such as electron beam exposure. Next, as shown in FIG. 5e, an X-ray absorber pattern 56 is formed using the resist pattern 55 as an etching mask, and after etching, the resist is peeled off. Next, as shown in FIG. 5(f), the plating electrode 53
is formed on the back side of the outer position of the circuit pattern. Next, as shown in FIG. 5(g), gold plating is performed on the plating electrodes simultaneously or sequentially to form an X-ray mask of the present invention. Note that the present invention is not limited to the above embodiments, and various modifications are possible.

【0010】0010

【発明の効果】以上に説明した様に、本発明のX線マス
クによれば従来大きな問題であった、多重露光が解消出
来且つ正確な線幅制御が可能となる。更に、X線透過膜
の両面に同一の多重露光防止膜を形成する為に、多重露
光防止膜の形成によって発生する内部応力をそれ自身で
相殺可能で、回路パターンの位置に影響を及ぼさずに多
重露光防止膜を形成出来る。従って、X線露光による高
精度な回路パターン転写が可能となる。
As described above, according to the X-ray mask of the present invention, multiple exposure, which has been a big problem in the past, can be solved and accurate line width control can be performed. Furthermore, since the same multiple exposure prevention film is formed on both sides of the X-ray transparent film, the internal stress generated by the formation of the multiple exposure prevention film can be canceled out by itself, without affecting the position of the circuit pattern. A film to prevent multiple exposure can be formed. Therefore, highly accurate circuit pattern transfer by X-ray exposure is possible.

【0011】[0011]

【図面の簡単な説明】[Brief explanation of the drawing]

【図1】本発明のX線マスクを図解的に示す断面図。FIG. 1 is a sectional view schematically showing an X-ray mask of the present invention.

【図2】従来技術のX線マスクを図解的に示す断面図。FIG. 2 is a cross-sectional view schematically showing a prior art X-ray mask.

【図3】多重X線露光を説明する図。FIG. 3 is a diagram illustrating multiple X-ray exposure.

【図4】本発明のX線マスクの製造工程の1例を示す図
FIG. 4 is a diagram showing an example of the manufacturing process of the X-ray mask of the present invention.

【図5】本発明のX線マスクの製造工程の他の例を示す
図。
FIG. 5 is a diagram showing another example of the manufacturing process of the X-ray mask of the present invention.

【符号の説明】[Explanation of symbols]

1、21、41、51:X線透過膜支持体2、22、4
2、52:X線透過膜 3、23、54:X線吸収体 4:多重露光防止膜 31:X線必要露光領域 32:X線露光領域 33:多重露光領域 43:めっき用電極 44、55:レジストパターン 45:めっき膜 53:めっき電極 56:X線吸収体パターン 57:めっき膜
1, 21, 41, 51: X-ray transparent membrane support 2, 22, 4
2, 52: X-ray transparent film 3, 23, 54: X-ray absorber 4: Multiple exposure prevention film 31: X-ray necessary exposure area 32: X-ray exposure area 33: Multiple exposure area 43: Plating electrode 44, 55 : Resist pattern 45: Plating film 53: Plating electrode 56: X-ray absorber pattern 57: Plating film

Claims (2)

【特許請求の範囲】[Claims] 【請求項1】  X線透過膜、X線吸収体及びX線透過
膜支持体からなるX線マスクにおいて、X線透過膜の枠
縁の両面に多重露光防止膜が形成されていることを特徴
とするX線マスク。
1. An X-ray mask comprising an X-ray transparent film, an X-ray absorber, and an X-ray transparent film support, characterized in that a multiple exposure prevention film is formed on both sides of the frame edge of the X-ray transparent film. X-ray mask.
【請求項2】  多重露光防止膜が金めっき膜である請
求項1に記載のX線マスク。
2. The X-ray mask according to claim 1, wherein the multiple exposure prevention film is a gold plating film.
JP4738491A 1991-02-21 1991-02-21 X-ray mask Expired - Fee Related JP2952063B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP4738491A JP2952063B2 (en) 1991-02-21 1991-02-21 X-ray mask

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP4738491A JP2952063B2 (en) 1991-02-21 1991-02-21 X-ray mask

Publications (2)

Publication Number Publication Date
JPH04267322A true JPH04267322A (en) 1992-09-22
JP2952063B2 JP2952063B2 (en) 1999-09-20

Family

ID=12773612

Family Applications (1)

Application Number Title Priority Date Filing Date
JP4738491A Expired - Fee Related JP2952063B2 (en) 1991-02-21 1991-02-21 X-ray mask

Country Status (1)

Country Link
JP (1) JP2952063B2 (en)

Also Published As

Publication number Publication date
JP2952063B2 (en) 1999-09-20

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