JPH0426065B2 - - Google Patents
Info
- Publication number
- JPH0426065B2 JPH0426065B2 JP58137214A JP13721483A JPH0426065B2 JP H0426065 B2 JPH0426065 B2 JP H0426065B2 JP 58137214 A JP58137214 A JP 58137214A JP 13721483 A JP13721483 A JP 13721483A JP H0426065 B2 JPH0426065 B2 JP H0426065B2
- Authority
- JP
- Japan
- Prior art keywords
- phase
- signal
- input
- signals
- phase detection
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R25/00—Arrangements for measuring phase angle between a voltage and a current or between voltages or currents
- G01R25/04—Arrangements for measuring phase angle between a voltage and a current or between voltages or currents involving adjustment of a phase shifter to produce a predetermined phase difference, e.g. zero difference
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Measurement Of Resistance Or Impedance (AREA)
- Measuring Phase Differences (AREA)
Priority Applications (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP58137214A JPS6028306A (ja) | 1983-07-27 | 1983-07-27 | 位相検波方法 |
| US06/634,907 US4654585A (en) | 1983-07-27 | 1984-07-26 | Phase detection method |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP58137214A JPS6028306A (ja) | 1983-07-27 | 1983-07-27 | 位相検波方法 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS6028306A JPS6028306A (ja) | 1985-02-13 |
| JPH0426065B2 true JPH0426065B2 (OSRAM) | 1992-05-06 |
Family
ID=15193453
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP58137214A Granted JPS6028306A (ja) | 1983-07-27 | 1983-07-27 | 位相検波方法 |
Country Status (2)
| Country | Link |
|---|---|
| US (1) | US4654585A (OSRAM) |
| JP (1) | JPS6028306A (OSRAM) |
Families Citing this family (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS62204166A (ja) * | 1986-03-04 | 1987-09-08 | Yokogawa Hewlett Packard Ltd | ベクトル電圧比測定装置 |
| GB2382878B (en) * | 2001-12-04 | 2005-09-07 | Adwel Internat Ltd | A method and apparatus for testing laminated cores of electrical machines |
| JP6809695B2 (ja) * | 2016-08-30 | 2021-01-06 | 株式会社エヌエフホールディングス | 非同期fra |
Family Cites Families (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5263372A (en) * | 1975-10-31 | 1977-05-25 | Hewlett Packard Yokogawa | Vector voltage ratio measuring device |
| US4048566A (en) * | 1976-01-05 | 1977-09-13 | Motorola Inc. | Suppressed carrier automatic gain control circuitry |
| US4196475A (en) * | 1976-09-02 | 1980-04-01 | Genrad, Inc. | Method of and apparatus for automatic measurement of impedance or other parameters with microprocessor calculation techniques |
| JPS55101868A (en) * | 1979-01-30 | 1980-08-04 | Yokogawa Hewlett Packard Ltd | Device for measuring vector voltage ratio |
| US4253118A (en) * | 1979-07-02 | 1981-02-24 | Zenith Radio Corporation | Synchronous detection system |
| JPS56126769A (en) * | 1980-03-11 | 1981-10-05 | Yokogawa Hewlett Packard Ltd | Impedance meter |
| US4459543A (en) * | 1981-10-01 | 1984-07-10 | Gould Inc. | Automatic phase compensation circuit |
-
1983
- 1983-07-27 JP JP58137214A patent/JPS6028306A/ja active Granted
-
1984
- 1984-07-26 US US06/634,907 patent/US4654585A/en not_active Expired - Lifetime
Also Published As
| Publication number | Publication date |
|---|---|
| US4654585A (en) | 1987-03-31 |
| JPS6028306A (ja) | 1985-02-13 |
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